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Topic: Measurement Technologies

Results

Sub-THz technologies state-of-the-art

2012 / IEEE / 978-617-607-138-9
By: Godziszewski, K.; Urzedowska, A.; Yashchyshyn, Y.;

Terahertz frequency-domain instrumentation for vector characterization of composite materials

2012 / IEEE / 978-1-4577-1438-2
By: Godziszewski, K.; Modelski, J.; Derzakowski, K.; Yashchyshyn, Y.;

50 years of progress in measuring and controlling industrial processes

1996 / IEEE
By: Wilbanks, W.G.;

Practical protection and control strategies during large power-system disturbances

1996 / IEEE / 0-7803-3522-8
By: Khoi T. Vu; Novosel, D.; Udren, E.; Hart, D.;

A simulation tool for virtual laboratory experiments in a WWW environment

1998 / IEEE / 0-7803-4797-8
By: Ferrero, A.; Piuri, V.;

1.55-/spl mu/m photonics for interrogating microwaves

2000 / IEEE / 0-7803-5947-X
By: Nagatsuma, T.;

Process module control for low-/spl kappa/ dielectrics [CVD]

2000 / IEEE / 0-7803-7392-8
By: Zhang, R.; Treadwell, C.; Young, M.; Stevens, P.; Lu, T.; Guevremont, M.; Srivatsa, A.; Slessor, M.; Casavant, T.; Ygartua, C.; Hayzelden, C.; Jihperng Leu; Tran, T.K.; Monahan, K.; Ashkenaz, S.; Marella, R.; Lange, S.; Fiordalice, R.; Krumbuegel, M.; Lauber, J.; Soltz, D.;

Towards the deployment of industrial robots as measurement instruments - An extended forward kinematic model incorporating geometric and nongeometric effects

2009 / IEEE / 978-1-4244-2852-6
By: Hemker, T.; Radkhah, K.; von Stryk, O.; Friedmann, M.;

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