Your Search Results
Use materials about this topic in your textbook!
AcademicPub holds over eight million pieces of educational content - such as case studies and journal articles - for you to mix-and-match your way.
Experience the freedom of customizing your course pack with AcademicPub!

Topic: Gallium Nitride
Results
2011 / IEEE
By: Shih-Cheng Huang; Jen-Hung Tu; Ming-Tsung Hung; Dong-Sing Wuu; Horng, R.-H.; Tsung-Yen Tsai; Li-Wei Tu; Wei-Yang Chiang;
By: Shih-Cheng Huang; Jen-Hung Tu; Ming-Tsung Hung; Dong-Sing Wuu; Horng, R.-H.; Tsung-Yen Tsai; Li-Wei Tu; Wei-Yang Chiang;
2011 / IEEE
By: Kuan, H.; Yang, J.R.; Li, W.C.; Sun, W.C.; Shiojiri, M.; Chen, M.J.; Huang, Y.H.; Chen, H.C.;
By: Kuan, H.; Yang, J.R.; Li, W.C.; Sun, W.C.; Shiojiri, M.; Chen, M.J.; Huang, Y.H.; Chen, H.C.;
Hydrogen-Sensing Characteristics of a Pd/GaN Schottky Diode With a Simple Surface Roughness Approach
2011 / IEEEBy: Po-Shun Chiu; Huey-Ing Chen; Chi-Shiang Hsu; Chien-Chang Huang; Po-Cheng Chou; Tai-You Chen; Wen-Chau Liu; Rong-Chau Liu;
2011 / IEEE
By: Eddy, C.R.; Jaehui Ahn; Hong-Youl Kim; Mastro, M.A.; Simpkins, B.; Hite, J.K.; Jihyun Kim; Pehrsson, P.;
By: Eddy, C.R.; Jaehui Ahn; Hong-Youl Kim; Mastro, M.A.; Simpkins, B.; Hite, J.K.; Jihyun Kim; Pehrsson, P.;
2011 / IEEE
By: Hsu, A.L.; Azize, M.; Palacios, T.; Gradecak, S.; Shiping Guo; Xiang Gao; Smith, M.; Saadat, O.I.;
By: Hsu, A.L.; Azize, M.; Palacios, T.; Gradecak, S.; Shiping Guo; Xiang Gao; Smith, M.; Saadat, O.I.;
2011 / IEEE
By: Giesen, C.; Ketteniss, N.; Lecourt, F.; De Jaeger, J.-C.; Heuken, M.; Behmenburg, H.; Vescan, A.; Eickelkamp, M.; Hoel, V.; Defrance, N.;
By: Giesen, C.; Ketteniss, N.; Lecourt, F.; De Jaeger, J.-C.; Heuken, M.; Behmenburg, H.; Vescan, A.; Eickelkamp, M.; Hoel, V.; Defrance, N.;
2011 / IEEE
By: Wowchak, A.M.; Smith, D.J.; Dabiran, A.M.; Crespo, A.; Johnson, M.R.; Walker, D.E.; Tetlak, S.K.; Trejo, M.; Fitch, R.C.; Chabak, K.D.; Gillespie, J.K.; Kossler, M.;
By: Wowchak, A.M.; Smith, D.J.; Dabiran, A.M.; Crespo, A.; Johnson, M.R.; Walker, D.E.; Tetlak, S.K.; Trejo, M.; Fitch, R.C.; Chabak, K.D.; Gillespie, J.K.; Kossler, M.;
2011 / IEEE
By: Puzyrev, Y.S.; Pantelides, S.T.; Schrimpf, R.D.; Fleetwood, D.M.; Zhang, E.X.; Roy, T.;
By: Puzyrev, Y.S.; Pantelides, S.T.; Schrimpf, R.D.; Fleetwood, D.M.; Zhang, E.X.; Roy, T.;
2011 / IEEE
By: Bo-Wen Lin; Wen-Ching Hsu; Wu, Y.-C.S.; Bau-Ming Wang; Cheng-Yu Hsieh; Chung-Cheng Chang;
By: Bo-Wen Lin; Wen-Ching Hsu; Wu, Y.-C.S.; Bau-Ming Wang; Cheng-Yu Hsieh; Chung-Cheng Chang;
2011 / IEEE
By: Wei-Lun Chung; Che-Hao Liao; Kuang-Yu Chen; Horng-Shyang Chen; Chih-Yen Chen; Wen-Ming Chang; Chih-Chung Yang; Yean-Woei Kiang; Yu-Feng Yao; Jeng-Jie Huang;
By: Wei-Lun Chung; Che-Hao Liao; Kuang-Yu Chen; Horng-Shyang Chen; Chih-Yen Chen; Wen-Ming Chang; Chih-Chung Yang; Yean-Woei Kiang; Yu-Feng Yao; Jeng-Jie Huang;
2011 / IEEE
By: Eun-Soo Nam; Cheol-Hoi Kim; Jong-In Shim; Han-Youl Ryu; Jin Hyoung Choi; Jong-Moo Lee; Min-Soo Noh; Hyun Min Jung;
By: Eun-Soo Nam; Cheol-Hoi Kim; Jong-In Shim; Han-Youl Ryu; Jin Hyoung Choi; Jong-Moo Lee; Min-Soo Noh; Hyun Min Jung;
2011 / IEEE
By: Fan Zhang; Xing Li; Mo Wu; Kayis, C.; Avrutin, V.; Congyong Zhu; Morkoc, H.; Ozgur, U.;
By: Fan Zhang; Xing Li; Mo Wu; Kayis, C.; Avrutin, V.; Congyong Zhu; Morkoc, H.; Ozgur, U.;
2011 / IEEE
By: Tien-Chang Lu; Chien-Kang Chen; Yun-Lin Wu; Chien-Chung Lin; Tzeng-Tsong Wu; Shing-Chung Wang; Hao-Chung Kuo;
By: Tien-Chang Lu; Chien-Kang Chen; Yun-Lin Wu; Chien-Chung Lin; Tzeng-Tsong Wu; Shing-Chung Wang; Hao-Chung Kuo;
2011 / IEEE
By: Yun-Wei Cheng; Szu-Chieh Wang; Jian Jang Huang; Yen-Jen Hung; Liang-Yu Su; Liang-Yi Chen; Yu-Feng Yin;
By: Yun-Wei Cheng; Szu-Chieh Wang; Jian Jang Huang; Yen-Jen Hung; Liang-Yu Su; Liang-Yi Chen; Yu-Feng Yin;
2011 / IEEE
By: Mostafa, S.; Tulip, F.S.; Lee, I.; Eliza, S.A.; Islam, S.K.; Ericson, M.N.; Greenbaum, E.;
By: Mostafa, S.; Tulip, F.S.; Lee, I.; Eliza, S.A.; Islam, S.K.; Ericson, M.N.; Greenbaum, E.;
2012 / IEEE
By: Butendheich, R.; Humphreys, C.; Dandan Zhu; Trivellin, N.; Vaccari, S.; Leirer, C.; Zanoni, E.; Meneghini, M.; Meneghesso, G.; Hahn, B.;
By: Butendheich, R.; Humphreys, C.; Dandan Zhu; Trivellin, N.; Vaccari, S.; Leirer, C.; Zanoni, E.; Meneghini, M.; Meneghesso, G.; Hahn, B.;
2012 / IEEE
By: Jian Jang Huang; Tzu-Chun Lu; Yu-Ting Wang; Li-Chuan Huang; Liang-Yi Chen; Chun-Hsiang Chang;
By: Jian Jang Huang; Tzu-Chun Lu; Yu-Ting Wang; Li-Chuan Huang; Liang-Yi Chen; Chun-Hsiang Chang;
2012 / IEEE
By: Jin-Chai Li; Chia-Cheng Tu; Ching-Hsueh Chiu; Shih-Cheng Huang; Po-Min Tu; Chien-Chung Lin; Zhen-Yu Li; Chun-Yen Chang; Shing-Chung Wang; Hao-Chung Kuo; Tien-Chang Lu; Hsiao-Wen Zan; Wu-Yih Uen;
By: Jin-Chai Li; Chia-Cheng Tu; Ching-Hsueh Chiu; Shih-Cheng Huang; Po-Min Tu; Chien-Chung Lin; Zhen-Yu Li; Chun-Yen Chang; Shing-Chung Wang; Hao-Chung Kuo; Tien-Chang Lu; Hsiao-Wen Zan; Wu-Yih Uen;
2012 / IEEE
By: Su-Ik Park; Jong-In Shim; Han-Youl Ryu; Dong-Soo Shin; Hyun-Sung Kim; Dong-Hyun Jang; Jong-Ik Lee;
By: Su-Ik Park; Jong-In Shim; Han-Youl Ryu; Dong-Soo Shin; Hyun-Sung Kim; Dong-Hyun Jang; Jong-Ik Lee;
2012 / IEEE
By: Armstrong, A.; Min Sun; DasGupta, S.; Palacios, T.; Kaplar, R.J.; Atcitty, S.; Stanley, J.B.; Marinella, M.J.;
By: Armstrong, A.; Min Sun; DasGupta, S.; Palacios, T.; Kaplar, R.J.; Atcitty, S.; Stanley, J.B.; Marinella, M.J.;
2012 / IEEE
By: del Alamo, J.A.; Jungwoo Joh; Doutt, D.R.; Merz, T.A.; Chung-Han Lin; Brillson, L.J.; Mishra, U.K.;
By: del Alamo, J.A.; Jungwoo Joh; Doutt, D.R.; Merz, T.A.; Chung-Han Lin; Brillson, L.J.; Mishra, U.K.;
2012 / IEEE
By: Berthet, F.; Guhel, Y.; Boudart, B.; Gualous, H.; Trolet, J.L.; Piccione, M.; Gaquiere, C.;
By: Berthet, F.; Guhel, Y.; Boudart, B.; Gualous, H.; Trolet, J.L.; Piccione, M.; Gaquiere, C.;
2012 / IEEE
By: Selberherr, S.; Rodle, T.; Murad, S.; Quay, R.; Maroldt, S.; Palankovski, V.; Vitanov, S.;
By: Selberherr, S.; Rodle, T.; Murad, S.; Quay, R.; Maroldt, S.; Palankovski, V.; Vitanov, S.;
2012 / IEEE
By: Jinn-Kong Sheu; Gou Chung Chi; Chung-Wei Chen; Wei-Chih Lai; Shang-Ju Tu; Po-Cheng Chen; Feng-Wen Huang; Yu-Hsiang Yeh; Ming-Lun Lee;
By: Jinn-Kong Sheu; Gou Chung Chi; Chung-Wei Chen; Wei-Chih Lai; Shang-Ju Tu; Po-Cheng Chen; Feng-Wen Huang; Yu-Hsiang Yeh; Ming-Lun Lee;
2012 / IEEE
By: Tai-You Chen; Huey-Ing Chen; Chien-Chang Huang; Wen-Chau Liu; Chi-Shiang Hsu; Jian-Kai Liou; Po-Cheng Chou; Chun-Chia Chen;
By: Tai-You Chen; Huey-Ing Chen; Chien-Chang Huang; Wen-Chau Liu; Chi-Shiang Hsu; Jian-Kai Liou; Po-Cheng Chou; Chun-Chia Chen;
2012 / IEEE
By: Ringel, S.A.; Mishra, U.K.; Speck, J.S.; DenBaars, S.P.; Sasikumar, A.; Keller, S.; Wong, M.H.; Kolluri, S.; Arehart, A.;
By: Ringel, S.A.; Mishra, U.K.; Speck, J.S.; DenBaars, S.P.; Sasikumar, A.; Keller, S.; Wong, M.H.; Kolluri, S.; Arehart, A.;
2012 / IEEE
By: Zhang, Y.Y.; Yan, Q.; Yu, J.; Chen, Y.; Wu, K.; Duan, R.; Li, J.M.; Wei, T.B.; Zeng, Y.; Wang, J.;
By: Zhang, Y.Y.; Yan, Q.; Yu, J.; Chen, Y.; Wu, K.; Duan, R.; Li, J.M.; Wei, T.B.; Zeng, Y.; Wang, J.;
2012 / IEEE
By: Hyun-Gi Hong; Jaekyun Kim; Joosung Kim; Youngjo Tak; Jun-Youn Kim; Moonseung Yang; U-In Chung; Youngsoo Park; Junghoon Park; Suhee Chae;
By: Hyun-Gi Hong; Jaekyun Kim; Joosung Kim; Youngjo Tak; Jun-Youn Kim; Moonseung Yang; U-In Chung; Youngsoo Park; Junghoon Park; Suhee Chae;
2012 / IEEE
By: Tulkki, J.; Oksanen, J.; Kivisaari, P.; Jang, C.H.; Lee, M.L.; Kai-Lun Chi; Jin-Wei Shi; Sheu, J.K.;
By: Tulkki, J.; Oksanen, J.; Kivisaari, P.; Jang, C.H.; Lee, M.L.; Kai-Lun Chi; Jin-Wei Shi; Sheu, J.K.;
2012 / IEEE
By: Meneghesso, G.; Zanoni, E.; Ueda, D.; Tanaka, T.; Ueda, T.; de Santi, C.; Meneghini, M.;
By: Meneghesso, G.; Zanoni, E.; Ueda, D.; Tanaka, T.; Ueda, T.; de Santi, C.; Meneghini, M.;
Light Extraction Efficiency Improvement by Curved GaN Sidewalls in InGaN-Based Light-Emitting Diodes
2012 / IEEEBy: Yi Xiaoyan; Li Jing; Wei Tongbo; Li Zhi; Guo Enqing; Zhang Yiyun; Wang Guohong;
2012 / IEEE
By: Wei-Chih Lai; Cheng-Hsiung Yen; Shoou-Jinn Chang; Schang-Jing Hon; Tsun-Kai Ko; Chun-Kai Wang; Ya-Yu Yang;
By: Wei-Chih Lai; Cheng-Hsiung Yen; Shoou-Jinn Chang; Schang-Jing Hon; Tsun-Kai Ko; Chun-Kai Wang; Ya-Yu Yang;
2012 / IEEE
By: Botton, G.A.; Korinek, A.; Kai Cui; Shaofei Zhang; Hieu Pham Trung Nguyen; Zetian Mi;
By: Botton, G.A.; Korinek, A.; Kai Cui; Shaofei Zhang; Hieu Pham Trung Nguyen; Zetian Mi;
2012 / IEEE
By: Shih-Ming Wang; Sheng-Joue Young; Bohr-Ran Huang; Shoou-Jinn Chang; Chih-Hung Hsiao; Tse-Pu Chen; Chun-Bo Yang; San-Lein Wu;
By: Shih-Ming Wang; Sheng-Joue Young; Bohr-Ran Huang; Shoou-Jinn Chang; Chih-Hung Hsiao; Tse-Pu Chen; Chun-Bo Yang; San-Lein Wu;
2012 / IEEE
By: Bo-Wen Lin; Shang-Ju Tu; Chia-Yu Lee; Lung-Hsing Hsu; Ching-Hsueh Chiu; Chun-Yen Chang; Shing-Chung Wang; Hao-Chung Kuo; Gou-Chung Chi; Tien-Chang Lu; Chien-Chung Lin; Jinn-Kong Sheu; Yu-Pin Lan; Wen-Ching Hsu; Che-Yu Liu; Yan-Hao Chen;
By: Bo-Wen Lin; Shang-Ju Tu; Chia-Yu Lee; Lung-Hsing Hsu; Ching-Hsueh Chiu; Chun-Yen Chang; Shing-Chung Wang; Hao-Chung Kuo; Gou-Chung Chi; Tien-Chang Lu; Chien-Chung Lin; Jinn-Kong Sheu; Yu-Pin Lan; Wen-Ching Hsu; Che-Yu Liu; Yan-Hao Chen;