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Topic: Lte
Results
2012 / IEEE
By: Min Jeong Kim; Kab Seok Ko; Jae Young Ahn; Jae Heung Kim; Dan Keun Sung; Kuk Yeol Bae;
By: Min Jeong Kim; Kab Seok Ko; Jae Young Ahn; Jae Heung Kim; Dan Keun Sung; Kuk Yeol Bae;
2012 / IEEE
By: Pathak, B.; Richards, D.; Antoniades, N.; Peiris, S.; Ellinas, G.; Madamopoulos, N.; Ali, M.A.; Dorsinville, R.;
By: Pathak, B.; Richards, D.; Antoniades, N.; Peiris, S.; Ellinas, G.; Madamopoulos, N.; Ali, M.A.; Dorsinville, R.;
2012 / IEEE
By: Montojo, J.; Barbieri, A.; Tingfang Ji; Damnjanovic, A.; Yongbin Wei; Horn, G.; Osok Song; Malladi, D.;
By: Montojo, J.; Barbieri, A.; Tingfang Ji; Damnjanovic, A.; Yongbin Wei; Horn, G.; Osok Song; Malladi, D.;
2011 / IEEE / 978-1-4577-0681-3
By: Alexiou, A.; Tseliou, G.; Papazois, A.; Kokkinos, V.; Bouras, C.; Asimakis, K.;
By: Alexiou, A.; Tseliou, G.; Papazois, A.; Kokkinos, V.; Bouras, C.; Asimakis, K.;
2011 / IEEE / 978-1-86135-373-3
By: Beltran, M.; Monroy, I.T.; Walker, S.; Llorente, R.; Jensen, J.B.; Quinlan, T.; Morant, M.;
By: Beltran, M.; Monroy, I.T.; Walker, S.; Llorente, R.; Jensen, J.B.; Quinlan, T.; Morant, M.;
2011 / IEEE / 978-1-4244-9563-4
By: Byungje Lee; Hyunho Wi; Byeongkwan Kim; Young-Seek Chung; Myun-Joo Park; Woo Kyoung Lee; Chang Won Jung;
By: Byungje Lee; Hyunho Wi; Byeongkwan Kim; Young-Seek Chung; Myun-Joo Park; Woo Kyoung Lee; Chang Won Jung;
2011 / IEEE / 978-1-4244-9563-4
By: Chuang, G.C.-H.; Shun-Chang Lo; Yi-Cheng Lin; Hsueh-Jyh Li; Yao-Chia Chan; Yu-Chun Lu;
By: Chuang, G.C.-H.; Shun-Chang Lo; Yi-Cheng Lin; Hsueh-Jyh Li; Yao-Chia Chan; Yu-Chun Lu;
2011 / IEEE / 978-1-4244-9563-4
By: Ben Mabrouk, I.; Denidni, T.A.; Coulibaly, Y.; Nedil, M.; Ait Jilal, R.; Talbi, L.;
By: Ben Mabrouk, I.; Denidni, T.A.; Coulibaly, Y.; Nedil, M.; Ait Jilal, R.; Talbi, L.;
2011 / IEEE / 978-1-4244-9221-3
By: Litjens, R.; Eisenblaetter, A.; Amirijoo, M.; Schmelz, L.C.; Turk, J.; Neuland, M.;
By: Litjens, R.; Eisenblaetter, A.; Amirijoo, M.; Schmelz, L.C.; Turk, J.; Neuland, M.;
2011 / IEEE / 978-1-4244-9538-2
By: Yongtao Su; Jian Wang; Ying He; Jinglin Shi; Xiaojing Huang; Dutkiewicz, E.;
By: Yongtao Su; Jian Wang; Ying He; Jinglin Shi; Xiaojing Huang; Dutkiewicz, E.;
2011 / IEEE / 978-1-936968-19-0
By: Kiminki, S.; Zetterman, T.; Immonen, A.; Parssinen, A.; Ryynanen, J.; Hirvisalo, V.; Saari, V.;
By: Kiminki, S.; Zetterman, T.; Immonen, A.; Parssinen, A.; Ryynanen, J.; Hirvisalo, V.; Saari, V.;
High-throughput Contention-Free concurrent interleaver architecture for multi-standard turbo decoder
2011 / IEEE / 978-1-4577-1292-0By: Guohui Wang; Yuanbin Guo; Cavallaro, J.R.; Yang Sun;
2011 / IEEE / 978-989-95055-7-5
By: Gaudart, G.; Bousoltane, K.; Nichele, S.; Burtschell, Y.; Tchuen, G.;
By: Gaudart, G.; Bousoltane, K.; Nichele, S.; Burtschell, Y.; Tchuen, G.;
2011 / IEEE / 978-1-61284-671-2
By: Shaojung Lu; Chun-Hsiang Chiu; Shiann-Tsong Sheu; Hsien-Hao Lai;
By: Shaojung Lu; Chun-Hsiang Chiu; Shiann-Tsong Sheu; Hsien-Hao Lai;