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Topic: Image Sensors
Results
2011 / IEEE
By: Beenakker, C.I.M.; Morrison, T.; Robertson, M.; Tajari Mofrad, M.R.; Ishihara, R.; Golshani, N.; Derakhshandeh, J.;
By: Beenakker, C.I.M.; Morrison, T.; Robertson, M.; Tajari Mofrad, M.R.; Ishihara, R.; Golshani, N.; Derakhshandeh, J.;
2011 / IEEE
By: No-Cheol Park; Young Jun Hur; Jun-Ho Yoon; Jung-Hyun Woo; Kyoung-Su Park; Young-Pil Park;
By: No-Cheol Park; Young Jun Hur; Jun-Ho Yoon; Jung-Hyun Woo; Kyoung-Su Park; Young-Pil Park;
2012 / IEEE
By: Richard, M.-H.; Walenta, A.H.; Dauvergne, D.; De Rydt, M.; Dedes, G.; Freud, N.; Krimmer, J.; Letang, J.M.; Lojacono, X.; Maxim, V.; Montarou, G.; Ray, C.; Roellinghoff, F.; Testa, E.; Dahoumane, M.;
By: Richard, M.-H.; Walenta, A.H.; Dauvergne, D.; De Rydt, M.; Dedes, G.; Freud, N.; Krimmer, J.; Letang, J.M.; Lojacono, X.; Maxim, V.; Montarou, G.; Ray, C.; Roellinghoff, F.; Testa, E.; Dahoumane, M.;
2012 / IEEE
By: Magnan, P.; Virmontois, C.; Goiffon, V.; Martin-Gonthier, P.; Estribeau, M.; Cervantes, P.; Paillet, P.; Girard, S.; Gaillardin, M.; Place, S.;
By: Magnan, P.; Virmontois, C.; Goiffon, V.; Martin-Gonthier, P.; Estribeau, M.; Cervantes, P.; Paillet, P.; Girard, S.; Gaillardin, M.; Place, S.;
2012 / IEEE
By: Tahara, T.; Yonesaka, R.; Yamamoto, S.; Kakue, T.; Matoba, O.; Awatsuji, Y.; Nishio, K.; Ura, S.; Kubota, T.; Peng Xia;
By: Tahara, T.; Yonesaka, R.; Yamamoto, S.; Kakue, T.; Matoba, O.; Awatsuji, Y.; Nishio, K.; Ura, S.; Kubota, T.; Peng Xia;
2012 / IEEE
By: van Veen, G.; Sakic, A.; Nanver, L.K.; Milosavljevic, S.; Vogelsang, P.; Kooijman, K.; Derakhshandeh, J.; de Boer, W.B.; Scholtes, T.L.M.; Wien, W.H.A.;
By: van Veen, G.; Sakic, A.; Nanver, L.K.; Milosavljevic, S.; Vogelsang, P.; Kooijman, K.; Derakhshandeh, J.; de Boer, W.B.; Scholtes, T.L.M.; Wien, W.H.A.;
2012 / IEEE
By: Zamarreno-Ramos, C.; Camunas-Mesa, L.; Linares-Barranco, B.; Serrano-Gotarredona, T.; Acosta-Jimenez, A.J.; Linares-Barranco, A.;
By: Zamarreno-Ramos, C.; Camunas-Mesa, L.; Linares-Barranco, B.; Serrano-Gotarredona, T.; Acosta-Jimenez, A.J.; Linares-Barranco, A.;
2012 / IEEE
By: Summers, R.M.; Sahiner, B.; Petrick, N.; Burns, J.E.; Nguyen, T.B.; McKenna, M.T.; Shijun Wang;
By: Summers, R.M.; Sahiner, B.; Petrick, N.; Burns, J.E.; Nguyen, T.B.; McKenna, M.T.; Shijun Wang;
2012 / IEEE
By: Jain, R.; Iftode, L.; Hong, K.; Ramachandran, U.; Kumar, R.; Sivakumar, R.; Junsuk Shin; Rothermel, K.;
By: Jain, R.; Iftode, L.; Hong, K.; Ramachandran, U.; Kumar, R.; Sivakumar, R.; Junsuk Shin; Rothermel, K.;
2012 / IEEE
By: Jie Zhang; Yuanming Suo; Minh Dao; Nguyen, D.T.; Orchard, G.; Posch, C.; Tran, T.D.; Etienne-Cummings, R.; Sang Chin;
By: Jie Zhang; Yuanming Suo; Minh Dao; Nguyen, D.T.; Orchard, G.; Posch, C.; Tran, T.D.; Etienne-Cummings, R.; Sang Chin;
2012 / IEEE
By: Cabello, D.; Linan, G.; Carmona-Galan, R.; Fernandez-Berni, J.; Brea, V.M.; Suarez, M.; Rodriguez-Vazquez, A.;
By: Cabello, D.; Linan, G.; Carmona-Galan, R.; Fernandez-Berni, J.; Brea, V.M.; Suarez, M.; Rodriguez-Vazquez, A.;
2012 / IEEE
By: Contreras, J.; Ferreira, I.; Martins, R.; Fortunato, E.; Filonovich, S.A.; Pereira, S.; Idzikowski, M.;
By: Contreras, J.; Ferreira, I.; Martins, R.; Fortunato, E.; Filonovich, S.A.; Pereira, S.; Idzikowski, M.;