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Topic: Heat Sinks
Results
2011 / IEEE
By: Fujimura, Y.; Mori, K.; Sasaki, H.; Ohshima, D.; Yamamichi, S.; Miki, R.; Kikuchi, K.; Enomoto, M.; Murakami, T.; Nishiyama, T.; Funaya, T.; Nakashima, Y.;
By: Fujimura, Y.; Mori, K.; Sasaki, H.; Ohshima, D.; Yamamichi, S.; Miki, R.; Kikuchi, K.; Enomoto, M.; Murakami, T.; Nishiyama, T.; Funaya, T.; Nakashima, Y.;
2012 / IEEE
By: Nagakura, T.; Torii, K.; Takauji, M.; Morita, T.; Maeda, J.; Kageyama, N.; Yoshida, H.; Miyajima, H.;
By: Nagakura, T.; Torii, K.; Takauji, M.; Morita, T.; Maeda, J.; Kageyama, N.; Yoshida, H.; Miyajima, H.;
2012 / IEEE
By: Quarterman, A.H.; Kbashi, H.J.; Wilcox, K.G.; Tropper, A.C.; Henini, M.; Apostolopoulos, V.; Morris, O.J.;
By: Quarterman, A.H.; Kbashi, H.J.; Wilcox, K.G.; Tropper, A.C.; Henini, M.; Apostolopoulos, V.; Morris, O.J.;
2012 / IEEE
By: Matsunaga, K.; Okamoto, Y.; Nakayama, T.; Ando, Y.; Miyamoto, H.; Tanomura, M.; Wakejima, A.; Kuroda, N.; Ota, K.;
By: Matsunaga, K.; Okamoto, Y.; Nakayama, T.; Ando, Y.; Miyamoto, H.; Tanomura, M.; Wakejima, A.; Kuroda, N.; Ota, K.;
2012 / IEEE
By: Shell, K. A.; Schuetz, M. A.; Davis, R. J.; French, R. H.; Reinbolt, G. S.; Brown, S. A.;
By: Shell, K. A.; Schuetz, M. A.; Davis, R. J.; French, R. H.; Reinbolt, G. S.; Brown, S. A.;
2012 / IEEE
By: Xinkun Li; Zhanguo Wang; Ju Wu; Jian Wu; Heng Wei; Xueqin Lv; Zuocai Wang; Qi An; Peng Jin;
By: Xinkun Li; Zhanguo Wang; Ju Wu; Jian Wu; Heng Wei; Xueqin Lv; Zuocai Wang; Qi An; Peng Jin;
2012 / IEEE
By: Goto, T.; Yuhara, T.; Asano, S.; Hachisuka, D.; Takao, T.; Nishimura, A.; Yamanaka, A.;
By: Goto, T.; Yuhara, T.; Asano, S.; Hachisuka, D.; Takao, T.; Nishimura, A.; Yamanaka, A.;
2011 / IEEE / 978-1-4244-9312-8
By: Zyskowski, L.; Sobczuk, D.; Gedroyc, K.; Jasinski, M.; Zelechowski, M.;
By: Zyskowski, L.; Sobczuk, D.; Gedroyc, K.; Jasinski, M.; Zelechowski, M.;
2011 / IEEE / 978-1-61284-385-8
By: Xudong Fan; Xudong Cui; Xinyong Tao; Zheng Fan; Lixin Dong; Xiaobin Zhang;
By: Xudong Fan; Xudong Cui; Xinyong Tao; Zheng Fan; Lixin Dong; Xiaobin Zhang;
2011 / IEEE / 978-1-4577-0803-9
By: Plosila, J.; Liljeberg, P.; Latif, K.; Rahmani, A.; Vaddina, K.R.;
By: Plosila, J.; Liljeberg, P.; Latif, K.; Rahmani, A.; Vaddina, K.R.;
2011 / IEEE / 978-1-4577-1048-3
By: Liljeberg, P.; Latif, K.; Rahmani, A.; Vaddina, K.R.; Plosila, J.;
By: Liljeberg, P.; Latif, K.; Rahmani, A.; Vaddina, K.R.; Plosila, J.;
2011 / IEEE / 978-1-4577-0321-8
By: Li-gang Wu; Kun Bai; Fa-wei Zhang; Zhao-yong Zheng; Qiu-hua Nie; Xiang-jun Ma; Bo-you Zhou; Shi-xun Dai;
By: Li-gang Wu; Kun Bai; Fa-wei Zhang; Zhao-yong Zheng; Qiu-hua Nie; Xiang-jun Ma; Bo-you Zhou; Shi-xun Dai;
2011 / IEEE / 978-1-4577-0321-8
By: Ligang Wu; Xiangjun Ma; Zhaoyong Zheng; Boyou Zhou; Kun Bai; Shixun Dai;
By: Ligang Wu; Xiangjun Ma; Zhaoyong Zheng; Boyou Zhou; Kun Bai; Shixun Dai;
2011 / IEEE / 978-1-4577-1769-7
By: Qiang Zhou; Shaojie Dong; Jianyi Yang; Xiaoqing Jiang; Minghua Wang;
By: Qiang Zhou; Shaojie Dong; Jianyi Yang; Xiaoqing Jiang; Minghua Wang;
2011 / IEEE / 978-1-4577-1769-7
By: Yuen, M.M.F.; Zhaoli Gao; Haibo Fan; Xiaohua Zhang; Xiao, D.G.W.; Kai Zhang;
By: Yuen, M.M.F.; Zhaoli Gao; Haibo Fan; Xiaohua Zhang; Xiao, D.G.W.; Kai Zhang;
2011 / IEEE / 978-1-4577-1769-7
By: He Jiameng; Wang Dianxiao; Li Zongshuo; Wang Jia; Wang Xiaojing;
By: He Jiameng; Wang Dianxiao; Li Zongshuo; Wang Jia; Wang Xiaojing;
2011 / IEEE / 978-1-4577-1646-1
By: Figueira, H.H.; Krug, R.P.; Cazakevicius, F.E.; Hey, H.L.; Beltrame, R.C.;
By: Figueira, H.H.; Krug, R.P.; Cazakevicius, F.E.; Hey, H.L.; Beltrame, R.C.;
2011 / IEEE / 978-2-35500-016-4
By: Madhour, Y.; Poulikakos, D.; Michel, B.; Thome, J.; Olivier, J.; Zimmermann, S.;
By: Madhour, Y.; Poulikakos, D.; Michel, B.; Thome, J.; Olivier, J.; Zimmermann, S.;
2011 / IEEE / 978-1-4577-1646-1
By: Soares, G.M.; Almeida, P.S.; Rodrigues, C.R.B.S.; Braga, H.A.C.; Pinto, D.P.; Jorge, J.M.;
By: Soares, G.M.; Almeida, P.S.; Rodrigues, C.R.B.S.; Braga, H.A.C.; Pinto, D.P.; Jorge, J.M.;
2011 / IEEE / 978-2-35500-016-4
By: Wunderle, B.; Schacht, R.; May, D.; Monory-Plantier, C.; Winkler, T.; Haug, R.; AboRas, M.; Michel, B.;
By: Wunderle, B.; Schacht, R.; May, D.; Monory-Plantier, C.; Winkler, T.; Haug, R.; AboRas, M.; Michel, B.;
2011 / IEEE / 978-2-87487-022-4
By: Yamamoto, Z.-I.; Moriguchi, Y.; Furuta, S.; Ishizaki, T.; Kobayashi, Y.; Kawasaki, S.; Isono, K.; Shibuya, Y.; Noji, H.; Hori, M.;
By: Yamamoto, Z.-I.; Moriguchi, Y.; Furuta, S.; Ishizaki, T.; Kobayashi, Y.; Kawasaki, S.; Isono, K.; Shibuya, Y.; Noji, H.; Hori, M.;