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Topic: Image Resolution
Results
2011 / IEEE
By: Nakamura, N.; Kasai, N.; Ishii, M.; Miyamoto, M.; Kageyama, H.; Kohno, T.; Akimoto, H.;
By: Nakamura, N.; Kasai, N.; Ishii, M.; Miyamoto, M.; Kageyama, H.; Kohno, T.; Akimoto, H.;
2011 / IEEE
By: Dengler, R.J.; Cooper, K.B.; Siegel, P.H.; Chattopadhyay, G.; Thomas, B.; Llombart, N.;
By: Dengler, R.J.; Cooper, K.B.; Siegel, P.H.; Chattopadhyay, G.; Thomas, B.; Llombart, N.;
On Complexity Modeling of H.264/AVC Video Decoding and Its Application for Energy Efficient Decoding
2011 / IEEEBy: Hao Hu; Zhan Ma; Yao Wang;
2011 / IEEE
By: Yamada, Y.; Sekiguchi, S.; Sugimoto, K.; Itani, Y.; Kato, Y.; Yamagishi, S.; Murakami, T.; Asai, K.; Minezawa, A.;
By: Yamada, Y.; Sekiguchi, S.; Sugimoto, K.; Itani, Y.; Kato, Y.; Yamagishi, S.; Murakami, T.; Asai, K.; Minezawa, A.;
2011 / IEEE
By: Pierce, L.A.; Hunter, W.; Xiaoli Li; Miyaoka, R.S.; Lewellen, T.K.; Kinahan, P.E.; McDougald, W.;
By: Pierce, L.A.; Hunter, W.; Xiaoli Li; Miyaoka, R.S.; Lewellen, T.K.; Kinahan, P.E.; McDougald, W.;
2011 / IEEE
By: Shih, W.Y.; Youngsoo Chung; Wei Wu; Xiang Li; Shung, K.K.; Qifa Zhou; Wei-Heng Shih;
By: Shih, W.Y.; Youngsoo Chung; Wei Wu; Xiang Li; Shung, K.K.; Qifa Zhou; Wei-Heng Shih;
2012 / IEEE
By: Riboldi, M.; Fattori, G.; Baroni, G.; Orecchia, R.; Pella, A.; Tagaste, B.; Desplanques, M.;
By: Riboldi, M.; Fattori, G.; Baroni, G.; Orecchia, R.; Pella, A.; Tagaste, B.; Desplanques, M.;
2012 / IEEE
By: Saunders, C.M.; Wood, B.A.; Robbins, P.D.; Scolaro, L.; Lorenser, D.; Sampson, D.D.; Kirk, R.W.; Curatolo, A.; Quirk, B.C.; McLaughlin, R.A.;
By: Saunders, C.M.; Wood, B.A.; Robbins, P.D.; Scolaro, L.; Lorenser, D.; Sampson, D.D.; Kirk, R.W.; Curatolo, A.; Quirk, B.C.; McLaughlin, R.A.;
2012 / IEEE
By: Yu-Chi Su; Keng-Yen Huang; Liang-Gee Chen; Yi-Min Tsai; Shao-Yi Chien; Tse-Wei Chen;
By: Yu-Chi Su; Keng-Yen Huang; Liang-Gee Chen; Yi-Min Tsai; Shao-Yi Chien; Tse-Wei Chen;
2012 / IEEE
By: Yoo, T.S.; Bliss, D.; Lowekamp, B.C.; Chen, D.T.; Subramaniam, S.; Narayan, K.; Hartnell, L.M.; Thao Do; Murphy, G.E.;
By: Yoo, T.S.; Bliss, D.; Lowekamp, B.C.; Chen, D.T.; Subramaniam, S.; Narayan, K.; Hartnell, L.M.; Thao Do; Murphy, G.E.;
2012 / IEEE
By: Fishburn, M.W.; Trimananda, R.; Maruyama, Y.; Gersbach, M.; Stoppa, D.; Charbon, E.; Henderson, R.; Walker, R.; Richardson, J.A.;
By: Fishburn, M.W.; Trimananda, R.; Maruyama, Y.; Gersbach, M.; Stoppa, D.; Charbon, E.; Henderson, R.; Walker, R.; Richardson, J.A.;
2012 / IEEE
By: Ahmed, S.S.; Wohlmuth, H.; Tiebout, M.; Zielska, A.; Juenemann, R.; Schiessl, A.; Knapp, H.; Wuertele, J.; Kaeferboeck, J.; Rest, M.; Druml, M.; Salerno, R.;
By: Ahmed, S.S.; Wohlmuth, H.; Tiebout, M.; Zielska, A.; Juenemann, R.; Schiessl, A.; Knapp, H.; Wuertele, J.; Kaeferboeck, J.; Rest, M.; Druml, M.; Salerno, R.;
2012 / IEEE
By: Roujol, S.; Moonen, C.T.W.; Quesson, B.; Ries, M.; de Senneville, B.D.; Benois-Pineau, J.;
By: Roujol, S.; Moonen, C.T.W.; Quesson, B.; Ries, M.; de Senneville, B.D.; Benois-Pineau, J.;
2012 / IEEE
By: Xiaochao Qu; Tavernarakis, N.; Birk, U.J.; Rieckher, M.; Jimin Liang; Di Dong; Shouping Zhu; Ripoll, J.; Jie Tian;
By: Xiaochao Qu; Tavernarakis, N.; Birk, U.J.; Rieckher, M.; Jimin Liang; Di Dong; Shouping Zhu; Ripoll, J.; Jie Tian;