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Topic: Laser Excitation
Results
2011 / IEEE
By: Kuan, H.; Yang, J.R.; Li, W.C.; Sun, W.C.; Shiojiri, M.; Chen, M.J.; Huang, Y.H.; Chen, H.C.;
By: Kuan, H.; Yang, J.R.; Li, W.C.; Sun, W.C.; Shiojiri, M.; Chen, M.J.; Huang, Y.H.; Chen, H.C.;
2011 / IEEE
By: Lujian Chen; Duanduan Wu; Min Zhou; Zhengqian Luo; Chenchun Ye; Zhiping Cai; Huiying Xu; Jun Dong; Jian Weng;
By: Lujian Chen; Duanduan Wu; Min Zhou; Zhengqian Luo; Chenchun Ye; Zhiping Cai; Huiying Xu; Jun Dong; Jian Weng;
2011 / IEEE
By: Bingham, R.; Silva, L.O.; Fonseca, R.A.; Fiuza, F.; Trines, R.M.G.M.; Norreys, P.A.; Cairns, R.A.;
By: Bingham, R.; Silva, L.O.; Fonseca, R.A.; Fiuza, F.; Trines, R.M.G.M.; Norreys, P.A.; Cairns, R.A.;
Tradeoffs in the Realization of Electrically Pumped Vertical External Cavity Surface Emitting Lasers
2011 / IEEEBy: Lin, L.C.; Childs, D.T.; Orchard, J.R.; Hogg, R.A.; Williams, D.M.; Stevens, B.J.;
2011 / IEEE
By: Yawei Yin; Geisler, D.J.; Yoo, S.J.B.; Shuo Chang; Scott, R.P.; Fontaine, N.K.; Ke Wen;
By: Yawei Yin; Geisler, D.J.; Yoo, S.J.B.; Shuo Chang; Scott, R.P.; Fontaine, N.K.; Ke Wen;
2011 / IEEE
By: Malcolm, G.; Maker, G.; Robertson, G.; Butkus, M.; Rafailov, E.U.; Hamilton, C.; Yang Qiu; Walther, T.; Hogg, R.A.; Stevens, B.J.; Krysa, A.B.;
By: Malcolm, G.; Maker, G.; Robertson, G.; Butkus, M.; Rafailov, E.U.; Hamilton, C.; Yang Qiu; Walther, T.; Hogg, R.A.; Stevens, B.J.; Krysa, A.B.;
2012 / IEEE
By: Jianzhou Wang; Yi Xu; Yanyan Li; Yansui Huang; Xiaoming Lu; Zhizhan Xu; Ruxin Li; Yuxin Leng;
By: Jianzhou Wang; Yi Xu; Yanyan Li; Yansui Huang; Xiaoming Lu; Zhizhan Xu; Ruxin Li; Yuxin Leng;
2012 / IEEE
By: Shambat, G.; Ellis, B.; Petykiewicz, J.; Mayer, M.A.; Vuckovic, J.; Sarmiento, T.; Harris, J.S.; Haller, E.E.; Majumdar, A.;
By: Shambat, G.; Ellis, B.; Petykiewicz, J.; Mayer, M.A.; Vuckovic, J.; Sarmiento, T.; Harris, J.S.; Haller, E.E.; Majumdar, A.;
2012 / IEEE
By: Jin-Chai Li; Chia-Cheng Tu; Ching-Hsueh Chiu; Shih-Cheng Huang; Po-Min Tu; Chien-Chung Lin; Zhen-Yu Li; Chun-Yen Chang; Shing-Chung Wang; Hao-Chung Kuo; Tien-Chang Lu; Hsiao-Wen Zan; Wu-Yih Uen;
By: Jin-Chai Li; Chia-Cheng Tu; Ching-Hsueh Chiu; Shih-Cheng Huang; Po-Min Tu; Chien-Chung Lin; Zhen-Yu Li; Chun-Yen Chang; Shing-Chung Wang; Hao-Chung Kuo; Tien-Chang Lu; Hsiao-Wen Zan; Wu-Yih Uen;
2012 / IEEE
By: Hai-Yu Wang; Bing-Rong Gao; Hong-Bo Sun; Qi-Dai Chen; Ya-Wei Hao; Ying Jiang; Lei Wang; Zhi-Yong Yang; Hai Wang;
By: Hai-Yu Wang; Bing-Rong Gao; Hong-Bo Sun; Qi-Dai Chen; Ya-Wei Hao; Ying Jiang; Lei Wang; Zhi-Yong Yang; Hai Wang;
2012 / IEEE
By: Yabashi, M.; Kimura, H.; Tono, K.; Matsubara, S.; Togashi, T.; Nagasono, M.; Fukuda, T.; Higashiya, A.; Wakamiya, A.; Kano, M.; Sarukura, N.; Shimizu, T.; Nakazato, T.; Cadatal-Raduban, M.; Sakai, K.; Yamanoi, K.; Ishikawa, T.; Ohashi, H.;
By: Yabashi, M.; Kimura, H.; Tono, K.; Matsubara, S.; Togashi, T.; Nagasono, M.; Fukuda, T.; Higashiya, A.; Wakamiya, A.; Kano, M.; Sarukura, N.; Shimizu, T.; Nakazato, T.; Cadatal-Raduban, M.; Sakai, K.; Yamanoi, K.; Ishikawa, T.; Ohashi, H.;
Investigation on Back-Reflected Pumping Light in High-Power Quasi-End-Pumped Yb:YAG Thin-Disk Lasers
2012 / IEEEBy: Radmard, S.; Kazemi, S.; Shayganmanesh, M.; Arabgari, S.;
2012 / IEEE
By: Weixia Lan; Xuebin Wan; Zhaojun Liu; Xingyu Zhang; Guofan Jin; Qingpu Wang; Fen Bai; Huaijin Zhang;
By: Weixia Lan; Xuebin Wan; Zhaojun Liu; Xingyu Zhang; Guofan Jin; Qingpu Wang; Fen Bai; Huaijin Zhang;
2012 / IEEE
By: Andres, M. V.; Sanchez-Martin, J. A.; Diez, A.; Rebolledo, M. A.; Berdejo, V.; Valles, J. A.;
By: Andres, M. V.; Sanchez-Martin, J. A.; Diez, A.; Rebolledo, M. A.; Berdejo, V.; Valles, J. A.;
2012 / IEEE
By: Orofino, C.; Kanibolotsky, A.L.; Chen, Y.; Herrnsdorf, J.; Skabara, P.J.; Guilhabert, B.; Laurand, N.; Dawson, M.D.;
By: Orofino, C.; Kanibolotsky, A.L.; Chen, Y.; Herrnsdorf, J.; Skabara, P.J.; Guilhabert, B.; Laurand, N.; Dawson, M.D.;
2012 / IEEE
By: Huang, J.Y.T.; Jeng-Ya Yeh; Menoni, C.S.; Pikal, J.M.; Mawst, L.J.; Patel, D.; Lifang Xu; Tansu, N.;
By: Huang, J.Y.T.; Jeng-Ya Yeh; Menoni, C.S.; Pikal, J.M.; Mawst, L.J.; Patel, D.; Lifang Xu; Tansu, N.;
2012 / IEEE
By: Dong-Yo Jheng; Kuang-Yu Hsu; Sheng-Lung Huang; Chien-Chih Lai; Tuan-Shu Ho; Yi-Han Liao;
By: Dong-Yo Jheng; Kuang-Yu Hsu; Sheng-Lung Huang; Chien-Chih Lai; Tuan-Shu Ho; Yi-Han Liao;
2012 / IEEE
By: Quarterman, A.H.; Kbashi, H.J.; Wilcox, K.G.; Tropper, A.C.; Henini, M.; Apostolopoulos, V.; Morris, O.J.;
By: Quarterman, A.H.; Kbashi, H.J.; Wilcox, K.G.; Tropper, A.C.; Henini, M.; Apostolopoulos, V.; Morris, O.J.;
2012 / IEEE
By: Ebendorff-Heidepriem, H.; Oermann, M.R.; Monro, T.M.; Veitch, P.J.; Lancaster, D.G.; Ottaway, D.J.;
By: Ebendorff-Heidepriem, H.; Oermann, M.R.; Monro, T.M.; Veitch, P.J.; Lancaster, D.G.; Ottaway, D.J.;
2012 / IEEE
By: Modotto, D.; Tonello, A.; Bettenzana, M.; Krupa, K.; Manili, G.; Wabnitz, S.; Barthelemy, A.; Di Bin, P.; Couderc, V.;
By: Modotto, D.; Tonello, A.; Bettenzana, M.; Krupa, K.; Manili, G.; Wabnitz, S.; Barthelemy, A.; Di Bin, P.; Couderc, V.;
2012 / IEEE
By: Haiwen Cai; Fei Yang; Zhengqing Pan; Qing Ye; Ronghui Qu; Yunqi Hao; Zhongmin Yang; Qinyuan Zhang;
By: Haiwen Cai; Fei Yang; Zhengqing Pan; Qing Ye; Ronghui Qu; Yunqi Hao; Zhongmin Yang; Qinyuan Zhang;
2012 / IEEE
By: Bauer-Marschallinger, J.; Burgholzer, P.; Reitinger, B.; Roitner, H.; Grun, H.; Berer, T.;
By: Bauer-Marschallinger, J.; Burgholzer, P.; Reitinger, B.; Roitner, H.; Grun, H.; Berer, T.;
2012 / IEEE
By: Shori, R.K.; Poutous, M.K.; Pung, A.J.; Woodward, R.H.; Srimathi, I.R.; Yuan Li; Johnson, E.G.;
By: Shori, R.K.; Poutous, M.K.; Pung, A.J.; Woodward, R.H.; Srimathi, I.R.; Yuan Li; Johnson, E.G.;
2012 / IEEE
By: Pasternak, I.; Abramski, K. M.; Sotor, J.; Sobon, G.; Grodecki, K.; Jankiewicz, Z.; Strupinski, W.; Paletko, P.;
By: Pasternak, I.; Abramski, K. M.; Sotor, J.; Sobon, G.; Grodecki, K.; Jankiewicz, Z.; Strupinski, W.; Paletko, P.;
2012 / IEEE
By: Gilfert, C.; Krakowski, M.; Michel, N.; Traub, M.; Westphalen, T.; Reithmaier, J.P.; Pavelescu, E.-M.;
By: Gilfert, C.; Krakowski, M.; Michel, N.; Traub, M.; Westphalen, T.; Reithmaier, J.P.; Pavelescu, E.-M.;
1992 / IEEE / 000-0-0000-0000-0
By: Kasuya, K.; Ohshita, E.; Kawakita, Y.; Miyai, Y.; Nakata, K.; Miyoshi, T.; Matsuura, N.; Hushiki, T.; Horioka, K.;
By: Kasuya, K.; Ohshita, E.; Kawakita, Y.; Miyai, Y.; Nakata, K.; Miyoshi, T.; Matsuura, N.; Hushiki, T.; Horioka, K.;
1992 / IEEE / 000-0-0000-0000-0
By: Kuznetsov, V.E.; Ovsyannikov, V.A.; Jeremkin, V.V.; Vodovosov, V.M.; Vasilevsky, M.A.; Burtsev, V.A.; Bolshakov, E.P.; Streltsov, A.P.; Baranov, V.Y.; Chetvertkov, V.L.; Cheraobrovin, V.I.; Finkelstein, K.I.; Pidelskaya, R.F.; Prokopenko, V.F.; Peohersky, O.P.;
By: Kuznetsov, V.E.; Ovsyannikov, V.A.; Jeremkin, V.V.; Vodovosov, V.M.; Vasilevsky, M.A.; Burtsev, V.A.; Bolshakov, E.P.; Streltsov, A.P.; Baranov, V.Y.; Chetvertkov, V.L.; Cheraobrovin, V.I.; Finkelstein, K.I.; Pidelskaya, R.F.; Prokopenko, V.F.; Peohersky, O.P.;
2002 / IEEE / 978-0-7354-0107-5
By: Roth, Markus; Cowan, Thomas E.; Schlegel, Theodor; Ruhl, Hartmut; Karsch, Stefan; Hegelich, Manuel; Gauthier, Jean-Claude; Vehn, Jurgen Meyer-ter; Allen, Matthew; Audebert, Patrick; Blazevic, Abel; Brambrink, Erik; Fuchs, Julien; Geissel, Matthias;
By: Roth, Markus; Cowan, Thomas E.; Schlegel, Theodor; Ruhl, Hartmut; Karsch, Stefan; Hegelich, Manuel; Gauthier, Jean-Claude; Vehn, Jurgen Meyer-ter; Allen, Matthew; Audebert, Patrick; Blazevic, Abel; Brambrink, Erik; Fuchs, Julien; Geissel, Matthias;
2006 / IEEE / 978-3-9805741-8-1
By: Eikema, K.S.E.; Zinkstok, R.T.; Witte, S.; Hogervorst, W.; Ubachs, W.;
By: Eikema, K.S.E.; Zinkstok, R.T.; Witte, S.; Hogervorst, W.; Ubachs, W.;
2011 / IEEE / 978-1-4244-5731-1
By: Ehrenreich, T.; Christensen, S.; Samson, B.; Wei, K.; Farley, K.; Majid, I.;
By: Ehrenreich, T.; Christensen, S.; Samson, B.; Wei, K.; Farley, K.; Majid, I.;
2011 / IEEE / 978-3-00-035081-8
By: Abo, S.; Nakahama, K.; Kisa, T.; Kaga, E.; Takai, M.; Wakaya, F.;
By: Abo, S.; Nakahama, K.; Kisa, T.; Kaga, E.; Takai, M.; Wakaya, F.;