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Topic: Loss Tangent
Results
2012 / IEEE
By: Mohanan, P.; Vasudevan, K.; Mridula, S.; Rasheed, A.; Deepak, U.; Dinesh, R.; Nijas, C.M.;
By: Mohanan, P.; Vasudevan, K.; Mridula, S.; Rasheed, A.; Deepak, U.; Dinesh, R.; Nijas, C.M.;
2011 / IEEE / 978-1-4577-0035-4
By: Jayadarsan, T.; Shanojan, E.; Bandara, K.M.C.S.; Amarasinghe, R.A.; Fernando, M.A.R.M.; Jayantha, G.A.;
By: Jayadarsan, T.; Shanojan, E.; Bandara, K.M.C.S.; Amarasinghe, R.A.; Fernando, M.A.R.M.; Jayantha, G.A.;
2011 / IEEE / 978-966-335-357-9
By: Korzh, V.G.; Derkach, V.N.; Goroshko, O.V.; Golovashchenko, R.V.; Tarapov, S.I.;
By: Korzh, V.G.; Derkach, V.N.; Goroshko, O.V.; Golovashchenko, R.V.; Tarapov, S.I.;
Characterization of PZT and PNZT thin films for monolithic microwave integrated circuit applications
2011 / IEEE / 978-1-4577-0255-6By: Awang, Z.; Nadzar, H.M.; Sulaiman, S.;
2014 / IEEE
By: Promwong, Sathaporn; Keowsawat, Panisa; Kanahna, Rachen; Phongcharoenpanich, Chuwong;
By: Promwong, Sathaporn; Keowsawat, Panisa; Kanahna, Rachen; Phongcharoenpanich, Chuwong;
Study of loss tangent and attenuation using Ground Penetration Radar (GPR): Sandy loam class of soil
2015 / IEEEBy: Pattanaik, Amitansu; Kumar, Ashish;
Measurement of complex permittivity by rectangular waveguide method with simple specimen preparation
2014 / IEEEBy: Hoang, T. Q. V.; Phan, H. P.; Hoang, M. H.; Nguyen, V. H.; Vuong, T. P.;
2014 / IEEE
By: Aris, Skander; Messai, Abderraouf; Mekimah, Boualem; Fortaki, Tarek; Meriche, Mohammed Amin;
By: Aris, Skander; Messai, Abderraouf; Mekimah, Boualem; Fortaki, Tarek; Meriche, Mohammed Amin;
Effect of PEG number on dielectric properties of paraffinbased PEG polymers at microwave frequencies
2008 / Emerald PublishingBy: Yoko Yamada Pittini; Dana Daneshvari; Susanne Leparoux; Sbastien Vaucher; Axel Ritter; Hans Leuenberger; Lukas Rohr;
Permittivity of fiber polymer composites environmental effects: comparison of measurement and theory
1990 / IEEEBy: Moore, R.L.; MacDonald, A.;
1990 / IEEE / 0-7803-0190-0
By: Winzer, S.R.; VanDamme, N.S.; Sutherland, A.E.; Ritter, K.; Chen, C.J.; Bridger, K.; Jones, L.;
By: Winzer, S.R.; VanDamme, N.S.; Sutherland, A.E.; Ritter, K.; Chen, C.J.; Bridger, K.; Jones, L.;
1992 / IEEE / 0-7803-0565-5
By: Mangalaraj, D.; Balasubramanian, C.; Kannan, M.D.; Narayandass, S.K.;
By: Mangalaraj, D.; Balasubramanian, C.; Kannan, M.D.; Narayandass, S.K.;
1992 / IEEE / 0-7803-0565-5
By: Braun, J.M.; Quinlan, J.P.; Steiner, J.P.; Sedding, H.G.; Morra, R.M.;
By: Braun, J.M.; Quinlan, J.P.; Steiner, J.P.; Sedding, H.G.; Morra, R.M.;
1994 / IEEE / 0-7803-1778-5
By: Cochrane, R.S.; Singh, P.K.; Chen, K.; Lu, T.M.; Rymaszewski, E.J.; Borrego, J.M.;
By: Cochrane, R.S.; Singh, P.K.; Chen, K.; Lu, T.M.; Rymaszewski, E.J.; Borrego, J.M.;