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Topic: Luminescence
Results
2011 / IEEE
By: Zanotti, L.; Calestani, D.; Zambelli, N.; Benassi, G.; Mingzheng Zha; Marchini, L.; Gombia, E.; Caroli, E.; Auricchio, N.; Zappettini, A.; Pavesi, M.; Zanichelli, M.; Mosca, R.;
By: Zanotti, L.; Calestani, D.; Zambelli, N.; Benassi, G.; Mingzheng Zha; Marchini, L.; Gombia, E.; Caroli, E.; Auricchio, N.; Zappettini, A.; Pavesi, M.; Zanichelli, M.; Mosca, R.;
2012 / IEEE
By: Butendheich, R.; Humphreys, C.; Dandan Zhu; Trivellin, N.; Vaccari, S.; Leirer, C.; Zanoni, E.; Meneghini, M.; Meneghesso, G.; Hahn, B.;
By: Butendheich, R.; Humphreys, C.; Dandan Zhu; Trivellin, N.; Vaccari, S.; Leirer, C.; Zanoni, E.; Meneghini, M.; Meneghesso, G.; Hahn, B.;
2012 / IEEE
By: Grinyov, B.; Sidletskiy, O.; Gorbenko, V.; Voznyak, T.; Savchyn, V.; Nikl, M.; Zorenko, Y.; Douissard, P.; Martin, T.; Mares, J.;
By: Grinyov, B.; Sidletskiy, O.; Gorbenko, V.; Voznyak, T.; Savchyn, V.; Nikl, M.; Zorenko, Y.; Douissard, P.; Martin, T.; Mares, J.;
2012 / IEEE
By: Fukuda, K.; Totsuka, D.; Yanagida, T.; Kurosawa, S.; Kawaguchi, N.; Watanabe, K.; Kamada, K.; Fujimoto, Y.; Yoshikawa, A.; Yokota, Y.; Yamazaki, A.;
By: Fukuda, K.; Totsuka, D.; Yanagida, T.; Kurosawa, S.; Kawaguchi, N.; Watanabe, K.; Kamada, K.; Fujimoto, Y.; Yoshikawa, A.; Yokota, Y.; Yamazaki, A.;
2012 / IEEE
By: Conroy, S.; Belli, F.; Zimbal, A.; Tittelmeier, K.; Syme, B.; Schuhmacher, H.; Riva, M.; Marocco, D.; Lucke, A.; Kiptily, V.; Giacomelli, L.; Esposito, B.;
By: Conroy, S.; Belli, F.; Zimbal, A.; Tittelmeier, K.; Syme, B.; Schuhmacher, H.; Riva, M.; Marocco, D.; Lucke, A.; Kiptily, V.; Giacomelli, L.; Esposito, B.;
2012 / IEEE
By: Villone, J.; Feng, P.L.; Doty, F.P.; Allendorf, M.D.; Wong, B.M.; Mrowka, S.; Hattar, K.;
By: Villone, J.; Feng, P.L.; Doty, F.P.; Allendorf, M.D.; Wong, B.M.; Mrowka, S.; Hattar, K.;
2012 / IEEE
By: Yanagida, T.; Fujimoto, Y.; Kamada, K.; Totsuka, D.; Yagi, H.; Nikl, M.; Futami, Y.; Yanagida, S.; Kurosawa, S.; Yokota, Y.; Yoshikawa, A.; Yanagitani, T.;
By: Yanagida, T.; Fujimoto, Y.; Kamada, K.; Totsuka, D.; Yagi, H.; Nikl, M.; Futami, Y.; Yanagida, S.; Kurosawa, S.; Yokota, Y.; Yoshikawa, A.; Yanagitani, T.;
2012 / IEEE
By: Vaccaro, L.; Marcandella, C.; Girard, S.; Alessi, A.; Ouerdane, Y.; Boukenter, A.; Cannas, M.;
By: Vaccaro, L.; Marcandella, C.; Girard, S.; Alessi, A.; Ouerdane, Y.; Boukenter, A.; Cannas, M.;
2012 / IEEE
By: Sekiwa, H.; Miyamoto, M.; Kikuchi, M.; Futami, Y.; Wakahara, S.; Sugiyama, M.; Nikl, M.; Yokota, Y.; Kurosawa, S.; Fujimoto, Y.; Yanagida, T.; Yoshikawa, A.; Yamaji, A.;
By: Sekiwa, H.; Miyamoto, M.; Kikuchi, M.; Futami, Y.; Wakahara, S.; Sugiyama, M.; Nikl, M.; Yokota, Y.; Kurosawa, S.; Fujimoto, Y.; Yanagida, T.; Yoshikawa, A.; Yamaji, A.;
2012 / IEEE
By: Jansons, J.; Elsts, E.; Rogulis, U.; Kundzins, K.; Stunda, A.; Doke, G.; Sarakovskis, A.;
By: Jansons, J.; Elsts, E.; Rogulis, U.; Kundzins, K.; Stunda, A.; Doke, G.; Sarakovskis, A.;
2012 / IEEE
By: Meneghesso, G.; Zanoni, E.; Ueda, D.; Tanaka, T.; Ueda, T.; de Santi, C.; Meneghini, M.;
By: Meneghesso, G.; Zanoni, E.; Ueda, D.; Tanaka, T.; Ueda, T.; de Santi, C.; Meneghini, M.;
Light Emission Enhancement From Er-Doped Silicon Photonic Crystal Double-Heterostructure Microcavity
2012 / IEEEBy: Yue Wang; Xiongwei Hu; Hongjie Wang; Jianguang Li; Junming An; Yuanda Wu; Jiashun Zhang;
2012 / IEEE
By: Ugartemendia, J.M.; Illarramendi, M.A.; Ayesta, I.; Sarasua, J.-R.; Arrue, J.; Bikandi, I.; Zubia, J.; Jimenez, F.;
By: Ugartemendia, J.M.; Illarramendi, M.A.; Ayesta, I.; Sarasua, J.-R.; Arrue, J.; Bikandi, I.; Zubia, J.; Jimenez, F.;
2012 / IEEE
By: Hung-Tai Chang; Ching-Chi Wang; Wei-Ting Lai; Inn-Hao Chen; Kuan-Hung Chen; Wen-Yen Chen; Pei-Wen Li; Ming-Tsung Hung; Tzu-Min Hsu; Shen-Wei Lee; Jung-Chao Hsu;
By: Hung-Tai Chang; Ching-Chi Wang; Wei-Ting Lai; Inn-Hao Chen; Kuan-Hung Chen; Wen-Yen Chen; Pei-Wen Li; Ming-Tsung Hung; Tzu-Min Hsu; Shen-Wei Lee; Jung-Chao Hsu;
2012 / IEEE
By: Zhi Qiang Jiao; Shou Gen Yin; Xue Mu; Wen Tao Bi; Juan Juan Bai; Yu Lin Hua; Xiao Ming Wu;
By: Zhi Qiang Jiao; Shou Gen Yin; Xue Mu; Wen Tao Bi; Juan Juan Bai; Yu Lin Hua; Xiao Ming Wu;
2004 / IEEE / 978-5-87911-088-3
By: Alexandrov, V.V.; Volkov, G.S.; Xia Guangxin; Ning Jiamin; Li Linbo; Liu Qiang; Gu Yuanchao; Ding Ning; Guo Cun; Yang Jianlun; Xu Zeping; Xu Rongkun; Peng Xianjue; Hua Xinsheng; Lee Zhenhong; Fedulov, M.V.; Frolov, I.N.; Smirnov, V.P.; Samokhin, A.A.; Porofeev, I.Y.; Oleinik, G.M.; Grabovsky, E.V.; Zaitsev, V.I.; Zurin, M.V.; Medovschikov, S.F.; Mitrofanov, K.N.; Nedoseev, S.L.;
By: Alexandrov, V.V.; Volkov, G.S.; Xia Guangxin; Ning Jiamin; Li Linbo; Liu Qiang; Gu Yuanchao; Ding Ning; Guo Cun; Yang Jianlun; Xu Zeping; Xu Rongkun; Peng Xianjue; Hua Xinsheng; Lee Zhenhong; Fedulov, M.V.; Frolov, I.N.; Smirnov, V.P.; Samokhin, A.A.; Porofeev, I.Y.; Oleinik, G.M.; Grabovsky, E.V.; Zaitsev, V.I.; Zurin, M.V.; Medovschikov, S.F.; Mitrofanov, K.N.; Nedoseev, S.L.;
2011 / IEEE / 978-1-61284-329-2
By: Winter, J.; Reuter, S.; Masur, K.; Hasse, S.; Schneider, R.; Schnabel, U.; Ehlbeck, J.; Weltmann, K.; Polak, M.;
By: Winter, J.; Reuter, S.; Masur, K.; Hasse, S.; Schneider, R.; Schnabel, U.; Ehlbeck, J.; Weltmann, K.; Polak, M.;
2011 / IEEE / 978-986-02-8974-9
By: Wang, J.; Ji-hung Chang; Jyun-Sian Liou; Chun-Chin Tsai; Shun-Yuan Huang; Wei-Chih Cheng; Wood-Hi Cheng;
By: Wang, J.; Ji-hung Chang; Jyun-Sian Liou; Chun-Chin Tsai; Shun-Yuan Huang; Wei-Chih Cheng; Wood-Hi Cheng;
2011 / IEEE / 978-1-4244-8161-3
By: Wensheng Wei; Lin Peng; Zhang Baoliu; Shen Danping; Jianling Su;
By: Wensheng Wei; Lin Peng; Zhang Baoliu; Shen Danping; Jianling Su;
2011 / IEEE / 978-1-4577-0430-7
By: Romer, F.; Deppner, M.; Strassburg, M.; Bergbauer, W.; Witzigmann, B.; Waag, A.; Neumann, R.; Ledig, J.;
By: Romer, F.; Deppner, M.; Strassburg, M.; Bergbauer, W.; Witzigmann, B.; Waag, A.; Neumann, R.; Ledig, J.;
2011 / IEEE / 978-966-335-357-9
By: Prislopskiy, S.Y.; Kolosnitsin, B.S.; Gaponenko, N.V.; Plyakin, D.V.; Stepanova, E.A.; Rudenko, M.V.;
By: Prislopskiy, S.Y.; Kolosnitsin, B.S.; Gaponenko, N.V.; Plyakin, D.V.; Stepanova, E.A.; Rudenko, M.V.;
2011 / IEEE / 978-966-335-357-9
By: Kochev, A.S.; Nikolaenko, I.A.; Stepanova, L.S.; Gaponenko, N.V.; Orekhovskaya, T.I.;
By: Kochev, A.S.; Nikolaenko, I.A.; Stepanova, L.S.; Gaponenko, N.V.; Orekhovskaya, T.I.;
2011 / IEEE / 978-1-4577-1589-1
By: Bright, Frank V.; Chodavarapu, Vamsy P.; Cheung, Maurice C.; Yung, Ka Yi; Yao, Lei;
By: Bright, Frank V.; Chodavarapu, Vamsy P.; Cheung, Maurice C.; Yung, Ka Yi; Yao, Lei;
2011 / IEEE / 978-1-4577-1769-7
By: Shan Yu; Sheng Liu; Mingxiang Chen; Huai Zheng; Cao Bin; Liang Yang;
By: Shan Yu; Sheng Liu; Mingxiang Chen; Huai Zheng; Cao Bin; Liang Yang;
2011 / IEEE / 978-1-4577-0509-0
By: Tanaka, K.; Kadoya, Y.; Tani, S.; Shirai, M.; Shinokita, K.; Hirori, H.;
By: Tanaka, K.; Kadoya, Y.; Tani, S.; Shirai, M.; Shinokita, K.; Hirori, H.;
2011 / IEEE / 978-1-4577-0586-1
By: Marcandella, C.; Girard, S.; Alessi, A.; Ouerdane, Y.; Boukenter, A.; Cannas, M.; Vaccaro, L.;
By: Marcandella, C.; Girard, S.; Alessi, A.; Ouerdane, Y.; Boukenter, A.; Cannas, M.; Vaccaro, L.;
2011 / IEEE / 978-1-4673-0120-6
By: Yanagida, T.; Furuya, Y.; Wakahara, S.; Yoshikawa, A.; Yokota, Y.; Totsuka, D.; Kawaguchi, N.; Sugiyama, M.; Pejchal, J.;
By: Yanagida, T.; Furuya, Y.; Wakahara, S.; Yoshikawa, A.; Yokota, Y.; Totsuka, D.; Kawaguchi, N.; Sugiyama, M.; Pejchal, J.;
2011 / IEEE / 978-1-61284-813-6
By: Kraiski, A.A.; Tcherniega, N.V.; Mironova, T.V.; Kudryavtseva, A.D.; Kraiski, A.V.;
By: Kraiski, A.A.; Tcherniega, N.V.; Mironova, T.V.; Kudryavtseva, A.D.; Kraiski, A.V.;
2011 / IEEE / 978-1-4673-0120-6
By: Marchini, L.; Armani, N.; Zambelli, N.; Zappettini, A.; Calestani, D.; Benassi, G.;
By: Marchini, L.; Armani, N.; Zambelli, N.; Zappettini, A.; Calestani, D.; Benassi, G.;
2011 / IEEE / 978-1-4673-0120-6
By: Yang, F.; Guohao Ren; Zaiwei Fu; Ru Jia; Yuekun Heng; Shangke Pan; Sen Qian; Gangming Huang; Xiaohui Chen; Shaoli Li;
By: Yang, F.; Guohao Ren; Zaiwei Fu; Ru Jia; Yuekun Heng; Shangke Pan; Sen Qian; Gangming Huang; Xiaohui Chen; Shaoli Li;
2011 / IEEE / 978-1-4673-0120-6
By: Kandarakis, I.S.; Mytafidis, A.K.; Kalyvas, N.I.; Seferis, I.; Panayiotakis, G.S.; Fountos, G.P.; Michail, C.M.; Valais, I.G.;
By: Kandarakis, I.S.; Mytafidis, A.K.; Kalyvas, N.I.; Seferis, I.; Panayiotakis, G.S.; Fountos, G.P.; Michail, C.M.; Valais, I.G.;
2011 / IEEE / 978-1-4673-0120-6
By: Nikl, M.; Usuki, Y.; Tsutumi, K.; Endo, T.; Fujimoto, Y.; Kamada, K.; Yanagida, T.; Yoshikawa, A.;
By: Nikl, M.; Usuki, Y.; Tsutumi, K.; Endo, T.; Fujimoto, Y.; Kamada, K.; Yanagida, T.; Yoshikawa, A.;
2011 / IEEE / 978-1-4673-0120-6
By: Fukuda, K.; Watanabe, K.; Kawaguchi, N.; Yamazaki, A.; Fujimoto, Y.; Yanagida, T.; Kajimoto, S.; Yoshikawa, A.; Yokota, Y.; Futami, Y.; Kurosawa, S.; Fukumura, H.;
By: Fukuda, K.; Watanabe, K.; Kawaguchi, N.; Yamazaki, A.; Fujimoto, Y.; Yanagida, T.; Kajimoto, S.; Yoshikawa, A.; Yokota, Y.; Futami, Y.; Kurosawa, S.; Fukumura, H.;
2011 / IEEE / 978-1-4244-9965-6
By: Dhere, R.G.; Gessert, T.A.; Bergeson, J.D.; Kanevce, A.; Kuciauskas, D.; Duenow, J.N.;
By: Dhere, R.G.; Gessert, T.A.; Bergeson, J.D.; Kanevce, A.; Kuciauskas, D.; Duenow, J.N.;
2011 / IEEE / 978-1-4244-9965-6
By: Bayat, K.; Gautam, U.; Dachhepati, D.; Paudel, H.P.; Baroughi, M.F.;
By: Bayat, K.; Gautam, U.; Dachhepati, D.; Paudel, H.P.; Baroughi, M.F.;
2011 / IEEE / 978-1-4244-9965-6
By: Kwapil, W.; Muller, J.; Hinken, D.; Bothe, K.; Schubert, M.C.; Breitenstein, O.; Bauer, J.; Warta, W.;
By: Kwapil, W.; Muller, J.; Hinken, D.; Bothe, K.; Schubert, M.C.; Breitenstein, O.; Bauer, J.; Warta, W.;
2011 / IEEE / 978-1-4673-0020-9
By: Hashim, Nooraain; Farida Zuraina Mohd Yusof; Nor Azila Md Ludin;
By: Hashim, Nooraain; Farida Zuraina Mohd Yusof; Nor Azila Md Ludin;
2011 / IEEE / 978-0-9775657-8-8
By: Dayong Jin; Piper, J.A.; Jie Lu; Wei Deng; Jiangbo Zhao; Yiqing Lu;
By: Dayong Jin; Piper, J.A.; Jie Lu; Wei Deng; Jiangbo Zhao; Yiqing Lu;
Cytometric investigation of rare-events featuring time-gated detection and high-speed stage scanning
2011 / IEEE / 978-0-9775657-8-8By: Yiqing Lu; Dayong Jin; Yujing Huo; Piper, J.A.;
2011 / IEEE / 978-0-9775657-8-8
By: Connor, M.; Goodchild, A.; Stremovskiy, O.A.; Keif, T.A.; Deyev, S.M.; Sreenivasan, V.K.A.; Ivukina, E.A.; Zvyagin, A.V.;
By: Connor, M.; Goodchild, A.; Stremovskiy, O.A.; Keif, T.A.; Deyev, S.M.; Sreenivasan, V.K.A.; Ivukina, E.A.; Zvyagin, A.V.;
2011 / IEEE / 978-1-4244-9965-6
By: Allen, C.R.; Lim, S.H.; Jing-Jing Li; Yong-Hang Zhang; Ding Ding;
By: Allen, C.R.; Lim, S.H.; Jing-Jing Li; Yong-Hang Zhang; Ding Ding;
2011 / IEEE / 978-1-4577-0927-2
By: Tsuchiya, B.; Nagata, S.; Shikama, T.; Narui, M.; Katsui, H.; Ming Zhao;
By: Tsuchiya, B.; Nagata, S.; Shikama, T.; Narui, M.; Katsui, H.; Ming Zhao;
2011 / IEEE / 978-1-4577-0927-2
By: de Carlan, L.; Aubineau-Laniece, I.; Magne, S.; Spasic, E.; Ferdinand, P.; Ginestet, C.; Malet, C.;
By: de Carlan, L.; Aubineau-Laniece, I.; Magne, S.; Spasic, E.; Ferdinand, P.; Ginestet, C.; Malet, C.;
Emission spectroscopic measurement in Fabry-Perot resonator: Different methods of spectra evaluation
2012 / IEEE / 978-1-4577-0920-3By: Kabourek, V.; Cerny, P.; Korinek, T.; Piksa, P.; Zvanovec, S.;
2012 / IEEE / 978-1-4577-1597-6
By: Kubo, T.; Hara, M.; Ebine, J.; Murakami, K.; Hirahara, F.; Kameyama, S.;
By: Kubo, T.; Hara, M.; Ebine, J.; Murakami, K.; Hirahara, F.; Kameyama, S.;
2012 / IEEE / 978-953-233-068-7
By: Derek, V.; Orel, Z.C.; Furic, K.; Music, S.; Ristic, M.; Gamulin, O.; Balarin, M.; Ivanda, M.;
By: Derek, V.; Orel, Z.C.; Furic, K.; Music, S.; Ristic, M.; Gamulin, O.; Balarin, M.; Ivanda, M.;
2012 / IEEE / 978-1-4577-0911-1
By: Li, Chen; Yan, Dong; Yu, Xue; Yang, Zhengwen; Song, Zhiguo; Wang, Rongfei; Zhou, Dacheng; Qiu, Jianbei;
By: Li, Chen; Yan, Dong; Yu, Xue; Yang, Zhengwen; Song, Zhiguo; Wang, Rongfei; Zhou, Dacheng; Qiu, Jianbei;
2012 / IEEE / 978-1-4577-0911-1
By: Song, Zhiguo; Li, Chen; Qiu, Jianbei; Xu, Yuanyuan; Wang, Rongfei; Yu, Xue; Yin, Zhaoyi; Yang, Zhengwen; Zhou, Dacheng; Li, Yongjin;
By: Song, Zhiguo; Li, Chen; Qiu, Jianbei; Xu, Yuanyuan; Wang, Rongfei; Yu, Xue; Yin, Zhaoyi; Yang, Zhengwen; Zhou, Dacheng; Li, Yongjin;