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Topic: Low-noise Amplifiers
Results
2011 / IEEE
By: Vincent, P.; Siligaris, A.; Cathelin, A.; Busson, P.; Pilard, R.; Yamamoto, S.D.; Dussopt, L.; Lanteri, J.; Dehos, C.; Ferragut, R.; Chaix, F.; Mounet, C.; Martineau, B.; Richard, O.; Belot, D.;
By: Vincent, P.; Siligaris, A.; Cathelin, A.; Busson, P.; Pilard, R.; Yamamoto, S.D.; Dussopt, L.; Lanteri, J.; Dehos, C.; Ferragut, R.; Chaix, F.; Mounet, C.; Martineau, B.; Richard, O.; Belot, D.;
2012 / IEEE
By: Vilasis-Cardona, X.; Machefert, F.; Lefrancois, J.; Grauges, E.; Gascon, D.; Garrido, L.; Duarte, O.; Abellan, C.; Picatoste, E.;
By: Vilasis-Cardona, X.; Machefert, F.; Lefrancois, J.; Grauges, E.; Gascon, D.; Garrido, L.; Duarte, O.; Abellan, C.; Picatoste, E.;
2012 / IEEE
By: Abbasi, M.; Nilsson, P.-A.; Wadefalk, N.; Moschetti, G.; Grahn, J.; Wallart, X.; Desplanque, L.;
By: Abbasi, M.; Nilsson, P.-A.; Wadefalk, N.; Moschetti, G.; Grahn, J.; Wallart, X.; Desplanque, L.;
2012 / IEEE
By: Lourenco, N.E.; Philips, S.D.; Bhattacharya, S.K.; Patterson, C.E.; Poh, C.H.J.; Papapolymerou, J.; Cressler, J.D.;
By: Lourenco, N.E.; Philips, S.D.; Bhattacharya, S.K.; Patterson, C.E.; Poh, C.H.J.; Papapolymerou, J.; Cressler, J.D.;
2011 / IEEE / 978-1-4577-1255-5
By: Rezakhani, S.; Farrokh, M.S.; Ghahramani, J.; Miri, M.S.; Kordalivand, A.M.;
By: Rezakhani, S.; Farrokh, M.S.; Ghahramani, J.; Miri, M.S.; Kordalivand, A.M.;
2011 / IEEE / 978-3-8007-3356-9
By: Sato, M.; Takahashi, T.; Hara, N.; Hirose, T.; Nakasha, Y.; Makiyama, K.;
By: Sato, M.; Takahashi, T.; Hara, N.; Hirose, T.; Nakasha, Y.; Makiyama, K.;
2011 / IEEE / 978-1-61284-712-2
By: Cetinoneri, B.; Inac, O.; Rebeiz, G.M.; Atesal, Y.A.; Uzunkol, M.;
By: Cetinoneri, B.; Inac, O.; Rebeiz, G.M.; Atesal, Y.A.; Uzunkol, M.;
2011 / IEEE / 978-1-61284-166-3
By: Bardy, S.; Meng, F.; Breunisse, R.; van der Heijden, E.; Moreau, F.; Praamsma, L.; Philippe, P.; Thomas, E.; Wane, S.;
By: Bardy, S.; Meng, F.; Breunisse, R.; van der Heijden, E.; Moreau, F.; Praamsma, L.; Philippe, P.; Thomas, E.; Wane, S.;
2011 / IEEE / 978-2-87487-022-4
By: Sieth, M.; Voll, P.; Lau, J.M.; Church, S.; Samoska, L.; Gaier, T.; Van Winkle, D.; Tantawi, S.; Soria, M.; Kangaslahti, P.;
By: Sieth, M.; Voll, P.; Lau, J.M.; Church, S.; Samoska, L.; Gaier, T.; Van Winkle, D.; Tantawi, S.; Soria, M.; Kangaslahti, P.;
2011 / IEEE / 978-2-87487-022-4
By: Gonzalez-Posadas, V.; Garcia-Perez, O.; Segovia-Vargas, D.; Garcia-Munoz, L.E.;
By: Gonzalez-Posadas, V.; Garcia-Perez, O.; Segovia-Vargas, D.; Garcia-Munoz, L.E.;
2011 / IEEE / 978-1-4577-0077-4
By: Qiang Fang; Tsung-Heng Tsai; Ming-Yang Haung; Ming-Chun Liang; Jia-Hua Hong; Shuenn-Yuh Lee;
By: Qiang Fang; Tsung-Heng Tsai; Ming-Yang Haung; Ming-Chun Liang; Jia-Hua Hong; Shuenn-Yuh Lee;
2012 / IEEE / 978-1-4577-1318-7
By: Gaskill, D.K.; Antcliffe, M.; Moon, J.S.; Asbeck, P.; Lee, K.-M.; Campbell, P.M.; Seo, H.C.; Wong, D.; McCalla, K.; Milosavljevic, I.; Schmitz, A.; Lin, S.C.;
By: Gaskill, D.K.; Antcliffe, M.; Moon, J.S.; Asbeck, P.; Lee, K.-M.; Campbell, P.M.; Seo, H.C.; Wong, D.; McCalla, K.; Milosavljevic, I.; Schmitz, A.; Lin, S.C.;
2011 / IEEE / 978-0-85825-974-4
By: Sato, M.; Kawano, Y.; Mineyama, A.; Joshin, K.; Hara, N.; Suzuki, T.;
By: Sato, M.; Kawano, Y.; Mineyama, A.; Joshin, K.; Hara, N.; Suzuki, T.;
2012 / IEEE / 978-1-4577-1155-8
By: Bormann, D.; Kaehlert, S.; Heinen, S.; Lei Liao; Muh-Dey Wei; Werth, T.D.;
By: Bormann, D.; Kaehlert, S.; Heinen, S.; Lei Liao; Muh-Dey Wei; Werth, T.D.;
2012 / IEEE / 978-1-4577-2081-9
By: Da-Chiang Chang; Chien-Nan Kuo; Chieh-Pin Chang; Chun-Lin Ko; Ying-Zong Juang;
By: Da-Chiang Chang; Chien-Nan Kuo; Chieh-Pin Chang; Chun-Lin Ko; Ying-Zong Juang;
2012 / IEEE / 978-1-4673-1088-8
By: Kikkawa, Toshihide; Yamada, Masao; Masuda, Satoshi; Shigematsu, Hisao; Kamada, Youichi; Imanishi, Kenji; Okamoto, Naoya; Makiyama, Kozo; Ohki, Toshihiro;
By: Kikkawa, Toshihide; Yamada, Masao; Masuda, Satoshi; Shigematsu, Hisao; Kamada, Youichi; Imanishi, Kenji; Okamoto, Naoya; Makiyama, Kozo; Ohki, Toshihiro;
2012 / IEEE / 978-1-4673-1088-8
By: Hsueh, Fu-Lung; Jou, Chewn-Pu; Yeh, Tzu-Jin; Hsu, Shawn S. H.; Tsai, Ming-Hsien;
By: Hsueh, Fu-Lung; Jou, Chewn-Pu; Yeh, Tzu-Jin; Hsu, Shawn S. H.; Tsai, Ming-Hsien;
2014 / IEEE
By: Kumar, Sandeep; Bhasin, Himanshu; Kanaujia, Binod Kumar; Handa, Mitul; Dwari, Santanu;
By: Kumar, Sandeep; Bhasin, Himanshu; Kanaujia, Binod Kumar; Handa, Mitul; Dwari, Santanu;
2015 / IEEE
By: Wagner, Jens; Jorges, Udo; Richter, Alexander; Tzschoppe, Christoph; Ellinger, Frank;
By: Wagner, Jens; Jorges, Udo; Richter, Alexander; Tzschoppe, Christoph; Ellinger, Frank;
2014 / IEEE
By: Bardin, Joseph C.; Coskun, Ahmet H.; Subramanian, Ajay; Ghadiri-Sadrabadi, Mohammad;
By: Bardin, Joseph C.; Coskun, Ahmet H.; Subramanian, Ajay; Ghadiri-Sadrabadi, Mohammad;
2013 / IEEE
By: Dehaese, N.; Benamor, I.; Barthelemy, H.; Meillere, S.; Ramos, O.; Bourdel, S.; Gaubert, J.;
By: Dehaese, N.; Benamor, I.; Barthelemy, H.; Meillere, S.; Ramos, O.; Bourdel, S.; Gaubert, J.;
1988 / IEEE
By: Noda, M.; Inoue, A.; Komaru, M.; Katoh, T.; Kobiki, M.; Ayaki, N.; Tanino, N.; Nagahama, K.;
By: Noda, M.; Inoue, A.; Komaru, M.; Katoh, T.; Kobiki, M.; Ayaki, N.; Tanino, N.; Nagahama, K.;
1988 / IEEE
By: Stein, R.D.; Deakin, D.S.; Sovero, E.A.; Ho, W.-J.; Sullivan, G.J.; August, R.R.; Trinh, T.N.; Higgins, J.A.;
By: Stein, R.D.; Deakin, D.S.; Sovero, E.A.; Ho, W.-J.; Sullivan, G.J.; August, R.R.; Trinh, T.N.; Higgins, J.A.;
1988 / IEEE
By: Carithers, W.C., Jr.; Kleinfelder, S.A.; Spieler, H.G.; Kirsten, F.; Haber, C.; Ely, R.P., Jr.;
By: Carithers, W.C., Jr.; Kleinfelder, S.A.; Spieler, H.G.; Kirsten, F.; Haber, C.; Ely, R.P., Jr.;
1988 / IEEE
By: Lester, L.F.; Smith, P.M.; Pane-Chane Chao; Duh, K.H.G.; Ming-Yih Kao; Ballingall, J.M.; Lee, B.R.;
By: Lester, L.F.; Smith, P.M.; Pane-Chane Chao; Duh, K.H.G.; Ming-Yih Kao; Ballingall, J.M.; Lee, B.R.;
1988 / IEEE
By: Nishimoto, C.K.; Yuen, C.; Zdasiuk, G.A.; Bandy, S.G.; Zubeck, I.; Day, M.; Norton, R.; LaRue, R.A.; Yi-Ching Pao; Glenn, M.W.;
By: Nishimoto, C.K.; Yuen, C.; Zdasiuk, G.A.; Bandy, S.G.; Zubeck, I.; Day, M.; Norton, R.; LaRue, R.A.; Yi-Ching Pao; Glenn, M.W.;