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Topic: Laser Modes
Results
2011 / IEEE
By: Lujian Chen; Duanduan Wu; Min Zhou; Zhengqian Luo; Chenchun Ye; Zhiping Cai; Huiying Xu; Jun Dong; Jian Weng;
By: Lujian Chen; Duanduan Wu; Min Zhou; Zhengqian Luo; Chenchun Ye; Zhiping Cai; Huiying Xu; Jun Dong; Jian Weng;
2011 / IEEE
By: Labate, L.; Koester, P.; Giulietti, D.; Giulietti, A.; Levato, T.; Gizzi, L.A.; Cecchetti, C.A.; Pathak, N.;
By: Labate, L.; Koester, P.; Giulietti, D.; Giulietti, A.; Levato, T.; Gizzi, L.A.; Cecchetti, C.A.; Pathak, N.;
2011 / IEEE
By: Yongdong Li; Hongguang Wang; Jianqi Wang; Chunliang Liu; Qiaogen Zhang; Ruopeng Wang;
By: Yongdong Li; Hongguang Wang; Jianqi Wang; Chunliang Liu; Qiaogen Zhang; Ruopeng Wang;
2011 / IEEE
By: Zuowei Yin; Johnson, M.B.; Santos, M.B.; Mishima, T.D.; Yang, R.Q.; Zhaobing Tian; Yuchao Jiang;
By: Zuowei Yin; Johnson, M.B.; Santos, M.B.; Mishima, T.D.; Yang, R.Q.; Zhaobing Tian; Yuchao Jiang;
2011 / IEEE
By: Hamacher, M.; Syvridis, D.; Mesaritakis, C.; Stamataki, I.; Kapsalis, A.; Heidrich, H.;
By: Hamacher, M.; Syvridis, D.; Mesaritakis, C.; Stamataki, I.; Kapsalis, A.; Heidrich, H.;
2011 / IEEE
By: Bogoni, A.; Cruz, J.L.; Palaci, J.; Villanueva, G.E.; Perez-Millan, P.; Ghelfi, P.; Serafino, G.;
By: Bogoni, A.; Cruz, J.L.; Palaci, J.; Villanueva, G.E.; Perez-Millan, P.; Ghelfi, P.; Serafino, G.;
2011 / IEEE
By: Bawamia, A.I.; Erbert, G.; Sumpf, B.; Thomas, M.; Spiesserger, S.; Ginolas, A.; Eppich, B.; Blume, G.;
By: Bawamia, A.I.; Erbert, G.; Sumpf, B.; Thomas, M.; Spiesserger, S.; Ginolas, A.; Eppich, B.; Blume, G.;
2012 / IEEE
By: Shambat, G.; Ellis, B.; Petykiewicz, J.; Mayer, M.A.; Vuckovic, J.; Sarmiento, T.; Harris, J.S.; Haller, E.E.; Majumdar, A.;
By: Shambat, G.; Ellis, B.; Petykiewicz, J.; Mayer, M.A.; Vuckovic, J.; Sarmiento, T.; Harris, J.S.; Haller, E.E.; Majumdar, A.;
2012 / IEEE
By: Miller, C.L.; Flicker, D.G.; Webb, T.J.; Oliver, B.V.; Campbell, R.B.; Rose, D.V.; Welch, D.R.;
By: Miller, C.L.; Flicker, D.G.; Webb, T.J.; Oliver, B.V.; Campbell, R.B.; Rose, D.V.; Welch, D.R.;
2012 / IEEE
By: Ermakov, I.V.; Verschaffelt, G.; Leijtens, X.J.M.; Bolk, J.; Docter, B.; Danckaert, J.; Ashour, M.; Beri, S.;
By: Ermakov, I.V.; Verschaffelt, G.; Leijtens, X.J.M.; Bolk, J.; Docter, B.; Danckaert, J.; Ashour, M.; Beri, S.;
2012 / IEEE
By: Hamacher, M.; Syvridis, D.; Mesaritakis, C.; Stamataki, I.; Kapsalis, A.; Heidrich, H.;
By: Hamacher, M.; Syvridis, D.; Mesaritakis, C.; Stamataki, I.; Kapsalis, A.; Heidrich, H.;
2012 / IEEE
By: Di Matteo, F.M.; Caponero, M.A.; Schena, E.; Saccomandi, P.; Silvestri, S.; Pandolfi, M.; Martino, M.;
By: Di Matteo, F.M.; Caponero, M.A.; Schena, E.; Saccomandi, P.; Silvestri, S.; Pandolfi, M.; Martino, M.;
Experimental Measurements of Path Length Sensitivity in Coherent Beam Combining by Spatial Filtering
2012 / IEEEBy: Chenhao Wan; Leger, J.R.;
2012 / IEEE
By: Holopainen, M.; Vastaranta, M.; Kaartinen, H.; Hyyppa, J.; Litkey, P.; Xinlian Liang;
By: Holopainen, M.; Vastaranta, M.; Kaartinen, H.; Hyyppa, J.; Litkey, P.; Xinlian Liang;
2012 / IEEE
By: Giddings, R.P.; Jin, X.Q.; Hugues-Salas, E.; Tang, J.M.; Villafranca, A.; Mansoor, S.; Hong, Y.;
By: Giddings, R.P.; Jin, X.Q.; Hugues-Salas, E.; Tang, J.M.; Villafranca, A.; Mansoor, S.; Hong, Y.;
2012 / IEEE
By: Anandarajah, P.M.; Barry, L.P.; O'Gorman, J.; Kelly, B.; Phelan, R.; O'Carroll, J.; Zhou, R.; Browning, C.; Latkowski, S.;
By: Anandarajah, P.M.; Barry, L.P.; O'Gorman, J.; Kelly, B.; Phelan, R.; O'Carroll, J.; Zhou, R.; Browning, C.; Latkowski, S.;
2012 / IEEE
By: Perez-Herrera, R.A.; Lopez-Amo, M.; Lopez-Higuera, J.M.; Loayssa, A.; Quintela, M.A.; Fernandez-Vallejo, M.; Leandro, D.; Ullan, A.;
By: Perez-Herrera, R.A.; Lopez-Amo, M.; Lopez-Higuera, J.M.; Loayssa, A.; Quintela, M.A.; Fernandez-Vallejo, M.; Leandro, D.; Ullan, A.;
2012 / IEEE
By: Goetz, P.G.; Reese, S.; Mahon, R.; Murphy, J.L.; Ferraro, M.S.; Suite, M.R.; Smith, W.R.; Burris, H.R.; Moore, C.I.; Schultz, W.W.; Freeman, W.T.; Frawley, S.J.; Mathieu, B.M.; Hacker, K.; Rabinovich, W.S.;
By: Goetz, P.G.; Reese, S.; Mahon, R.; Murphy, J.L.; Ferraro, M.S.; Suite, M.R.; Smith, W.R.; Burris, H.R.; Moore, C.I.; Schultz, W.W.; Freeman, W.T.; Frawley, S.J.; Mathieu, B.M.; Hacker, K.; Rabinovich, W.S.;
2012 / IEEE
By: Mergo, P.; Nasilowski, T.; Beres-Pawlik, E.; Napierala, M.; Thienpont, H.; Berghmans, F.;
By: Mergo, P.; Nasilowski, T.; Beres-Pawlik, E.; Napierala, M.; Thienpont, H.; Berghmans, F.;
2012 / IEEE
By: Yue-De Yang; Yong-Zhen Huang; Jian-Dong Lin; Ling-Xiu Zou; Qi-Feng Yao; Xiao-Meng Lv; Yun Du; Jin-Long Xiao;
By: Yue-De Yang; Yong-Zhen Huang; Jian-Dong Lin; Ling-Xiu Zou; Qi-Feng Yao; Xiao-Meng Lv; Yun Du; Jin-Long Xiao;
2012 / IEEE
By: Lamponi, M.; Duan, G.H.; Fedeli, J.-M.; Messaoudene, S.; Van Thourhout, D.; Roelkens, G.; de Valicourt, G.; Lelarge, F.; Poingt, F.; Jany, C.; Keyvaninia, S.;
By: Lamponi, M.; Duan, G.H.; Fedeli, J.-M.; Messaoudene, S.; Van Thourhout, D.; Roelkens, G.; de Valicourt, G.; Lelarge, F.; Poingt, F.; Jany, C.; Keyvaninia, S.;
2012 / IEEE
By: Wei-Hua Guo; Donegan, J.F.; Weldon, V.; Lynch, M.; Qiaoyin Lu; O'Callaghan, J.; Abdullaev, A.; Nawrocka, M.;
By: Wei-Hua Guo; Donegan, J.F.; Weldon, V.; Lynch, M.; Qiaoyin Lu; O'Callaghan, J.; Abdullaev, A.; Nawrocka, M.;