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Topic: Laser Ablation
Results
2011 / IEEE
By: Kai Wang; Kandulski, W.; Calver, J.; Rygate, J.; Zakariyah, S.S.; Selviah, D.R.; Hutt, D.A.; Conway, P.P.;
By: Kai Wang; Kandulski, W.; Calver, J.; Rygate, J.; Zakariyah, S.S.; Selviah, D.R.; Hutt, D.A.; Conway, P.P.;
2012 / IEEE
By: Simanovskii, D.M.; Mackanos, M.A.; Jansen, E.D.; Kozub, J.A.; Contag, C.H.; Hutson, M.M.; Schriver, K.E.;
By: Simanovskii, D.M.; Mackanos, M.A.; Jansen, E.D.; Kozub, J.A.; Contag, C.H.; Hutson, M.M.; Schriver, K.E.;
2012 / IEEE
By: Di Matteo, F.M.; Caponero, M.A.; Schena, E.; Saccomandi, P.; Silvestri, S.; Pandolfi, M.; Martino, M.;
By: Di Matteo, F.M.; Caponero, M.A.; Schena, E.; Saccomandi, P.; Silvestri, S.; Pandolfi, M.; Martino, M.;
Light-Extraction Enhancement by Cavity Array-Textured N-Polar GaN Surfaces Ablated Using a KrF Laser
2012 / IEEEBy: You-Hsien Chang; Yi-Chin Lin; Yen-Shuo Liu; Cheng-Yi Liu;
1992 / IEEE / 000-0-0000-0000-0
By: Masugata, K.; Masuda, W.; Yatsui, K.; Kang, X.D.; Jiang, W.; Sonegawa, T.; Imada, G.; Sekimoto, Y.;
By: Masugata, K.; Masuda, W.; Yatsui, K.; Kang, X.D.; Jiang, W.; Sonegawa, T.; Imada, G.; Sekimoto, Y.;
2004 / IEEE / 978-5-87911-088-3
By: Mitchell, I.; Chuaqui, H.; Aliaga-Rossel, R.; Favre, M.; Wyndham, E.S.;
By: Mitchell, I.; Chuaqui, H.; Aliaga-Rossel, R.; Favre, M.; Wyndham, E.S.;
2011 / IEEE / 978-1-61284-329-2
By: Hammer, D.A.; Greenly, J.B.; Blesener, K.S.; Blesener, I.C.; Blue, B.; Seyler, C.E.; Kusse, B.R.;
By: Hammer, D.A.; Greenly, J.B.; Blesener, K.S.; Blesener, I.C.; Blue, B.; Seyler, C.E.; Kusse, B.R.;
2011 / IEEE / 978-1-61284-329-2
By: Mack, J.M.; Evans, S.C.; Young, C.S.; Wilson, D.C.; Herrmann, H.W.; Kim, Y.H.; Hoffman, N.M.; Duffy, T.; Glebov, V.Yu.; Miller, E.K.; Grafil, E.; Stoeffl, W.; Horsfield, C.J.; Rubery, M.S.; Sedillo, T.J.;
By: Mack, J.M.; Evans, S.C.; Young, C.S.; Wilson, D.C.; Herrmann, H.W.; Kim, Y.H.; Hoffman, N.M.; Duffy, T.; Glebov, V.Yu.; Miller, E.K.; Grafil, E.; Stoeffl, W.; Horsfield, C.J.; Rubery, M.S.; Sedillo, T.J.;
2011 / IEEE / 978-1-61284-329-2
By: O'Brien, L.; Stein, S.; Presura, R.; Plechaty, C.; Tooth, M.; Haque, S.;
By: O'Brien, L.; Stein, S.; Presura, R.; Plechaty, C.; Tooth, M.; Haque, S.;
2011 / IEEE / 978-1-61284-329-2
By: Burdiak, G.; Niasse, N.; Bocchi, M.; Harvey-Thompson, A.J.; Suzuki-Vidal, F.; Hall, G.N.; Khoory, E.; Lebedev, S.V.; Swadling, G.F.; Subtle, L.; Bland, S.N.; de Grouchi, P.; Pickworth, L.;
By: Burdiak, G.; Niasse, N.; Bocchi, M.; Harvey-Thompson, A.J.; Suzuki-Vidal, F.; Hall, G.N.; Khoory, E.; Lebedev, S.V.; Swadling, G.F.; Subtle, L.; Bland, S.N.; de Grouchi, P.; Pickworth, L.;
Cluster formation and hydrogen co-deposition by colliding ablation plasma plumes of lithium and lead
2011 / IEEE / 978-1-61284-329-2By: Hirooka, Y.; Tanaka, K.A.; Oishi, T.; Kono, T.; Omoto, N.;
2011 / IEEE / 978-1-4244-6051-9
By: Bhuyan, M.K.; Dudley, J.M.; Furfaro, L.; Salut, R.; Froehly, L.; Lacourt, P.-A.; Jacquot, M.; Courvoisier, F.;
By: Bhuyan, M.K.; Dudley, J.M.; Furfaro, L.; Salut, R.; Froehly, L.; Lacourt, P.-A.; Jacquot, M.; Courvoisier, F.;
2011 / IEEE / 978-1-4577-1589-1
By: Ishii, K.; Awazu, K.; Yamamoto, K.; Yasuo, K.; Yoshikawa, K.; Saiki, M.;
By: Ishii, K.; Awazu, K.; Yamamoto, K.; Yasuo, K.; Yoshikawa, K.; Saiki, M.;
2011 / IEEE / 978-1-4577-1589-1
By: Lueth, T.C.; Deppe, H.; Hohlweg-Majert, B.; Poitzsch, L.; Weitz, J.; Wolff, R.;
By: Lueth, T.C.; Deppe, H.; Hohlweg-Majert, B.; Poitzsch, L.; Weitz, J.; Wolff, R.;
2011 / IEEE / 978-1-4577-1589-1
By: Saccomandi, P.; Silvestri, S.; Rea, R.; Martino, M.; Pandolfi, M.; Di Matteo, F.M.; Schena, E.;
By: Saccomandi, P.; Silvestri, S.; Rea, R.; Martino, M.; Pandolfi, M.; Di Matteo, F.M.; Schena, E.;
2011 / IEEE / 978-0-933957-39-8
By: Ohki, K.; Sakka, T.; Ura, T.; Takahashi, T.; Masamura, T.; Thornton, B.;
By: Ohki, K.; Sakka, T.; Ura, T.; Takahashi, T.; Masamura, T.; Thornton, B.;
2011 / IEEE / 978-1-4577-1362-0
By: Yamanishi, Y.; Arai, F.; Kawahara, T.; Hagiwara, M.; Sakuma, S.; Kuriki, H.;
By: Yamanishi, Y.; Arai, F.; Kawahara, T.; Hagiwara, M.; Sakuma, S.; Kuriki, H.;
2011 / IEEE / 978-1-4577-1694-2
By: Sajin, G.; Dabu, R.; Zamfirescu, M.; Dinescu, A.; Craciunoiu, F.; Bunea, A.C.;
By: Sajin, G.; Dabu, R.; Zamfirescu, M.; Dinescu, A.; Craciunoiu, F.; Bunea, A.C.;
2011 / IEEE / 978-1-61284-972-0
By: Garcia, J.; Medina, D.; Perdigones, F.; Flores, G.; Luque, A.; Quero, J.M.;
By: Garcia, J.; Medina, D.; Perdigones, F.; Flores, G.; Luque, A.; Quero, J.M.;
2011 / IEEE / 978-1-61284-172-4
By: Stoian, R.; Radu, C.; Craciunoiu, F.; Dinescu, A.; Zamfirescu, M.;
By: Stoian, R.; Radu, C.; Craciunoiu, F.; Dinescu, A.; Zamfirescu, M.;
2011 / IEEE / 978-1-4244-9965-6
By: Jaffrennou, P.; Rothschild, A.; Szlufcik, J.; Lombardet, B.; Moors, M.; Penaud, J.; Duerinckx, F.; Das, J.; Uruena, A.;
By: Jaffrennou, P.; Rothschild, A.; Szlufcik, J.; Lombardet, B.; Moors, M.; Penaud, J.; Duerinckx, F.; Das, J.; Uruena, A.;
2011 / IEEE / 978-1-4244-9965-6
By: Dinkel, C.; Murison, R.; Rekow, M.; Sampath, W.S.; Nikumb, S.; Panarello, T.;
By: Dinkel, C.; Murison, R.; Rekow, M.; Sampath, W.S.; Nikumb, S.; Panarello, T.;
2011 / IEEE / 978-1-4244-9965-6
By: Munoz, K.; Anh Viet Nguyen; Michaelson, L.; Haldar, P.; Efstathiadis, H.; Gallegos, A.; Rane-Fondacaro, M.V.; Tyson, T.; Wang, J.C.;
By: Munoz, K.; Anh Viet Nguyen; Michaelson, L.; Haldar, P.; Efstathiadis, H.; Gallegos, A.; Rane-Fondacaro, M.V.; Tyson, T.; Wang, J.C.;
2011 / IEEE / 978-1-4244-9965-6
By: Das, J.; Janssens, T.; Singh, S.; Robbelein, J.; Posthuma, N.E.; Pawlak, B.J.; Sojka, B.; Poortmans, J.;
By: Das, J.; Janssens, T.; Singh, S.; Robbelein, J.; Posthuma, N.E.; Pawlak, B.J.; Sojka, B.; Poortmans, J.;
2011 / IEEE / 978-1-4577-1982-0
By: Lefevre, M.J.; Beauquis, F.; Yang, J.; Obein, M.; Gounet, P.; Barberan, S.;
By: Lefevre, M.J.; Beauquis, F.; Yang, J.; Obein, M.; Gounet, P.; Barberan, S.;
2011 / IEEE / 978-1-4244-9965-6
By: Brendel, R.; Dullweber, T.; Gatz, S.; Schmidt, J.; Zielke, D.; Rojas, E.G.; Petermann, J.;
By: Brendel, R.; Dullweber, T.; Gatz, S.; Schmidt, J.; Zielke, D.; Rojas, E.G.; Petermann, J.;
2011 / IEEE / 978-0-9775657-8-8
By: Simpson, M.C.; Rohde, C.A.; Meladze, M.; MacMillan, F.; Ware, H.;
By: Simpson, M.C.; Rohde, C.A.; Meladze, M.; MacMillan, F.; Ware, H.;
2011 / IEEE / 978-1-4577-1982-0
By: Liu, D.; Chiang, J.; Tsai, J.; Chang, I.; Tung, E.; Shih, D.; Tsai, F.L.;
By: Liu, D.; Chiang, J.; Tsai, J.; Chang, I.; Tung, E.; Shih, D.; Tsai, F.L.;
2012 / IEEE / 978-1-4673-1965-2
By: Fuhan Liu; Kumar, G.; Suzuki, Y.; Chen, Q.; Sundaram, V.; Tummala, R.;
By: Fuhan Liu; Kumar, G.; Suzuki, Y.; Chen, Q.; Sundaram, V.; Tummala, R.;
2012 / IEEE / 978-1-4673-2229-4
By: Reisinger, B.; Heitz, J.; Svorcik, V.; Siegel, J.; Romanin, C.; Fahrner, M.;
By: Reisinger, B.; Heitz, J.; Svorcik, V.; Siegel, J.; Romanin, C.; Fahrner, M.;
2012 / IEEE / 978-1-4673-1965-2
By: Jimbo, T.; Mori, R.; Hashimoto, M.; Fuhan Liu; Kumbhat, N.; Sundaram, V.; Goyal, A.; Sitaraman, S.; Suzuki, Y.; Tummala, R.;
By: Jimbo, T.; Mori, R.; Hashimoto, M.; Fuhan Liu; Kumbhat, N.; Sundaram, V.; Goyal, A.; Sitaraman, S.; Suzuki, Y.; Tummala, R.;
2012 / IEEE / 978-1-4673-2349-9
By: Hein, Bjorn; Mende, Michael; Kern, Patrick; Notheis, Simon; Gentes, Sascha; Worn, Heinz;
By: Hein, Bjorn; Mende, Michael; Kern, Patrick; Notheis, Simon; Gentes, Sascha; Worn, Heinz;
2012 / IEEE / 978-1-4577-0911-1
By: Tanski, Mateusz; Mizeraczyk, Jerzy; Garasz, Katarzyna; Barbucha, Robert; Kocik, Marek;
By: Tanski, Mateusz; Mizeraczyk, Jerzy; Garasz, Katarzyna; Barbucha, Robert; Kocik, Marek;
2012 / IEEE / 978-1-4673-2576-9
By: Irlinger, Franz; Kagerer, Markus; Ottnad, Thomas; Lueth, Tim C.;
By: Irlinger, Franz; Kagerer, Markus; Ottnad, Thomas; Lueth, Tim C.;
2012 / IEEE / 978-1-4577-0911-1
By: Zhang, Xianzeng; Zhan, Zhenlin; Ye, Qing; Ye, Qing; Xie, Shusen; Xie, Shusen; Liu, Nenrong; Zhan, Zhenlin;
By: Zhang, Xianzeng; Zhan, Zhenlin; Ye, Qing; Ye, Qing; Xie, Shusen; Xie, Shusen; Liu, Nenrong; Zhan, Zhenlin;
2012 / IEEE / 978-1-4577-0911-1
By: Ni, Xiao-Wu; Lu, Jian; Shen, Zhong-Hua; Han, Bing; Qian, Hao; Chen, Jun;
By: Ni, Xiao-Wu; Lu, Jian; Shen, Zhong-Hua; Han, Bing; Qian, Hao; Chen, Jun;
2007 / American Institute of Physics
By: Shin Kajita; Noriyasu Ohno; Shuichi Takamura; Wataru Sakaguchi; Dai Nishijima;
By: Shin Kajita; Noriyasu Ohno; Shuichi Takamura; Wataru Sakaguchi; Dai Nishijima;
2007 / American Institute of Physics
By: J. Siegel; D. Puerto; W. Gawelda; G. Bachelier; J. Solis; L. Ehrentraut; J. Bonse;
By: J. Siegel; D. Puerto; W. Gawelda; G. Bachelier; J. Solis; L. Ehrentraut; J. Bonse;
2008 / American Institute of Physics
By: J. Badziak; L. Ry; P. Parys; T. Pisarczyk; M. RosiDski; J. WoBowski; R. SuchaDska; J. Krása; E. Krousky; L. Láska; K. Maaek; M. Pfeifer; K. Rohlena; J. Skala; J. Ullschmied; L. J. Dhareshwar; I. B. Földes; T. Suta; A. Borrielli; A. Mezzasalma; L. Torrisi; P. Pisarczyk; A. Kasperczuk;
By: J. Badziak; L. Ry; P. Parys; T. Pisarczyk; M. RosiDski; J. WoBowski; R. SuchaDska; J. Krása; E. Krousky; L. Láska; K. Maaek; M. Pfeifer; K. Rohlena; J. Skala; J. Ullschmied; L. J. Dhareshwar; I. B. Földes; T. Suta; A. Borrielli; A. Mezzasalma; L. Torrisi; P. Pisarczyk; A. Kasperczuk;
2010 / American Institute of Physics
By: Yuto Tanaka; Go Obara; Akira Zenidaka; Mitsuhiro Terakawa; Minoru Obara;
By: Yuto Tanaka; Go Obara; Akira Zenidaka; Mitsuhiro Terakawa; Minoru Obara;
2007 / American Institute of Physics
By: Stanley Paul; Sergey I. Kudryashov; Kevin Lyon; Susan D. Allen;
By: Stanley Paul; Sergey I. Kudryashov; Kevin Lyon; Susan D. Allen;
Femtosecond pulsed laser ablation dynamics and ablation morphology of nickel based superalloy CMSX-4
2008 / American Institute of PhysicsBy: Joel P. McDonald; Shuwei Ma; Tresa M. Pollock; Steven M. Yalisove; John A. Nees;
2008 / American Institute of Physics
By: David J. Hwang; Hojeong Jeon; Costas P. Grigoropoulos; Jong Yoo; Richard E. Russo;
By: David J. Hwang; Hojeong Jeon; Costas P. Grigoropoulos; Jong Yoo; Richard E. Russo;
2009 / American Institute of Physics
By: Russell A. Burdt; Sam Yuspeh; Kevin L. Sequoia; Yezheng Tao; Mark S. Tillack; Farrokh Najmabadi;
By: Russell A. Burdt; Sam Yuspeh; Kevin L. Sequoia; Yezheng Tao; Mark S. Tillack; Farrokh Najmabadi;
2008 / American Institute of Physics
By: S. P. Nikitin; J. Grun; Y. Aglitskiy; C. Manka; D. Zabetakis; A. L. Velikovich; C. Miller;
By: S. P. Nikitin; J. Grun; Y. Aglitskiy; C. Manka; D. Zabetakis; A. L. Velikovich; C. Miller;
2010 / American Institute of Physics
By: Jiyan Zhang; Guohong Yang; Xin Hu; Jiamin Yang; Yaonan Ding; Yongkun Ding; Baohan Zhang; Zhijian Zheng; Yan Xu; Jun Yan; Wenbin Pei;
By: Jiyan Zhang; Guohong Yang; Xin Hu; Jiamin Yang; Yaonan Ding; Yongkun Ding; Baohan Zhang; Zhijian Zheng; Yan Xu; Jun Yan; Wenbin Pei;
2010 / American Institute of Physics
By: L. F. Wang; W. H. Ye; Z. M. Sheng; Wai-Sun Don; Y. J. Li; X. T. He;
By: L. F. Wang; W. H. Ye; Z. M. Sheng; Wai-Sun Don; Y. J. Li; X. T. He;
2010 / American Institute of Physics
By: Changquan Xia; Jiansheng Liu; Aihua Deng; Wentao Wang; Cheng Wang; Ruxin Li; Zhizhan Xu;
By: Changquan Xia; Jiansheng Liu; Aihua Deng; Wentao Wang; Cheng Wang; Ruxin Li; Zhizhan Xu;