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Topic: Ii-vi Semiconductors
Results
2011 / IEEE
By: Kuan, H.; Yang, J.R.; Li, W.C.; Sun, W.C.; Shiojiri, M.; Chen, M.J.; Huang, Y.H.; Chen, H.C.;
By: Kuan, H.; Yang, J.R.; Li, W.C.; Sun, W.C.; Shiojiri, M.; Chen, M.J.; Huang, Y.H.; Chen, H.C.;
2011 / IEEE
By: Zanotti, L.; Calestani, D.; Zambelli, N.; Benassi, G.; Mingzheng Zha; Marchini, L.; Gombia, E.; Caroli, E.; Auricchio, N.; Zappettini, A.; Pavesi, M.; Zanichelli, M.; Mosca, R.;
By: Zanotti, L.; Calestani, D.; Zambelli, N.; Benassi, G.; Mingzheng Zha; Marchini, L.; Gombia, E.; Caroli, E.; Auricchio, N.; Zappettini, A.; Pavesi, M.; Zanichelli, M.; Mosca, R.;
2011 / IEEE
By: Seller, P.; Cernik, R.C.; Jones, L.L.; Bell, S.J.; Veale, M.C.; Wilson, M.D.; Veeramani, P.; Sellin, P.J.; Kitou, D.; Allwork, C.;
By: Seller, P.; Cernik, R.C.; Jones, L.L.; Bell, S.J.; Veale, M.C.; Wilson, M.D.; Veeramani, P.; Sellin, P.J.; Kitou, D.; Allwork, C.;
2011 / IEEE
By: Zhao, X.; Luo, J.K.; Milne, W.I.; Ashley, G.M.; Lu, J.R.; Flewitt, A.J.; Al-Naimi, F.; Garcia-Gancedo, L.;
By: Zhao, X.; Luo, J.K.; Milne, W.I.; Ashley, G.M.; Lu, J.R.; Flewitt, A.J.; Al-Naimi, F.; Garcia-Gancedo, L.;
2011 / IEEE
By: Po-Yu Yang; Huang-Chung Cheng; Hung-Hsien Li; Cheng-Wei Chen; Jung-Chuan Chou; Po-Chun Chiu; Jyh-Liang Wang;
By: Po-Yu Yang; Huang-Chung Cheng; Hung-Hsien Li; Cheng-Wei Chen; Jung-Chuan Chou; Po-Chun Chiu; Jyh-Liang Wang;
2012 / IEEE
By: Butendheich, R.; Humphreys, C.; Dandan Zhu; Trivellin, N.; Vaccari, S.; Leirer, C.; Zanoni, E.; Meneghini, M.; Meneghesso, G.; Hahn, B.;
By: Butendheich, R.; Humphreys, C.; Dandan Zhu; Trivellin, N.; Vaccari, S.; Leirer, C.; Zanoni, E.; Meneghini, M.; Meneghesso, G.; Hahn, B.;
2012 / IEEE
By: Jr-Hau He; Miin-Jang Chen; Der-Hsien Lien; Chia-Yang Hsu; Ming-Wei Chen; Cheng-Ying Chen;
By: Jr-Hau He; Miin-Jang Chen; Der-Hsien Lien; Chia-Yang Hsu; Ming-Wei Chen; Cheng-Ying Chen;
2012 / IEEE
By: Chih-Wei Chien; Chang-Yu Lin; Tzong-Ming Lee; Chyi-Ming Leu; Ming-Jiue Yu; Chih-Ming Lai; Chun-Cheng Cheng; Yung-Hui Yeh; Chung-Chih Wu;
By: Chih-Wei Chien; Chang-Yu Lin; Tzong-Ming Lee; Chyi-Ming Leu; Ming-Jiue Yu; Chih-Ming Lai; Chun-Cheng Cheng; Yung-Hui Yeh; Chung-Chih Wu;
2012 / IEEE
By: Eun Suk Hwang; Un Ki Kim; Yoon Jang Chung; Yoonsoo Jung; Jisim Jung; Byoung Keon Park; Cheol Seong Hwang; Sang Ho Rha; Jung-Hae Choi; Tae Joo Park;
By: Eun Suk Hwang; Un Ki Kim; Yoon Jang Chung; Yoonsoo Jung; Jisim Jung; Byoung Keon Park; Cheol Seong Hwang; Sang Ho Rha; Jung-Hae Choi; Tae Joo Park;
2012 / IEEE
By: Huby, N.; Scarpa, G.; Tallarida, G.; Lugli, P.; Guziewicz, E.; Arcari, M.; Godlewski, M.; Krajewski, T.A.;
By: Huby, N.; Scarpa, G.; Tallarida, G.; Lugli, P.; Guziewicz, E.; Arcari, M.; Godlewski, M.; Krajewski, T.A.;
2012 / IEEE
By: Shimizu, T.; Nakazato, T.; Cadatal-Raduban, M.; Takeda, K.; Sakai, K.; Sarukura, N.; Wakamiya, A.; Kano, M.; Yamanoi, K.; Fukuda, T.;
By: Shimizu, T.; Nakazato, T.; Cadatal-Raduban, M.; Takeda, K.; Sakai, K.; Sarukura, N.; Wakamiya, A.; Kano, M.; Yamanoi, K.; Fukuda, T.;
2012 / IEEE
By: Nishikino, M.; Kawachi, T.; Fukuda, T.; Ehrentraut, D.; Azechi, H.; Nishimura, H.; Sarukura, N.; Tanaka, M.; Cadatal-Raduban, M.; Minami, Y.; Nishi, R.; Takeda, K.; Sakai, K.; Yamanoi, K.; Shimizu, T.; Nakazato, T.;
By: Nishikino, M.; Kawachi, T.; Fukuda, T.; Ehrentraut, D.; Azechi, H.; Nishimura, H.; Sarukura, N.; Tanaka, M.; Cadatal-Raduban, M.; Minami, Y.; Nishi, R.; Takeda, K.; Sakai, K.; Yamanoi, K.; Shimizu, T.; Nakazato, T.;
2011 / IEEE
By: Mastria, R.; Pompa, P.P.; Mangoni, A.; Quarta, A.; Capogrossi, M.C.; Zacheo, A.; Pellegrino, T.; Rinaldi, R.;
By: Mastria, R.; Pompa, P.P.; Mangoni, A.; Quarta, A.; Capogrossi, M.C.; Zacheo, A.; Pellegrino, T.; Rinaldi, R.;
2012 / IEEE
By: Muramatsu, S.; Kondo, T.; Namba, S.; Inuzuka, H.; Agata, Y.; Tachi, T.; Fujimura, N.; Yasuda, K.; Niraula, M.;
By: Muramatsu, S.; Kondo, T.; Namba, S.; Inuzuka, H.; Agata, Y.; Tachi, T.; Fujimura, N.; Yasuda, K.; Niraula, M.;
2012 / IEEE
By: Sekiwa, H.; Miyamoto, M.; Kikuchi, M.; Futami, Y.; Wakahara, S.; Sugiyama, M.; Nikl, M.; Yokota, Y.; Kurosawa, S.; Fujimoto, Y.; Yanagida, T.; Yoshikawa, A.; Yamaji, A.;
By: Sekiwa, H.; Miyamoto, M.; Kikuchi, M.; Futami, Y.; Wakahara, S.; Sugiyama, M.; Nikl, M.; Yokota, Y.; Kurosawa, S.; Fujimoto, Y.; Yanagida, T.; Yoshikawa, A.; Yamaji, A.;
Solution-Processed Zinc Oxide Thin-Film Transistors With a Low-Temperature Polymer Passivation Layer
2012 / IEEEBy: Xiaoli Xu; Xiaojun Guo; Yizheng Jin; Shasha He; Linrun Feng;
2012 / IEEE
By: Hyungcheol Shin; Ju-Wan Lee; In-Tak Cho; Jong-Ho Lee; Byung-Gook Park; Jun-Mo Park; Hyuck-In Kwon; Il-Hwan Cho; Joon-Seop Kwak; Chi-Sun Hwang; Woo-Seok Cheong;
By: Hyungcheol Shin; Ju-Wan Lee; In-Tak Cho; Jong-Ho Lee; Byung-Gook Park; Jun-Mo Park; Hyuck-In Kwon; Il-Hwan Cho; Joon-Seop Kwak; Chi-Sun Hwang; Woo-Seok Cheong;
2012 / IEEE
By: Yong-Kee Hwang; Myungchul Jun; Soo Young Yoon; Juhn-Suk Yoo; Min-Koo Han; Woo Seok Choi; Hyung Nyuck Cho; Binn Kim; Seung-Hee Kuk;
By: Yong-Kee Hwang; Myungchul Jun; Soo Young Yoon; Juhn-Suk Yoo; Min-Koo Han; Woo Seok Choi; Hyung Nyuck Cho; Binn Kim; Seung-Hee Kuk;
2012 / IEEE
By: Kanayama, Y.; Takahashi, T.; Watanabe, S.; Aono, H.; Hiromura, M.; Ishikawa, S.; Odaka, H.; Takeda, S.; Enomoto, S.;
By: Kanayama, Y.; Takahashi, T.; Watanabe, S.; Aono, H.; Hiromura, M.; Ishikawa, S.; Odaka, H.; Takeda, S.; Enomoto, S.;
2012 / IEEE
By: James, R.B.; Bolotnikov, A.E.; Reinhard, M.I.; Kim, K.; Rafiei, R.; Sarbutt, A.; Boardman, D.; Prokopovich, D.A.;
By: James, R.B.; Bolotnikov, A.E.; Reinhard, M.I.; Kim, K.; Rafiei, R.; Sarbutt, A.; Boardman, D.; Prokopovich, D.A.;
2012 / IEEE
By: Hung-Che Ting; Yi-Chen Chung; Ann-Kuo Chu; Ming-Yen Tsai; Chia-Yu Chen; Te-Chih Chen; Ting-Chang Chang; Tien-Yu Hsieh; Yu-Te Chen;
By: Hung-Che Ting; Yi-Chen Chung; Ann-Kuo Chu; Ming-Yen Tsai; Chia-Yu Chen; Te-Chih Chen; Ting-Chang Chang; Tien-Yu Hsieh; Yu-Te Chen;
2012 / IEEE
By: Moravec, P.; Bugar, M.; Belas, E.; Uxa, S.; Hoschl, P.; Elhadidy, H.; Franc, J.; Grill, R.;
By: Moravec, P.; Bugar, M.; Belas, E.; Uxa, S.; Hoschl, P.; Elhadidy, H.; Franc, J.; Grill, R.;
2012 / IEEE
By: Marchini, L.; James, R.B.; Camarda, G.S.; Bolotnikov, A.E.; Zambelli, N.; Zha, M.; Zappettini, A.;
By: Marchini, L.; James, R.B.; Camarda, G.S.; Bolotnikov, A.E.; Zambelli, N.; Zha, M.; Zappettini, A.;
2012 / IEEE
By: Hao-Chung Kuo; Chien-Chung Lin; Yi-Chun Yang; Ming-Yen Kuo; Kuo-Ju Chen; Chao-Hsun Wang; Min-Hsiung Shih; Hsin-Chu Chen;
By: Hao-Chung Kuo; Chien-Chung Lin; Yi-Chun Yang; Ming-Yen Kuo; Kuo-Ju Chen; Chao-Hsun Wang; Min-Hsiung Shih; Hsin-Chu Chen;
2012 / IEEE
By: Horng-Shyang Chen; Shao-Ying Ting; Chih-Chung Yang; Yean-Woei Kiang; Hao-Tsung Chen; Yu-Feng Yao; Chieh Hsieh; Chih-Yen Chen; Che-Hao Liao; Jeng-Jie Huang; Wen-Ming Chang;
By: Horng-Shyang Chen; Shao-Ying Ting; Chih-Chung Yang; Yean-Woei Kiang; Hao-Tsung Chen; Yu-Feng Yao; Chieh Hsieh; Chih-Yen Chen; Che-Hao Liao; Jeng-Jie Huang; Wen-Ming Chang;
2012 / IEEE
By: Tai-You Chen; Wen-Chau Liu; Po-Cheng Chou; Jian-Sheng Wu; Chien-Chang Huang; Chi-Shiang Hsu; Huey-Ing Chen;
By: Tai-You Chen; Wen-Chau Liu; Po-Cheng Chou; Jian-Sheng Wu; Chien-Chang Huang; Chi-Shiang Hsu; Huey-Ing Chen;
2012 / IEEE
By: Carroy, P.; Bugnon, G.; Boccard, M.; Ding, L.; Ballif, C.; Caglar, O.; Benkhaira, M.; Kluth, O.; Losio, P.A.; Nicolay, S.; Sculati-Meillaud, F.; Despeisse, M.;
By: Carroy, P.; Bugnon, G.; Boccard, M.; Ding, L.; Ballif, C.; Caglar, O.; Benkhaira, M.; Kluth, O.; Losio, P.A.; Nicolay, S.; Sculati-Meillaud, F.; Despeisse, M.;
2012 / IEEE
By: Chien-Hua Chiu; Kuo-Yi Yen; Jyh-Rong Gong; Tai-Yuan Lin; Tzu-Pei Chen; Pei-Shin Lin; Chien-Hua Chou; Chun-Wei Li;
By: Chien-Hua Chiu; Kuo-Yi Yen; Jyh-Rong Gong; Tai-Yuan Lin; Tzu-Pei Chen; Pei-Shin Lin; Chien-Hua Chou; Chun-Wei Li;
2012 / IEEE
By: Baghban, H.; Shekari, H.; Miri, S.; Rasooli, H.; Rostami, A.; Dolatyari, M.; Amini, E.;
By: Baghban, H.; Shekari, H.; Miri, S.; Rasooli, H.; Rostami, A.; Dolatyari, M.; Amini, E.;
2012 / IEEE
By: Dae-Hyuk Kwon; Tae-Yang You; Byoung-Ho Kang; Shin-Won Kang; Se-Hyuk Yeom; Heng Yuan; Sang-Won Lee; Su-Hwan Kim; Kyu-Jin Kim;
By: Dae-Hyuk Kwon; Tae-Yang You; Byoung-Ho Kang; Shin-Won Kang; Se-Hyuk Yeom; Heng Yuan; Sang-Won Lee; Su-Hwan Kim; Kyu-Jin Kim;
2012 / IEEE
By: Lu, S.; Vasekar, P.; Vanhart, D.; Nandur, A.S.; Sharma, A.; Dhakal, T.P.; Hamasha, M.M.; Westgate, C.R.;
By: Lu, S.; Vasekar, P.; Vanhart, D.; Nandur, A.S.; Sharma, A.; Dhakal, T.P.; Hamasha, M.M.; Westgate, C.R.;
2012 / IEEE
By: Myungchul Jun; Hyung Nyuck Cho; Kim, B.; Min-Koo Han; Yong-Kee Hwang; Woo Seok Choi; Soo Young Yoon; Juhn-Suk Yoo; Yong Ho Jang; Seung-Hee Kuk;
By: Myungchul Jun; Hyung Nyuck Cho; Kim, B.; Min-Koo Han; Yong-Kee Hwang; Woo Seok Choi; Soo Young Yoon; Juhn-Suk Yoo; Yong Ho Jang; Seung-Hee Kuk;
2012 / IEEE
By: Yongsik Kim; Dongsik Kong; Sungchul Kim; Dae Hwan Kim; Dong Myong Kim; Hyuck-In Kwon; Jaewoo Park; Jun-Hyun Park; Yong Woo Jeon; Sei Yong Park; Byung Du Ahn; Je-Hun Lee; Min-Kyung Bae; Hyun Kwang Jung;
By: Yongsik Kim; Dongsik Kong; Sungchul Kim; Dae Hwan Kim; Dong Myong Kim; Hyuck-In Kwon; Jaewoo Park; Jun-Hyun Park; Yong Woo Jeon; Sei Yong Park; Byung Du Ahn; Je-Hun Lee; Min-Kyung Bae; Hyun Kwang Jung;
2012 / IEEE
By: Allen, M.W.; Partridge, J.; Gunn, R.; Fang, Q.; Masaud, T.B.; Ashburn, P.; Sun, K.; Sultan, S.M.; Clark, O.D.; Chong, H.M.H.;
By: Allen, M.W.; Partridge, J.; Gunn, R.; Fang, Q.; Masaud, T.B.; Ashburn, P.; Sun, K.; Sultan, S.M.; Clark, O.D.; Chong, H.M.H.;
2012 / IEEE
By: Hung, F.Y.; Hsueh, H.T.; Chang, S.J.; Hsueh, T.J.; Hsu, C.L.; Wen, K.H.; Lam, K.T.; Dai, B.T.;
By: Hung, F.Y.; Hsueh, H.T.; Chang, S.J.; Hsueh, T.J.; Hsu, C.L.; Wen, K.H.; Lam, K.T.; Dai, B.T.;