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Topic: Impedance Measurement
Results
2012 / IEEE
By: van Helleputte, N.; Sunyoung Kim; Buxi, D.; van Hoof, C.; Penders, J.; Yazicioglu, R.F.; Wijsman, J.; Altini, M.;
By: van Helleputte, N.; Sunyoung Kim; Buxi, D.; van Hoof, C.; Penders, J.; Yazicioglu, R.F.; Wijsman, J.; Altini, M.;
2011 / IEEE / 978-1-4577-0365-2
By: Xiaosheng Qi; Qiang Du; Houlei Gao; Yuan Li; Guofang Zhu; Qingle Pang;
By: Xiaosheng Qi; Qiang Du; Houlei Gao; Yuan Li; Guofang Zhu; Qingle Pang;
2011 / IEEE / 978-1-4244-8418-8
By: Pierz, P.; Izykowski, J.; Rosolowki, E.; Fulczyk, M.; Balcerek, P.; Saha, M.M.;
By: Pierz, P.; Izykowski, J.; Rosolowki, E.; Fulczyk, M.; Balcerek, P.; Saha, M.M.;
2011 / IEEE / 978-90-75815-14-6
By: Zhiyu Shen; Boroyevich, D.; Mattavelli, P.; Ahmed, S.; Jaksic, M.;
By: Zhiyu Shen; Boroyevich, D.; Mattavelli, P.; Ahmed, S.; Jaksic, M.;
2011 / IEEE / 978-1-4244-8418-8
By: Chilard, O.; Caire, R.; Raison, B.; Jecu, C.; Alibert, P.; Deschamps, P.; Grenard, S.;
By: Chilard, O.; Caire, R.; Raison, B.; Jecu, C.; Alibert, P.; Deschamps, P.; Grenard, S.;
2011 / IEEE / 978-1-4577-0811-4
By: Ebert, H.; Pedersen, G.F.; Christensen, S.K.; Franek, O.; Sorensen, M.;
By: Ebert, H.; Pedersen, G.F.; Christensen, S.K.; Franek, O.; Sorensen, M.;
2011 / IEEE / 978-1-4577-1236-4
By: Moretti, F.N.; Luna, M.C.; Pivetta, O.H.; Battaglia, G.A.; Cabrera, J.L.;
By: Moretti, F.N.; Luna, M.C.; Pivetta, O.H.; Battaglia, G.A.; Cabrera, J.L.;
2011 / IEEE / 978-1-61284-777-1
By: Pin-Chian Wu; Ya-Chun Chuang; Ming-Kun Chen; Jen-Yu Jao; Chia-Feng Liu; Ling-Sheng Jang;
By: Pin-Chian Wu; Ya-Chun Chuang; Ming-Kun Chen; Jen-Yu Jao; Chia-Feng Liu; Ling-Sheng Jang;
2011 / IEEE / 978-1-4577-1002-5
By: Thein, M.; Haginomori, E.; Nakamoto, T.; Koshizuka, T.; Ikeda, H.; Hikita, M.; Toda, H.;
By: Thein, M.; Haginomori, E.; Nakamoto, T.; Koshizuka, T.; Ikeda, H.; Hikita, M.; Toda, H.;
2011 / IEEE / 978-1-4244-8165-1
By: Meiling Jiang; Zhijian Hu; Yang Zhou; Zhiyong Chen; Jing Wang; Jinlong Xu; Jun Tang; Yang Gao;
By: Meiling Jiang; Zhijian Hu; Yang Zhou; Zhiyong Chen; Jing Wang; Jinlong Xu; Jun Tang; Yang Gao;
2011 / IEEE / 978-1-4577-0704-9
By: Bayford, R.; Hongwei Hong; Rahal, M.; Demosthenous, A.; Triantis, I.F.;
By: Bayford, R.; Hongwei Hong; Rahal, M.; Demosthenous, A.; Triantis, I.F.;
2011 / IEEE / 978-1-4577-1974-5
By: Mathe, K.; Burkus, E.; Henezi, F.; Odry, P.; Halasz, A.; Szakall, T.; Kuljic, B.; Marki, R.; Kecskes, I.;
By: Mathe, K.; Burkus, E.; Henezi, F.; Odry, P.; Halasz, A.; Szakall, T.; Kuljic, B.; Marki, R.; Kecskes, I.;
2011 / IEEE / 978-0-9541146-3-3
By: Pillonnet, G.; Morel, F.; Mrad, R.; Labrousse, D.; Vollaire, C.;
By: Pillonnet, G.; Morel, F.; Mrad, R.; Labrousse, D.; Vollaire, C.;