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Topic: Linearity
Results
2012 / IEEE
By: Wei-Hung Chou; Hong-Yuan Yang; Jeng-Han Tsai; Wei-Tsung Li; Tian-Wei Huang; Hsin-Chia Lu; Shyh-Buu Gea;
By: Wei-Hung Chou; Hong-Yuan Yang; Jeng-Han Tsai; Wei-Tsung Li; Tian-Wei Huang; Hsin-Chia Lu; Shyh-Buu Gea;
2012 / IEEE
By: Varin, G.; Mobarak, M.; Hedayati, H.; Entesari, K.; Sanchez-Sinencio, E.; Gamand, P.; Meunier, P.;
By: Varin, G.; Mobarak, M.; Hedayati, H.; Entesari, K.; Sanchez-Sinencio, E.; Gamand, P.; Meunier, P.;
2012 / IEEE
By: Mirzaei, A.; Hafez, A.A.; Abidi, A.; Darabi, H.; Murphy, D.; Chang, M.-C.F.; Mikhemar, M.;
By: Mirzaei, A.; Hafez, A.A.; Abidi, A.; Darabi, H.; Murphy, D.; Chang, M.-C.F.; Mikhemar, M.;
2012 / IEEE
By: Meghelli, M.; Gangasani, G.R.; Garlett, J.; Wielgos, M.; Jong-Ru Guo; Rasmus, T.; Natonio, J.; Xu, H.H.; Sorna, M.A.; Jieming Qi; Shannon, M.; Kelly, W.; Freitas, D.; Beukema, T.; Rylov, S.; Bulzacchelli, J.F.; Chun-Ming Hsu;
By: Meghelli, M.; Gangasani, G.R.; Garlett, J.; Wielgos, M.; Jong-Ru Guo; Rasmus, T.; Natonio, J.; Xu, H.H.; Sorna, M.A.; Jieming Qi; Shannon, M.; Kelly, W.; Freitas, D.; Beukema, T.; Rylov, S.; Bulzacchelli, J.F.; Chun-Ming Hsu;
2012 / IEEE
By: Leenaerts, D.M.W.; Bergervoet, J.; Simin, A.; Lobeek, J.; van der Heijden, E.; de Jong, G.W.;
By: Leenaerts, D.M.W.; Bergervoet, J.; Simin, A.; Lobeek, J.; van der Heijden, E.; de Jong, G.W.;
2012 / IEEE
By: Myoungbo Kwak; Kimball, D.F.; Presti, C.D.; Scuderi, A.; Santagati, C.; Yan, J.J.; Asbeck, P.M.; Larson, L.E.;
By: Myoungbo Kwak; Kimball, D.F.; Presti, C.D.; Scuderi, A.; Santagati, C.; Yan, J.J.; Asbeck, P.M.; Larson, L.E.;
2012 / IEEE
By: Ukon, J.; Kagawa, K.; Yasutomi, K.; Kawahito, S.; Zhuo Li; Niioka, H.; Hashimoto, M.;
By: Ukon, J.; Kagawa, K.; Yasutomi, K.; Kawahito, S.; Zhuo Li; Niioka, H.; Hashimoto, M.;
2012 / IEEE
By: Chtioui, M.; Achouche, M.; van Dijk, F.; Marceaux, A.; Lelarge, F.; Carpentier, D.; Pommereau, F.; Enard, A.;
By: Chtioui, M.; Achouche, M.; van Dijk, F.; Marceaux, A.; Lelarge, F.; Carpentier, D.; Pommereau, F.; Enard, A.;
2012 / IEEE
By: Jiang Wei Man; Liang Xie; Wei Wang; Ning Hua Zhu; Yu Liu; Bao Jun Wang; Ling Juan Zhao; Hai Qing Yuan; Xin Wang; Hong Liang Zhu;
By: Jiang Wei Man; Liang Xie; Wei Wang; Ning Hua Zhu; Yu Liu; Bao Jun Wang; Ling Juan Zhao; Hai Qing Yuan; Xin Wang; Hong Liang Zhu;
2012 / IEEE
By: Zhiyong Liu; Feipeng Ning; Guoqing Zhang; Ling Zhao; Zian Zhu; Zhilong Hou; Weichao Yao; Xiaoji Du; Wenbin Ma; Meifen Wang;
By: Zhiyong Liu; Feipeng Ning; Guoqing Zhang; Ling Zhao; Zian Zhu; Zhilong Hou; Weichao Yao; Xiaoji Du; Wenbin Ma; Meifen Wang;
2012 / IEEE
By: Smit, G.J.M.; Soer, M.C.M.; Kokkeler, A.B.J.; Klumperink, E.A.M.; Oude Alink, M. S.; Nauta, B.;
By: Smit, G.J.M.; Soer, M.C.M.; Kokkeler, A.B.J.; Klumperink, E.A.M.; Oude Alink, M. S.; Nauta, B.;
2012 / IEEE
By: Davis, W.O.; Baran, U.; Urey, H.; Gokce, S.K.; Sharma, J.; Brown, D.; Holmstrom, S.;
By: Davis, W.O.; Baran, U.; Urey, H.; Gokce, S.K.; Sharma, J.; Brown, D.; Holmstrom, S.;