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Topic: Machine Vision
Results
2012 / IEEE
By: Frisoli, A.; Loconsole, C.; Leonardis, D.; Bergamasco, M.; Barsotti, M.; Chisari, C.; Banno, F.;
By: Frisoli, A.; Loconsole, C.; Leonardis, D.; Bergamasco, M.; Barsotti, M.; Chisari, C.; Banno, F.;
2012 / IEEE
By: Zamarreno-Ramos, C.; Camunas-Mesa, L.; Linares-Barranco, B.; Serrano-Gotarredona, T.; Acosta-Jimenez, A.J.; Linares-Barranco, A.;
By: Zamarreno-Ramos, C.; Camunas-Mesa, L.; Linares-Barranco, B.; Serrano-Gotarredona, T.; Acosta-Jimenez, A.J.; Linares-Barranco, A.;
2012 / IEEE
By: Han, T.X.; Zhen Li; Kai-Hsiang Lin; Tariq, U.; Xi Zhou; Xutao Lv; Huang, T.S.; Vuong Le; Zhaowen Wang;
By: Han, T.X.; Zhen Li; Kai-Hsiang Lin; Tariq, U.; Xi Zhou; Xutao Lv; Huang, T.S.; Vuong Le; Zhaowen Wang;
2012 / IEEE
By: Contreras, J.; Ferreira, I.; Martins, R.; Fortunato, E.; Filonovich, S.A.; Pereira, S.; Idzikowski, M.;
By: Contreras, J.; Ferreira, I.; Martins, R.; Fortunato, E.; Filonovich, S.A.; Pereira, S.; Idzikowski, M.;
2011 / IEEE / 978-1-61284-774-0
By: Al-Hamadi, A.; Niese, R.; Matuszewski, B.; Michaelis, B.; Heuer, M.;
By: Al-Hamadi, A.; Niese, R.; Matuszewski, B.; Michaelis, B.; Heuer, M.;
2011 / IEEE / 978-1-61284-709-2
By: Sorbello, F.; Gentile, A.; Franchini, S.; Vitabile, S.; Vassallo, G.;
By: Sorbello, F.; Gentile, A.; Franchini, S.; Vitabile, S.; Vassallo, G.;
2011 / IEEE / 978-1-4244-8115-6
By: Fuse, Y.; Kiyohiro, N.; Kotani, S.; Tanzawa, T.; Watanabe, H.; Yoshimura, C.; Nishimura, M.; Furuya, M.;
By: Fuse, Y.; Kiyohiro, N.; Kotani, S.; Tanzawa, T.; Watanabe, H.; Yoshimura, C.; Nishimura, M.; Furuya, M.;
2011 / IEEE / 978-1-61284-088-8
By: Xiong Yingjun; Lu Mingzhou; Sun Yuwen; Zhao Xianlin; Shen Mingxia; Liu Longshen;
By: Xiong Yingjun; Lu Mingzhou; Sun Yuwen; Zhao Xianlin; Shen Mingxia; Liu Longshen;
2011 / IEEE / 978-0-9555293-7-5
By: Yongping Dan; Hongtao Peng; Dongyun Wang; Liusong Wang; Fanghua Liu;
By: Yongping Dan; Hongtao Peng; Dongyun Wang; Liusong Wang; Fanghua Liu;
2011 / IEEE / 978-1-61284-181-6
By: Shen Lian-guan; Liu Xing; Zheng Jin-jin; Wang Wei; Zhou Hong-jun;
By: Shen Lian-guan; Liu Xing; Zheng Jin-jin; Wang Wei; Zhou Hong-jun;
2011 / IEEE / 978-1-4577-1707-9
By: Zhenyu Ye; Jonker, P.; Corporaal, H.; Mesman, B.; Pieters, R.; Yifan He;
By: Zhenyu Ye; Jonker, P.; Corporaal, H.; Mesman, B.; Pieters, R.; Yifan He;
2011 / IEEE / 978-1-61284-456-5
By: Skantze, G.; Bohg, J.; Johnson-Roberson, M.; Kragic, D.; Rasolzadeh, B.; Carlson, R.; Gustafson, J.;
By: Skantze, G.; Bohg, J.; Johnson-Roberson, M.; Kragic, D.; Rasolzadeh, B.; Carlson, R.; Gustafson, J.;
2011 / IEEE / 978-1-61284-651-4
By: Street, J.; Bitner, T.; Starman, V.; Crandall, E.R.; Zhao, Z.; Rodekohr, C.L.; Jackson, R.; Bozack, M.J.; Flowers, G.T.; Martens, R.;
By: Street, J.; Bitner, T.; Starman, V.; Crandall, E.R.; Zhao, Z.; Rodekohr, C.L.; Jackson, R.; Bozack, M.J.; Flowers, G.T.; Martens, R.;
2011 / IEEE / 978-1-61284-456-5
By: Bland, D.; Thurrowgood, S.; Moore, R.J.D.; Srinivasan, M.V.; Soccol, D.;
By: Bland, D.; Thurrowgood, S.; Moore, R.J.D.; Srinivasan, M.V.; Soccol, D.;
2011 / IEEE / 978-1-4577-1732-1
By: Gamez Garcia, J.; Sanchez Garcia, A.; Gomez Ortega, J.; Satorres Martinez, S.;
By: Gamez Garcia, J.; Sanchez Garcia, A.; Gomez Ortega, J.; Satorres Martinez, S.;
2011 / IEEE / 978-1-4577-1732-1
By: Zhun Fan; Jinchao Liu; Kristensen, J.K.; Christensen, K.H.; Olsen, S.I.;
By: Zhun Fan; Jinchao Liu; Kristensen, J.K.; Christensen, K.H.; Olsen, S.I.;
2011 / IEEE / 978-1-4577-0018-7
By: Zanotti, L.; Mantovani, M.; Foroni, A.; Riello, V.G.; Rossi, A.; Cenci, S.; Rosati, G.; Carli, A.;
By: Zanotti, L.; Mantovani, M.; Foroni, A.; Riello, V.G.; Rossi, A.; Cenci, S.; Rosati, G.; Carli, A.;
2011 / IEEE / 978-1-61284-456-5
By: Popovic, Mila; Kruger, Norbert; Kragic, Danica; Jorgensen, Jimmy Alison; Kootstra, Gert;
By: Popovic, Mila; Kruger, Norbert; Kragic, Danica; Jorgensen, Jimmy Alison; Kootstra, Gert;
2011 / IEEE / 978-1-61284-456-5
By: Girbes, Vicent; Solanes, J. Ernesto; Tornero, Josep; Armesto, Leopoldo;
By: Girbes, Vicent; Solanes, J. Ernesto; Tornero, Josep; Armesto, Leopoldo;
2011 / IEEE / 978-1-4244-8161-3
By: Luo Yi; Chen Yong; Wang Xiaodong; Teng Lin; Ma Tianming; Chen Liang;
By: Luo Yi; Chen Yong; Wang Xiaodong; Teng Lin; Ma Tianming; Chen Liang;