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Topic: Laser Feedback
Results
Tradeoffs in the Realization of Electrically Pumped Vertical External Cavity Surface Emitting Lasers
2011 / IEEEBy: Lin, L.C.; Childs, D.T.; Orchard, J.R.; Hogg, R.A.; Williams, D.M.; Stevens, B.J.;
2011 / IEEE
By: Nian Qiang Li; Lei Yang; Ning Jiang; Xi Hua Zou; Shui Ying Xiang; Bin Luo; Wei Pan; Lian Shan Yan;
By: Nian Qiang Li; Lei Yang; Ning Jiang; Xi Hua Zou; Shui Ying Xiang; Bin Luo; Wei Pan; Lian Shan Yan;
2012 / IEEE
By: Ermakov, I.V.; Verschaffelt, G.; Leijtens, X.J.M.; Bolk, J.; Docter, B.; Danckaert, J.; Ashour, M.; Beri, S.;
By: Ermakov, I.V.; Verschaffelt, G.; Leijtens, X.J.M.; Bolk, J.; Docter, B.; Danckaert, J.; Ashour, M.; Beri, S.;
Flat Broadband Chaos in Vertical-Cavity Surface-Emitting Lasers Subject to Chaotic Optical Injection
2012 / IEEEBy: Shore, K.A.; Spencer, P.S.; Yanhua Hong;
2012 / IEEE
By: John, W.; Ginolas, A.; Brox, O.P.; Bugge, F.; Ressel, P.; Fricke, J.; Erbert, G.; Wenzel, H.; Weixelbaum, L.;
By: John, W.; Ginolas, A.; Brox, O.P.; Bugge, F.; Ressel, P.; Fricke, J.; Erbert, G.; Wenzel, H.; Weixelbaum, L.;
2012 / IEEE
By: Xi Hua Zou; Lian Shan Yan; Bin Luo; Wei Pan; Ning Jiang; Hong Na Zhu; Shui Ying Xiang; Nian Qiang Li;
By: Xi Hua Zou; Lian Shan Yan; Bin Luo; Wei Pan; Ning Jiang; Hong Na Zhu; Shui Ying Xiang; Nian Qiang Li;
2012 / IEEE
By: Xiao-Dong Lin; Yi-Yuan Xie; Guang-Qiong Xia; Zhu-Qiang Zhong; Li Fan; Zheng-Mao Wu; Tao Deng;
By: Xiao-Dong Lin; Yi-Yuan Xie; Guang-Qiong Xia; Zhu-Qiang Zhong; Li Fan; Zheng-Mao Wu; Tao Deng;
2012 / IEEE
By: Bosman, E.; Van Hoe, B.; Van Steenberge, G.; Van Daele, P.; Godier, G.; De Geyter, T.; Melpignano, G.; Kalathimekkad, S.; Missinne, J.;
By: Bosman, E.; Van Hoe, B.; Van Steenberge, G.; Van Daele, P.; Godier, G.; De Geyter, T.; Melpignano, G.; Kalathimekkad, S.; Missinne, J.;
2012 / IEEE
By: Bowers, J.E.; Spencer, D.T.; Zhihong Huang; Fiorentino, M.; Beausoleil, R.G.; Srinivasan, S.; Di Liang; Fattal, D.A.;
By: Bowers, J.E.; Spencer, D.T.; Zhihong Huang; Fiorentino, M.; Beausoleil, R.G.; Srinivasan, S.; Di Liang; Fattal, D.A.;
2012 / IEEE
By: Liyue Zhang; Nianqiang Li; Shuiying Xiang; Xihua Zou; Bin Luo; Lianshan Yan; Wei Pan;
By: Liyue Zhang; Nianqiang Li; Shuiying Xiang; Xihua Zou; Bin Luo; Lianshan Yan; Wei Pan;
2012 / IEEE
By: Shui Ying Xiang; Penghua Mu; Liyue Zhang; Xi Hua Zou; Lian Shan Yan; Bin Luo; Nian Qiang Li; Wei Pan;
By: Shui Ying Xiang; Penghua Mu; Liyue Zhang; Xi Hua Zou; Lian Shan Yan; Bin Luo; Nian Qiang Li; Wei Pan;
2012 / IEEE
By: Sugimoto, Y.; Ikeda, N.; Hogg, R.A.; Khamas, S.; Williams, D.M.; Childs, D.T.D.; Stevens, B.J.; Groom, K.M.; Taylor, R.J.E.;
By: Sugimoto, Y.; Ikeda, N.; Hogg, R.A.; Khamas, S.; Williams, D.M.; Childs, D.T.D.; Stevens, B.J.; Groom, K.M.; Taylor, R.J.E.;
2012 / IEEE
By: Ye Li; Yang Zhao; Erjun Zang; Tianchu Li; Zhanjun Fang; Fei Meng; Qiang Wang; Shiying Cao; Baike Lin; Shaokai Wang; Yige Lin; Jianping Cao;
By: Ye Li; Yang Zhao; Erjun Zang; Tianchu Li; Zhanjun Fang; Fei Meng; Qiang Wang; Shiying Cao; Baike Lin; Shaokai Wang; Yige Lin; Jianping Cao;
2006 / IEEE / 978-3-9805741-8-1
By: Wicht, A.; Danzmann, K.; Rinkleff, R.-H.; Huke, P.; Schiller, S.; Chepurov, S.; Ernsting, I.; Strauss, N.;
By: Wicht, A.; Danzmann, K.; Rinkleff, R.-H.; Huke, P.; Schiller, S.; Chepurov, S.; Ernsting, I.; Strauss, N.;
2011 / IEEE / 978-986-02-8974-9
By: Chuan-Pi Hsu; Tsu-Chiang Yen; Wang-Chuang Kuo; Da-Long Cheng; Yu-Heng Wu;
By: Chuan-Pi Hsu; Tsu-Chiang Yen; Wang-Chuang Kuo; Da-Long Cheng; Yu-Heng Wu;
2011 / IEEE / 978-1-55752-932-9
By: Podivilov, E.V.; Harper, P.; El-Taher, A.E.; Babin, S.A.; Turitsyn, S.K.; Churkin, D.;
By: Podivilov, E.V.; Harper, P.; El-Taher, A.E.; Babin, S.A.; Turitsyn, S.K.; Churkin, D.;
2011 / IEEE / 978-1-4577-0509-0
By: Kalinin, P.V.; Arzhannikov, A.V.; Sergeev, A.S.; Peskov, N.Y.; Ginzburg, N.S.; Thumm, M.; Sinitsky, S.L.;
By: Kalinin, P.V.; Arzhannikov, A.V.; Sergeev, A.S.; Peskov, N.Y.; Ginzburg, N.S.; Thumm, M.; Sinitsky, S.L.;
2011 / IEEE / 978-1-4577-0509-0
By: Kuwashima, F.; Iwasawa, H.; Nagashima, T.; Hangyo, M.; Takei, K.; Kurihara, K.; Tani, M.; Fujii, T.;
By: Kuwashima, F.; Iwasawa, H.; Nagashima, T.; Hangyo, M.; Takei, K.; Kurihara, K.; Tani, M.; Fujii, T.;
2011 / IEEE / 978-1-4244-8939-8
By: Amemiya, T.; Koguchi, T.; Osabe, R.; Futami, M.; Shindo, T.; Arai, S.; Nishiyama, N.;
By: Amemiya, T.; Koguchi, T.; Osabe, R.; Futami, M.; Shindo, T.; Arai, S.; Nishiyama, N.;
2011 / IEEE / 978-1-4244-8939-8
By: Tran, M.; Faugeron, M.; Van Dijk, F.; Jacquet, J.; Enard, A.; Vinet, E.; Robert, Y.; Chtioui, M.;
By: Tran, M.; Faugeron, M.; Van Dijk, F.; Jacquet, J.; Enard, A.; Vinet, E.; Robert, Y.; Chtioui, M.;
2011 / IEEE / 978-1-4244-8939-8
By: White, I.H.; Penty, R.V.; Wonfor, A.; Lee, S.H.; Wale, M.; Cush, R.; Busico, G.;
By: White, I.H.; Penty, R.V.; Wonfor, A.; Lee, S.H.; Wale, M.; Cush, R.; Busico, G.;
2011 / IEEE / 978-1-4244-8939-8
By: Naderi, N.A.; Grillot, F.; Lester, L.F.; Crowley, M.T.; Raghunathan, R.; Rahimi, N.; Wright, J.B.;
By: Naderi, N.A.; Grillot, F.; Lester, L.F.; Crowley, M.T.; Raghunathan, R.; Rahimi, N.; Wright, J.B.;
2011 / IEEE / 978-0-9775657-8-8
By: Inoue, T.; Edamura, T.; Fujita, K.; Akikusa, N.; Kasahara, K.; Kataoka, T.; Tsushima, K.;
By: Inoue, T.; Edamura, T.; Fujita, K.; Akikusa, N.; Kasahara, K.; Kataoka, T.; Tsushima, K.;
2011 / IEEE / 978-0-9775657-8-8
By: Gong-Ru Lin; Ting-Hsiao Wu; Kun-Yu Lee; Yao-Tsu Yang; Jia-Min Shieh; Hau-Wei Hung; Jiun Ru Huang; Chih-Kuo Tseng; Lee, M.-C.M.;
By: Gong-Ru Lin; Ting-Hsiao Wu; Kun-Yu Lee; Yao-Tsu Yang; Jia-Min Shieh; Hau-Wei Hung; Jiun Ru Huang; Chih-Kuo Tseng; Lee, M.-C.M.;
2012 / IEEE / 978-1-55752-935-1
By: Mao, B.; Zhao, Y.; Stojanovic, N.; Chen, M.; Hauske, F.N.; Xie, C.;
By: Mao, B.; Zhao, Y.; Stojanovic, N.; Chen, M.; Hauske, F.N.; Xie, C.;
2012 / IEEE / 978-1-4577-1619-5
By: Arai, S.; Nishiyama, N.; Amemiya, T.; Doi, K.; Shindo, T.; Shinno, K.; Futami, M.;
By: Arai, S.; Nishiyama, N.; Amemiya, T.; Doi, K.; Shindo, T.; Shinno, K.; Futami, M.;
2012 / IEEE / 978-1-4577-1820-5
By: Kovanis, V.; Usechak, N.; AlMulla, M.; Jia-Ming Liu; Simpson, T.B.;
By: Kovanis, V.; Usechak, N.; AlMulla, M.; Jia-Ming Liu; Simpson, T.B.;
2012 / IEEE / 978-1-4673-2229-4
By: Schmeckebier, H.; Stracke, G.; Stubenrauch, M.; Bimberg, D.; Arsenijevic, D.;
By: Schmeckebier, H.; Stracke, G.; Stubenrauch, M.; Bimberg, D.; Arsenijevic, D.;
2012 / IEEE / 978-1-4673-2229-4
By: Weihua Guo; Qiaoyin Lu; Donegan, J.F.; Weldon, V.; Lynch, M.; O'Callaghan, J.; Nawrocka, M.; Abdullaev, A.;
By: Weihua Guo; Qiaoyin Lu; Donegan, J.F.; Weldon, V.; Lynch, M.; O'Callaghan, J.; Nawrocka, M.; Abdullaev, A.;
2012 / IEEE / 978-1-4577-1527-3
By: Schultz, C.M.; Crump, P.; Erbert, G.; Weyers, M.; Sumpf, B.; Knigge, S.; Wenzel, H.; Mogilatenko, A.; Bugge, F.; Brox, O.; Maassdorf, A.;
By: Schultz, C.M.; Crump, P.; Erbert, G.; Weyers, M.; Sumpf, B.; Knigge, S.; Wenzel, H.; Mogilatenko, A.; Bugge, F.; Brox, O.; Maassdorf, A.;
2012 / IEEE / 978-1-4577-1527-3
By: Li, Yufeng; Treusch, Georg; Strohmaier, Stephan; Barnowski, Tobias; Negoita, Viorel;
By: Li, Yufeng; Treusch, Georg; Strohmaier, Stephan; Barnowski, Tobias; Negoita, Viorel;
2012 / IEEE
By: Arai, K.; Sunada, S.; Harayama, T.; Uchida, A.; Yoshimura, K.; Akizawa, Y.; Yamazaki, T.; Davis, P.;
By: Arai, K.; Sunada, S.; Harayama, T.; Uchida, A.; Yoshimura, K.; Akizawa, Y.; Yamazaki, T.; Davis, P.;
2013 / IEEE
By: Danckaert, J.; Soriano, M. C.; Van der Sande, G.; Nguimdo, R. M.; Mashal, L.; Verschaffelt, G.;
By: Danckaert, J.; Soriano, M. C.; Van der Sande, G.; Nguimdo, R. M.; Mashal, L.; Verschaffelt, G.;
2013 / IEEE
By: Schnabel, Florian; Rippien, Anna; Gilfert, Christian; Sichkovskyi, Vitalii; Ivanov, Vitalii; Reithmaier, Johann Peter; Eisenstein, Gadi; Gready, David;
By: Schnabel, Florian; Rippien, Anna; Gilfert, Christian; Sichkovskyi, Vitalii; Ivanov, Vitalii; Reithmaier, Johann Peter; Eisenstein, Gadi; Gready, David;
2008 / American Institute of Physics
By: Richard P. Green; Ji-Hua Xu; Lukas Mahler; Alessandro Tredicucci; Fabio Beltram; Guido Giuliani; Harvey E. Beere; David A. Ritchie;
By: Richard P. Green; Ji-Hua Xu; Lukas Mahler; Alessandro Tredicucci; Fabio Beltram; Guido Giuliani; Harvey E. Beere; David A. Ritchie;
2015 / IEEE
By: Slipchenko, S.O.; Simakov, V.A.; Padalitsa, A.A.; Marmalyuk, A.A.; Podoskin, A.A.; Bagaev, T.A.; Tarasov, I.S.; Pikhtin, N.A.; Rozhkov, A.V.; Ladugin, M.A.;
By: Slipchenko, S.O.; Simakov, V.A.; Padalitsa, A.A.; Marmalyuk, A.A.; Podoskin, A.A.; Bagaev, T.A.; Tarasov, I.S.; Pikhtin, N.A.; Rozhkov, A.V.; Ladugin, M.A.;
First demonstration of a WDM-PON system using full C-band tunable SFP+ transceiver modules [invited]
2015 / IEEEBy: Zhu, Jiannan; Elbers, Jorg-Peter; White, Ian H.; Wale, Mike; Firth, Paul; Pachnicke, Stephan; Cush, Rosie; Penty, Richard V.; Wonfor, Adrian; Mayne, Stephen; Lawin, Mirko; Turner, Richard;