Your Search Results
Use materials about this topic in your textbook!
AcademicPub holds over eight million pieces of educational content - such as case studies and journal articles - for you to mix-and-match your way.
Experience the freedom of customizing your course pack with AcademicPub!

Topic: Image Reconstruction
Results
2011 / IEEE
By: Fotiou, E.; Stefanou, K.; Karvounis, E.; Athanasiou, L.; Exarchos, T.P.; Sakellarios, A.; Fotiadis, D.I.; Siogkas, P.; Parodi, O.; Filipovic, N.; Michalis, L.K.; Naka, K.K.;
By: Fotiou, E.; Stefanou, K.; Karvounis, E.; Athanasiou, L.; Exarchos, T.P.; Sakellarios, A.; Fotiadis, D.I.; Siogkas, P.; Parodi, O.; Filipovic, N.; Michalis, L.K.; Naka, K.K.;
2011 / IEEE
By: Hennig, J.; Weber, H.; Schultz, G.; Zaitsev, M.; Gallichan, D.; Cocosco, C.A.; Welz, A.M.; Witschey, W.R.T.;
By: Hennig, J.; Weber, H.; Schultz, G.; Zaitsev, M.; Gallichan, D.; Cocosco, C.A.; Welz, A.M.; Witschey, W.R.T.;
2011 / IEEE
By: Pierce, L.A.; Hunter, W.; Xiaoli Li; Miyaoka, R.S.; Lewellen, T.K.; Kinahan, P.E.; McDougald, W.;
By: Pierce, L.A.; Hunter, W.; Xiaoli Li; Miyaoka, R.S.; Lewellen, T.K.; Kinahan, P.E.; McDougald, W.;
2011 / IEEE
By: Chao Wang; Ying Zhang; Yongping Li; Jingyan Wang; Xin Gao; Guoling Chen; Honglan Xie;
By: Chao Wang; Ying Zhang; Yongping Li; Jingyan Wang; Xin Gao; Guoling Chen; Honglan Xie;
2012 / IEEE
By: Ying Li; Guizhi Xu; Shuai Zhang; Weili Yan; Xueying Zhang; Ning Yin; Yaoyuan Xu; Hongbin Wang; Bo Zhang;
By: Ying Li; Guizhi Xu; Shuai Zhang; Weili Yan; Xueying Zhang; Ning Yin; Yaoyuan Xu; Hongbin Wang; Bo Zhang;
2012 / IEEE
By: Savolainen, T.; Lipponen, A.; Voutilainen, A.; Kaipio, J.P.; Vauhkonen, M.; Lehikoinen, A.;
By: Savolainen, T.; Lipponen, A.; Voutilainen, A.; Kaipio, J.P.; Vauhkonen, M.; Lehikoinen, A.;
2012 / IEEE
By: Shao, K.R.; Guangyuan Yang; Gang Lei; Xiaoming Chen; Lavers, J.D.; Jianguo Zhu; Youguang Guo;
By: Shao, K.R.; Guangyuan Yang; Gang Lei; Xiaoming Chen; Lavers, J.D.; Jianguo Zhu; Youguang Guo;
2012 / IEEE
By: Gonzalez Lima, R.; Bueno de Camargo, E.D.L.; de Castro Martins, T.; de Sales Guerra Tsuzuki, M.; Amato, M.B.P.;
By: Gonzalez Lima, R.; Bueno de Camargo, E.D.L.; de Castro Martins, T.; de Sales Guerra Tsuzuki, M.; Amato, M.B.P.;
2012 / IEEE
By: Shuhui Bu; Asao, Y.; Someda, Y.; Fukutani, K.; Yamakawa, M.; Kondo, K.; Shiina, T.; Zhenbao Liu;
By: Shuhui Bu; Asao, Y.; Someda, Y.; Fukutani, K.; Yamakawa, M.; Kondo, K.; Shiina, T.; Zhenbao Liu;
2012 / IEEE
By: Kothapalli, S.; Gambhir, S.S.; Khuri-Yakub, B.T.; Oralkan, O.; Vaithilingam, S.; Te-Jen Ma;
By: Kothapalli, S.; Gambhir, S.S.; Khuri-Yakub, B.T.; Oralkan, O.; Vaithilingam, S.; Te-Jen Ma;
2012 / IEEE
By: Saunders, C.M.; Wood, B.A.; Robbins, P.D.; Scolaro, L.; Lorenser, D.; Sampson, D.D.; Kirk, R.W.; Curatolo, A.; Quirk, B.C.; McLaughlin, R.A.;
By: Saunders, C.M.; Wood, B.A.; Robbins, P.D.; Scolaro, L.; Lorenser, D.; Sampson, D.D.; Kirk, R.W.; Curatolo, A.; Quirk, B.C.; McLaughlin, R.A.;
2012 / IEEE
By: Guthe, S.; Ament, M.; Wenger, S.; Magnor, M.; Weiskopf, D.; Tillmann, A.; Lorenz, D.;
By: Guthe, S.; Ament, M.; Wenger, S.; Magnor, M.; Weiskopf, D.; Tillmann, A.; Lorenz, D.;
2012 / IEEE
By: Gerndt, A.; Hamann, B.; Gwinner, K.; Cowgill, E.; Hagen, H.; Compton, T.; Bernadin, T.; Westerteiger, R.;
By: Gerndt, A.; Hamann, B.; Gwinner, K.; Cowgill, E.; Hagen, H.; Compton, T.; Bernadin, T.; Westerteiger, R.;
2012 / IEEE
By: Freeman, W.T.; Szeliski, R.; Sing Bing Kang; Joshi, N.; Zitnick, C.L.; Taeg Sang Cho;
By: Freeman, W.T.; Szeliski, R.; Sing Bing Kang; Joshi, N.; Zitnick, C.L.; Taeg Sang Cho;
2012 / IEEE
By: Schulz, V.; Schleyer, P.; King, A.P.; Aitken, A.; Marsden, P.K.; Buerger, C.; Tsoumpas, C.; Schaeffter, T.;
By: Schulz, V.; Schleyer, P.; King, A.P.; Aitken, A.; Marsden, P.K.; Buerger, C.; Tsoumpas, C.; Schaeffter, T.;
2012 / IEEE
By: Yamaya, T.; Haneishi, H.; Suga, M.; Murayama, H.; Tashima, H.; Inadama, N.; Nishikido, F.; Kinouchi, S.; Yoshida, E.;
By: Yamaya, T.; Haneishi, H.; Suga, M.; Murayama, H.; Tashima, H.; Inadama, N.; Nishikido, F.; Kinouchi, S.; Yoshida, E.;