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Topic: Impedance
Results
2011 / IEEE
By: Fujimura, Y.; Mori, K.; Sasaki, H.; Ohshima, D.; Yamamichi, S.; Miki, R.; Kikuchi, K.; Enomoto, M.; Murakami, T.; Nishiyama, T.; Funaya, T.; Nakashima, Y.;
By: Fujimura, Y.; Mori, K.; Sasaki, H.; Ohshima, D.; Yamamichi, S.; Miki, R.; Kikuchi, K.; Enomoto, M.; Murakami, T.; Nishiyama, T.; Funaya, T.; Nakashima, Y.;
2011 / IEEE
By: Kollberg, E.L.; Jian-Rong Gao; Khosropanah, P.; Wen Zhang; Yuan Ren; Yngvesson, K.S.;
By: Kollberg, E.L.; Jian-Rong Gao; Khosropanah, P.; Wen Zhang; Yuan Ren; Yngvesson, K.S.;
2011 / IEEE
By: Yazicioglu, R.F.; Seidl, K.; Erismis, M.A.; Aarts, A.A.A.; Torfs, T.; Neves, H.P.; Van Hoof, C.; Ruther, P.; Paul, O.; Puers, R.; Aslam, J.; Kerekes, B.P.; Fiath, R.; Dombovari, B.; Ulbert, I.; Herwik, S.;
By: Yazicioglu, R.F.; Seidl, K.; Erismis, M.A.; Aarts, A.A.A.; Torfs, T.; Neves, H.P.; Van Hoof, C.; Ruther, P.; Paul, O.; Puers, R.; Aslam, J.; Kerekes, B.P.; Fiath, R.; Dombovari, B.; Ulbert, I.; Herwik, S.;
2011 / IEEE
By: Tianshi Lei; Xinjun Zhang; Jiangtao Zeng; Peitian Cong; Yixiang Hu; Tao Huang; Ai'ci Qiu; Fengju Sun;
By: Tianshi Lei; Xinjun Zhang; Jiangtao Zeng; Peitian Cong; Yixiang Hu; Tao Huang; Ai'ci Qiu; Fengju Sun;
2011 / IEEE
By: Threadgold, J.R.; Martin, P.N.; Juniper, P.; Jeffries, G.; Webb, K.; Cooper, G.M.; McLean, J.; Jones, A.;
By: Threadgold, J.R.; Martin, P.N.; Juniper, P.; Jeffries, G.; Webb, K.; Cooper, G.M.; McLean, J.; Jones, A.;
2011 / IEEE
By: Chien, G.; Chinq-Shiun Chiu; Tzung-Han Wu; Sheng-Jui Huang; Wen-Chang Lee; Hsiang-Hui Chang; Chi-Yao Yu; Sun, C.E.; Lan-Chou Cho; Yen-Horng Chen; Lu, I.S.; Chih-Chun Tang;
By: Chien, G.; Chinq-Shiun Chiu; Tzung-Han Wu; Sheng-Jui Huang; Wen-Chang Lee; Hsiang-Hui Chang; Chi-Yao Yu; Sun, C.E.; Lan-Chou Cho; Yen-Horng Chen; Lu, I.S.; Chih-Chun Tang;
2011 / IEEE
By: Yaming Zhang; Ruonan Han; O, K.K.; Brown, E.; Knap, W.; Videlier, H.; Coquillat, D.;
By: Yaming Zhang; Ruonan Han; O, K.K.; Brown, E.; Knap, W.; Videlier, H.; Coquillat, D.;
2011 / IEEE
By: Kabos, P.; Imtiaz, A.; Dazhen Gu; Sang-Hyun Lim; Filipovic, D.S.; Rice, P.; Wallis, T.M.; Kichul Kim;
By: Kabos, P.; Imtiaz, A.; Dazhen Gu; Sang-Hyun Lim; Filipovic, D.S.; Rice, P.; Wallis, T.M.; Kichul Kim;
2011 / IEEE
By: Munakata, M.; Sato, A.; Yabukami, S.; Shiokawa, T.; Takahashi, J.; Shimada, Y.; Yanagi, K.; Miyazawa, Y.; Ozawa, T.;
By: Munakata, M.; Sato, A.; Yabukami, S.; Shiokawa, T.; Takahashi, J.; Shimada, Y.; Yanagi, K.; Miyazawa, Y.; Ozawa, T.;
2011 / IEEE
By: Rawat, K.; Zhenghe Feng; Ghannouchi, F.M.; Helaoui, M.; Wenhua Chen; Yucheng Liu; Xiang Li; Bassam, S.A.;
By: Rawat, K.; Zhenghe Feng; Ghannouchi, F.M.; Helaoui, M.; Wenhua Chen; Yucheng Liu; Xiang Li; Bassam, S.A.;
2011 / IEEE
By: Chaudhary, G.; Jun-Chul Kim; Dongsu Kim; Jongsik Lim; Yongchae Jeong; Heungjae Choi;
By: Chaudhary, G.; Jun-Chul Kim; Dongsu Kim; Jongsik Lim; Yongchae Jeong; Heungjae Choi;