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Topic: Low Voltage
Results
2011 / IEEE
By: Chapman, E.; Staples, C.J.; Johnson, E.; Chen, X.J.; Whitney, C.M.; Alberghini, G.; Shah, K.; Christian, J.F.; Glodo, J.; Loef, E.V.; Rines, R.;
By: Chapman, E.; Staples, C.J.; Johnson, E.; Chen, X.J.; Whitney, C.M.; Alberghini, G.; Shah, K.; Christian, J.F.; Glodo, J.; Loef, E.V.; Rines, R.;
2011 / IEEE
By: Breeschoten, A.; Van Ginderdeuren, J.; Ashouei, M.; Konijnenburg, M.; Hulzink, J.; Berset, T.; David, J.; Barat, F.; de Groot, H.; Stuyt, J.; Huisken, J.;
By: Breeschoten, A.; Van Ginderdeuren, J.; Ashouei, M.; Konijnenburg, M.; Hulzink, J.; Berset, T.; David, J.; Barat, F.; de Groot, H.; Stuyt, J.; Huisken, J.;
2012 / IEEE
By: Ming-Hsien Tu; Ching-Te Chuang; Shyh-Jye Jou; Wei-Chiang Shih; Kuen-Di Lee; Huan-Shun Huang; Meng-Hsueh Wang; Yuh-Jiun Lin; Chien-Yu Lu; Ming-Chien Tsai; Jihi-Yu Lin;
By: Ming-Hsien Tu; Ching-Te Chuang; Shyh-Jye Jou; Wei-Chiang Shih; Kuen-Di Lee; Huan-Shun Huang; Meng-Hsueh Wang; Yuh-Jiun Lin; Chien-Yu Lu; Ming-Chien Tsai; Jihi-Yu Lin;
2012 / IEEE
By: Gammie, G.; Sinangil, M.E.; Ko, U.; Chandrakasan, A.P.; Buss, D.; Baldwin, G.; Ho, L.; Honnavara-Prasad, S.; Ickes, N.; Rong, B.; Datla, S.R.; Mair, H.; Wang, A.; Gu, J.; Rithe, R.;
By: Gammie, G.; Sinangil, M.E.; Ko, U.; Chandrakasan, A.P.; Buss, D.; Baldwin, G.; Ho, L.; Honnavara-Prasad, S.; Ickes, N.; Rong, B.; Datla, S.R.; Mair, H.; Wang, A.; Gu, J.; Rithe, R.;
2012 / IEEE
By: Ghasemi, H.R.; Katariya, S.; Shi-Ting Zhou; Draper, S.C.; Nam Sung Kim; Taejoon Park;
By: Ghasemi, H.R.; Katariya, S.; Shi-Ting Zhou; Draper, S.C.; Nam Sung Kim; Taejoon Park;
2012 / IEEE
By: Tai-Hsiang Huang; Chu-Yu Liu; Sugiura, N.; Ishinabe, T.; Cheng-Yeh Tsai; Hui-Chuan Cheng; Shin-Tson Wu; Jin Yan; Ching-Huan Lin;
By: Tai-Hsiang Huang; Chu-Yu Liu; Sugiura, N.; Ishinabe, T.; Cheng-Yeh Tsai; Hui-Chuan Cheng; Shin-Tson Wu; Jin Yan; Ching-Huan Lin;
2011 / IEEE / 978-1-4577-0061-3
By: Jin Hur; Byoung-Kuk Lee; Gyu-Yeong Choe; Jong-Soo Kim; Joon-Young Jeon; Hyun-Cheol Jin;
By: Jin Hur; Byoung-Kuk Lee; Gyu-Yeong Choe; Jong-Soo Kim; Joon-Young Jeon; Hyun-Cheol Jin;
Variation-aware static and dynamic writability analysis for voltage-scaled bit-interleaved 8-T SRAMs
2011 / IEEE / 978-1-61284-660-6By: Chandra, V.; Daeyeon Kim; Sylvester, D.; Blaauw, D.; Aitken, R.;
2011 / IEEE / 978-1-4244-9312-8
By: Emira, A.; Abdelaziz, S.; Soliman, A.M.; Mohieldin, A.N.; Radwan, A.G.;
By: Emira, A.; Abdelaziz, S.; Soliman, A.M.; Mohieldin, A.N.; Radwan, A.G.;
2011 / IEEE / 978-1-4577-0752-0
By: Heryana, N.; Firmansyah, M.; Pranyoto, P.; Mawardi, A.; Purwadi, A.; Nurafiat, D.;
By: Heryana, N.; Firmansyah, M.; Pranyoto, P.; Mawardi, A.; Purwadi, A.; Nurafiat, D.;
2011 / IEEE / 978-1-4244-8418-8
By: Burgos Payan, M.; Roldan Fernandez, J.M.; Calero Lagares, J.L.; Riquelme Santos, J.M.;
By: Burgos Payan, M.; Roldan Fernandez, J.M.; Calero Lagares, J.L.; Riquelme Santos, J.M.;
2011 / IEEE / 978-1-4577-0618-9
By: Celma, S.; Aldea, C.; Gimeno, C.; Sanchez-Azqueta, C.; Aznar, F.;
By: Celma, S.; Aldea, C.; Gimeno, C.; Sanchez-Azqueta, C.; Aznar, F.;
2011 / IEEE / 978-1-4577-0618-9
By: Duque-Carrillo, J.F.; Dominguez, M.A.; Carrillo, J.M.; Torelli, G.;
By: Duque-Carrillo, J.F.; Dominguez, M.A.; Carrillo, J.M.; Torelli, G.;
2011 / IEEE / 978-1-4244-8165-1
By: Jianwen Zhao; Zhouxing Fu; Shangbin Sun; He Li; Ran Yu; Xuejie Chen;
By: Jianwen Zhao; Zhouxing Fu; Shangbin Sun; He Li; Ran Yu; Xuejie Chen;
2011 / IEEE / 978-1-4244-8165-1
By: Libing Zhou; Huaishu Li; Guangwei Meng; Lin Liu; Hao Xiong; Qiang Wu;
By: Libing Zhou; Huaishu Li; Guangwei Meng; Lin Liu; Hao Xiong; Qiang Wu;
2011 / IEEE / 978-1-4577-0223-5
By: Bill Liu; Xiaofen Ma; Hanqing Wang; Rui Fan; Menglian Zhao; Xiaobo Wu; Jian Xu;
By: Bill Liu; Xiaofen Ma; Hanqing Wang; Rui Fan; Menglian Zhao; Xiaobo Wu; Jian Xu;
2011 / IEEE / 978-1-4577-1002-5
By: Orths, A.; Cuk, V.; Kling, W.L.; Myrzik, J.M.A.; Heskes, P.J.M.; Schegner, P.; Meyer, J.; Romero Gordon, J.M.; Bohm, M.; Preis, D.; Jager, J.; Konig, S.; Browne, N.; Langella, R.; Testa, A.; Grandi, A.L.Z.; Macedo, J.R.; da Silva Lira, M.M.; Leitao, J.J.A.L.; Ribeiro, P.F.; Vandevelde, L.; Desmet, J.; Debruyne, C.; Verhelst, B.; Timens, R.B.; Cobben, J.F.G.;
By: Orths, A.; Cuk, V.; Kling, W.L.; Myrzik, J.M.A.; Heskes, P.J.M.; Schegner, P.; Meyer, J.; Romero Gordon, J.M.; Bohm, M.; Preis, D.; Jager, J.; Konig, S.; Browne, N.; Langella, R.; Testa, A.; Grandi, A.L.Z.; Macedo, J.R.; da Silva Lira, M.M.; Leitao, J.J.A.L.; Ribeiro, P.F.; Vandevelde, L.; Desmet, J.; Debruyne, C.; Verhelst, B.; Timens, R.B.; Cobben, J.F.G.;
2011 / IEEE / 978-1-4577-0223-5
By: Kawasumi, A.; Moriwaki, S.; Miyano, S.; Sakurai, T.; Suzuki, T.;
By: Kawasumi, A.; Moriwaki, S.; Miyano, S.; Sakurai, T.; Suzuki, T.;
2011 / IEEE / 978-1-4577-0541-0
By: Xu She; Gangyao Wang; Wenxi Yao; Huang, A.; Tiefu Zhao; Kadavelugu, A.; Fei Wang;
By: Xu She; Gangyao Wang; Wenxi Yao; Huang, A.; Tiefu Zhao; Kadavelugu, A.; Fei Wang;
2011 / IEEE / 978-1-4577-0541-0
By: Fei Wang; Gangyao Wang; Bhattacharya, S.; Xu She; Tiefu Zhao; Huang, A.;
By: Fei Wang; Gangyao Wang; Bhattacharya, S.; Xu She; Tiefu Zhao; Huang, A.;
2011 / IEEE / 978-1-4673-0195-4
By: Brunner, H.; Burnier, D.; Bletterie, B.; Stifter, M.; Abart, A.;
By: Brunner, H.; Burnier, D.; Bletterie, B.; Stifter, M.; Abart, A.;
2011 / IEEE / 978-1-4577-1702-4
By: Vispoel, S.; Vanalme, J.; Cappelle, J.; Desmet, J.; Debruyne, C.; Verhelst, B.; Van Maerhem, T.;
By: Vispoel, S.; Vanalme, J.; Cappelle, J.; Desmet, J.; Debruyne, C.; Verhelst, B.; Van Maerhem, T.;
2011 / IEEE / 978-2-87487-023-1
By: Gauvin, J.; Cazaux, J.L.; Vendier, O.; Blondy, P.; Barriere, F.; Crunteanu, A.; Pothier, A.; Mardivirin, D.;
By: Gauvin, J.; Cazaux, J.L.; Vendier, O.; Blondy, P.; Barriere, F.; Crunteanu, A.; Pothier, A.; Mardivirin, D.;