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Topic: Insertion Loss
Results
2011 / IEEE
By: Fujimura, Y.; Mori, K.; Sasaki, H.; Ohshima, D.; Yamamichi, S.; Miki, R.; Kikuchi, K.; Enomoto, M.; Murakami, T.; Nishiyama, T.; Funaya, T.; Nakashima, Y.;
By: Fujimura, Y.; Mori, K.; Sasaki, H.; Ohshima, D.; Yamamichi, S.; Miki, R.; Kikuchi, K.; Enomoto, M.; Murakami, T.; Nishiyama, T.; Funaya, T.; Nakashima, Y.;
2011 / IEEE
By: Masse, C.; Huang, C.-W.P.; Zhan-Feng Zhou; McPartlin, M.J.; Madan, A.; Cressler, J.D.;
By: Masse, C.; Huang, C.-W.P.; Zhan-Feng Zhou; McPartlin, M.J.; Madan, A.; Cressler, J.D.;
2011 / IEEE
By: Shih, W.Y.; Youngsoo Chung; Wei Wu; Xiang Li; Shung, K.K.; Qifa Zhou; Wei-Heng Shih;
By: Shih, W.Y.; Youngsoo Chung; Wei Wu; Xiang Li; Shung, K.K.; Qifa Zhou; Wei-Heng Shih;
2011 / IEEE
By: Cassan, E.; Duan, G.; Fedeli, J.; Sanchis, P.; Campo, A.M.G.; Vivien, L.; Marris-Morini, D.; Ziebell, M.; Rasigade, G.; Brimont, A.;
By: Cassan, E.; Duan, G.; Fedeli, J.; Sanchis, P.; Campo, A.M.G.; Vivien, L.; Marris-Morini, D.; Ziebell, M.; Rasigade, G.; Brimont, A.;
2012 / IEEE
By: Apostolopoulos, D.; Avramopoulos, H.; Kalavrouziotis, D.; Giannoulis, G.; Vyrsokinos, K.; Papaioannou, S.; Yioultsis, T.V.; Pitilakis, A.; Tsilipakos, O.; Kriezis, E.E.; Pleros, N.; Bozhevolnyi, S.I.; Kumar, A.; Dereux, A.; Markey, L.; Weeber, J.; Hassan, K.; Karl, M.; Baus, M.; Tekin, T.;
By: Apostolopoulos, D.; Avramopoulos, H.; Kalavrouziotis, D.; Giannoulis, G.; Vyrsokinos, K.; Papaioannou, S.; Yioultsis, T.V.; Pitilakis, A.; Tsilipakos, O.; Kriezis, E.E.; Pleros, N.; Bozhevolnyi, S.I.; Kumar, A.; Dereux, A.; Markey, L.; Weeber, J.; Hassan, K.; Karl, M.; Baus, M.; Tekin, T.;
2012 / IEEE
By: Huihui Cheng; Zhiping Cai; Chenchun Ye; Hongyan Fu; Huiying Xu; Min Zhou; Zhengqian Luo; Jinzhang Wang; Wei Qi;
By: Huihui Cheng; Zhiping Cai; Chenchun Ye; Hongyan Fu; Huiying Xu; Min Zhou; Zhengqian Luo; Jinzhang Wang; Wei Qi;
2012 / IEEE
By: Yuan-Fu Tsai; Jen-Tang Lu; Chih-Hsien Lai; Tzu-Fang Tseng; Chi-Kuang Sun; Yuh-Jing Hwang;
By: Yuan-Fu Tsai; Jen-Tang Lu; Chih-Hsien Lai; Tzu-Fang Tseng; Chi-Kuang Sun; Yuh-Jing Hwang;
2012 / IEEE
By: Aamer, M.; Gutierrez, A.M.; Brimont, A.; Sanchis, P.; Thomson, D.J.; Marti, J.; Reed, G.T.; Fedeli, J.; Gardes, F.Y.;
By: Aamer, M.; Gutierrez, A.M.; Brimont, A.; Sanchis, P.; Thomson, D.J.; Marti, J.; Reed, G.T.; Fedeli, J.; Gardes, F.Y.;
2012 / IEEE
By: Junfeng Song; Shiyi Chen; Jing Zhang; Huijuan Zhang; Guo-Qiang Lo; Mingbin Yu; Kee, J.S.;
By: Junfeng Song; Shiyi Chen; Jing Zhang; Huijuan Zhang; Guo-Qiang Lo; Mingbin Yu; Kee, J.S.;
2012 / IEEE
By: Nielsen, M.G.; Weeber, J.-C.; Hassan, K.; Fatome, J.; Finot, C.; Dereux, A.; Markey, L.; Albrektsen, O.; Bozhevolnyi, S.I.; Millot, G.; Kaya, S.;
By: Nielsen, M.G.; Weeber, J.-C.; Hassan, K.; Fatome, J.; Finot, C.; Dereux, A.; Markey, L.; Albrektsen, O.; Bozhevolnyi, S.I.; Millot, G.; Kaya, S.;
2012 / IEEE
By: Egnell, L.; Tipsuwannakul, E.; Eriksson, T.A.; Jianqiang Li; Sjostrom, F.; Karlsson, M.; Andrekson, P.A.; Pejnefors, J.;
By: Egnell, L.; Tipsuwannakul, E.; Eriksson, T.A.; Jianqiang Li; Sjostrom, F.; Karlsson, M.; Andrekson, P.A.; Pejnefors, J.;
2012 / IEEE
By: Bin Wei; Bisong Cao; Xubo Guo; Ying Zhang; Xiaoping Zhang; Guoyong Zhang; Guannan Suo; Xiaoke Song;
By: Bin Wei; Bisong Cao; Xubo Guo; Ying Zhang; Xiaoping Zhang; Guoyong Zhang; Guannan Suo; Xiaoke Song;
2012 / IEEE
By: Zhi-Cheng Hsiao; Cheng-Ta Ko; Kuan-Neng Chen; Wei-Chung Lo; Yu-Hua Chen; Shyh-Shyuan Sheu; Chia-Wen Chiang; Jui-Hsiung Huang; Huan-Chun Fu; Yu-Jiau Hwang; Peng-Shu Chen; Yao-Jen Chang;
By: Zhi-Cheng Hsiao; Cheng-Ta Ko; Kuan-Neng Chen; Wei-Chung Lo; Yu-Hua Chen; Shyh-Shyuan Sheu; Chia-Wen Chiang; Jui-Hsiung Huang; Huan-Chun Fu; Yu-Jiau Hwang; Peng-Shu Chen; Yao-Jen Chang;