Your Search Results
Use materials about this topic in your textbook!
AcademicPub holds over eight million pieces of educational content - such as case studies and journal articles - for you to mix-and-match your way.
Experience the freedom of customizing your course pack with AcademicPub!

Topic: Laser Transitions
Results
2012 / IEEE
By: Huayan Lan; Suling Sang; Peiying Li; Haixia Chen; Changbiao Li; Zhiguo Wang; Huaibin Zheng; Yanpeng Zhang;
By: Huayan Lan; Suling Sang; Peiying Li; Haixia Chen; Changbiao Li; Zhiguo Wang; Huaibin Zheng; Yanpeng Zhang;
2012 / IEEE
By: Olivier, N.; Bakir, B.B.; Harduin, J.; Letartre, X.; Seassal, C.; Sciancalepore, C.; Viktorovitch, P.; Fedeli, J.;
By: Olivier, N.; Bakir, B.B.; Harduin, J.; Letartre, X.; Seassal, C.; Sciancalepore, C.; Viktorovitch, P.; Fedeli, J.;
2012 / IEEE
By: Jiang Wei Man; Liang Xie; Wei Wang; Ning Hua Zhu; Yu Liu; Bao Jun Wang; Ling Juan Zhao; Hai Qing Yuan; Xin Wang; Hong Liang Zhu;
By: Jiang Wei Man; Liang Xie; Wei Wang; Ning Hua Zhu; Yu Liu; Bao Jun Wang; Ling Juan Zhao; Hai Qing Yuan; Xin Wang; Hong Liang Zhu;
2011 / IEEE / 978-1-61284-112-0
By: Santarelli, G.; Davies, A.G.; Linfield, E.H.; Khanna, S.P.; Ravaro, M.; Sirtori, C.; Manquest, C.; Gellie, P.; Barbieri, S.;
By: Santarelli, G.; Davies, A.G.; Linfield, E.H.; Khanna, S.P.; Ravaro, M.; Sirtori, C.; Manquest, C.; Gellie, P.; Barbieri, S.;
2011 / IEEE / 978-986-02-8974-9
By: Guei-Ru Lin; Pei-Ping Wu; Hao-Jan Sheng; Wen-Fung Liu; Ming-Yue Fu; Yu-Li Wang;
By: Guei-Ru Lin; Pei-Ping Wu; Hao-Jan Sheng; Wen-Fung Liu; Ming-Yue Fu; Yu-Li Wang;
2011 / IEEE / 978-1-4577-0509-0
By: Richter, H.; Hubers, H.-W.; Grahn, H.T.; Hey, R.; Giehler, M.; Schrottke, L.; Wienold, M.; Semenov, A.D.; Pavlov, S.G.;
By: Richter, H.; Hubers, H.-W.; Grahn, H.T.; Hey, R.; Giehler, M.; Schrottke, L.; Wienold, M.; Semenov, A.D.; Pavlov, S.G.;
2011 / IEEE / 978-1-4577-0509-0
By: Dyer, G.C.; Cich, M.J.; Lee, M.; Nordquist, C.D.; Cavaliere, M.; Wanke, M.C.; Reno, J.L.; Fuller, C.T.; Grine, A.D.;
By: Dyer, G.C.; Cich, M.J.; Lee, M.; Nordquist, C.D.; Cavaliere, M.; Wanke, M.C.; Reno, J.L.; Fuller, C.T.; Grine, A.D.;
2011 / IEEE / 978-1-4577-0509-0
By: Katz, S.; Grasse, C.; Vizbaras, A.; Adams, R.W.; Belkin, M.A.; Boehm, G.; Amann, M.C.; Belyanin, A.A.; Cho, Y.; Jang, M.; Vijayraghavan, K.;
By: Katz, S.; Grasse, C.; Vizbaras, A.; Adams, R.W.; Belkin, M.A.; Boehm, G.; Amann, M.C.; Belyanin, A.A.; Cho, Y.; Jang, M.; Vijayraghavan, K.;
2011 / IEEE / 978-1-4577-0509-0
By: Carr, G.L.; Yuzhen Shen; Xi Yang; Xijie Wang; Murphy, J.B.; Heese, R.;
By: Carr, G.L.; Yuzhen Shen; Xi Yang; Xijie Wang; Murphy, J.B.; Heese, R.;
2011 / IEEE / 978-1-4577-0509-0
By: Schulz, S.; Hoffmann, M.C.; Schmidt, B.; Wunderlich, S.; Wesch, S.;
By: Schulz, S.; Hoffmann, M.C.; Schmidt, B.; Wunderlich, S.; Wesch, S.;
2011 / IEEE / 978-1-4244-8939-8
By: Tahvili, M.S.; Bente, E.A.J.M.; Smit, M.K.; Notzel, R.; Heck, M.J.R.;
By: Tahvili, M.S.; Bente, E.A.J.M.; Smit, M.K.; Notzel, R.; Heck, M.J.R.;
2011 / IEEE / 978-1-4244-8939-8
By: Newkirk, M.; Wyss, R.; Tsai, C.; Sercel, P.; Paslaski, J.; Benzoni, A.;
By: Newkirk, M.; Wyss, R.; Tsai, C.; Sercel, P.; Paslaski, J.; Benzoni, A.;
2011 / IEEE / 978-1-61284-813-6
By: Khodakovsky, V.M.; Matsnev, I.V.; Negriyko, A.M.; Perederiy, O.O.;
By: Khodakovsky, V.M.; Matsnev, I.V.; Negriyko, A.M.; Perederiy, O.O.;
2011 / IEEE / 978-0-9775657-8-8
By: Falkovich, G.; Turitsyna, E.G.; Turitsyn, S.K.; Xuewen Shu; Harper, P.; El-Taher, A.;
By: Falkovich, G.; Turitsyna, E.G.; Turitsyn, S.K.; Xuewen Shu; Harper, P.; El-Taher, A.;
2011 / IEEE / 978-0-9775657-8-8
By: Sang Eon Park; Sang Bum Lee; Ki-Se Lee; Jaewan Kim; Taeg Yong Kwon;
By: Sang Eon Park; Sang Bum Lee; Ki-Se Lee; Jaewan Kim; Taeg Yong Kwon;
2011 / IEEE / 978-1-4577-1652-2
By: Krellmann, M.; Pahner, D.; Dauderstadt, U.; Mai, A.; Wagner, M.; Schmeiser, D.;
By: Krellmann, M.; Pahner, D.; Dauderstadt, U.; Mai, A.; Wagner, M.; Schmeiser, D.;
2012 / IEEE / 978-1-55752-935-1
By: Dutt, B.; Romagnoli, M.; Bessette, J.T.; Patel, N.; Kimerling, L.C.; Yan Cai; Camacho-Aguilera, R.E.; Michel, J.;
By: Dutt, B.; Romagnoli, M.; Bessette, J.T.; Patel, N.; Kimerling, L.C.; Yan Cai; Camacho-Aguilera, R.E.; Michel, J.;
2011 / IEEE / 978-0-9775657-8-8
By: Matsubara, K.; Nagano, S.; Ido, T.; Wakui, K.; Li, Y.; Hayasaka, K.; Hanado, Y.;
By: Matsubara, K.; Nagano, S.; Ido, T.; Wakui, K.; Li, Y.; Hayasaka, K.; Hanado, Y.;
2011 / IEEE / 978-0-9775657-8-8
By: Kielpinski, D.; Feder, K.S.; Westbrook, P.S.; Stevenson, M.; Canning, J.; Jechow, A.; Petrasiunas, M.J.;
By: Kielpinski, D.; Feder, K.S.; Westbrook, P.S.; Stevenson, M.; Canning, J.; Jechow, A.; Petrasiunas, M.J.;
2011 / IEEE / 978-0-9775657-8-8
By: Stace, T.M.; Benabid, F.; Light, P.S.; Perrella, C.; Luiten, A.N.;
By: Stace, T.M.; Benabid, F.; Light, P.S.; Perrella, C.; Luiten, A.N.;
2012 / IEEE / 978-1-4673-0442-9
By: Dai-Hyuk Yu; Sang-Bum Lee; Long Zhe Li; Sang Eon Park; Taeg Yong Kwon; Won-Kyu Lee; Chang Yong Park;
By: Dai-Hyuk Yu; Sang-Bum Lee; Long Zhe Li; Sang Eon Park; Taeg Yong Kwon; Won-Kyu Lee; Chang Yong Park;
2012 / IEEE / 978-1-4673-0442-9
By: Lodewyck, J.; Lemonde, P.; Targat, R.L.; Coq, Y.L.; Xu, Z.; Bize, S.; Tyumenev, R.; Nagorny, B.; McFerran, J.J.; Gurov, M.;
By: Lodewyck, J.; Lemonde, P.; Targat, R.L.; Coq, Y.L.; Xu, Z.; Bize, S.; Tyumenev, R.; Nagorny, B.; McFerran, J.J.; Gurov, M.;
2012 / IEEE / 978-1-4577-1820-5
By: Lijun Wang; Bo Wang; Kai Miao; Shiguang Wang; Zhengbo Wang; Jianwei Zhang;
By: Lijun Wang; Bo Wang; Kai Miao; Shiguang Wang; Zhengbo Wang; Jianwei Zhang;
2012 / IEEE / 978-1-4577-1820-5
By: Tonggang Zhang; Dongying Wang; Xiaobo Xue; Yanfei Wang; Qinqing Sun; Jingbiao Chen; Wei Zhuang; Yelong Hong;
By: Tonggang Zhang; Dongying Wang; Xiaobo Xue; Yanfei Wang; Qinqing Sun; Jingbiao Chen; Wei Zhuang; Yelong Hong;
2008 / American Institute of Physics
By: Scott S. Howard; Daniel P. Howard; Kale Franz; Anthony Hoffman; Deborah L. Sivco; Claire F. Gmachl;
By: Scott S. Howard; Daniel P. Howard; Kale Franz; Anthony Hoffman; Deborah L. Sivco; Claire F. Gmachl;
2009 / American Institute of Physics
By: J. Teissier; S. Laurent; C. Sirtori; H. Debrégeas-Sillard; F. Lelarge; F. Brillouet; R. Colombelli;
By: J. Teissier; S. Laurent; C. Sirtori; H. Debrégeas-Sillard; F. Lelarge; F. Brillouet; R. Colombelli;
2010 / American Institute of Physics
By: Alpár Mátyás; Mikhail A. Belkin; Paolo Lugli; Christian Jirauschek;
By: Alpár Mátyás; Mikhail A. Belkin; Paolo Lugli; Christian Jirauschek;
2015 / IEEE
By: Tardy, C.; Tombez, L.; Schilt, S.; Sudmeyer, T.; Bismuto, A.; Terazzi, R.; Maulini, R.; Blaser, S.; Rochat, M.;
By: Tardy, C.; Tombez, L.; Schilt, S.; Sudmeyer, T.; Bismuto, A.; Terazzi, R.; Maulini, R.; Blaser, S.; Rochat, M.;
2015 / IEEE
By: Beecher, S.J.; Szela, J.W.; Mackenzie, J.I.; Shepherd, D.P.; Eason, R.W.; Parsonage, T.L.;
By: Beecher, S.J.; Szela, J.W.; Mackenzie, J.I.; Shepherd, D.P.; Eason, R.W.; Parsonage, T.L.;
2014 / IEEE
By: Breuer, Stefan; Elsaser, Wolfgang; Hopkinson, Mark; Krakowski, Michel; Montrosset, Ivo; Drzewietzki, Lukas; Rossetti, Mattia;
By: Breuer, Stefan; Elsaser, Wolfgang; Hopkinson, Mark; Krakowski, Michel; Montrosset, Ivo; Drzewietzki, Lukas; Rossetti, Mattia;
2014 / IEEE
By: Lee, Sang-Bum; Mun, Jongchul; Heo, Myoung-Sun; Park, Sang Eon; Kwon, Taeg Yong; Lee, Won-Kyu; Lee, Sangkyung; Yu, Dai-Hyuk; Park, Chang Yong;
By: Lee, Sang-Bum; Mun, Jongchul; Heo, Myoung-Sun; Park, Sang Eon; Kwon, Taeg Yong; Lee, Won-Kyu; Lee, Sangkyung; Yu, Dai-Hyuk; Park, Chang Yong;
2014 / IEEE
By: Cai, Z.; Liu, Z.; Moncorge, R.; Camy, P.; Doualan, J.-L.; Xu, B.; Wang, F.; Yan, Y.; Zeng, C.; Huang, S.; Xu, H.;
By: Cai, Z.; Liu, Z.; Moncorge, R.; Camy, P.; Doualan, J.-L.; Xu, B.; Wang, F.; Yan, Y.; Zeng, C.; Huang, S.; Xu, H.;
2013 / IEEE
By: Wilken, T.; Lezius, M.; Holzwarth, R.; Peters, A.; Sengstock, K.; Windpassinger, P.; Hellmig, O.; Duncker, H.; Krutzik, M.; Hansch, T. W.; Kohfeldt, A.; Wicht, A.; Schkolnik, V.;
By: Wilken, T.; Lezius, M.; Holzwarth, R.; Peters, A.; Sengstock, K.; Windpassinger, P.; Hellmig, O.; Duncker, H.; Krutzik, M.; Hansch, T. W.; Kohfeldt, A.; Wicht, A.; Schkolnik, V.;
2013 / IEEE
By: Urruti, Eric H.; Roth, Matthew; Hayden, Joseph S.; Carlie, Nathan; Davis, Mark J.; George, Simi A.;
By: Urruti, Eric H.; Roth, Matthew; Hayden, Joseph S.; Carlie, Nathan; Davis, Mark J.; George, Simi A.;
2013 / IEEE
By: Vijayraghavan, Karun; Jiang, Aiting; Belkin, Mikhail A.; Wasilewski, Zbig R.; Jirauschek, Christian; Matyas, Alpar;
By: Vijayraghavan, Karun; Jiang, Aiting; Belkin, Mikhail A.; Wasilewski, Zbig R.; Jirauschek, Christian; Matyas, Alpar;
2013 / IEEE
By: Kao, Christina; Comhair, Suzy; Wysocki, Gerard; Dweik, Raed; Erzurum, Serpil; Grove, David; Dababneh, Luma; Barnes, Jarrod; Cikach, Frank; Wang, Yin;
By: Kao, Christina; Comhair, Suzy; Wysocki, Gerard; Dweik, Raed; Erzurum, Serpil; Grove, David; Dababneh, Luma; Barnes, Jarrod; Cikach, Frank; Wang, Yin;
2013 / IEEE
By: Mirov, S. B.; Gapontsev, V. P.; Mirov, M. S.; Martyshkin, D. V.; Vasyliev, S.; Moskalev, I. S.; Fedorov, V. V.;
By: Mirov, S. B.; Gapontsev, V. P.; Mirov, M. S.; Martyshkin, D. V.; Vasyliev, S.; Moskalev, I. S.; Fedorov, V. V.;
2013 / IEEE
By: Pelivanov, Ivan M.; Larson-Smith, Kjersta; Lombardo, Michael; Wei, Chen-wei; Perez, Camilo; Matula, Thomas J.; Pozzo, Danilo; Jinjun Xia; O'Donnell, Matthew;
By: Pelivanov, Ivan M.; Larson-Smith, Kjersta; Lombardo, Michael; Wei, Chen-wei; Perez, Camilo; Matula, Thomas J.; Pozzo, Danilo; Jinjun Xia; O'Donnell, Matthew;
2013 / IEEE
By: Pozzo, Danilo; Matula, Thomas J.; Perez, Camilo; Lombardo, Michael; O'Donnell, Matthew; Arnal, Bastien; Wei, Chen-wei; Xia, Jinjun; Pelivanov, Ivan M.;
By: Pozzo, Danilo; Matula, Thomas J.; Perez, Camilo; Lombardo, Michael; O'Donnell, Matthew; Arnal, Bastien; Wei, Chen-wei; Xia, Jinjun; Pelivanov, Ivan M.;