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Topic: Measurement By Laser Beam
Results
Properties of a He-Ne laser at � = 612 nm, stabilized by means of an external iodine absorption cell
1987 / IEEEBy: Glaser, Michael;
2011 / IEEE
By: Detraz, S.; Troska, J.; Vasey, F.; Soos, C.; Sigaud, C.; Stejskal, P.; El Nasr-Storey, S.S.;
By: Detraz, S.; Troska, J.; Vasey, F.; Soos, C.; Sigaud, C.; Stejskal, P.; El Nasr-Storey, S.S.;
2011 / IEEE
By: Heidel, D.F.; Marshall, P.W.; Pellish, J.A.; Melinger, J.S.; Gouker, P.M.; Ferlet-Cavrois, V.; Warner, J.H.; McMorrow, D.; Dodd, P.E.; Shaneyfelt, M.R.; Schwank, J.R.; Swanson, S.E.; Rodbell, K.P.; LaBel, K.A.;
By: Heidel, D.F.; Marshall, P.W.; Pellish, J.A.; Melinger, J.S.; Gouker, P.M.; Ferlet-Cavrois, V.; Warner, J.H.; McMorrow, D.; Dodd, P.E.; Shaneyfelt, M.R.; Schwank, J.R.; Swanson, S.E.; Rodbell, K.P.; LaBel, K.A.;
2011 / IEEE
By: Zuowei Yin; Johnson, M.B.; Santos, M.B.; Mishima, T.D.; Yang, R.Q.; Zhaobing Tian; Yuchao Jiang;
By: Zuowei Yin; Johnson, M.B.; Santos, M.B.; Mishima, T.D.; Yang, R.Q.; Zhaobing Tian; Yuchao Jiang;
2011 / IEEE
By: Lorfevre, E.; Bezerra, F.; Samaras, A.; Lewis, D.; Darracq, F.; Ecoffet, R.; Larue, C.; Shao, K.; Pouget, V.; Faraud, E.;
By: Lorfevre, E.; Bezerra, F.; Samaras, A.; Lewis, D.; Darracq, F.; Ecoffet, R.; Larue, C.; Shao, K.; Pouget, V.; Faraud, E.;
2011 / IEEE
By: Malcolm, G.; Maker, G.; Robertson, G.; Butkus, M.; Rafailov, E.U.; Hamilton, C.; Yang Qiu; Walther, T.; Hogg, R.A.; Stevens, B.J.; Krysa, A.B.;
By: Malcolm, G.; Maker, G.; Robertson, G.; Butkus, M.; Rafailov, E.U.; Hamilton, C.; Yang Qiu; Walther, T.; Hogg, R.A.; Stevens, B.J.; Krysa, A.B.;
2011 / IEEE
By: Kai Shi; Barry, L.P.; Smyth, F.; Anandarajah, P.M.; Browning, C.; Huynh, T.N.; Reid, D.; Watts, R.;
By: Kai Shi; Barry, L.P.; Smyth, F.; Anandarajah, P.M.; Browning, C.; Huynh, T.N.; Reid, D.; Watts, R.;
2011 / IEEE
By: Bawamia, A.I.; Erbert, G.; Sumpf, B.; Thomas, M.; Spiesserger, S.; Ginolas, A.; Eppich, B.; Blume, G.;
By: Bawamia, A.I.; Erbert, G.; Sumpf, B.; Thomas, M.; Spiesserger, S.; Ginolas, A.; Eppich, B.; Blume, G.;
2012 / IEEE
By: Riboldi, M.; Fattori, G.; Baroni, G.; Orecchia, R.; Pella, A.; Tagaste, B.; Desplanques, M.;
By: Riboldi, M.; Fattori, G.; Baroni, G.; Orecchia, R.; Pella, A.; Tagaste, B.; Desplanques, M.;
2012 / IEEE
By: Jianzhou Wang; Yi Xu; Yanyan Li; Yansui Huang; Xiaoming Lu; Zhizhan Xu; Ruxin Li; Yuxin Leng;
By: Jianzhou Wang; Yi Xu; Yanyan Li; Yansui Huang; Xiaoming Lu; Zhizhan Xu; Ruxin Li; Yuxin Leng;
2012 / IEEE
By: Simanovskii, D.M.; Mackanos, M.A.; Jansen, E.D.; Kozub, J.A.; Contag, C.H.; Hutson, M.M.; Schriver, K.E.;
By: Simanovskii, D.M.; Mackanos, M.A.; Jansen, E.D.; Kozub, J.A.; Contag, C.H.; Hutson, M.M.; Schriver, K.E.;
2012 / IEEE
By: Aveline, D.; Allen, G.; Adell, P.; Kettunen, H.; El Mamouni, F.; Ferlet-Cavrois, V.; Larue, C.; Pouget, V.; Morand, S.; Miller, F.; McMorrow, D.; Warner, J.; Roche, N.; Buchner, S.;
By: Aveline, D.; Allen, G.; Adell, P.; Kettunen, H.; El Mamouni, F.; Ferlet-Cavrois, V.; Larue, C.; Pouget, V.; Morand, S.; Miller, F.; McMorrow, D.; Warner, J.; Roche, N.; Buchner, S.;
Investigation on Back-Reflected Pumping Light in High-Power Quasi-End-Pumped Yb:YAG Thin-Disk Lasers
2012 / IEEEBy: Radmard, S.; Kazemi, S.; Shayganmanesh, M.; Arabgari, S.;
2012 / IEEE
By: Burschka, D.; Suppa, M.; Ruess, F.; Grixa, I.L.; Mair, E.; Tomic, T.; Domel, A.; Lutz, P.; Schmid, K.; Kassecker, M.;
By: Burschka, D.; Suppa, M.; Ruess, F.; Grixa, I.L.; Mair, E.; Tomic, T.; Domel, A.; Lutz, P.; Schmid, K.; Kassecker, M.;
Investigation on the Single Event Burnout Sensitive Volume Using Two-Photon Absorption Laser Testing
2012 / IEEEBy: Lorfevre, E.; Pouget, V.; Azzopardi, S.; Mbaye, N.; Darracq, F.; Lewis, D.; Bezerra, F.;
2012 / IEEE
By: Nagdi, A.E.; Evans, G.A.; MacFarlane, D.L.; Sultana, N.; Dabkowski, M.; Ramakrishna, V.; Liu, K.; LaFave, T.P.; Christensen, M.P.; Kirk, J.; Kim, T.W.; Jiyoung Kim; Huntoon, N.; Hunt, L.R.;
By: Nagdi, A.E.; Evans, G.A.; MacFarlane, D.L.; Sultana, N.; Dabkowski, M.; Ramakrishna, V.; Liu, K.; LaFave, T.P.; Christensen, M.P.; Kirk, J.; Kim, T.W.; Jiyoung Kim; Huntoon, N.; Hunt, L.R.;
2012 / IEEE
By: Tudisco, O.; Gaudio, P.; Murari, A.; Gelfusa, M.; Boboc, A.; Orsitto, F.P.; Lupelli, I.; Avino, F.; Mazon, D.;
By: Tudisco, O.; Gaudio, P.; Murari, A.; Gelfusa, M.; Boboc, A.; Orsitto, F.P.; Lupelli, I.; Avino, F.; Mazon, D.;
Experimental Measurements of Path Length Sensitivity in Coherent Beam Combining by Spatial Filtering
2012 / IEEEBy: Chenhao Wan; Leger, J.R.;
2012 / IEEE
By: Holopainen, M.; Vastaranta, M.; Kaartinen, H.; Hyyppa, J.; Litkey, P.; Xinlian Liang;
By: Holopainen, M.; Vastaranta, M.; Kaartinen, H.; Hyyppa, J.; Litkey, P.; Xinlian Liang;
2012 / IEEE
By: Orofino, C.; Kanibolotsky, A.L.; Chen, Y.; Herrnsdorf, J.; Skabara, P.J.; Guilhabert, B.; Laurand, N.; Dawson, M.D.;
By: Orofino, C.; Kanibolotsky, A.L.; Chen, Y.; Herrnsdorf, J.; Skabara, P.J.; Guilhabert, B.; Laurand, N.; Dawson, M.D.;
2012 / IEEE
By: Parker, C.; Fadeyev, V.; Ely, S.; Deran, A.; Butko, Z.; Ptak, N.; Betancourt, C.; Wright, J.; Bielecki, A.; Sadrozinski, H.F.;
By: Parker, C.; Fadeyev, V.; Ely, S.; Deran, A.; Butko, Z.; Ptak, N.; Betancourt, C.; Wright, J.; Bielecki, A.; Sadrozinski, H.F.;
2012 / IEEE
By: Anandarajah, P.M.; Barry, L.P.; O'Gorman, J.; Kelly, B.; Phelan, R.; O'Carroll, J.; Zhou, R.; Browning, C.; Latkowski, S.;
By: Anandarajah, P.M.; Barry, L.P.; O'Gorman, J.; Kelly, B.; Phelan, R.; O'Carroll, J.; Zhou, R.; Browning, C.; Latkowski, S.;
2012 / IEEE
By: Sedaka, J.; Scholz, C.; Cooper, M.; Miyasaka, H.; Meras, P.; Mao, P.; Liebe, C.C.; Madsen, K.K.; Kecman, B.; Cook, R.; Clark, G.R.; Bauman, B.W.;
By: Sedaka, J.; Scholz, C.; Cooper, M.; Miyasaka, H.; Meras, P.; Mao, P.; Liebe, C.C.; Madsen, K.K.; Kecman, B.; Cook, R.; Clark, G.R.; Bauman, B.W.;
2012 / IEEE
By: Jiang Wei Man; Liang Xie; Wei Wang; Ning Hua Zhu; Yu Liu; Bao Jun Wang; Ling Juan Zhao; Hai Qing Yuan; Xin Wang; Hong Liang Zhu;
By: Jiang Wei Man; Liang Xie; Wei Wang; Ning Hua Zhu; Yu Liu; Bao Jun Wang; Ling Juan Zhao; Hai Qing Yuan; Xin Wang; Hong Liang Zhu;