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Topic: Laser Theory
Results
2011 / IEEE
By: Sangster, T.C.; Norreys, P.A.; Maksimchuk, A.; Thomas, A.G.R.; Craxton, R.S.; Cobble, J.; Scott, R.H.H.; Nilson, P.M.; Willingale, L.; Krushelnick, K.; Zulick, C.; Stoeckl, C.;
By: Sangster, T.C.; Norreys, P.A.; Maksimchuk, A.; Thomas, A.G.R.; Craxton, R.S.; Cobble, J.; Scott, R.H.H.; Nilson, P.M.; Willingale, L.; Krushelnick, K.; Zulick, C.; Stoeckl, C.;
2011 / IEEE
By: Pfeifer, M.; Krasa, J.; Jungwirth, K.; Krousky, E.; Rohlena, K.; Velyhan, A.; Laska, L.; Ullschmied, J.; Skala, J.;
By: Pfeifer, M.; Krasa, J.; Jungwirth, K.; Krousky, E.; Rohlena, K.; Velyhan, A.; Laska, L.; Ullschmied, J.; Skala, J.;
2011 / IEEE
By: Nian Qiang Li; Lei Yang; Ning Jiang; Xi Hua Zou; Shui Ying Xiang; Bin Luo; Wei Pan; Lian Shan Yan;
By: Nian Qiang Li; Lei Yang; Ning Jiang; Xi Hua Zou; Shui Ying Xiang; Bin Luo; Wei Pan; Lian Shan Yan;
2011 / IEEE
By: Bocquillon, A.; Panariti, A.; Violante, M.; Sterpone, L.; Miller, F.; Gerardin, S.; Paccagnella, A.; Manuzzato, A.; Buard, N.;
By: Bocquillon, A.; Panariti, A.; Violante, M.; Sterpone, L.; Miller, F.; Gerardin, S.; Paccagnella, A.; Manuzzato, A.; Buard, N.;
2012 / IEEE
By: Jianzhou Wang; Yi Xu; Yanyan Li; Yansui Huang; Xiaoming Lu; Zhizhan Xu; Ruxin Li; Yuxin Leng;
By: Jianzhou Wang; Yi Xu; Yanyan Li; Yansui Huang; Xiaoming Lu; Zhizhan Xu; Ruxin Li; Yuxin Leng;
2012 / IEEE
By: Takahashi, D.; Arai, S.; Nishiyama, N.; Amemiya, T.; Shinno, K.; Shindo, T.; Shirao, M.; SeungHun Lee;
By: Takahashi, D.; Arai, S.; Nishiyama, N.; Amemiya, T.; Shinno, K.; Shindo, T.; Shirao, M.; SeungHun Lee;
Investigation on Back-Reflected Pumping Light in High-Power Quasi-End-Pumped Yb:YAG Thin-Disk Lasers
2012 / IEEEBy: Radmard, S.; Kazemi, S.; Shayganmanesh, M.; Arabgari, S.;
2012 / IEEE
By: Batani, D.; Vauzour, B.; Santos, J.J.; Perez, F.; Koenig, M.; Baton, S.; Ramis, R.; Nicolai, P.; Volpe, L.;
By: Batani, D.; Vauzour, B.; Santos, J.J.; Perez, F.; Koenig, M.; Baton, S.; Ramis, R.; Nicolai, P.; Volpe, L.;
2012 / IEEE
By: Hongwei Qu; Bin Jiang; Yufei Wang; Jianxin Zhang; Lei Liu; Wanhua Zheng; Yejin Zhang;
By: Hongwei Qu; Bin Jiang; Yufei Wang; Jianxin Zhang; Lei Liu; Wanhua Zheng; Yejin Zhang;
2002 / IEEE / 978-0-7354-0107-5
By: Kasuya, Koichi; Kamiya, Takahiro; Nakai, Sadao; Yamanaka, Tatsuhiko; Okihara, Sin-ichiro; Shimizu, Seiji; Sakabe, Shuhji; Mroz, Waldemar; Sugimoto, Takehisa;
By: Kasuya, Koichi; Kamiya, Takahiro; Nakai, Sadao; Yamanaka, Tatsuhiko; Okihara, Sin-ichiro; Shimizu, Seiji; Sakabe, Shuhji; Mroz, Waldemar; Sugimoto, Takehisa;
2002 / IEEE / 978-0-7354-0107-5
By: Wyndham, Edmundo; Mitchell, Ian; Favre, Mario; Aliaga-Rossel, Raul; Chuaqui, Hernan; Pavez, Cristian;
By: Wyndham, Edmundo; Mitchell, Ian; Favre, Mario; Aliaga-Rossel, Raul; Chuaqui, Hernan; Pavez, Cristian;
2009 / IEEE / 978-1-4577-0493-2
By: Violante, M.; Sterpone, L.; Pacagnella, A.; Gerardin, S.; Bocquillon, A.; Manuzzato, A.; Buard, N.; Miller, F.;
By: Violante, M.; Sterpone, L.; Pacagnella, A.; Gerardin, S.; Bocquillon, A.; Manuzzato, A.; Buard, N.; Miller, F.;
2011 / IEEE / 978-1-4577-1226-5
By: Mendoza-Yero, O.; Perez-Vizcaino, J.; Andres, P.; Lancis, J.; Martinez-Leon, L.; Martinez-Cuenca, R.;
By: Mendoza-Yero, O.; Perez-Vizcaino, J.; Andres, P.; Lancis, J.; Martinez-Leon, L.; Martinez-Cuenca, R.;
2011 / IEEE / 978-1-4577-0158-0
By: Midoh, Y.; Tonouchi, M.; Matsumoto, T.; Otani, C.; Miura, K.; Yamashita, M.; Nikawa, K.; Nakamae, K.;
By: Midoh, Y.; Tonouchi, M.; Matsumoto, T.; Otani, C.; Miura, K.; Yamashita, M.; Nikawa, K.; Nakamae, K.;
2011 / IEEE / 978-1-4244-9439-2
By: Chen Jiaqing; Jiao Xiangdong; Ji Yipeng; Luo Yu; Gao Hui; Li Zhigang; Zhao Dongyan; Cao Jun; Ding Wenbin; Ji Wengang; Zhou Canfeng;
By: Chen Jiaqing; Jiao Xiangdong; Ji Yipeng; Luo Yu; Gao Hui; Li Zhigang; Zhao Dongyan; Cao Jun; Ding Wenbin; Ji Wengang; Zhou Canfeng;
2011 / IEEE / 978-3-8007-3356-9
By: Osabe, R.; Shindo, T.; Futami, M.; Okumura, T.; Ito, H.; Arai, S.; Nishiyama, N.; Amemiya, T.; Koguchi, T.;
By: Osabe, R.; Shindo, T.; Futami, M.; Okumura, T.; Ito, H.; Arai, S.; Nishiyama, N.; Amemiya, T.; Koguchi, T.;
2011 / IEEE / 978-1-4577-0378-2
By: Wang, C.-J.; Shih, M.H.; Hsu, T.M.; Chen, W.-Y.; Chyi, J.-I.; Tseng, Y.C.;
By: Wang, C.-J.; Shih, M.H.; Hsu, T.M.; Chen, W.-Y.; Chyi, J.-I.; Tseng, Y.C.;
2011 / IEEE / 978-986-02-8974-9
By: Broeng, J.; Lyngso, J.K.; Olausson, C.B.; Ueda, K.; Xinyan Fan; Meishin Chen; Shirakawa, A.;
By: Broeng, J.; Lyngso, J.K.; Olausson, C.B.; Ueda, K.; Xinyan Fan; Meishin Chen; Shirakawa, A.;
2011 / IEEE / 978-1-4244-6051-9
By: Bhuyan, M.K.; Dudley, J.M.; Furfaro, L.; Salut, R.; Froehly, L.; Lacourt, P.-A.; Jacquot, M.; Courvoisier, F.;
By: Bhuyan, M.K.; Dudley, J.M.; Furfaro, L.; Salut, R.; Froehly, L.; Lacourt, P.-A.; Jacquot, M.; Courvoisier, F.;
2011 / IEEE / 978-1-4577-0321-8
By: Yuan Xu; Tianbing Chen; Xu Zhang; Qiumei Peng; Muhua Liu; Mingyin Yao; Zejian Lei;
By: Yuan Xu; Tianbing Chen; Xu Zhang; Qiumei Peng; Muhua Liu; Mingyin Yao; Zejian Lei;
2011 / IEEE / 978-1-4244-6051-9
By: Chan, S.; Tombet, S.A.B.; Otsuji, T.; Ryzhii, V.; Ryzhii, M.; Satou, A.; Watanabe, T.;
By: Chan, S.; Tombet, S.A.B.; Otsuji, T.; Ryzhii, V.; Ryzhii, M.; Satou, A.; Watanabe, T.;
2011 / IEEE / 978-1-55752-932-9
By: Podivilov, E.V.; Harper, P.; El-Taher, A.E.; Babin, S.A.; Turitsyn, S.K.; Churkin, D.;
By: Podivilov, E.V.; Harper, P.; El-Taher, A.E.; Babin, S.A.; Turitsyn, S.K.; Churkin, D.;
2011 / IEEE / 978-1-55752-932-9
By: Wei-Hua Guo; Qiaoyin Lu; Donegan, J.F.; Weldon, V.; Lynch, M.; Abdullaev, A.; Nawrocka, M.;
By: Wei-Hua Guo; Qiaoyin Lu; Donegan, J.F.; Weldon, V.; Lynch, M.; Abdullaev, A.; Nawrocka, M.;
2011 / IEEE / 978-1-4577-1025-4
By: Bauer, S.; Tofail, S.A.M.; Lang, S.B.; Krause, M.; Gandhi, A.A.; Kost, J.; Wolf-Brandstetter, C.; Gregor, M.;
By: Bauer, S.; Tofail, S.A.M.; Lang, S.B.; Krause, M.; Gandhi, A.A.; Kost, J.; Wolf-Brandstetter, C.; Gregor, M.;
2011 / IEEE / 978-1-4577-1589-1
By: Saccomandi, P.; Silvestri, S.; Rea, R.; Martino, M.; Pandolfi, M.; Di Matteo, F.M.; Schena, E.;
By: Saccomandi, P.; Silvestri, S.; Rea, R.; Martino, M.; Pandolfi, M.; Di Matteo, F.M.; Schena, E.;
2011 / IEEE / 978-1-4577-0509-0
By: Kawabe, S.; Kaneko, R.; Tonouchi, M.; Mori, Y.; Kawase, K.; Kawayama, I.; Suizu, K.; Yoshimura, M.; Shibuya, T.; Takahashi, Y.; Murakami, H.;
By: Kawabe, S.; Kaneko, R.; Tonouchi, M.; Mori, Y.; Kawase, K.; Kawayama, I.; Suizu, K.; Yoshimura, M.; Shibuya, T.; Takahashi, Y.; Murakami, H.;
2011 / IEEE / 978-1-4577-0509-0
By: Hashida, M.; Jahangiri, F.; Sakabe, S.; Hangyo, M.; Tokita, S.; Nagashima, T.;
By: Hashida, M.; Jahangiri, F.; Sakabe, S.; Hangyo, M.; Tokita, S.; Nagashima, T.;
2011 / IEEE / 978-1-4577-1277-7
By: Svasta, P.; Bunea, R.; Geczy, A.; Batorfi, R.; Illyefalvi-Vitez, Z.;
By: Svasta, P.; Bunea, R.; Geczy, A.; Batorfi, R.; Illyefalvi-Vitez, Z.;