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Topic: Logic Gates

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The gate controlled switch employed in horizontal television scanning

1964 / IEEE
By: Motto, J. W.;

A self-oscillating vertical circuit using a dual-control pentode tube

1964 / IEEE
By: Austin, W. M.; Dean, J. A.;

Designing FET's and MOST's into A-M radios

1964 / IEEE
By: Blaser, Larry; Cummins, Earl;

Engineering aspects of multi-valued logic systems

1974 / IEEE
By: Vranesic, Z. G.; Smith, K. C.;

Uniform shift networks

1974 / IEEE
By: Davis, Robert L.;

The interconnection problem: A tutorial

1974 / IEEE
By: Hightower, David W.;

Concurrent simulation of nearly identical digital networks

1974 / IEEE
By: Ulrich, E. G.; Baker, T.;

Hardware description languages in Canada

1974 / IEEE
By: Vaucher, Jean;

Hardware description languages in Great Britain

1974 / IEEE
By: Dervisoglu, Bulent;

Automated database-driven digital testing

1974 / IEEE
By: Toth, Attila; Holt, Chip;

New precise comparison methods of testing watthour meters

1976 / IEEE
By: Ludmer, J.;

Spectrum's hardware review

1976 / IEEE

Threshold-logic instrumentation to identify the signal-arrival order

1976 / IEEE
By: Pratapa Reddy, V.C.V.;

A basic language 8080 microcomputer software development system for time sharing

1976 / IEEE
By: Parrish, E.A.; McDonald, W.E.; Aylor, J.H.;

Optically strobed sampling oscilloscope

1976 / IEEE
By: Lawton, R.A.; Andrews, J.R.;

An improved automatic test system for VLSI parametric testing

1982 / IEEE
By: Rung, R.D.; Fang, R.C.Y.; Cham, K.M.;

High-speed, low-crosstalk chip holder for Josephson integrated circuits

1982 / IEEE
By: Hamilton, C.A.;

P-functions: A new tool for the analysis and synthesis of binary programs

1981 / IEEE
By: Thayse, A.;

Solid state looks to VLSI: Meanwhile, uncommitted logic arrays enjoy a revival and new bubble memories are introduced

1980 / IEEE
By: Bernhard, Robert;

The potential of biopolar devices in LSI gigabit logic

1981 / IEEE
By: Knorr, Siegfried G.;

Cepstral processing using spread spectra for cable diagnostics

1981 / IEEE
By: Chiou-Shiun Chen; Roemer, L.E.; Hostetler, M.S.;

A decade range linearly tunable versatile filter

1981 / IEEE
By: Kumar, U.;

Part 1: Logic circuit simulation

1979 / IEEE
By: Acken, John M.; Stauffer, Jerry D.;

Part II: Logic circuit simulation

1979 / IEEE
By: Acken, John M.; Stauffer, Jerry D.;

Josephson LSI circuits

1981 / IEEE
By: Faris, S. M.;

Automated Universal Array

1981 / IEEE
By: Noto, Richard; Suskind, Barry; Borgini, Fred;

A fault diagnosis algorithm for asymmetric modular architectures

1981 / IEEE
By: Meyer, G.G.L.;

Design of a dynamically programmable logic gate

1981 / IEEE
By: Chang, Oscar; Suarez, Ricardo E.; Adam, Vladimir;

The elements of single neurons: A review

1983 / IEEE
By: Lewis, E.R.;

Hierarchical determination of precedence order and representation of digraphs

1983 / IEEE
By: Inagaki, T.; Himmelblau, D.H.;

Structural sensitivity analysis in a certain class of linear systems

1983 / IEEE
By: Romanowicz, T.M.;

On the learning behaviors of variable-structure stochastic automaton in the general n-teacher environment

1983 / IEEE
By: Baba, N.;

A digital frequency control system for a variable speed alternator

1982 / IEEE
By: Yang, Chauming; Grannemann, W. W.;

CAE workstations and semicustom IC vendors offer increased design flexibility

1986 / IEEE
By: Hampton, L.;

TRACAS: An automatic router for circuits designed with the MDMOS symbolism

1985 / IEEE
By: Leblond, A.;

New high-speed (Al, Ga) as modulation doped field-effect transistors

1985 / IEEE
By: Morkoc, H.; Fischer, R.;

Interconnection lengths and VLSI

1985 / IEEE
By: Ferry, D.K.;

Device advantages of DI-LDD/LDD MOSFET over DD MOSFET

1985 / IEEE
By: Hanafi, H.I.;

Standard cell VLSI design: A tutorial

1985 / IEEE
By: Ganesan, A.; Kessler, A.J.;

A large-signal GaAs MESFET model implemented on SPICE

1985 / IEEE
By: Hauser, J.R.; Golio, J.M.; Blakey, P.A.;

Computer-Aided Design: Leading or responding?

1983 / IEEE
By: Wisniewski, John A.; Daniel, Marvin E.; Acken, John M.;

A cost-effective multistage interconnection network with network overlapping and memory interleaving

1985 / IEEE
By: Shin, K.G.; Jyh-Charn Liu;

A guide to short-channel effects in MOSFETs

1986 / IEEE
By: Duvvury, C.;

Software techniques in ADA for high-level hardware descriptions

1986 / IEEE
By: Ghosh, S.;

Error minimization in time-constant measurements

1987 / IEEE
By: Rusek, A.;

Application of MOSFET's in the temperature compensation of DC amplifiers

1987 / IEEE
By: Rizkalla, M.E.; Hanna, N.N.;

SOI technology using buried layers of oxidized porous Si

1987 / IEEE
By: Bomchil, G.; Barla, K.; Monroy, A.; Herino, R.;

Some properties of thin-film SOI MOSFETs

1987 / IEEE
By: Colinge, J.-P.;

Total-dose effects of gamma-ray irradiation on CMOS/SIMOX devices

1987 / IEEE
By: Izumi, K.; Ohno, T.; Shiono, N.; Shimaya, M.;

SIMOX SOI for integrated circuit fabrication

1987 / IEEE
By: Lam, H.W.;

Internet Locus: Extending transparency to an Internet environment

1986 / IEEE
By: Sheltzer, A.B.; Popek, G.J.;

Zone-melting-recrystallization silicon-on-insulator technology

1987 / IEEE
By: Tsaur, B.-Y.;

Recent advances in solid-phase epitaxial recrystallization of SOS with applications to CMOS and bipolar devices

1987 / IEEE
By: Vasudev, P.K.;

Domino-CMOS barrel switch for 32-bit VLSI processors

1987 / IEEE
By: Kang, S.M.;

Effects of Channel Width and Nitride Passivation Layer on Electrical Characteristics of Polysilicon Thin-Film Transistors

2011 / IEEE
By: Chia-Chun Liao; Tien-Sheng Chao; Tsung-Yu Chiang; Min-Chen Lin;

Gauge Factor Tuning, Long-Term Stability, and Miniaturization of Nanoelectromechanical Carbon-Nanotube Sensors

2011 / IEEE
By: Roman, C.; Helbling, T.; Hierold, C.; Stampfer, C.; Durrer, L.;

Comparative Analysis of SEU in FinFET SRAM Cells for Superthreshold and Subthreshold Supply Voltage Operation

2011 / IEEE
By: Rathod, S.S.; Dasgupta, S.; Saxena, A.K.;

Nanoscale Characterization of Gate Leakage in Strained High-Mobility Devices

2011 / IEEE
By: Olsen, S.H.; Escobedo-Cousin, E.; Kapoor, R.; Bull, S.J.;

Predictive 3-D Modeling of Parasitic Gate Capacitance in Gate-all-Around Cylindrical Silicon Nanowire MOSFETs

2011 / IEEE
By: Qiumin Xu; Jibin Zou; Yangyuan Wang; Ru Huang; Runsheng Wang; Jieying Luo;

Shear Piezoresistance in MOSFET Devices Under General Operating Conditions

2011 / IEEE
By: Sbierski, B.; Paul, O.; Gieschke, P.;

Influence of Orientation, Geometry, and Strain on Electron Distribution in Silicon Gate-All-Around (GAA) MOSFETs

2011 / IEEE
By: Biel, B.; Godoy, A.; Ruiz, F.J.G.; Tienda-Luna, I.M.; Gamiz, F.;

Capacitance Compact Model for Ultrathin Low-Electron-Effective-Mass Materials

2011 / IEEE
By: Kotlyar, R.; Roy, A.; Mudanai, S.; Stettler, M.; Rakshit, T.;

Modeling of MFIS-FETs for the Application of Ferroelectric Random Access Memory

2011 / IEEE
By: Jing Sun; Xuejun Zheng;

Self-Annealing Effect of Tensile Liner on Thick-Tinv PMOS

2011 / IEEE
By: Jie Chen; Qintao Zhang; Sherony, M.J.;

High-Speed Programming Architecture and Image-Sticking Cancellation Technology for High-Resolution Low-Voltage AMOLEDs

2011 / IEEE
By: Nakamura, N.; Kasai, N.; Ishii, M.; Miyamoto, M.; Kageyama, H.; Kohno, T.; Akimoto, H.;

An Extraction Method of the Energy Distribution of Interface Traps by an Optically Assisted Charge Pumping Technique

2011 / IEEE
By: Sungho Kim; Yang-Kyu Choi; Dong-Il Moon; Sung-Jin Choi;

Estimation of Trapped Charge Density in SONOS Flash Memory Using a Parallel Capacitor Model

2011 / IEEE
By: Hua-Min Li; Won Jong Yoo; Gang Zhang;

Evaluation of Lateral Power MOSFETs in a Synchronous Buck Converter Using a Mixed-Mode Device and Circuit Simulation

2011 / IEEE
By: Shen, Z.J.; Jiann-Shiun Yuan; Boyi Yang;

Epitaxial ALD BeO: Efficient Oxygen Diffusion Barrier for EOT Scaling and Reliability Improvement

2011 / IEEE
By: Jung Hwan Yum; Bersuker, G.; Akyol, T.; Ferrer, D.A.; Lei, M.; Keun Woo Park; Banerjee, S.K.; Downer, M.C.; Bielawski, C.W.; Yu, E.T.; Price, J.; Lee, J.C.; Hudnall, T.W.;

Compact Modeling of Partially Depleted Silicon-on-Insulator Drain-Extended MOSFET (DEMOSFET) Including High-Voltage and Floating-Body Effects

2011 / IEEE
By: Agarwal, T.K.; Kumar, M.J.; Subramanian, V.; Trivedi, A.R.;

Inelastic Phonon Scattering in Graphene FETs

2011 / IEEE
By: Jing Guo; Chauhan, J.;

A Retention Model for Ferroelectric-Gate Field-Effect Transistor

2011 / IEEE
By: Xiangli Zhong; Shuai Huang; Yichun Zhou; Jinbin Wang; Qiuhong Tan; Yi Zhang;

A Static Model for Electrolyte-Gated Organic Field-Effect Transistors

2011 / IEEE
By: Kergoat, L.; Herlogsson, L.; Deyu Tu; Forchheimer, R.; Berggren, M.; Crispin, X.;

Transversality Versus Universality for Additive Quantum Codes

2011 / IEEE
By: Cross, A.; Bei Zeng; Chuang, I.L.;

Carrier Dynamics Investigation on Passivation Dielectric Constant and RF Performance of Millimeter-Wave Power GaN HEMTs

2011 / IEEE
By: Saraniti, M.; Guerra, D.; Marino, F.A.; Goodnick, S.M.; Ferry, D.K.;

Analysis of the Correlation Between the Programmed Threshold-Voltage Distribution Spread of nand Flash Memory Devices and Floating-Gate Impurity Concentration

2011 / IEEE
By: Wen-Chuan Chao; Sakamoto, Y.; Jian-Ming Jaw; Hung-Ming Hsueh; Chih-Ming Chao; Shirota, R.; Arakawa, H.; Sheng-Fu Yang;

Degradation of Amorphous Silicon Thin Film Transistors Under Negative Gate Bias Stress

2011 / IEEE
By: Dapeng Zhou; Shengdong Zhang; Mingxiang Wang;

Narrow-Width Effects on a Body-Tied Partially Depleted SOI MOSFET

2011 / IEEE
By: Scheer, P.; Puget, S.; Bertrand, G.; Valentin, R.; Raynaud, C.; Jaouen, H.; Juge, A.;

Monolithic 3-D Integration of SRAM and Image Sensor Using Two Layers of Single-Grain Silicon

2011 / IEEE
By: Beenakker, C.I.M.; Morrison, T.; Robertson, M.; Tajari Mofrad, M.R.; Ishihara, R.; Golshani, N.; Derakhshandeh, J.;

Read Characteristics of Independent Double-Gate Poly-Si Nanowire SONOS Devices

2011 / IEEE
By: Horng-Chih Lin; Tiao-Yuan Huang; Wei-Chen Chen; Zer-Ming Lin;

A Physics-Based Analytical Model for 2DEG Charge Density in AlGaN/GaN HEMT Devices

2011 / IEEE
By: Goyal, N.; Khandelwal, S.; Fjeldly, T.A.;

Endurance Characteristics of Amorphous-InGaZnO Transparent Flash Memory With Gold Nanocrystal Storage Layer

2011 / IEEE
By: Jang-Sik Lee; Jae Chul Park; Kim, D.M.; Dongsik Kong; Byeong-Hyeok Sohn; Jaeman Jang; Dae Hwan Kim; Il Hwan Cho;

Explicit Drain-Current Model of Graphene Field-Effect Transistors Targeting Analog and Radio-Frequency Applications

2011 / IEEE
By: Moldovan, O.; Jimenez, D.;

Modeling of SOI-LDMOS Transistor Including Impact Ionization, Snapback, and Self-Heating

2011 / IEEE
By: Chakravorty, A.; DasGupta, N.; DasGupta, A.; Radhakrishna, U.;

Study of Random Dopant Fluctuation Effects in Germanium-Source Tunnel FETs

2011 / IEEE
By: Vega, R.A.; Sung Hwan Kim; Changhwan Shin; Damrongplasit, N.; Tsu-Jae King Liu;

TiN Metal Gate Electrode Thickness Effect on BTI and Dielectric Breakdown in HfSiON-Based MOSFETs

2011 / IEEE
By: Ya-Chin King; Chien-Liang Chen;

Tri-Mode Independent-Gate FinFETs for Dynamic Voltage/Frequency Scalable 6T SRAMs

2011 / IEEE
By: Gupta, S.K.; Roy, K.; Park, S.P.;

Scaling Between Channel Mobility and Interface State Density in SiC MOSFETs

2011 / IEEE
By: Feldman, L.C.; Williams, J.R.; Xingguang Zhu; Ahyi, A.C.; Rozen, J.;

300-GHz InAlN/GaN HEMTs With InGaN Back Barrier

2011 / IEEE
By: Fay, P.; Kopp, D.; Shiping Guo; Xiang Gao; Dong Seup Lee; Palacios, T.;

Observation of Extreme-Ultraviolet-Irradiation-Induced Damages on High-Dielectric-Constant Dielectrics

2011 / IEEE
By: Bing-Yue Tsui; Chih-Chan Yen; Po-Hsueh Li;

A Physical Model for Work-Function Variation in Ultra-Short Channel Metal-Gate MOSFETs

2011 / IEEE
By: Banerjee, K.; Singh, N.; Chuan Xu; Rasouli, S.H.;

Collaborative Wakeup in Clustered Ad Hoc Networks

2011 / IEEE
By: Ming-Syan Chen; Chung-Min Chen; Shan-Hung Wu;

A Highly Dense, Low Power, Programmable Analog Vector-Matrix Multiplier: The FPAA Implementation

2011 / IEEE
By: Hasler, P.E.; Schlottmann, C.R.;

Phase-Synchronization Early Epileptic Seizure Detector VLSI Architecture

2011 / IEEE
By: Abdelhalim, K.; Genov, R.; Smolyakov, V.;

Power Efficient Variability Compensation Through Clustered Tunable Power-Gating

2011 / IEEE
By: de Lima Silva, L.M.; Poncino, M.; Macii, E.; Macii, A.; Calimera, A.;

Self-Powered Rectifier for Energy Harvesting Applications

2011 / IEEE
By: Wardlaw, J.L.; Karsilayan, A.I.;

An Overview of Solid-State Integrated Circuit Amplifiers in the Submillimeter-Wave and THz Regime

2011 / IEEE
By: Samoska, L.A.;

Deprioritization of heavy users in wireless networks

2011 / IEEE
By: Busschbach, P.; Dominique, F.; Monogioudis, P.; Gopalakrishnan, N.; Sparks, K.; Hai Zhou; Seymour, J.;

Performance of 10G-EPON

2011 / IEEE
By: Silva, H.J.; Hajduczenia, M.; Kramer, G.; Roy, R.;

Rail-to-Rail, Linear Hot-Electron Injection Programming of Floating-Gate Voltage Bias Generators at 13-Bit Resolution

2011 / IEEE
By: Chenling Huang; Chakrabartty, S.; Sarkar, P.;

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Topic: Logic Gates

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