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Topic: Lo
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2011 / IEEE / 978-1-61284-846-4
By: Yoshida, K.; Kanaya, H.; Pokharel, R.K.; Shahimin, M.M.; Murad, S.A.Z.;
By: Yoshida, K.; Kanaya, H.; Pokharel, R.K.; Shahimin, M.M.; Murad, S.A.Z.;
2007 / IEEE / 978-4-900784-04-8
By: Sungho Beck; Tae-Jin Kim; Sanghoon Lee; Myung-Woon Hwang; Sunki Min; Kyoohyun Lim; Sungmin Ock; Jongsik Kim; Sangwoo Han; Seokyong Hong; Hyosun Jung; Jeong-Cheol Lee;
By: Sungho Beck; Tae-Jin Kim; Sanghoon Lee; Myung-Woon Hwang; Sunki Min; Kyoohyun Lim; Sungmin Ock; Jongsik Kim; Sangwoo Han; Seokyong Hong; Hyosun Jung; Jeong-Cheol Lee;
2008 / IEEE / 978-1-4244-1808-4
By: Li, T.; Roufoogaran, R.; Behzad, A.; Shetter, P.; Ojo, A.; Mahadeva, S.; Lee, C.P.; Cheng, S.;
By: Li, T.; Roufoogaran, R.; Behzad, A.; Shetter, P.; Ojo, A.; Mahadeva, S.; Lee, C.P.; Cheng, S.;
2009 / IEEE / 978-1-4244-3869-3
By: Mareels, I.; Evans, R.; Skafidas, E.; Zhang, F.; Wang, K.; Mo, Y.;
By: Mareels, I.; Evans, R.; Skafidas, E.; Zhang, F.; Wang, K.; Mo, Y.;