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Topic: Laser Tuning
Results
Tradeoffs in the Realization of Electrically Pumped Vertical External Cavity Surface Emitting Lasers
2011 / IEEEBy: Lin, L.C.; Childs, D.T.; Orchard, J.R.; Hogg, R.A.; Williams, D.M.; Stevens, B.J.;
2011 / IEEE
By: Malcolm, G.; Maker, G.; Robertson, G.; Butkus, M.; Rafailov, E.U.; Hamilton, C.; Yang Qiu; Walther, T.; Hogg, R.A.; Stevens, B.J.; Krysa, A.B.;
By: Malcolm, G.; Maker, G.; Robertson, G.; Butkus, M.; Rafailov, E.U.; Hamilton, C.; Yang Qiu; Walther, T.; Hogg, R.A.; Stevens, B.J.; Krysa, A.B.;
2011 / IEEE
By: Kai Shi; Barry, L.P.; Smyth, F.; Anandarajah, P.M.; Browning, C.; Huynh, T.N.; Reid, D.; Watts, R.;
By: Kai Shi; Barry, L.P.; Smyth, F.; Anandarajah, P.M.; Browning, C.; Huynh, T.N.; Reid, D.; Watts, R.;
2011 / IEEE
By: Bawamia, A.I.; Erbert, G.; Sumpf, B.; Thomas, M.; Spiesserger, S.; Ginolas, A.; Eppich, B.; Blume, G.;
By: Bawamia, A.I.; Erbert, G.; Sumpf, B.; Thomas, M.; Spiesserger, S.; Ginolas, A.; Eppich, B.; Blume, G.;
2012 / IEEE
By: Ermakov, I.V.; Verschaffelt, G.; Leijtens, X.J.M.; Bolk, J.; Docter, B.; Danckaert, J.; Ashour, M.; Beri, S.;
By: Ermakov, I.V.; Verschaffelt, G.; Leijtens, X.J.M.; Bolk, J.; Docter, B.; Danckaert, J.; Ashour, M.; Beri, S.;
2012 / IEEE
By: De-Yuan Shen; Cheng Li; Zhi Yang; Wei Zhang; Cun-Xiao Gao; Jia Yu; Xiao-Hui Li; Wei Zhao; Xiao-Hong Hu; Yi-Shan Wang; Yong-Gang Wang; Xiang-Lian Liu;
By: De-Yuan Shen; Cheng Li; Zhi Yang; Wei Zhang; Cun-Xiao Gao; Jia Yu; Xiao-Hui Li; Wei Zhao; Xiao-Hong Hu; Yi-Shan Wang; Yong-Gang Wang; Xiang-Lian Liu;
2012 / IEEE
By: Orofino, C.; Kanibolotsky, A.L.; Chen, Y.; Herrnsdorf, J.; Skabara, P.J.; Guilhabert, B.; Laurand, N.; Dawson, M.D.;
By: Orofino, C.; Kanibolotsky, A.L.; Chen, Y.; Herrnsdorf, J.; Skabara, P.J.; Guilhabert, B.; Laurand, N.; Dawson, M.D.;
2012 / IEEE
By: Gaomeng Wang; Li Zhan; Qishun Shen; Pingping Xiao; Zhijing Wu; Jinmei Liu; Liang Zhang; Xuesong Liu;
By: Gaomeng Wang; Li Zhan; Qishun Shen; Pingping Xiao; Zhijing Wu; Jinmei Liu; Liang Zhang; Xuesong Liu;
2012 / IEEE
By: Yu, G.; Wei, C.; Yue, Y.; Ren, Y.; Yang, J.; Dinu, R.; Nuccio, S.R.; Huang, H.; Willner, A.E.; Chang-Hasnain, C.J.; Parekh, D.;
By: Yu, G.; Wei, C.; Yue, Y.; Ren, Y.; Yang, J.; Dinu, R.; Nuccio, S.R.; Huang, H.; Willner, A.E.; Chang-Hasnain, C.J.; Parekh, D.;
2012 / IEEE
By: Ruiz, M.; Tran, M.; Fedorova, K.; Nikitichev, D.; Alhazime, A.; Ying Ding; Rafailov, E.; Krakowski, M.; Cataluna, M.A.; Syvridis, D.; Montrosset, I.; Livshits, D.; Krestnikov, I.; Rossetti, M.; Bardella, P.; Tianhong Xu; Mesaritakis, C.; Simos, H.; Kapsalis, A.; Robert, Y.;
By: Ruiz, M.; Tran, M.; Fedorova, K.; Nikitichev, D.; Alhazime, A.; Ying Ding; Rafailov, E.; Krakowski, M.; Cataluna, M.A.; Syvridis, D.; Montrosset, I.; Livshits, D.; Krestnikov, I.; Rossetti, M.; Bardella, P.; Tianhong Xu; Mesaritakis, C.; Simos, H.; Kapsalis, A.; Robert, Y.;
2012 / IEEE
By: Liu, A.Q.; Bo Chen; Lei Gao; Man Ying Lam; Yuen Hong Tsang; Ming Feng; Ning Wang; Zhiqing Feng; Xuming Zhang;
By: Liu, A.Q.; Bo Chen; Lei Gao; Man Ying Lam; Yuen Hong Tsang; Ming Feng; Ning Wang; Zhiqing Feng; Xuming Zhang;
2012 / IEEE
By: Jau-Sheng Wang; Wei-Lun Wang; Wood-Hi Cheng; Sheng-Lung Huang; Li-Wei Liu; Yi-Chung Huang;
By: Jau-Sheng Wang; Wei-Lun Wang; Wood-Hi Cheng; Sheng-Lung Huang; Li-Wei Liu; Yi-Chung Huang;
2012 / IEEE
By: Hyun-Soo Kim; Su Hwan Oh; Byung-Seok Choi; Ki Soo Kim; Jae-Sik Sim; Ki-Hong Yoon; O-Kyun Kwon; Hyung-Moo Park;
By: Hyun-Soo Kim; Su Hwan Oh; Byung-Seok Choi; Ki Soo Kim; Jae-Sik Sim; Ki-Hong Yoon; O-Kyun Kwon; Hyung-Moo Park;
2012 / IEEE
By: Chavez-Pirson, A.; Petersen, E.; Wei Shi; Renjie Zhou; Peyghambarian, N.; Stephen, M.;
By: Chavez-Pirson, A.; Petersen, E.; Wei Shi; Renjie Zhou; Peyghambarian, N.; Stephen, M.;
Free-Motion Beam Propagation Factor Measurement by Means of a Liquid Crystal Spatial Light Modulator
2012 / IEEEBy: Lancis, J.; Tajahuerce, E.; Martinez-Leon, L.; Martinez-Cuenca, R.; Mendoza-Yero, O.; Perez-Vizcaino, J.;
1992 / IEEE / 000-0-0000-0000-0
By: Renk, T.J.; Tisone, G.C.; Adams, R.G.; Gerber, R.A.; Johnson, D.J.;
By: Renk, T.J.; Tisone, G.C.; Adams, R.G.; Gerber, R.A.; Johnson, D.J.;
2006 / IEEE / 978-3-9805741-8-1
By: Wicht, A.; Danzmann, K.; Rinkleff, R.-H.; Huke, P.; Schiller, S.; Chepurov, S.; Ernsting, I.; Strauss, N.;
By: Wicht, A.; Danzmann, K.; Rinkleff, R.-H.; Huke, P.; Schiller, S.; Chepurov, S.; Ernsting, I.; Strauss, N.;
2011 / IEEE / 978-3-8007-3356-9
By: Dupont, L.; Paranthoen, C.; Castany, O.; Le Corre, A.; Levallois, C.; Durand, O.; Chevalier, N.; Gauthier, J.P.; Shuaib, A.;
By: Dupont, L.; Paranthoen, C.; Castany, O.; Le Corre, A.; Levallois, C.; Durand, O.; Chevalier, N.; Gauthier, J.P.; Shuaib, A.;
2011 / IEEE / 978-1-4244-7317-5
By: Fernandez, F.; Chavez, F.; Herrera, F.; Alcala-Fdez, J.; Alcala, R.;
By: Fernandez, F.; Chavez, F.; Herrera, F.; Alcala-Fdez, J.; Alcala, R.;
2011 / IEEE / 978-1-4244-5731-1
By: Villeneuve, A.; Dubois, J.; Chateauneuf, M.; Theberge, F.; Burgoyne, B.; Salhany, J.;
By: Villeneuve, A.; Dubois, J.; Chateauneuf, M.; Theberge, F.; Burgoyne, B.; Salhany, J.;
2011 / IEEE / 978-986-02-8974-9
By: Kuo, M.Y.; Hsing, J.Y.; Lay, T.S.; Shih, M.H.; Chuang, K.Y.; Tzeng, T.E.;
By: Kuo, M.Y.; Hsing, J.Y.; Lay, T.S.; Shih, M.H.; Chuang, K.Y.; Tzeng, T.E.;
2011 / IEEE / 978-986-02-8974-9
By: Swee Chuan Tjin; Bo Lin; Yao Ge; Yan He; Shum, P.P.; Meng Jiang;
By: Swee Chuan Tjin; Bo Lin; Yao Ge; Yan He; Shum, P.P.; Meng Jiang;
2011 / IEEE / 978-1-4244-6051-9
By: Huber, R.; Manzoni, C.; Brida, D.; Cerullo, G.; Leitenstorfer, A.;
By: Huber, R.; Manzoni, C.; Brida, D.; Cerullo, G.; Leitenstorfer, A.;
2011 / IEEE / 978-1-55752-932-9
By: Podivilov, E.V.; Harper, P.; El-Taher, A.E.; Babin, S.A.; Turitsyn, S.K.; Churkin, D.;
By: Podivilov, E.V.; Harper, P.; El-Taher, A.E.; Babin, S.A.; Turitsyn, S.K.; Churkin, D.;
2011 / IEEE / 978-1-4244-6051-9
By: Baumann, E.; Giorgetta, F.R.; Roos, P.A.; Barber, Z.W.; Newbury, N.R.; Swann, W.C.; Coddington, I.;
By: Baumann, E.; Giorgetta, F.R.; Roos, P.A.; Barber, Z.W.; Newbury, N.R.; Swann, W.C.; Coddington, I.;
2011 / IEEE / 978-1-55752-932-9
By: Hotate, K.; Ito, F.; Fan, X.; Koshikiya, Y.; He, Z.; Kazama, T.;
By: Hotate, K.; Ito, F.; Fan, X.; Koshikiya, Y.; He, Z.; Kazama, T.;
2011 / IEEE / 978-1-61284-718-4
By: van Dijk, F.; Lelarge, F.; Make, D.; Drisse, O.; Enard, A.; Accard, A.;
By: van Dijk, F.; Lelarge, F.; Make, D.; Drisse, O.; Enard, A.; Accard, A.;
2011 / IEEE / 978-1-4577-0861-9
By: Mangan, B.J.; Mosley, P.J.; Yu, F.; Muir, A.C.; Wadsworth, W.J.; Hooper, L.E.; Dudley, J.M.; Knight, J.C.;
By: Mangan, B.J.; Mosley, P.J.; Yu, F.; Muir, A.C.; Wadsworth, W.J.; Hooper, L.E.; Dudley, J.M.; Knight, J.C.;
2011 / IEEE / 978-1-4577-0509-0
By: Kawabe, S.; Kaneko, R.; Tonouchi, M.; Mori, Y.; Kawase, K.; Kawayama, I.; Suizu, K.; Yoshimura, M.; Shibuya, T.; Takahashi, Y.; Murakami, H.;
By: Kawabe, S.; Kaneko, R.; Tonouchi, M.; Mori, Y.; Kawase, K.; Kawayama, I.; Suizu, K.; Yoshimura, M.; Shibuya, T.; Takahashi, Y.; Murakami, H.;
2011 / IEEE / 978-1-4577-0509-0
By: Donghun Lee; Jeong-Woo Park; Han-Cheol Ryu; Hyunsung Ko; Min Yong Jeon; Sang-Pil Han; Young Ahn Leem; Namje Kim; Kyung Hyun Park;
By: Donghun Lee; Jeong-Woo Park; Han-Cheol Ryu; Hyunsung Ko; Min Yong Jeon; Sang-Pil Han; Young Ahn Leem; Namje Kim; Kyung Hyun Park;
2011 / IEEE / 978-1-4577-0509-0
By: Rivera-Rivera, L.A.; McElmurry, B.A.; Bevan, J.W.; Legon, A.C.; Scott, K.W.; Leonov, I.; Zhongcheng Wang; Lucchese, R.R.;
By: Rivera-Rivera, L.A.; McElmurry, B.A.; Bevan, J.W.; Legon, A.C.; Scott, K.W.; Leonov, I.; Zhongcheng Wang; Lucchese, R.R.;
2011 / IEEE / 978-1-4244-8939-8
By: Meissner, P.; Amann, M.; Meyer, R.; Boehm, G.; Gruendl, T.; Grasse, C.; Gierl, C.; Zogal, K.;
By: Meissner, P.; Amann, M.; Meyer, R.; Boehm, G.; Gruendl, T.; Grasse, C.; Gierl, C.; Zogal, K.;
2011 / IEEE / 978-1-4244-8939-8
By: Eden, J.G.; Cunningham, B.T.; Meng, L.; Wagner, C.J.; Ge, C.; Zheng, J.;
By: Eden, J.G.; Cunningham, B.T.; Meng, L.; Wagner, C.J.; Ge, C.; Zheng, J.;