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Topic: Latency
Results
2012 / IEEE
By: Seok-Kyun Han; Chang-Jin Jeong; Ho-Yong Kang; Cartwright, J.; Nae-Soo Kim; Dae-Young Yoon; Sang-Gug Lee; Dong-Sam Ha;
By: Seok-Kyun Han; Chang-Jin Jeong; Ho-Yong Kang; Cartwright, J.; Nae-Soo Kim; Dae-Young Yoon; Sang-Gug Lee; Dong-Sam Ha;
2011 / IEEE / 978-1-4577-0223-5
By: Yu-Shun Wang; Chen, C.C.; Li, J.C.; Chi-Wei Liu; Chia-Ming Liu; Min-Han Hsieh;
By: Yu-Shun Wang; Chen, C.C.; Li, J.C.; Chi-Wei Liu; Chia-Ming Liu; Min-Han Hsieh;
2011 / IEEE / 978-1-4577-0170-2
By: Liljeberg, P.; Daneshtalab, M.; Ebrahimi, M.; Tenhunen, H.; Plosila, J.;
By: Liljeberg, P.; Daneshtalab, M.; Ebrahimi, M.; Tenhunen, H.; Plosila, J.;
2011 / IEEE / 978-1-4577-0170-2
By: Kologeski, A.; Concatto, C.; Silvano, C.; Palermo, G.; Kastensmidt, F.; Carro, L.;
By: Kologeski, A.; Concatto, C.; Silvano, C.; Palermo, G.; Kastensmidt, F.; Carro, L.;
2011 / IEEE / 978-1-4577-2135-9
By: Gang Wang; Guangzhi Xu; Guangjun Xie; Yan Gao; Rui Cao; Xiaoguang Liu;
By: Gang Wang; Guangzhi Xu; Guangjun Xie; Yan Gao; Rui Cao; Xiaoguang Liu;
2011 / IEEE / 978-1-4673-0126-8
By: Ghazanfari, A.; Ghorbanian, M.; Doroud, H.; Sabbaghi-Nadooshan, R.;
By: Ghazanfari, A.; Ghorbanian, M.; Doroud, H.; Sabbaghi-Nadooshan, R.;
2011 / IEEE / 978-1-4244-9289-3
By: Ouvry, L.; Ktenas, D.; Ben Hamida, E.; Maman, M.; Mercier, E.; Honda, A.;
By: Ouvry, L.; Ktenas, D.; Ben Hamida, E.; Maman, M.; Mercier, E.; Honda, A.;
2011 / IEEE / 978-1-4673-0006-3
By: Celestino, J.; Riaz, M.T.; Pedersen, J.M.; Patel, A.; Ledzinski, D.; Dubalski, B.;
By: Celestino, J.; Riaz, M.T.; Pedersen, J.M.; Patel, A.; Ledzinski, D.; Dubalski, B.;
2011 / IEEE / 978-1-4577-1794-9
By: Kirby, R.M.; Gopalakrishnan, G.; Vo, A.; Bronevetsky, G.; Schulz, M.; de Supinski, B.R.;
By: Kirby, R.M.; Gopalakrishnan, G.; Vo, A.; Bronevetsky, G.; Schulz, M.; de Supinski, B.R.;
2011 / IEEE / 978-1-4244-9268-8
By: Tamassia, R.; Fan Zhou; Trajcevski, G.; Khokhar, A.; Scheuermann, P.; Avci, B.;
By: Tamassia, R.; Fan Zhou; Trajcevski, G.; Khokhar, A.; Scheuermann, P.; Avci, B.;
2011 / IEEE / 978-1-4577-2209-7
By: Noureddine, A.; Wissem, C.; Attia, B.; Tourki, R.; Torki, K.; Zitouni, A.;
By: Noureddine, A.; Wissem, C.; Attia, B.; Tourki, R.; Torki, K.; Zitouni, A.;
2012 / IEEE / 978-1-4673-2118-1
By: Demmel, S.; Monacelli, E.; Rakotonirainy, A.; Gruyer, D.; Lambert, A.;
By: Demmel, S.; Monacelli, E.; Rakotonirainy, A.; Gruyer, D.; Lambert, A.;
2012 / IEEE / 978-1-4673-1612-5
By: Branzoi, V.; Kumar, R.; Samarasekera, S.; Chai, S.; Kuthirummal, S.; van der Wal, G.; Gudis, E.;
By: Branzoi, V.; Kumar, R.; Samarasekera, S.; Chai, S.; Kuthirummal, S.; van der Wal, G.; Gudis, E.;
2012 / IEEE / 978-1-4673-0974-5
By: Jaiswal, Manish Kumar; Ullah, Zahid; Cheung, Ray C.C.; Chan, Y.C.;
By: Jaiswal, Manish Kumar; Ullah, Zahid; Cheung, Ray C.C.; Chan, Y.C.;
2015 / IEEE
By: Webber, Thais; Brahm, Lucas; Fernandes, Ramon; Marcon, Cesar; Poehls, Leticia B.; Cataldo, Rodrigo;
By: Webber, Thais; Brahm, Lucas; Fernandes, Ramon; Marcon, Cesar; Poehls, Leticia B.; Cataldo, Rodrigo;