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Topic: Grain Size
Results
2011 / IEEE
By: Cheng-Wei Lin; Wen-Chau Liu; Chi-Shiang Hsu; Chien-Chang Huang; Tai-You Chen; Huey-Ing Chen;
By: Cheng-Wei Lin; Wen-Chau Liu; Chi-Shiang Hsu; Chien-Chang Huang; Tai-You Chen; Huey-Ing Chen;
2011 / IEEE
By: Sasaki, T.; Akutsu, H.; Hokazono, A.; Sonehara, T.; Uchida, H.; Toyoshima, Y.; Inaba, S.; Kawanaka, S.; Tomita, M.;
By: Sasaki, T.; Akutsu, H.; Hokazono, A.; Sonehara, T.; Uchida, H.; Toyoshima, Y.; Inaba, S.; Kawanaka, S.; Tomita, M.;
2011 / IEEE
By: Pinol, L.A.; Clatterbaugh, G.; Coles, G.; Deacon, R.; Lee, D.M.; Charles, H.K.; Melngailis, J.;
By: Pinol, L.A.; Clatterbaugh, G.; Coles, G.; Deacon, R.; Lee, D.M.; Charles, H.K.; Melngailis, J.;
2011 / IEEE
By: Wasa, K.; Kalinin, S.V.; Jesse, S.; Jackson, T.N.; Bharadwaja, S.S.N.; Trolier-McKinstry, S.; Dalong Zhao; Jousse, P.; Yaeger, C.; Griggio, F.;
By: Wasa, K.; Kalinin, S.V.; Jesse, S.; Jackson, T.N.; Bharadwaja, S.S.N.; Trolier-McKinstry, S.; Dalong Zhao; Jousse, P.; Yaeger, C.; Griggio, F.;
2012 / IEEE
By: Atassi, I.; Maric, A.; Blaz, N.; Smetana, W.; Homolka, H.; Zivanov, L.; Radosavljevic, G.;
By: Atassi, I.; Maric, A.; Blaz, N.; Smetana, W.; Homolka, H.; Zivanov, L.; Radosavljevic, G.;
2012 / IEEE
By: de Campos, M.F.; Machado, R.; Landgraf, F.J.G.; Missell, F.P.; Gerhardt, G.J.L.; Silveira, J.R.F.; Rodrigues, D.L.;
By: de Campos, M.F.; Machado, R.; Landgraf, F.J.G.; Missell, F.P.; Gerhardt, G.J.L.; Silveira, J.R.F.; Rodrigues, D.L.;
2012 / IEEE
By: Kaneko, Y.; Kato, A.; Manabe, A.; Shoji, T.; Miyamoto, N.; Harada, M.; Ono, K.; Yano, M.; Kohlbrecher, J.; Nozaki, H.;
By: Kaneko, Y.; Kato, A.; Manabe, A.; Shoji, T.; Miyamoto, N.; Harada, M.; Ono, K.; Yano, M.; Kohlbrecher, J.; Nozaki, H.;
2012 / IEEE
By: Shiming Ang; Chun Lian Ong; Zhi-Min Yuan; Mingsheng Zhang; Siang Huei Leong; Bo Liu;
By: Shiming Ang; Chun Lian Ong; Zhi-Min Yuan; Mingsheng Zhang; Siang Huei Leong; Bo Liu;
2012 / IEEE
By: Colombeau, B.; Chung, S.S.; Guo, B.N.; Hsieh, E.R.; Wu, J.Y.; Chan, M.; Lu, S.; Liao, C.I.; Chin, Y.L.; Chen, W.J.; Lin, G.P.; Tzeng, C.Y.; Li, C.I.; Tsai, C.H.; Yang, C.L.; Chen, I.C.;
By: Colombeau, B.; Chung, S.S.; Guo, B.N.; Hsieh, E.R.; Wu, J.Y.; Chan, M.; Lu, S.; Liao, C.I.; Chin, Y.L.; Chen, W.J.; Lin, G.P.; Tzeng, C.Y.; Li, C.I.; Tsai, C.H.; Yang, C.L.; Chen, I.C.;
2012 / IEEE
By: Shuyun Zhao; Zhiguo Meng; Wei Zhou; Hoi-Sing Kwok; Man Wong; Rongsheng Chen; Meng Zhang;
By: Shuyun Zhao; Zhiguo Meng; Wei Zhou; Hoi-Sing Kwok; Man Wong; Rongsheng Chen; Meng Zhang;
2011 / IEEE / 978-1-61284-774-0
By: Yuemin Zhao; Yongwei Zhang; Qiong Chen; Xianqing Yang; Zhenhui Wang;
By: Yuemin Zhao; Yongwei Zhang; Qiong Chen; Xianqing Yang; Zhenhui Wang;
2011 / IEEE / 978-1-61284-088-8
By: Yangan Yan; Jing Wang; Huawa Yu; Yali Du; Hanchen Liu; Bin Gao; Xin Wang;
By: Yangan Yan; Jing Wang; Huawa Yu; Yali Du; Hanchen Liu; Bin Gao; Xin Wang;
2011 / IEEE / 978-1-4577-0399-7
By: Wang Cheng; Wang Fengchun; Lianwei Shan; Xianyou Zhang; Han Zhidong; Dong Limin; Wu Ze;
By: Wang Cheng; Wang Fengchun; Lianwei Shan; Xianyou Zhang; Han Zhidong; Dong Limin; Wu Ze;
Optimization of process parameters on grain size of Fe3 O4 nanoparticles by support vector regression
2011 / IEEE / 978-1-61284-777-1By: Yuan, F.Q.; Pei, J.F.; Zhu, X.J.; Cai, C.Z.; Wang, G.L.;
2011 / IEEE / 978-1-4577-0708-7
By: Masahara, M.; Mastukawa, T.; Liu, Y.X.; Ogura, A.; Hayashida, T.; Kamei, T.; Endo, K.; Sakamoto, K.; Ishikawa, Y.; Yamauchi, H.; Tsukada, J.; Oruchi, S.;
By: Masahara, M.; Mastukawa, T.; Liu, Y.X.; Ogura, A.; Hayashida, T.; Kamei, T.; Endo, K.; Sakamoto, K.; Ishikawa, Y.; Yamauchi, H.; Tsukada, J.; Oruchi, S.;
2011 / IEEE / 978-1-4577-1005-6
By: Lemmetyinen, J.; Shichang Kang; Jiancheng Shi; Huadong Guo; Yubao Qiu; Wang, J.R.;
By: Lemmetyinen, J.; Shichang Kang; Jiancheng Shi; Huadong Guo; Yubao Qiu; Wang, J.R.;
2011 / IEEE / 978-966-335-357-9
By: Opanasyuk, A.S.; Kurbatov, D.I.; Protsenko, I.Y.; Danilchenko, S.M.; Sofronov, D.S.;
By: Opanasyuk, A.S.; Kurbatov, D.I.; Protsenko, I.Y.; Danilchenko, S.M.; Sofronov, D.S.;
Classification of aromatic and non-aromatic rice using electronic nose and artificial neural network
2011 / IEEE / 978-1-4244-9477-4By: Bhattacharyya, N.; Jana, A.; Mukherjee, S.; Roy, J.K.; Kundu, C.; Tudu, B.; Adhikari, B.; Bandyopadhyay, R.;
2011 / IEEE / 978-1-4577-1769-7
By: Galuschki, K.; Ting Liu; Dongyan Ding; Yiqing Wang; Yu Hu; Dali Mao; Ming Li; Yihua Gong;
By: Galuschki, K.; Ting Liu; Dongyan Ding; Yiqing Wang; Yu Hu; Dali Mao; Ming Li; Yihua Gong;
2011 / IEEE / 978-1-4673-0149-7
By: Ming Li; Chun Chen; Dongyan Ding; Jiangyan Sun; Hongqi Sun; Yanfeng He;
By: Ming Li; Chun Chen; Dongyan Ding; Jiangyan Sun; Hongqi Sun; Yanfeng He;
2011 / IEEE / 978-1-4577-1516-7
By: Hauri, K.; Fu, R.; Meissner, G.; Kilpatrick, S.; Nichols, B.M.; Zakar, E.;
By: Hauri, K.; Fu, R.; Meissner, G.; Kilpatrick, S.; Nichols, B.M.; Zakar, E.;
2011 / IEEE / 978-1-4577-2037-6
By: Yadav, K.L.; Kumar, A.; Singh, H.; Rawat, M.; Adhlakha, N.; Rani, J.; Patel, P.K.;
By: Yadav, K.L.; Kumar, A.; Singh, H.; Rawat, M.; Adhlakha, N.; Rani, J.; Patel, P.K.;
2011 / IEEE / 978-1-4577-2037-6
By: Santucci, S.; Passacantando, M.; Murthy, C.S.C.; Krishna, M.; Rao, K.N.; Sumana, K.S.; Phani, A.R.;
By: Santucci, S.; Passacantando, M.; Murthy, C.S.C.; Krishna, M.; Rao, K.N.; Sumana, K.S.; Phani, A.R.;
2011 / IEEE / 978-1-4577-2141-0
By: Bunjongpru, W.; Panprom, P.; Porntheeraphat, S.; Meananeatra, R.; Jeamsaksiri, W.; Nukeaw, J.; Chaisriratanakul, W.; Chaowicharat, E.; Pankiew, A.; Hruanun, C.; Poyai, A.; Srisuwan, A.;
By: Bunjongpru, W.; Panprom, P.; Porntheeraphat, S.; Meananeatra, R.; Jeamsaksiri, W.; Nukeaw, J.; Chaisriratanakul, W.; Chaowicharat, E.; Pankiew, A.; Hruanun, C.; Poyai, A.; Srisuwan, A.;
2011 / IEEE / 978-1-4577-2141-0
By: Cho, I.S.; Jun, T.J.; Park, I.G.; Lee, C.S.; Shin, K.S.; Ahn, D.G.; Amanov, A.;
By: Cho, I.S.; Jun, T.J.; Park, I.G.; Lee, C.S.; Shin, K.S.; Ahn, D.G.; Amanov, A.;
2011 / IEEE / 978-1-4244-9965-6
By: Contreras-Puente, G.; Tufino-Velazquez, M.; Albor-Aguilera, M.L.; Calixto, M.E.; Sastre-Hernandez, J.; Casados, G.; Morales-Acevedo, A.;
By: Contreras-Puente, G.; Tufino-Velazquez, M.; Albor-Aguilera, M.L.; Calixto, M.E.; Sastre-Hernandez, J.; Casados, G.; Morales-Acevedo, A.;
2011 / IEEE / 978-1-4244-9965-6
By: Compaan, A.D.; Scarpulla, M.A.; Nowell, M.M.; Wieland, K.A.; Dohyoung Kwon; Paudel, N.R.; Liu, X.;
By: Compaan, A.D.; Scarpulla, M.A.; Nowell, M.M.; Wieland, K.A.; Dohyoung Kwon; Paudel, N.R.; Liu, X.;