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Topic: Gallium Compounds
Results
2011 / IEEE
By: Shih-Cheng Huang; Jen-Hung Tu; Ming-Tsung Hung; Dong-Sing Wuu; Horng, R.-H.; Tsung-Yen Tsai; Li-Wei Tu; Wei-Yang Chiang;
By: Shih-Cheng Huang; Jen-Hung Tu; Ming-Tsung Hung; Dong-Sing Wuu; Horng, R.-H.; Tsung-Yen Tsai; Li-Wei Tu; Wei-Yang Chiang;
2011 / IEEE
By: Kuan, H.; Yang, J.R.; Li, W.C.; Sun, W.C.; Shiojiri, M.; Chen, M.J.; Huang, Y.H.; Chen, H.C.;
By: Kuan, H.; Yang, J.R.; Li, W.C.; Sun, W.C.; Shiojiri, M.; Chen, M.J.; Huang, Y.H.; Chen, H.C.;
Hydrogen-Sensing Characteristics of a Pd/GaN Schottky Diode With a Simple Surface Roughness Approach
2011 / IEEEBy: Po-Shun Chiu; Huey-Ing Chen; Chi-Shiang Hsu; Chien-Chang Huang; Po-Cheng Chou; Tai-You Chen; Wen-Chau Liu; Rong-Chau Liu;
2011 / IEEE
By: Jang-Sik Lee; Jae Chul Park; Kim, D.M.; Dongsik Kong; Byeong-Hyeok Sohn; Jaeman Jang; Dae Hwan Kim; Il Hwan Cho;
By: Jang-Sik Lee; Jae Chul Park; Kim, D.M.; Dongsik Kong; Byeong-Hyeok Sohn; Jaeman Jang; Dae Hwan Kim; Il Hwan Cho;
2011 / IEEE
By: Xiao-Mei Cai; Bao-Ping Zhang; Shao-Xiong Wu; Wen-Jie Liu; Ming Chen; An-Kai Lin; Shuo Lin; Jiang-Yong Zhang; Xin Li; Sheng-Wei Zeng;
By: Xiao-Mei Cai; Bao-Ping Zhang; Shao-Xiong Wu; Wen-Jie Liu; Ming Chen; An-Kai Lin; Shuo Lin; Jiang-Yong Zhang; Xin Li; Sheng-Wei Zeng;
2011 / IEEE
By: Hsu, A.L.; Azize, M.; Palacios, T.; Gradecak, S.; Shiping Guo; Xiang Gao; Smith, M.; Saadat, O.I.;
By: Hsu, A.L.; Azize, M.; Palacios, T.; Gradecak, S.; Shiping Guo; Xiang Gao; Smith, M.; Saadat, O.I.;
2011 / IEEE
By: Giesen, C.; Ketteniss, N.; Lecourt, F.; De Jaeger, J.-C.; Heuken, M.; Behmenburg, H.; Vescan, A.; Eickelkamp, M.; Hoel, V.; Defrance, N.;
By: Giesen, C.; Ketteniss, N.; Lecourt, F.; De Jaeger, J.-C.; Heuken, M.; Behmenburg, H.; Vescan, A.; Eickelkamp, M.; Hoel, V.; Defrance, N.;
2011 / IEEE
By: Hee Sung Lee; Youn-Gyoung Chang; Dae-Hwan Kim; Tae-Woong Moon; Jae Hoon Kim; Seongil Im; Chang-Dong Kim; Kwon-shik Park;
By: Hee Sung Lee; Youn-Gyoung Chang; Dae-Hwan Kim; Tae-Woong Moon; Jae Hoon Kim; Seongil Im; Chang-Dong Kim; Kwon-shik Park;
2011 / IEEE
By: Wowchak, A.M.; Smith, D.J.; Dabiran, A.M.; Crespo, A.; Johnson, M.R.; Walker, D.E.; Tetlak, S.K.; Trejo, M.; Fitch, R.C.; Chabak, K.D.; Gillespie, J.K.; Kossler, M.;
By: Wowchak, A.M.; Smith, D.J.; Dabiran, A.M.; Crespo, A.; Johnson, M.R.; Walker, D.E.; Tetlak, S.K.; Trejo, M.; Fitch, R.C.; Chabak, K.D.; Gillespie, J.K.; Kossler, M.;
2011 / IEEE
By: Dae Hwan Kim; Dongsik Kong; Yongsik Kim; Minkyung Bae; Hyun Kwang Jeong; Dong Myong Kim; Inseok Hur; Jaehyeong Kim; Woojoon Kim;
By: Dae Hwan Kim; Dongsik Kong; Yongsik Kim; Minkyung Bae; Hyun Kwang Jeong; Dong Myong Kim; Inseok Hur; Jaehyeong Kim; Woojoon Kim;
2011 / IEEE
By: Puzyrev, Y.S.; Pantelides, S.T.; Schrimpf, R.D.; Fleetwood, D.M.; Zhang, E.X.; Roy, T.;
By: Puzyrev, Y.S.; Pantelides, S.T.; Schrimpf, R.D.; Fleetwood, D.M.; Zhang, E.X.; Roy, T.;
2011 / IEEE
By: Chengyong Hu; Taverne, M.P.C.; Ivanov, P.S.; Nicol, M.F.J.; Engin, E.; Cryan, M.J.; Ho, Y.D.; Rarity, J.G.; Railton, C.J.; Craddock, I.J.;
By: Chengyong Hu; Taverne, M.P.C.; Ivanov, P.S.; Nicol, M.F.J.; Engin, E.; Cryan, M.J.; Ho, Y.D.; Rarity, J.G.; Railton, C.J.; Craddock, I.J.;
Enhancement in Light Extraction of GaN-Based Light-Emitting Diodes With High Reflectivity Electrodes
2011 / IEEEBy: Yan-Kuin Su; Hsiao-Chiu Hsu; Chun-Liang Lin; Kuan Chun Chen;
2011 / IEEE
By: Roelkens, G.; Tournie, E.; Rodriguez, J.-B.; Cerutti, L.; Gassenq, A.; Hattasan, N.;
By: Roelkens, G.; Tournie, E.; Rodriguez, J.-B.; Cerutti, L.; Gassenq, A.; Hattasan, N.;
2011 / IEEE
By: Eun-Soo Nam; Cheol-Hoi Kim; Jong-In Shim; Han-Youl Ryu; Jin Hyoung Choi; Jong-Moo Lee; Min-Soo Noh; Hyun Min Jung;
By: Eun-Soo Nam; Cheol-Hoi Kim; Jong-In Shim; Han-Youl Ryu; Jin Hyoung Choi; Jong-Moo Lee; Min-Soo Noh; Hyun Min Jung;
2011 / IEEE
By: Fan Zhang; Xing Li; Mo Wu; Kayis, C.; Avrutin, V.; Congyong Zhu; Morkoc, H.; Ozgur, U.;
By: Fan Zhang; Xing Li; Mo Wu; Kayis, C.; Avrutin, V.; Congyong Zhu; Morkoc, H.; Ozgur, U.;
2011 / IEEE
By: Dongsik Kong; Dae Hwan Kim; Dong Myong Kim; Sungchul Kim; Yong Woo Jeon; Minkyung Bae; Yongsik Kim; Hyun-Kwang Jung;
By: Dongsik Kong; Dae Hwan Kim; Dong Myong Kim; Sungchul Kim; Yong Woo Jeon; Minkyung Bae; Yongsik Kim; Hyun-Kwang Jung;
2011 / IEEE
By: Tien-Chang Lu; Chien-Kang Chen; Yun-Lin Wu; Chien-Chung Lin; Tzeng-Tsong Wu; Shing-Chung Wang; Hao-Chung Kuo;
By: Tien-Chang Lu; Chien-Kang Chen; Yun-Lin Wu; Chien-Chung Lin; Tzeng-Tsong Wu; Shing-Chung Wang; Hao-Chung Kuo;
2011 / IEEE
By: Yun-Wei Cheng; Szu-Chieh Wang; Jian Jang Huang; Yen-Jen Hung; Liang-Yu Su; Liang-Yi Chen; Yu-Feng Yin;
By: Yun-Wei Cheng; Szu-Chieh Wang; Jian Jang Huang; Yen-Jen Hung; Liang-Yu Su; Liang-Yi Chen; Yu-Feng Yin;
2011 / IEEE
By: Mostafa, S.; Tulip, F.S.; Lee, I.; Eliza, S.A.; Islam, S.K.; Ericson, M.N.; Greenbaum, E.;
By: Mostafa, S.; Tulip, F.S.; Lee, I.; Eliza, S.A.; Islam, S.K.; Ericson, M.N.; Greenbaum, E.;
2012 / IEEE
By: Yoon Hee Jeong; Yong-Woo Lee; Sam Jin Kim; Woo Jun Kwon; Bo Ra Myoung; Chul Sung Kim;
By: Yoon Hee Jeong; Yong-Woo Lee; Sam Jin Kim; Woo Jun Kwon; Bo Ra Myoung; Chul Sung Kim;
2012 / IEEE
By: Butendheich, R.; Humphreys, C.; Dandan Zhu; Trivellin, N.; Vaccari, S.; Leirer, C.; Zanoni, E.; Meneghini, M.; Meneghesso, G.; Hahn, B.;
By: Butendheich, R.; Humphreys, C.; Dandan Zhu; Trivellin, N.; Vaccari, S.; Leirer, C.; Zanoni, E.; Meneghini, M.; Meneghesso, G.; Hahn, B.;
2012 / IEEE
By: Jian Jang Huang; Tzu-Chun Lu; Yu-Ting Wang; Li-Chuan Huang; Liang-Yi Chen; Chun-Hsiang Chang;
By: Jian Jang Huang; Tzu-Chun Lu; Yu-Ting Wang; Li-Chuan Huang; Liang-Yi Chen; Chun-Hsiang Chang;
2012 / IEEE
By: Jin-Chai Li; Chia-Cheng Tu; Ching-Hsueh Chiu; Shih-Cheng Huang; Po-Min Tu; Chien-Chung Lin; Zhen-Yu Li; Chun-Yen Chang; Shing-Chung Wang; Hao-Chung Kuo; Tien-Chang Lu; Hsiao-Wen Zan; Wu-Yih Uen;
By: Jin-Chai Li; Chia-Cheng Tu; Ching-Hsueh Chiu; Shih-Cheng Huang; Po-Min Tu; Chien-Chung Lin; Zhen-Yu Li; Chun-Yen Chang; Shing-Chung Wang; Hao-Chung Kuo; Tien-Chang Lu; Hsiao-Wen Zan; Wu-Yih Uen;
2012 / IEEE
By: Su-Ik Park; Jong-In Shim; Han-Youl Ryu; Dong-Soo Shin; Hyun-Sung Kim; Dong-Hyun Jang; Jong-Ik Lee;
By: Su-Ik Park; Jong-In Shim; Han-Youl Ryu; Dong-Soo Shin; Hyun-Sung Kim; Dong-Hyun Jang; Jong-Ik Lee;
2012 / IEEE
By: Chih-Wei Chien; Chang-Yu Lin; Tzong-Ming Lee; Chyi-Ming Leu; Ming-Jiue Yu; Chih-Ming Lai; Chun-Cheng Cheng; Yung-Hui Yeh; Chung-Chih Wu;
By: Chih-Wei Chien; Chang-Yu Lin; Tzong-Ming Lee; Chyi-Ming Leu; Ming-Jiue Yu; Chih-Ming Lai; Chun-Cheng Cheng; Yung-Hui Yeh; Chung-Chih Wu;
2012 / IEEE
By: Armstrong, A.; Min Sun; DasGupta, S.; Palacios, T.; Kaplar, R.J.; Atcitty, S.; Stanley, J.B.; Marinella, M.J.;
By: Armstrong, A.; Min Sun; DasGupta, S.; Palacios, T.; Kaplar, R.J.; Atcitty, S.; Stanley, J.B.; Marinella, M.J.;
2012 / IEEE
By: Chung-Chih Wu; Chih-Wei Chien; Hsing-Hung Hsieh; Cheng-Han Wu; Yung-Hui Yeh; Chang-Yu Lin; Ming-Jiue Yu; Chih-Ming Lai; Chun-Cheng Cheng;
By: Chung-Chih Wu; Chih-Wei Chien; Hsing-Hung Hsieh; Cheng-Han Wu; Yung-Hui Yeh; Chang-Yu Lin; Ming-Jiue Yu; Chih-Ming Lai; Chun-Cheng Cheng;
2012 / IEEE
By: Eun Suk Hwang; Un Ki Kim; Yoon Jang Chung; Yoonsoo Jung; Jisim Jung; Byoung Keon Park; Cheol Seong Hwang; Sang Ho Rha; Jung-Hae Choi; Tae Joo Park;
By: Eun Suk Hwang; Un Ki Kim; Yoon Jang Chung; Yoonsoo Jung; Jisim Jung; Byoung Keon Park; Cheol Seong Hwang; Sang Ho Rha; Jung-Hae Choi; Tae Joo Park;
2012 / IEEE
By: del Alamo, J.A.; Jungwoo Joh; Doutt, D.R.; Merz, T.A.; Chung-Han Lin; Brillson, L.J.; Mishra, U.K.;
By: del Alamo, J.A.; Jungwoo Joh; Doutt, D.R.; Merz, T.A.; Chung-Han Lin; Brillson, L.J.; Mishra, U.K.;
2012 / IEEE
By: Vizkelethy, G.; Reed, R.A.; Ramachandran, V.; Pantelides, S.T.; Shen, X.; Schrimpf, R.D.; Zhang, E.X.; King, M.P.; Boos, J.B.; McMorrow, D.;
By: Vizkelethy, G.; Reed, R.A.; Ramachandran, V.; Pantelides, S.T.; Shen, X.; Schrimpf, R.D.; Zhang, E.X.; King, M.P.; Boos, J.B.; McMorrow, D.;
2012 / IEEE
By: Berthet, F.; Guhel, Y.; Boudart, B.; Gualous, H.; Trolet, J.L.; Piccione, M.; Gaquiere, C.;
By: Berthet, F.; Guhel, Y.; Boudart, B.; Gualous, H.; Trolet, J.L.; Piccione, M.; Gaquiere, C.;
2012 / IEEE
By: Satter, M.M.; Yoder, P.D.; Dupuis, R.D.; Shyh-Chiang Shen; Jae-Hyun Ryou; Lochner, Z.;
By: Satter, M.M.; Yoder, P.D.; Dupuis, R.D.; Shyh-Chiang Shen; Jae-Hyun Ryou; Lochner, Z.;
2012 / IEEE
By: Selberherr, S.; Rodle, T.; Murad, S.; Quay, R.; Maroldt, S.; Palankovski, V.; Vitanov, S.;
By: Selberherr, S.; Rodle, T.; Murad, S.; Quay, R.; Maroldt, S.; Palankovski, V.; Vitanov, S.;
2012 / IEEE
By: Jinn-Kong Sheu; Gou Chung Chi; Chung-Wei Chen; Wei-Chih Lai; Shang-Ju Tu; Po-Cheng Chen; Feng-Wen Huang; Yu-Hsiang Yeh; Ming-Lun Lee;
By: Jinn-Kong Sheu; Gou Chung Chi; Chung-Wei Chen; Wei-Chih Lai; Shang-Ju Tu; Po-Cheng Chen; Feng-Wen Huang; Yu-Hsiang Yeh; Ming-Lun Lee;