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Topic: Heating
Results
2011 / IEEE
By: Li-Han Chen; Villwock, D.; Cihan Kuru; Daehoon Hong; Sungho Jin; Young Oh; Kunbae Noh; Chulmin Choi;
By: Li-Han Chen; Villwock, D.; Cihan Kuru; Daehoon Hong; Sungho Jin; Young Oh; Kunbae Noh; Chulmin Choi;
Spectrally and Spatially Resolved Radiance Measurement in High-Speed Shock Waves for Planetary Entry
2011 / IEEEBy: Cruden, B.A.;
2011 / IEEE
By: de Moraes Oliveira, R.; Kostov, K.G.; Ueda, M.; Bacci Fernandes, B.; Mello, C.B.; da Silva Savonov, G.;
By: de Moraes Oliveira, R.; Kostov, K.G.; Ueda, M.; Bacci Fernandes, B.; Mello, C.B.; da Silva Savonov, G.;
2011 / IEEE
By: Hyun-Jong Chung; Jinseong Heo; Sung Kwan Lim; Chunhum Cho; Hyeon Jun Hwang; Heejun Yang; Sang Kyung Lee; Chang Goo Kang; Byoung Hun Lee; Young Gon Lee; Sunae Seo;
By: Hyun-Jong Chung; Jinseong Heo; Sung Kwan Lim; Chunhum Cho; Hyeon Jun Hwang; Heejun Yang; Sang Kyung Lee; Chang Goo Kang; Byoung Hun Lee; Young Gon Lee; Sunae Seo;
2011 / IEEE
By: Vyrsokinos, K.; Stamatiadis, C.; Avramopoulos, H.; Van Thourhout, D.; Zhen Sheng; De Heyn, P.; Wahlbrink, T.; Karl, M.; Bolten, J.; Maziotis, A.; Lazarou, I.; Stampoulidis, L.;
By: Vyrsokinos, K.; Stamatiadis, C.; Avramopoulos, H.; Van Thourhout, D.; Zhen Sheng; De Heyn, P.; Wahlbrink, T.; Karl, M.; Bolten, J.; Maziotis, A.; Lazarou, I.; Stampoulidis, L.;
2011 / IEEE
By: Osada, H.; Kubota, K.; Sekino, N.; Namizaki, Y.; Dawson, F.P.; Uchidate, S.; Oka, H.; Lavers, J.D.;
By: Osada, H.; Kubota, K.; Sekino, N.; Namizaki, Y.; Dawson, F.P.; Uchidate, S.; Oka, H.; Lavers, J.D.;
2011 / IEEE
By: Dirisaglik, F.; Cywar, A.; Gokirmak, A.; Silva, H.; Steen, S.; Bakan, G.; Akbulut, M.;
By: Dirisaglik, F.; Cywar, A.; Gokirmak, A.; Silva, H.; Steen, S.; Bakan, G.; Akbulut, M.;
2012 / IEEE
By: Machala, C.; Hou, F.; Martin, S.; Shichijo, H.; Trombley, D.E.; Patalay, P.R.; Jindal, R.P.; Mahajan, V.M.;
By: Machala, C.; Hou, F.; Martin, S.; Shichijo, H.; Trombley, D.E.; Patalay, P.R.; Jindal, R.P.; Mahajan, V.M.;
2011 / IEEE
By: Ghafouri, N.; Hengxi Yang; Baoling Huang; Gi Suk Hwang; Gross, A.J.; Hanseup Kim; Kaviany, M.; Najafi, K.; Uher, C.; Peterson, R.L.;
By: Ghafouri, N.; Hengxi Yang; Baoling Huang; Gi Suk Hwang; Gross, A.J.; Hanseup Kim; Kaviany, M.; Najafi, K.; Uher, C.; Peterson, R.L.;
2012 / IEEE
By: Agrawal, M.; Shrivastava, M.; Rao, V.R.; Sharma, D.K.; Schulz, T.; Gossner, H.; Mahajan, S.;
By: Agrawal, M.; Shrivastava, M.; Rao, V.R.; Sharma, D.K.; Schulz, T.; Gossner, H.; Mahajan, S.;
2012 / IEEE
By: Kim, W.C.; Yang, H.L.; Bak, J.G.; Jeon, Y.M.; Lee, K.S.; Kim, H.K.; Oh, Y.S.; Kim, K.M.; Hong, S.H.; Bang, E.N.; Kim, H.T.; Chung, K.S.;
By: Kim, W.C.; Yang, H.L.; Bak, J.G.; Jeon, Y.M.; Lee, K.S.; Kim, H.K.; Oh, Y.S.; Kim, K.M.; Hong, S.H.; Bang, E.N.; Kim, H.T.; Chung, K.S.;
2012 / IEEE
By: Kallenbach, A.; Zohm, H.; Braun, F.; Herrmann, A.; Hohnle, H.; McDermott, R.M.; Neu, R.; Noterdaeme, J.; Putterich, T.; Schweinzer, J.; Stober, J.; Strumberger, E.; Suttrop, W.; Wagner, D.; Bobkov, V.;
By: Kallenbach, A.; Zohm, H.; Braun, F.; Herrmann, A.; Hohnle, H.; McDermott, R.M.; Neu, R.; Noterdaeme, J.; Putterich, T.; Schweinzer, J.; Stober, J.; Strumberger, E.; Suttrop, W.; Wagner, D.; Bobkov, V.;
2012 / IEEE
By: Ahmed, I.; Roopesh, G.; Parmar, K.G.; Pandya, K.; Gahlaut, A.; Bansal, G.; Singh, M.J.; Bandyopadhyay, M.; Chakraborty, A.K.; Yadav, R.K.; Soni, J.; Phukan, A.; Shah, S.; Rotti, C.;
By: Ahmed, I.; Roopesh, G.; Parmar, K.G.; Pandya, K.; Gahlaut, A.; Bansal, G.; Singh, M.J.; Bandyopadhyay, M.; Chakraborty, A.K.; Yadav, R.K.; Soni, J.; Phukan, A.; Shah, S.; Rotti, C.;
2011 / IEEE
By: Frechette, M.; Gubanski, S.; Bulinski, A.; Tanaka, T.; Han, S.J.; Sutton, S.; Reed, C.W.; Ohki, Y.; Vaughan, A.; Castellon, J.; Pelissou, S.; Tanaka, Y.; Morshuis, P.; Nagao, M.; Montanari, G.C.; Kindersberger, J.;
By: Frechette, M.; Gubanski, S.; Bulinski, A.; Tanaka, T.; Han, S.J.; Sutton, S.; Reed, C.W.; Ohki, Y.; Vaughan, A.; Castellon, J.; Pelissou, S.; Tanaka, Y.; Morshuis, P.; Nagao, M.; Montanari, G.C.; Kindersberger, J.;