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Topic: Magnetic Hysteresis
Results
2011 / IEEE
By: Kwan-Seob Yoon; Ki-Chan Kim; Young-Hak Kim; Hae-Yong Jeong; Kwang-Ho Shin; Chang-Seob Yang;
By: Kwan-Seob Yoon; Ki-Chan Kim; Young-Hak Kim; Hae-Yong Jeong; Kwang-Ho Shin; Chang-Seob Yang;
2011 / IEEE
By: Corbetta, M.; Nahas, Y.; Borme, J.; Ouazi, S.; Oka, H.; Rodary, G.; Wedekind, S.; Kirschner, J.; Sander, D.;
By: Corbetta, M.; Nahas, Y.; Borme, J.; Ouazi, S.; Oka, H.; Rodary, G.; Wedekind, S.; Kirschner, J.; Sander, D.;
2011 / IEEE
By: Jianmin Bai; Zhenghua Li; Fu Zheng; Yuanfu Lou; Fulin Wei; Kaiming Zhang; Hongjia Li; Hailong Xie; Dan Wei;
By: Jianmin Bai; Zhenghua Li; Fu Zheng; Yuanfu Lou; Fulin Wei; Kaiming Zhang; Hongjia Li; Hailong Xie; Dan Wei;
2011 / IEEE
By: Jong-Ching Wu; Jin-Zhen Liu; Jia-Hua Lin; Jia-Mou Lee; Ching-Ming Lee; Lin-Xiu Ye; Te-Ho Wu;
By: Jong-Ching Wu; Jin-Zhen Liu; Jia-Hua Lin; Jia-Mou Lee; Ching-Ming Lee; Lin-Xiu Ye; Te-Ho Wu;
2011 / IEEE
By: Li-Han Chen; Daehoon Hong; Young Oh; Jin-Yeol Kim; Sungho Jin; Hyunsu Kim; Chulmin Choi; Kunbae Noh;
By: Li-Han Chen; Daehoon Hong; Young Oh; Jin-Yeol Kim; Sungho Jin; Hyunsu Kim; Chulmin Choi; Kunbae Noh;
2011 / IEEE
By: Fernandez, E.; Volchkov, S.O.; Kurlyandskaya, G.V.; Lepalovskij, V.N.; Barandiaran, J.M.; Garcia-Arribas, A.;
By: Fernandez, E.; Volchkov, S.O.; Kurlyandskaya, G.V.; Lepalovskij, V.N.; Barandiaran, J.M.; Garcia-Arribas, A.;
2011 / IEEE
By: Russek, S.E.; Xiaolu Yin; Liou, S.H.; Shen, J.; Heindl, R.; Yuan, L.; Pappas, D.P.; Moreland, J.; Da Silva, F.C.S.;
By: Russek, S.E.; Xiaolu Yin; Liou, S.H.; Shen, J.; Heindl, R.; Yuan, L.; Pappas, D.P.; Moreland, J.; Da Silva, F.C.S.;
2011 / IEEE
By: Seong-Hyok Kim; Sungho Beck; Kwanyeob Chae; Jaehyouk Choi; Kim, S.T.; Bien, F.; Laskar, J.; Tentzeris, M.M.; Kyutae Lim; Chang-Ho Lee;
By: Seong-Hyok Kim; Sungho Beck; Kwanyeob Chae; Jaehyouk Choi; Kim, S.T.; Bien, F.; Laskar, J.; Tentzeris, M.M.; Kyutae Lim; Chang-Ho Lee;
2011 / IEEE
By: Perov, N.; Badini-Confalonieri, G.A.; Torrejon, J.; Nikoshin, A.; Rodionova, V.; Vazquez, M.;
By: Perov, N.; Badini-Confalonieri, G.A.; Torrejon, J.; Nikoshin, A.; Rodionova, V.; Vazquez, M.;
2011 / IEEE
By: Liping Jiang; Yajie Chen; Fitchorov, T.; Harris, V.G.; Vittoria, C.; Zengqi Zhao; Guangrui Zhang;
By: Liping Jiang; Yajie Chen; Fitchorov, T.; Harris, V.G.; Vittoria, C.; Zengqi Zhao; Guangrui Zhang;
2011 / IEEE
By: Cihan Kuru; Chulmin Choi; Young Oh; Kunbae Noh; Daehoon Hong; Sungho Jin; Tae-Yeon Seong; Sy-Hwang Liou; Li-Han Chen;
By: Cihan Kuru; Chulmin Choi; Young Oh; Kunbae Noh; Daehoon Hong; Sungho Jin; Tae-Yeon Seong; Sy-Hwang Liou; Li-Han Chen;
2011 / IEEE
By: Kobayashi, S.; Kikuchi, H.; Kamada, Y.; Mohapatra, J.N.; Cheong, Y.M.; Park, D.G.; Echigoya, J.;
By: Kobayashi, S.; Kikuchi, H.; Kamada, Y.; Mohapatra, J.N.; Cheong, Y.M.; Park, D.G.; Echigoya, J.;
2011 / IEEE
By: Sining Mao; Lin, H.; Feng Liu; Shaoping Li; Bai, D.Z.; Tao Pan; Zhanjie Li; Peng Luo;
By: Sining Mao; Lin, H.; Feng Liu; Shaoping Li; Bai, D.Z.; Tao Pan; Zhanjie Li; Peng Luo;
2011 / IEEE
By: Celegato, F.; Carpentieri, M.; Ragusa, C.; Finocchio, G.; Boarino, L.; Enrico, E.; Tiberto, P.;
By: Celegato, F.; Carpentieri, M.; Ragusa, C.; Finocchio, G.; Boarino, L.; Enrico, E.; Tiberto, P.;
2012 / IEEE
By: Gubbiotti, G.; Bisero, D.; Madami, M.; Ono, T.; Nakano, K.; Carlotti, G.; Tacchi, S.;
By: Gubbiotti, G.; Bisero, D.; Madami, M.; Ono, T.; Nakano, K.; Carlotti, G.; Tacchi, S.;
2012 / IEEE
By: Yoon Hee Jeong; Yong-Woo Lee; Sam Jin Kim; Woo Jun Kwon; Bo Ra Myoung; Chul Sung Kim;
By: Yoon Hee Jeong; Yong-Woo Lee; Sam Jin Kim; Woo Jun Kwon; Bo Ra Myoung; Chul Sung Kim;
2012 / IEEE
By: Schlegel, J.P.; Espindola, A.A.; Bastos, J.P.A.; Iamamura, B.A.T.; Batistela, N.J.; Sadowski, N.;
By: Schlegel, J.P.; Espindola, A.A.; Bastos, J.P.A.; Iamamura, B.A.T.; Batistela, N.J.; Sadowski, N.;
2012 / IEEE
By: de Campos, M.F.; Machado, R.; Landgraf, F.J.G.; Missell, F.P.; Gerhardt, G.J.L.; Silveira, J.R.F.; Rodrigues, D.L.;
By: de Campos, M.F.; Machado, R.; Landgraf, F.J.G.; Missell, F.P.; Gerhardt, G.J.L.; Silveira, J.R.F.; Rodrigues, D.L.;