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Topic: Glasses
Results
2012 / IEEE / 978-1-4577-1991-2
By: Asif, M.; Ali, S.F.A.; Mirza, E.H.; Najam ul Hassan, S.; Azhar bin Ibrahim, W.M.;
By: Asif, M.; Ali, S.F.A.; Mirza, E.H.; Najam ul Hassan, S.; Azhar bin Ibrahim, W.M.;
2014 / IEEE
By: Eaton, Shane M.; Ramponi, Roberta; Guduru, Surya S. K.; Turco, Sara Lo; Criante, Luigino;
By: Eaton, Shane M.; Ramponi, Roberta; Guduru, Surya S. K.; Turco, Sara Lo; Criante, Luigino;
2006 / RSC Publishing
By: Carla C. de Araujo; Younes Messaddeq; Sidney J. L. Ribeiro; Gaeumll Poirier; Hellmut Eckert; Long Zhang; Wenzel Strojek;
By: Carla C. de Araujo; Younes Messaddeq; Sidney J. L. Ribeiro; Gaeumll Poirier; Hellmut Eckert; Long Zhang; Wenzel Strojek;
2008 / RSC Publishing
By: Gerile Naren; Takayoshi Kimura; Toshiharu Suzuki; Hiromichi Kurosu; Masafumi Harada; Masayasu Iida; Rie Masuda;
By: Gerile Naren; Takayoshi Kimura; Toshiharu Suzuki; Hiromichi Kurosu; Masafumi Harada; Masayasu Iida; Rie Masuda;
2009 / RSC Publishing
By: Toshiharu Suzuki; Masafumi Harada; Masayasu Iida; Ami Yasuda; Gerile Naren; Masako Kato;
By: Toshiharu Suzuki; Masafumi Harada; Masayasu Iida; Ami Yasuda; Gerile Naren; Masako Kato;
2009 / RSC Publishing
By: Isaac Abrahams; Ricardo A. Piresfnoteref; Geoffrey E. Hawkes; Teresa G. Nunes;
By: Isaac Abrahams; Ricardo A. Piresfnoteref; Geoffrey E. Hawkes; Teresa G. Nunes;
2009 / RSC Publishing
By: Michaeumll Deschamps; Julien Hiet; Dominique Massiot; Franck Fayon; Nadia Pellerin;
By: Michaeumll Deschamps; Julien Hiet; Dominique Massiot; Franck Fayon; Nadia Pellerin;
2010 / RSC Publishing
By: Aleksei Bytchkovfnoteref; David L. Price; Louis Hennet; Dominique Massiot; Franck Fayon;
By: Aleksei Bytchkovfnoteref; David L. Price; Louis Hennet; Dominique Massiot; Franck Fayon;
2010 / RSC Publishing
By: Jefferson Tsuchida; Hellmut Eckert; Matthias T. Rinke; Andreacute Orlandi de Oliveira; Joseacute Schneider;
By: Jefferson Tsuchida; Hellmut Eckert; Matthias T. Rinke; Andreacute Orlandi de Oliveira; Joseacute Schneider;
2010 / RSC Publishing
By: Javier RodriacuteguezViejo; Maria Teresa ClavagueraMora; Gemma Garcia; Alfonso Sepuacutelveda; Edgar LeonGutierrez;
By: Javier RodriacuteguezViejo; Maria Teresa ClavagueraMora; Gemma Garcia; Alfonso Sepuacutelveda; Edgar LeonGutierrez;
2010 / RSC Publishing
By: M. M. Stevens; R. G. Hill; R. V. Law; M. D. ODonnell; G. Jell; M. M. Azevedo;
By: M. M. Stevens; R. G. Hill; R. V. Law; M. D. ODonnell; G. Jell; M. M. Azevedo;
2010 / RSC Publishing
By: P. L. Candarlioglu; M. D. OrsquoDonnell; M. M. Stevens; E. Gentleman; C. A. Miller;
By: P. L. Candarlioglu; M. D. OrsquoDonnell; M. M. Stevens; E. Gentleman; C. A. Miller;
2001 / IEEE / 0-7803-7100-3
By: Li, J.; Chen, K.; Herman, P.R.; Marowsky, G.; Ihlemann, J.; Wei, M.;
By: Li, J.; Chen, K.; Herman, P.R.; Marowsky, G.; Ihlemann, J.; Wei, M.;
2003 / IEEE / 1-55752-748-2
By: Torti, C.; Greenhalgh, C.; Evans, R.; Camacho-Lopez, S.; Robertson, J.; Nantel, M.; Lilge, L.; Herman, P.; Marjoribanks, R.;
By: Torti, C.; Greenhalgh, C.; Evans, R.; Camacho-Lopez, S.; Robertson, J.; Nantel, M.; Lilge, L.; Herman, P.; Marjoribanks, R.;
2003 / IEEE / 0-7803-7733-8
By: Barkauskas, M.; Kudriashov, V.; Simtkaitis, V.; Grigonis, R.; Gaizcmskas, E.;
By: Barkauskas, M.; Kudriashov, V.; Simtkaitis, V.; Grigonis, R.; Gaizcmskas, E.;
2004 / IEEE / 0-7803-8490-3
By: Miles, R.E.; Stringer, M.R.; Foulds, A.P.; Naftaly, M.; Davies, A.G.;
By: Miles, R.E.; Stringer, M.R.; Foulds, A.P.; Naftaly, M.; Davies, A.G.;
2005 / IEEE / 0-7803-8865-8
By: Jacko, J.A.; Barreto, A.; Alonso, M., Jr.; Choudhury, M.; Adjouadi, M.;
By: Jacko, J.A.; Barreto, A.; Alonso, M., Jr.; Choudhury, M.; Adjouadi, M.;
2005 / IEEE / 1-55752-795-4
By: Graper, D.; Frank, F.; Marjoribanks, R.; Stuart, B.; McKinney, L.; Shirk, M.; Nantel, M.; Soudagar, Y.;
By: Graper, D.; Frank, F.; Marjoribanks, R.; Stuart, B.; McKinney, L.; Shirk, M.; Nantel, M.; Soudagar, Y.;
2007 / IEEE / 1-4244-1248-X
By: Ferraris, M.; Fokine, M.; Chiaretta, D.; Jianjun Xing; Guihua Liao; Qiuping Chen; Milanese, D.;
By: Ferraris, M.; Fokine, M.; Chiaretta, D.; Jianjun Xing; Guihua Liao; Qiuping Chen; Milanese, D.;
2007 / IEEE / 978-1-4244-0930-3
By: Madden, S.; Rongping Wang; Luther-Davies, B.; Prasad, A.; Congji Zha; Rode, A.;
By: Madden, S.; Rongping Wang; Luther-Davies, B.; Prasad, A.; Congji Zha; Rode, A.;
2007 / IEEE / 978-1-55752-834-6
By: Cardinal, T.; Rivero, C.; Couzi, M.; Rodriguez, V.; Bousquet, B.; Fargin, E.; Royon, A.; Richardson, K.; Canioni, L.; Richardson, M.;
By: Cardinal, T.; Rivero, C.; Couzi, M.; Rodriguez, V.; Bousquet, B.; Fargin, E.; Royon, A.; Richardson, K.; Canioni, L.; Richardson, M.;
2007 / IEEE / 978-1-55752-834-6
By: Fischer, B.M.; Atakaramians, S.; Afshar, S.; Abbott, D.; Monro, T.; Ebendorff-Heidepriema, H.;
By: Fischer, B.M.; Atakaramians, S.; Afshar, S.; Abbott, D.; Monro, T.; Ebendorff-Heidepriema, H.;
2008 / IEEE / 978-1-4244-2625-6
By: Gebavi, H.; Guihua Liao; Qiuping Chen; Milanese, D.; Taccheo, S.;
By: Gebavi, H.; Guihua Liao; Qiuping Chen; Milanese, D.; Taccheo, S.;
2006 / IEEE / 978-1-55752-813-1
By: McKinney, L.; Marjoribanks, R.; Nantel, M.; Rioblanc, M.; Frank, F.; Forrester, P.; Dean, J.; Graper, D.;
By: McKinney, L.; Marjoribanks, R.; Nantel, M.; Rioblanc, M.; Frank, F.; Forrester, P.; Dean, J.; Graper, D.;
2009 / IEEE / 978-1-4244-4079-5
By: Mitrofanov, A.; Verhoef, A.J.; Baltuska, A.; Zheltikov, A.M.; Serebryannikov, E.E.;
By: Mitrofanov, A.; Verhoef, A.J.; Baltuska, A.; Zheltikov, A.M.; Serebryannikov, E.E.;
2009 / IEEE / 978-1-55752-869-8
By: Withford, M.J.; Dawes, J.M.; Marshall, G.D.; Dekker, P.; Ams, M.; Little, D.J.;
By: Withford, M.J.; Dawes, J.M.; Marshall, G.D.; Dekker, P.; Ams, M.; Little, D.J.;
2009 / IEEE / 978-1-4244-3680-4
By: Beresna, M.; Kazansky, P.G.; Svirko, Y.P.; Hirao, K.; Shimotsuma, Y.;
By: Beresna, M.; Kazansky, P.G.; Svirko, Y.P.; Hirao, K.; Shimotsuma, Y.;
Impact of Raman gain spectral effects on the soliton self-frequency shift in silica and As2 S3 fibers
2010 / IEEE / 978-1-55752-890-2By: de Sterke, C.M.; Pant, R.; Judge, A.C.; Eggleton, B.J.;
2010 / IEEE / 978-1-4244-8394-5
By: Xinmin Wang; Qianguang Li; Xunong Yi; Aimei Liu; Jufang Tong; Yaoming Ding; Hao Lv;
By: Xinmin Wang; Qianguang Li; Xunong Yi; Aimei Liu; Jufang Tong; Yaoming Ding; Hao Lv;
2011 / Springer Science+Business Media / 1598-9623
By: Y. Ko; J. Kim; B. Kim; J. Yun; H. Lee; Y. Kang; H. Koo; Y. Hong;
By: Y. Ko; J. Kim; B. Kim; J. Yun; H. Lee; Y. Kang; H. Koo; Y. Hong;