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Topic: Magnetic Films
Results
2011 / IEEE
By: Naganuma, H.; Watanabe, D.; Zhang, X.; Kubota, T.; Oogane, M.; Mizukami, S.; Miyazaki, T.; Ando, Y.;
By: Naganuma, H.; Watanabe, D.; Zhang, X.; Kubota, T.; Oogane, M.; Mizukami, S.; Miyazaki, T.; Ando, Y.;
2011 / IEEE
By: Serrano-Guisan, S.; Liebing, N.; Schumacher, H.W.; Muller, A.; Caprile, A.; Pasquale, M.; Celegato, F.; Olivetti, E.S.;
By: Serrano-Guisan, S.; Liebing, N.; Schumacher, H.W.; Muller, A.; Caprile, A.; Pasquale, M.; Celegato, F.; Olivetti, E.S.;
2011 / IEEE
By: Celegato, F.; Carpentieri, M.; Ragusa, C.; Finocchio, G.; Boarino, L.; Enrico, E.; Tiberto, P.;
By: Celegato, F.; Carpentieri, M.; Ragusa, C.; Finocchio, G.; Boarino, L.; Enrico, E.; Tiberto, P.;
2012 / IEEE
By: Scarlat, C.; Haidu, F.; Schubert, C.; Fronk, M.; Dorr, K.; Salvan, G.; Zahn, D.R.T.; Albrecht, M.;
By: Scarlat, C.; Haidu, F.; Schubert, C.; Fronk, M.; Dorr, K.; Salvan, G.; Zahn, D.R.T.; Albrecht, M.;
2000 / IEEE
By: Gorokhov, V.V.; Yermolovich, V.F.; Volkov, A.A.; Selyavsky, V.T.; Selemir, V.D.; Savchenko, R.V.; Repin, P.B.; Orlov, A.P.; Karelin, V.I.; Ivanovsky, A.V.; Ivanov, M.M.; Grebenev, E.V.;
By: Gorokhov, V.V.; Yermolovich, V.F.; Volkov, A.A.; Selyavsky, V.T.; Selemir, V.D.; Savchenko, R.V.; Repin, P.B.; Orlov, A.P.; Karelin, V.I.; Ivanovsky, A.V.; Ivanov, M.M.; Grebenev, E.V.;
2011 / IEEE / 978-1-61284-088-8
By: Yangan Yan; Jing Wang; Huawa Yu; Yali Du; Hanchen Liu; Bin Gao; Xin Wang;
By: Yangan Yan; Jing Wang; Huawa Yu; Yali Du; Hanchen Liu; Bin Gao; Xin Wang;
2011 / IEEE / 978-1-4577-1163-3
By: Kong, C.; Zheng, R.K.; Chan, N.Y.; Wang, D.Y.; Chan, H.L.W.; Li, S.;
By: Kong, C.; Zheng, R.K.; Chan, N.Y.; Wang, D.Y.; Chan, H.L.W.; Li, S.;
2011 / IEEE / 978-1-4577-1163-3
By: Dingquan Xiao; Hong Liu; Dongxu Yan; Hongli Guo; Xiaolong Chen; Jianguo Zhu;
By: Dingquan Xiao; Hong Liu; Dongxu Yan; Hongli Guo; Xiaolong Chen; Jianguo Zhu;
2011 / IEEE / 978-986-02-8974-9
By: Shih-Kun Liu; Po-Wei Chen; Yen-Sheng Lin; Yung-Hao Huang; Kun-Cheng Chen; Wei-Chih Tseng;
By: Shih-Kun Liu; Po-Wei Chen; Yen-Sheng Lin; Yung-Hao Huang; Kun-Cheng Chen; Wei-Chih Tseng;
2011 / IEEE / 978-1-4244-6051-9
By: Yongli Wang; Osherovich, V.; Fainberg, J.; Benson, R.F.; Truhlik, V.; Shing Fung; Bilitza, D.;
By: Yongli Wang; Osherovich, V.; Fainberg, J.; Benson, R.F.; Truhlik, V.; Shing Fung; Bilitza, D.;
2011 / IEEE / 978-2-87487-022-4
By: Yamaguchi, M.; Nagata, M.; Sasaki, Y.; Yoshikawa, K.; Kodate, W.; Endo, Y.; Muroga, S.;
By: Yamaguchi, M.; Nagata, M.; Sasaki, Y.; Yoshikawa, K.; Kodate, W.; Endo, Y.; Muroga, S.;
2011 / IEEE / 978-1-61284-264-6
By: Krishnasamy, J.; KahYoong Chan; Jian Wei Hoon; Teck Yong Tou; Hin Yong Wong;
By: Krishnasamy, J.; KahYoong Chan; Jian Wei Hoon; Teck Yong Tou; Hin Yong Wong;
2011 / IEEE / 978-1-4577-2141-0
By: Namwoog Kim; Jisung So; Jongchul Moon; Kiho Yeo; Jaimoo Yoo; Sunghwan Lim; Youngha Jun;
By: Namwoog Kim; Jisung So; Jongchul Moon; Kiho Yeo; Jaimoo Yoo; Sunghwan Lim; Youngha Jun;
2011 / IEEE / 978-1-4577-2141-0
By: Rabizadeh, T.; Khonsari, S.K.; Towhidi, N.; Allahkaram, S.R.; Cheraghi, M.S.;
By: Rabizadeh, T.; Khonsari, S.K.; Towhidi, N.; Allahkaram, S.R.; Cheraghi, M.S.;
2011 / IEEE / 978-1-4244-9965-6
By: Yong-Soo Jeong; Sun-Young Park; Yong-Jin Kang; Hye-Ri Kim; Jae-Wook Kang; Dong-Ho Kim;
By: Yong-Soo Jeong; Sun-Young Park; Yong-Jin Kang; Hye-Ri Kim; Jae-Wook Kang; Dong-Ho Kim;
2012 / IEEE / 978-1-4673-0325-5
By: Miki, S.; Maenaka, K.; Higuchi, K.; Kanda, K.; Fujita, T.; Uehara, M.; Jiang, Y.G.; Kotoge, T.;
By: Miki, S.; Maenaka, K.; Higuchi, K.; Kanda, K.; Fujita, T.; Uehara, M.; Jiang, Y.G.; Kotoge, T.;
2011 / IEEE / 978-1-4244-9965-6
By: Miranda, D.O.; Moura, T.D.O.; Branco, J.R.T.; Diniz, A.S.A.C.; Proenca, R.T.; Guimaraes, G.R.; Santana, R.J.;
By: Miranda, D.O.; Moura, T.D.O.; Branco, J.R.T.; Diniz, A.S.A.C.; Proenca, R.T.; Guimaraes, G.R.; Santana, R.J.;
2011 / IEEE / 978-1-4673-0074-2
By: Jose, F.; Prasad, A.K.; Tyagi, A.K.; Dash, S.; Kamruddin, M.; Sundari, S.T.; Raut, N.C.;
By: Jose, F.; Prasad, A.K.; Tyagi, A.K.; Dash, S.; Kamruddin, M.; Sundari, S.T.; Raut, N.C.;
2011 / IEEE / 978-1-4673-0074-2
By: Uthanna, S.; Prasad, K.J.; Mallikarjuna, K.; Kondaiah, P.; Anurag, K.; Manoj, L.;
By: Uthanna, S.; Prasad, K.J.; Mallikarjuna, K.; Kondaiah, P.; Anurag, K.; Manoj, L.;
2012 / IEEE / 978-1-4673-1965-2
By: Nair, V.; Tummala, R.; Murali, K.P.; Sharma, H.; Raj, P.M.; Swaminathan, M.; Kyu Han;
By: Nair, V.; Tummala, R.; Murali, K.P.; Sharma, H.; Raj, P.M.; Swaminathan, M.; Kyu Han;
2012 / IEEE
By: Shandong Li; Lili Wang; Jie Xu; Zeng Wang; Ming Liu; Jenq-Gong Duh; Beguhn, S.; Tianxiang Nan; Feng Xu; Sun, N.X.; Lou, J.;
By: Shandong Li; Lili Wang; Jie Xu; Zeng Wang; Ming Liu; Jenq-Gong Duh; Beguhn, S.; Tianxiang Nan; Feng Xu; Sun, N.X.; Lou, J.;
2012 / IEEE
By: Maroutian, T.; Solignac, A.; Gogol, P.; Guerrero, R.; Ott, F.; Pannetier-Lecoeur, M.; Fermon, C.; Lecoeur, P.;
By: Maroutian, T.; Solignac, A.; Gogol, P.; Guerrero, R.; Ott, F.; Pannetier-Lecoeur, M.; Fermon, C.; Lecoeur, P.;
2013 / IEEE
By: Song, J.-Z.; Zhang, Y.; Zhang, Y.; Liu, J. P.; Qi, X.-Y.; Zhang, J.; Xia, W.-X.; Du, J.; Yan, A.-R.;
By: Song, J.-Z.; Zhang, Y.; Zhang, Y.; Liu, J. P.; Qi, X.-Y.; Zhang, J.; Xia, W.-X.; Du, J.; Yan, A.-R.;
2015 / IEEE
By: Koh, Kisik; Lin, Liwei; Tayebi, Noureddine; O'brien, Kevin P.; Yang, Chen; Gardner, Donald S.;
By: Koh, Kisik; Lin, Liwei; Tayebi, Noureddine; O'brien, Kevin P.; Yang, Chen; Gardner, Donald S.;
2014 / IEEE
By: Roshchupkin, Dmitry; Kondratiev, Serguei; Buzanov, Oleg; Medvedev, Andrey; Zabelin, Alexey; Sakharov, Sergey; Zhgoon, Sergei; Shvetsov, Alexander;
By: Roshchupkin, Dmitry; Kondratiev, Serguei; Buzanov, Oleg; Medvedev, Andrey; Zabelin, Alexey; Sakharov, Sergey; Zhgoon, Sergei; Shvetsov, Alexander;
2014 / IEEE
By: Deng, S. Z.; Zhang, G. F.; Chen, Y. X.; Li, Y. F.; Zhao, Long; Chen, Jun; Xu, N. S.;
By: Deng, S. Z.; Zhang, G. F.; Chen, Y. X.; Li, Y. F.; Zhao, Long; Chen, Jun; Xu, N. S.;
2014 / IEEE
By: Novikov, V. A.; Klochko, N. P.; Pirohov, O. V.; Sokol, E. I.; Klepikova, K. S.; Khrypunov, G. S.;
By: Novikov, V. A.; Klochko, N. P.; Pirohov, O. V.; Sokol, E. I.; Klepikova, K. S.; Khrypunov, G. S.;
2014 / IEEE
By: Yuan Gao; Zare, Saba; Sun, Nian X.; Brown, Gail J.; Jones, John G.; Howe, Brandon M.; Mahalingam, Krishnamurthy; Liu, Ming; Xi Yang; Tianxiang Nan; Zhou, Ziyao; Ming Li; Onabajo, Marvin;
By: Yuan Gao; Zare, Saba; Sun, Nian X.; Brown, Gail J.; Jones, John G.; Howe, Brandon M.; Mahalingam, Krishnamurthy; Liu, Ming; Xi Yang; Tianxiang Nan; Zhou, Ziyao; Ming Li; Onabajo, Marvin;
2014 / IEEE
By: Chong Bi; Yunpeng Chen; Fan, Xin; Xiao, John Q.; Yunsong Xie; Simons, Rainee N.; Wilson, Jeffrey D.; Kolodzey, James; Zhang, Huaiwu;
By: Chong Bi; Yunpeng Chen; Fan, Xin; Xiao, John Q.; Yunsong Xie; Simons, Rainee N.; Wilson, Jeffrey D.; Kolodzey, James; Zhang, Huaiwu;
2013 / IEEE
By: Kijima, H.; Masumoto, H.; Setter, N.; Muralt, P.; Ohnuma, S.; Kobayashi, N.; Zhang, Y.;
By: Kijima, H.; Masumoto, H.; Setter, N.; Muralt, P.; Ohnuma, S.; Kobayashi, N.; Zhang, Y.;
2014 / IEEE
By: Klaus, C.; Schwiegel, B.; Wojcik, H.; Bartha, J. W.; Urbansky, N.; Kubasch, C.; Hahn, J.; Kriz, J.; Wenzel, C.;
By: Klaus, C.; Schwiegel, B.; Wojcik, H.; Bartha, J. W.; Urbansky, N.; Kubasch, C.; Hahn, J.; Kriz, J.; Wenzel, C.;
1988 / IEEE
By: Saito, Y.; Umehara, Y.; Shiraki, M.; Tokushima, T.; Tsuya, N.; Harada, Y.; Nakamura, H.;
By: Saito, Y.; Umehara, Y.; Shiraki, M.; Tokushima, T.; Tsuya, N.; Harada, Y.; Nakamura, H.;