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Topic: Laser Noise
Results
2011 / IEEE
By: Davila-Rodriguez, J.; Hernandez-Romano, I.; Delfyett, P.J.; May-Arrioja, D.A.; Sanchez-Mondragon, J.J.; Mandridis, D.;
By: Davila-Rodriguez, J.; Hernandez-Romano, I.; Delfyett, P.J.; May-Arrioja, D.A.; Sanchez-Mondragon, J.J.; Mandridis, D.;
2011 / IEEE
By: Mura, A.; Clivati, C.; Godone, A.; Calosso, C.E.; Costanzo, G.A.; Levi, F.; Calonico, D.;
By: Mura, A.; Clivati, C.; Godone, A.; Calosso, C.E.; Costanzo, G.A.; Levi, F.; Calonico, D.;
2011 / IEEE
By: Kai Shi; Barry, L.P.; Smyth, F.; Anandarajah, P.M.; Browning, C.; Huynh, T.N.; Reid, D.; Watts, R.;
By: Kai Shi; Barry, L.P.; Smyth, F.; Anandarajah, P.M.; Browning, C.; Huynh, T.N.; Reid, D.; Watts, R.;
2011 / IEEE
By: Bogoni, A.; Cruz, J.L.; Palaci, J.; Villanueva, G.E.; Perez-Millan, P.; Ghelfi, P.; Serafino, G.;
By: Bogoni, A.; Cruz, J.L.; Palaci, J.; Villanueva, G.E.; Perez-Millan, P.; Ghelfi, P.; Serafino, G.;
2011 / IEEE
By: Kan Wu; Lee, K.E.K.; Huy Quoc Lam; Jia Haur Wong; Chunmei Ouyang; Aditya, S.; Shum, P.P.;
By: Kan Wu; Lee, K.E.K.; Huy Quoc Lam; Jia Haur Wong; Chunmei Ouyang; Aditya, S.; Shum, P.P.;
2012 / IEEE
By: Hamacher, M.; Syvridis, D.; Mesaritakis, C.; Stamataki, I.; Kapsalis, A.; Heidrich, H.;
By: Hamacher, M.; Syvridis, D.; Mesaritakis, C.; Stamataki, I.; Kapsalis, A.; Heidrich, H.;
2012 / IEEE
By: de Ridder, R.M.; Bernhardi, E.H.; Burla, M.; Marpaung, D.A.I.; Worhoff, K.; Khan, M.R.H.; Roeloffzen, C.G.H.; Pollnau, M.;
By: de Ridder, R.M.; Bernhardi, E.H.; Burla, M.; Marpaung, D.A.I.; Worhoff, K.; Khan, M.R.H.; Roeloffzen, C.G.H.; Pollnau, M.;
2012 / IEEE
By: Jiang Wei Man; Liang Xie; Wei Wang; Ning Hua Zhu; Yu Liu; Bao Jun Wang; Ling Juan Zhao; Hai Qing Yuan; Xin Wang; Hong Liang Zhu;
By: Jiang Wei Man; Liang Xie; Wei Wang; Ning Hua Zhu; Yu Liu; Bao Jun Wang; Ling Juan Zhao; Hai Qing Yuan; Xin Wang; Hong Liang Zhu;
2012 / IEEE
By: Schmogrow, R.; Leuthold, J.; Freude, W.; Becker, J.; Koos, C.; Huebner, M.; Winter, M.; Dreschmann, M.; Meyer, J.; Koenig, S.; Hillerkuss, D.; Josten, A.; Nebendahl, B.;
By: Schmogrow, R.; Leuthold, J.; Freude, W.; Becker, J.; Koos, C.; Huebner, M.; Winter, M.; Dreschmann, M.; Meyer, J.; Koenig, S.; Hillerkuss, D.; Josten, A.; Nebendahl, B.;
2012 / IEEE
By: Xian Xu; Morsy-Osman, M.; Mousa-Pasandi, M.E.; Qunbi Zhuge; Plant, D.V.; El-Sahn, Z.A.; Chagnon, M.;
By: Xian Xu; Morsy-Osman, M.; Mousa-Pasandi, M.E.; Qunbi Zhuge; Plant, D.V.; El-Sahn, Z.A.; Chagnon, M.;
2012 / IEEE
By: Costanzo, G.A.; Pizzocaro, M.; Calonico, D.; Zoppi, M.; Mura, A.; Levi, F.; Godone, A.;
By: Costanzo, G.A.; Pizzocaro, M.; Calonico, D.; Zoppi, M.; Mura, A.; Levi, F.; Godone, A.;
2012 / IEEE
By: Paret, J.-F.; Bellini, S.; Lelarge, F.; Brenot, R.; Drisse, O.; Glastre, G.; Caillaud, C.; Achouche, M.; Carpentier, D.;
By: Paret, J.-F.; Bellini, S.; Lelarge, F.; Brenot, R.; Drisse, O.; Glastre, G.; Caillaud, C.; Achouche, M.; Carpentier, D.;
2012 / IEEE
By: Ye Li; Yang Zhao; Erjun Zang; Tianchu Li; Zhanjun Fang; Fei Meng; Qiang Wang; Shiying Cao; Baike Lin; Shaokai Wang; Yige Lin; Jianping Cao;
By: Ye Li; Yang Zhao; Erjun Zang; Tianchu Li; Zhanjun Fang; Fei Meng; Qiang Wang; Shiying Cao; Baike Lin; Shaokai Wang; Yige Lin; Jianping Cao;
2012 / IEEE
By: Plant, J.J.; Delfyett, P.J.; Bagnell, M.; Ozdur, I.T.; Davila-Rodriguez, J.; Juodawlkis, P.W.;
By: Plant, J.J.; Delfyett, P.J.; Bagnell, M.; Ozdur, I.T.; Davila-Rodriguez, J.; Juodawlkis, P.W.;
2006 / IEEE / 978-3-9805741-8-1
By: Wicht, A.; Danzmann, K.; Rinkleff, R.-H.; Huke, P.; Schiller, S.; Chepurov, S.; Ernsting, I.; Strauss, N.;
By: Wicht, A.; Danzmann, K.; Rinkleff, R.-H.; Huke, P.; Schiller, S.; Chepurov, S.; Ernsting, I.; Strauss, N.;
2010 / IEEE / 978-1-4244-8701-1
By: Banerjee, S.; Ertel, K.; Collier, J.L.; Hernandez-Gomez, C.; Phillips, P.J.; Mason, P.D.;
By: Banerjee, S.; Ertel, K.; Collier, J.L.; Hernandez-Gomez, C.; Phillips, P.J.; Mason, P.D.;
Noise characteristics and radiation spectra of multimode MQW laser diodes during mode-hopping effect
2011 / IEEE / 978-1-4577-0192-4By: Saulys, B.; Palenskis, V.; Pralgauskaite, S.; Smetona, S.; Kornijcuk, V.; Matukas, J.;
2011 / IEEE / 978-1-4244-6051-9
By: Lours, M.; Haboucha, A.; Li, T.; Zhang, W.; Luiten, A.N.; Le Coq, Y.; Santarelli, G.; Holzwarth, R.;
By: Lours, M.; Haboucha, A.; Li, T.; Zhang, W.; Luiten, A.N.; Le Coq, Y.; Santarelli, G.; Holzwarth, R.;
Recognition Algorithm of Laser Echo Signal in Tuyere Raceway Based on Multiwavelet Denoising and ICA
2011 / IEEE / 978-1-4577-0755-1By: Ren Zhen; Wang Xue;
2011 / IEEE / 978-1-4577-0861-9
By: Mangan, B.J.; Mosley, P.J.; Yu, F.; Muir, A.C.; Wadsworth, W.J.; Hooper, L.E.; Dudley, J.M.; Knight, J.C.;
By: Mangan, B.J.; Mosley, P.J.; Yu, F.; Muir, A.C.; Wadsworth, W.J.; Hooper, L.E.; Dudley, J.M.; Knight, J.C.;
2011 / IEEE / 978-1-4244-8939-8
By: Loh, W.; Klamkin, J.; Plant, J.J.; Juodawlkis, P.W.; Madison, S.M.; Yegnanarayanan, S.; Grein, M.E.;
By: Loh, W.; Klamkin, J.; Plant, J.J.; Juodawlkis, P.W.; Madison, S.M.; Yegnanarayanan, S.; Grein, M.E.;
2011 / IEEE / 978-1-4244-8939-8
By: Sorimachi, M.; Higa, Y.; Miyamoto, T.; Matsutani, A.; Iwasaki, H.; Nishinome, T.;
By: Sorimachi, M.; Higa, Y.; Miyamoto, T.; Matsutani, A.; Iwasaki, H.; Nishinome, T.;
2011 / IEEE / 978-1-4244-8939-8
By: Kainzmaier, P.; Spinnler, B.; Inan, B.; Karakaya, O.; Jansen, S.L.; Hanik, N.;
By: Kainzmaier, P.; Spinnler, B.; Inan, B.; Karakaya, O.; Jansen, S.L.; Hanik, N.;
2011 / IEEE / 978-1-4244-8939-8
By: Tran, M.; Faugeron, M.; Van Dijk, F.; Jacquet, J.; Enard, A.; Vinet, E.; Robert, Y.; Chtioui, M.;
By: Tran, M.; Faugeron, M.; Van Dijk, F.; Jacquet, J.; Enard, A.; Vinet, E.; Robert, Y.; Chtioui, M.;
2011 / IEEE / 978-0-9775657-8-8
By: Sang Eon Park; Sang Bum Lee; Ki-Se Lee; Jaewan Kim; Taeg Yong Kwon;
By: Sang Eon Park; Sang Bum Lee; Ki-Se Lee; Jaewan Kim; Taeg Yong Kwon;
2011 / IEEE / 978-0-9775657-8-8
By: Inoue, T.; Edamura, T.; Fujita, K.; Akikusa, N.; Kasahara, K.; Kataoka, T.; Tsushima, K.;
By: Inoue, T.; Edamura, T.; Fujita, K.; Akikusa, N.; Kasahara, K.; Kataoka, T.; Tsushima, K.;
2011 / IEEE / 978-0-9775657-8-8
By: Tao Fang; Ying Zhang; Yanwei Wang; Guang Zheng; Jing Chen; Hua Cheng; Yong Bi; Boxia Yan; Yan Qi; Bin Wang;
By: Tao Fang; Ying Zhang; Yanwei Wang; Guang Zheng; Jing Chen; Hua Cheng; Yong Bi; Boxia Yan; Yan Qi; Bin Wang;
2011 / IEEE / 978-0-9775657-8-8
By: Chang Su Jun; Dong-Il Yeom; Rotermund, F.; Sun Young Choi; Byoung Yoon Kim; Sang Hwa Yoo; Ju Hee Im;
By: Chang Su Jun; Dong-Il Yeom; Rotermund, F.; Sun Young Choi; Byoung Yoon Kim; Sang Hwa Yoo; Ju Hee Im;