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Topic: Lead Compounds
Results
2011 / IEEE
By: Junqi Gao; Viehland, D.; Finkel, P.; Jiefang Li; Gray, D.; Liangguo Shen; Ying Shen; Junyi Zhai;
By: Junqi Gao; Viehland, D.; Finkel, P.; Jiefang Li; Gray, D.; Liangguo Shen; Ying Shen; Junyi Zhai;
2011 / IEEE
By: Wasa, K.; Kalinin, S.V.; Jesse, S.; Jackson, T.N.; Bharadwaja, S.S.N.; Trolier-McKinstry, S.; Dalong Zhao; Jousse, P.; Yaeger, C.; Griggio, F.;
By: Wasa, K.; Kalinin, S.V.; Jesse, S.; Jackson, T.N.; Bharadwaja, S.S.N.; Trolier-McKinstry, S.; Dalong Zhao; Jousse, P.; Yaeger, C.; Griggio, F.;
2011 / IEEE
By: Liping Jiang; Yajie Chen; Fitchorov, T.; Harris, V.G.; Vittoria, C.; Zengqi Zhao; Guangrui Zhang;
By: Liping Jiang; Yajie Chen; Fitchorov, T.; Harris, V.G.; Vittoria, C.; Zengqi Zhao; Guangrui Zhang;
2011 / IEEE
By: Shih, W.Y.; Youngsoo Chung; Wei Wu; Xiang Li; Shung, K.K.; Qifa Zhou; Wei-Heng Shih;
By: Shih, W.Y.; Youngsoo Chung; Wei Wu; Xiang Li; Shung, K.K.; Qifa Zhou; Wei-Heng Shih;
2011 / IEEE
By: Gaunekar, A.; Chin Yaw Tan; Yifan Chen; Oh, S.R.; Ng, P.H.Y.; Kui Yao; Shanmugavel, S.; Trung Dung Luong; Li, M.H.L.;
By: Gaunekar, A.; Chin Yaw Tan; Yifan Chen; Oh, S.R.; Ng, P.H.Y.; Kui Yao; Shanmugavel, S.; Trung Dung Luong; Li, M.H.L.;
2011 / IEEE
By: Shuting Chen; Kui Yao; Li Lu; Sritharan, T.; Tay, F.E.H.; Shuhui Yu; Mirshekarloo, M.S.; Rahimabady, M.;
By: Shuting Chen; Kui Yao; Li Lu; Sritharan, T.; Tay, F.E.H.; Shuhui Yu; Mirshekarloo, M.S.; Rahimabady, M.;
2011 / IEEE
By: Titov, V.V.; Malitskaya, M.A.; Zakharov, Y.N.; Raevskaya, S.I.; Kubrin, S.P.; Zakharchenko, I.N.; Lutokhin, A.G.; Raevski, I.P.; Sitalo, E.I.; Blazhevich, A.V.;
By: Titov, V.V.; Malitskaya, M.A.; Zakharov, Y.N.; Raevskaya, S.I.; Kubrin, S.P.; Zakharchenko, I.N.; Lutokhin, A.G.; Raevski, I.P.; Sitalo, E.I.; Blazhevich, A.V.;
2011 / IEEE
By: Lambros, J.; Chasiotis, I.; Yagnamurthy, S.; Dubey, M.; Pulskamp, J.S.; Polcawich, R.G.;
By: Lambros, J.; Chasiotis, I.; Yagnamurthy, S.; Dubey, M.; Pulskamp, J.S.; Polcawich, R.G.;
2012 / IEEE
By: Baird, J.; Shkuratov, S.I.; Altgilbers, L.L.; Stults, A.H.; Hackenberger, W.S.; Alberta, E.F.; Talantsev, E.F.;
By: Baird, J.; Shkuratov, S.I.; Altgilbers, L.L.; Stults, A.H.; Hackenberger, W.S.; Alberta, E.F.; Talantsev, E.F.;
2012 / IEEE
By: Wang, K.L.W.; Fleetwood, D.M.; En Xia Zhang; Cher Xuan Zhang; Alles, M.L.; Galatsis, K.; Sung Min Kim; Song, E.B.; Schrimpf, R.D.;
By: Wang, K.L.W.; Fleetwood, D.M.; En Xia Zhang; Cher Xuan Zhang; Alles, M.L.; Galatsis, K.; Sung Min Kim; Song, E.B.; Schrimpf, R.D.;
2012 / IEEE
By: Weibao Qiu; Yan Chen; Xiang Li; Yanyan Yu; Lei Sun; Fu Keung Tsang; Qifa Zhou; Shung, K.K.; Jiyan Dai; Wang Fai Cheng;
By: Weibao Qiu; Yan Chen; Xiang Li; Yanyan Yu; Lei Sun; Fu Keung Tsang; Qifa Zhou; Shung, K.K.; Jiyan Dai; Wang Fai Cheng;
2012 / IEEE
By: Costecalde, J.; Mazenq, L.; Saya, D.; Guillon, S.; Nicu, L.; Soyer, C.; Remiens, D.;
By: Costecalde, J.; Mazenq, L.; Saya, D.; Guillon, S.; Nicu, L.; Soyer, C.; Remiens, D.;
2012 / IEEE
By: Sarychev, D.A.; Titov, V.V.; Prosandeev, S.A.; Malitskaya, M.A.; Blazhevich, A.V.; Raevskaya, S.I.; Kubrin, S.P.; Raevski, I.P.; Zakharchenko, I.N.;
By: Sarychev, D.A.; Titov, V.V.; Prosandeev, S.A.; Malitskaya, M.A.; Blazhevich, A.V.; Raevskaya, S.I.; Kubrin, S.P.; Raevski, I.P.; Zakharchenko, I.N.;
2012 / IEEE
By: Dada Wang; Yuejin Tang; Kunnan Cao; Meng Song; Jingdong Li; Shaoquan Zhang; Nianrong Zhou;
By: Dada Wang; Yuejin Tang; Kunnan Cao; Meng Song; Jingdong Li; Shaoquan Zhang; Nianrong Zhou;
2012 / IEEE
By: Jinchuan Wu; Ruimin Chen; Shung, K.K.; Pengdi Han; Jian Tian; Qifa Zhou; Liheng Yao; Kwok Ho Lam;
By: Jinchuan Wu; Ruimin Chen; Shung, K.K.; Pengdi Han; Jian Tian; Qifa Zhou; Liheng Yao; Kwok Ho Lam;
2012 / IEEE
By: Liu, A.Q.; Bo Chen; Lei Gao; Man Ying Lam; Yuen Hong Tsang; Ming Feng; Ning Wang; Zhiqing Feng; Xuming Zhang;
By: Liu, A.Q.; Bo Chen; Lei Gao; Man Ying Lam; Yuen Hong Tsang; Ming Feng; Ning Wang; Zhiqing Feng; Xuming Zhang;
2012 / IEEE
By: Pulskamp, J.S.; Bhave, S.A.; Power, B.; Martin, J.; Smith, G.L.; Polcawich, R.G.; Bedair, S.S.;
By: Pulskamp, J.S.; Bhave, S.A.; Power, B.; Martin, J.; Smith, G.L.; Polcawich, R.G.; Bedair, S.S.;
2012 / IEEE
By: Morgan, B.; Polcawich, R.G.; Mirabelli, M.; Meyer, C.D.; Pulskamp, J.S.; Bedair, S.S.;
By: Morgan, B.; Polcawich, R.G.; Mirabelli, M.; Meyer, C.D.; Pulskamp, J.S.; Bedair, S.S.;
2012 / IEEE
By: Wasa, K.; Kotera, H.; Kanno, I.; Matsushima, T.; Yamamoto, T.; Nishida, K.; Adachi, H.;
By: Wasa, K.; Kotera, H.; Kanno, I.; Matsushima, T.; Yamamoto, T.; Nishida, K.; Adachi, H.;
2010 / IEEE / 978-1-61284-986-7
By: Bennett, J.W.; Grinberg, I.; Tingting Qi; Nelson, K.A.; Ka-Lo Yeh; Rappe, A.M.; Young-Han Shin;
By: Bennett, J.W.; Grinberg, I.; Tingting Qi; Nelson, K.A.; Ka-Lo Yeh; Rappe, A.M.; Young-Han Shin;
2011 / IEEE / 978-3-00-035081-8
By: Weiss, B.L.; Mayer, A.; Chung, M.S.; Cutler, P.H.; Miskovsky, N.M.;
By: Weiss, B.L.; Mayer, A.; Chung, M.S.; Cutler, P.H.; Miskovsky, N.M.;
2011 / IEEE / 978-1-4577-1163-3
By: Mazenq, L.; Saya, D.; Guillon, S.; Remiens, D.; Costecalde, J.; Soyer, C.; Nicu, L.;
By: Mazenq, L.; Saya, D.; Guillon, S.; Remiens, D.; Costecalde, J.; Soyer, C.; Nicu, L.;
2011 / IEEE / 978-1-4577-1163-3
By: Raevski, I.P.; Zakharchenko, I.N.; Blazhevich, A.V.; Sitalo, E.I.; Sarychev, D.A.; Titov, V.V.; Lutokhin, A.G.; Zakharov, Yu.N.; Malitskaya, M.A.; Prosandeev, S.A.; Raevskaya, S.I.; Kubrin, S.P.;
By: Raevski, I.P.; Zakharchenko, I.N.; Blazhevich, A.V.; Sitalo, E.I.; Sarychev, D.A.; Titov, V.V.; Lutokhin, A.G.; Zakharov, Yu.N.; Malitskaya, M.A.; Prosandeev, S.A.; Raevskaya, S.I.; Kubrin, S.P.;
2011 / IEEE / 978-1-4577-1163-3
By: Hyeong Jae Lee; Fei Li; Shujun Zhang; Meyer, R.J.; Jun Luo; Shrout, T.R.; Dabin Lin;
By: Hyeong Jae Lee; Fei Li; Shujun Zhang; Meyer, R.J.; Jun Luo; Shrout, T.R.; Dabin Lin;
2011 / IEEE / 978-1-4577-1163-3
By: Karakaya, K.; Jambunathan, M.; Van Schaijk, R.; Vullers, R.; Elfrink, R.;
By: Karakaya, K.; Jambunathan, M.; Van Schaijk, R.; Vullers, R.; Elfrink, R.;
Syntheses of (Pb-Sn-Ti)O3 thin films by PLD method and their structural and ferroelectric properties
2011 / IEEE / 978-1-4577-1163-3By: Yokota, H.; Kiat, J.M.; Janolin, P.E.; Uesu, Y.; Iwasaki, J.; Haumant, R.;
2011 / IEEE / 978-1-4577-1163-3
By: Xiaolong Chen; Xuedong Li; Dongxu Yan; Jianguo Zhu; Dingquan Xiao; Hong Liu;
By: Xiaolong Chen; Xuedong Li; Dongxu Yan; Jianguo Zhu; Dingquan Xiao; Hong Liu;
2011 / IEEE / 978-1-4577-1163-3
By: Nicolai, M.; Schonecker, A.J.; Uhlig, S.; Henschke, T.; Schlenkrich, F.;
By: Nicolai, M.; Schonecker, A.J.; Uhlig, S.; Henschke, T.; Schlenkrich, F.;
2011 / IEEE / 978-1-4577-1163-3
By: Dingquan Xiao; Hong Liu; Dongxu Yan; Hongli Guo; Xiaolong Chen; Jianguo Zhu;
By: Dingquan Xiao; Hong Liu; Dongxu Yan; Hongli Guo; Xiaolong Chen; Jianguo Zhu;
2011 / IEEE / 978-1-4577-1163-3
By: Sotnikov, A.; Weihnacht, M.; Ktitorov, S.; Smirnova, E.; Schmidt, H.;
By: Sotnikov, A.; Weihnacht, M.; Ktitorov, S.; Smirnova, E.; Schmidt, H.;
Effects of high-pressure high-temperature sintering on the thermoelectric properties of Pb0.55 Te0.45
2011 / IEEE / 978-1-4577-0536-6By: Li Ming-Fa; Sun Zhen-Ya; Chen Bo; Fan Duan; Wang Shan-Yu;
2011 / IEEE / 978-1-4577-1163-3
By: Remiens, D.; Soyer, C.; Costecalde, J.; Morozovska, A.N.; Deresmes, D.; Morozovsky, N.V.; Bravina, S.L.; Eliseev, E.A.;
By: Remiens, D.; Soyer, C.; Costecalde, J.; Morozovska, A.N.; Deresmes, D.; Morozovsky, N.V.; Bravina, S.L.; Eliseev, E.A.;
2011 / IEEE / 978-1-4577-1163-3
By: Komol, K.; Manoonpong, P.; Pechrach, K.; Phontip, J.; Tungpimolrut, K.; Hatti, N.;
By: Komol, K.; Manoonpong, P.; Pechrach, K.; Phontip, J.; Tungpimolrut, K.; Hatti, N.;
2011 / IEEE / 978-1-61284-722-1
By: Xintao Wang; Zhengxin Jiang; Mu Li; Guangkai Li; Hongyan Wang; Quanxin Zhao;
By: Xintao Wang; Zhengxin Jiang; Mu Li; Guangkai Li; Hongyan Wang; Quanxin Zhao;
2011 / IEEE / 978-1-4577-0839-8
By: Chaillet, N.; Lutz, P.; Rakotondrabe, M.; Agnus, J.; Ivan, I.A.;
By: Chaillet, N.; Lutz, P.; Rakotondrabe, M.; Agnus, J.; Ivan, I.A.;