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Topic: Liquids
Results
2011 / IEEE
By: Dirisaglik, F.; Cywar, A.; Gokirmak, A.; Silva, H.; Steen, S.; Bakan, G.; Akbulut, M.;
By: Dirisaglik, F.; Cywar, A.; Gokirmak, A.; Silva, H.; Steen, S.; Bakan, G.; Akbulut, M.;
2012 / IEEE
By: Reuter, S.; Tresp, H.; Wende, K.; Weltmann, K.; Winter, J.; Masur, K.; Schmidt-Bleker, A.; Hammer, M.U.;
By: Reuter, S.; Tresp, H.; Wende, K.; Weltmann, K.; Winter, J.; Masur, K.; Schmidt-Bleker, A.; Hammer, M.U.;
2012 / IEEE
By: Qing Zhou; Lei Pang; Junping Zhao; Jun Zhang; Xuandong Liu; Wenyu Yan; Qiaogen Zhang;
By: Qing Zhou; Lei Pang; Junping Zhao; Jun Zhang; Xuandong Liu; Wenyu Yan; Qiaogen Zhang;
2012 / IEEE
By: Jun Long Lim; Hu, D.J.J.; Wolinski, T.; Shum, P.P.; Yixin Wang; Milenko, K.; Ying Cui;
By: Jun Long Lim; Hu, D.J.J.; Wolinski, T.; Shum, P.P.; Yixin Wang; Milenko, K.; Ying Cui;
2012 / IEEE
By: Jenicek, D.; Peters, T.B.; Dominguez-Espinosa, F.A.; Allison, J.; McCarthy, M.; Kariya, H.A.; Wang, E.N.; Lang, J.H.; Brisson, J.G.; Staats, W.L.;
By: Jenicek, D.; Peters, T.B.; Dominguez-Espinosa, F.A.; Allison, J.; McCarthy, M.; Kariya, H.A.; Wang, E.N.; Lang, J.H.; Brisson, J.G.; Staats, W.L.;
2012 / IEEE
By: Macgregor, S.J.; Timoshkin, I.V.; Vorob'ev, V.S.; Atrazhev, V.M.; Wang, T.; Wilson, M.P.; Given, M.J.;
By: Macgregor, S.J.; Timoshkin, I.V.; Vorob'ev, V.S.; Atrazhev, V.M.; Wang, T.; Wilson, M.P.; Given, M.J.;
2002 / IEEE / 978-0-7354-0107-5
By: Dickens, J.; Krompholz, H.; Krile, J.; Haustein, M.; Neuber, A.;
By: Dickens, J.; Krompholz, H.; Krile, J.; Haustein, M.; Neuber, A.;
2011 / IEEE / 978-1-61284-795-5
By: Kirienko, V.V.; Vandisheva, N.V.; Parashchenko, M.A.; Romanov, S.I.; Filippov, N.S.;
By: Kirienko, V.V.; Vandisheva, N.V.; Parashchenko, M.A.; Romanov, S.I.; Filippov, N.S.;
2011 / IEEE / 978-1-4244-7355-7
By: Yamamoto, H.; Chiba, K.; Ozaki, R.; Moritake, H.; Yoshino, K.; Ogawa, J.;
By: Yamamoto, H.; Chiba, K.; Ozaki, R.; Moritake, H.; Yoshino, K.; Ogawa, J.;
2011 / IEEE / 978-1-4244-7355-7
By: Josef, P.; Jiri, B.; Pavel, T.; Vaclav, M.; Martin, S.; Petr, M.;
By: Josef, P.; Jiri, B.; Pavel, T.; Vaclav, M.; Martin, S.; Petr, M.;
2011 / IEEE / 978-1-4577-0027-9
By: Bennett, G.; James, R.K.; Mercer, A.J.; Cai, J.; Johnston, C.; Patel, P.;
By: Bennett, G.; James, R.K.; Mercer, A.J.; Cai, J.; Johnston, C.; Patel, P.;
2011 / IEEE / 978-2-87487-022-4
By: Vitusevich, S.; Cherpak, N.T.; Barannik, A.A.; Gubin, A.I.; Klein, N.; Offenhaeusser, A.;
By: Vitusevich, S.; Cherpak, N.T.; Barannik, A.A.; Gubin, A.I.; Klein, N.; Offenhaeusser, A.;
2011 / IEEE / 978-1-4577-1376-7
By: Mazzitelli, C.L.; Chipuk, J.E.; Chamberlin, S.C.; Reaves, M.A.; Straight, S.D.; Kendall, J.K.;
By: Mazzitelli, C.L.; Chipuk, J.E.; Chamberlin, S.C.; Reaves, M.A.; Straight, S.D.; Kendall, J.K.;
2011 / IEEE / 978-1-4577-0479-6
By: Mata-Chavez, R.I.; Andrade-Lucio, J.A.; Alvarado-Mendez, E.; Trejo-Duran, M.; Vargas-Rodriguez, E.;
By: Mata-Chavez, R.I.; Andrade-Lucio, J.A.; Alvarado-Mendez, E.; Trejo-Duran, M.; Vargas-Rodriguez, E.;
2011 / IEEE / 978-1-4244-8939-8
By: Ferraro, P.; Merola, F.; Grilli, S.; Finizio, A.; Vespini, V.; Coppola, S.;
By: Ferraro, P.; Merola, F.; Grilli, S.; Finizio, A.; Vespini, V.; Coppola, S.;
2011 / IEEE / 978-1-4577-1788-8
By: Yu Xiaojie; Zhou Cunshan; Wang Yunxiang; Lin Lin; Zhang Youzuo; Yang Huqing;
By: Yu Xiaojie; Zhou Cunshan; Wang Yunxiang; Lin Lin; Zhang Youzuo; Yang Huqing;
2011 / IEEE / 978-0-8194-8961-6
By: Reddy, P. Saidi; Rao, P. Vengal; Shankar, M. Sai; Sengupta, D.; Srimannarayana, K.; Kishore, P.; Prasad, R. L. N Sai;
By: Reddy, P. Saidi; Rao, P. Vengal; Shankar, M. Sai; Sengupta, D.; Srimannarayana, K.; Kishore, P.; Prasad, R. L. N Sai;
2011 / IEEE / 978-0-8194-8961-6
By: Liu, Bo; Liu, Yange; Wang, Zhi; Wei, Chengli; Liu, Yunqi; Zhang, Hao;
By: Liu, Bo; Liu, Yange; Wang, Zhi; Wei, Chengli; Liu, Yunqi; Zhang, Hao;
2012 / IEEE / 978-1-4673-1622-4
By: Thierry Gloude, R.; Muthu, T.; Satish Kumar, L.; Swaminathan, S.;
By: Thierry Gloude, R.; Muthu, T.; Satish Kumar, L.; Swaminathan, S.;
2012 / IEEE / 978-81-909042-2-3
By: Sivakumaran, N.; Srivignesh, N.; Sowmya, P.; Balasubramanian, G.;
By: Sivakumaran, N.; Srivignesh, N.; Sowmya, P.; Balasubramanian, G.;
2012 / IEEE / 978-1-4673-0767-3
By: Yeli Zhou; Mingming Lin; Wenfang Zhang; Jianhua Zhang; Guolian Hou;
By: Yeli Zhou; Mingming Lin; Wenfang Zhang; Jianhua Zhang; Guolian Hou;
2012 / IEEE / 978-1-4577-1772-7
By: Liberti, M.; Apollonio, F.; Zambotti, A.; Merla, C.; D'Atanasio, P.; De Benedetto, E.; Cataldo, A.; Cannazza, G.; Piuzzi, E.;
By: Liberti, M.; Apollonio, F.; Zambotti, A.; Merla, C.; D'Atanasio, P.; De Benedetto, E.; Cataldo, A.; Cannazza, G.; Piuzzi, E.;