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Topic: Frequency Synthesizers
Results
2011 / IEEE
By: Bourgeois, P.; Schafer, W.S.; Grop, S.G.; Giordano, V.; Rubiola, E.; Oxborrow, M.; Kersale, Y.K.;
By: Bourgeois, P.; Schafer, W.S.; Grop, S.G.; Giordano, V.; Rubiola, E.; Oxborrow, M.; Kersale, Y.K.;
2011 / IEEE
By: Vincent, P.; Siligaris, A.; Cathelin, A.; Busson, P.; Pilard, R.; Yamamoto, S.D.; Dussopt, L.; Lanteri, J.; Dehos, C.; Ferragut, R.; Chaix, F.; Mounet, C.; Martineau, B.; Richard, O.; Belot, D.;
By: Vincent, P.; Siligaris, A.; Cathelin, A.; Busson, P.; Pilard, R.; Yamamoto, S.D.; Dussopt, L.; Lanteri, J.; Dehos, C.; Ferragut, R.; Chaix, F.; Mounet, C.; Martineau, B.; Richard, O.; Belot, D.;
2011 / IEEE
By: Okada, K.; Matsuzawa, A.; Matsushita, K.; Bunsen, K.; Murakami, R.; Musa, A.; Sato, T.; Asada, H.; Takayama, N.; Ito, S.; Chaivipas, W.; Minami, R.; Yamaguchi, T.; Takeuchi, Y.; Yamagishi, H.; Noda, M.; Ning Li;
By: Okada, K.; Matsuzawa, A.; Matsushita, K.; Bunsen, K.; Murakami, R.; Musa, A.; Sato, T.; Asada, H.; Takayama, N.; Ito, S.; Chaivipas, W.; Minami, R.; Yamaguchi, T.; Takeuchi, Y.; Yamagishi, H.; Noda, M.; Ning Li;
2011 / IEEE
By: Bogoni, A.; Cruz, J.L.; Palaci, J.; Villanueva, G.E.; Perez-Millan, P.; Ghelfi, P.; Serafino, G.;
By: Bogoni, A.; Cruz, J.L.; Palaci, J.; Villanueva, G.E.; Perez-Millan, P.; Ghelfi, P.; Serafino, G.;
2012 / IEEE
By: Yung-Chung Lo; Hyung-Joon Jeon; Helmy, A.A.; Entesari, K.; Larsson, A.J.; Silva-Martinez, J.; Jusung Kim; Kulkarni, R.;
By: Yung-Chung Lo; Hyung-Joon Jeon; Helmy, A.A.; Entesari, K.; Larsson, A.J.; Silva-Martinez, J.; Jusung Kim; Kulkarni, R.;
2012 / IEEE
By: Ward, J.S.; Pearson, J.; Siles, J.V.; Mehdi, I.; Maestrini, A.; Siegel, P.; Lin, R.; Schlecht, E.; Chattopadhyay, G.; Gill, J.; Lee, C.; Thomas, B.;
By: Ward, J.S.; Pearson, J.; Siles, J.V.; Mehdi, I.; Maestrini, A.; Siegel, P.; Lin, R.; Schlecht, E.; Chattopadhyay, G.; Gill, J.; Lee, C.; Thomas, B.;
2012 / IEEE
By: Nan Qi; Yang Xu; Baoyong Chi; Xiaobao Yu; Zhihua Wang; Ni Xu; Chiang, P.; Woogeun Rhee; Xing Zhang;
By: Nan Qi; Yang Xu; Baoyong Chi; Xiaobao Yu; Zhihua Wang; Ni Xu; Chiang, P.; Woogeun Rhee; Xing Zhang;
2006 / IEEE / 978-3-9805741-8-1
By: Solovyov, V.S.; Zub, S.I.; Levenberg, A.I.; Kleiman, A.S.; Usenko, T.A.; Kravchenko, P.A.; Sidorenko, G.S.;
By: Solovyov, V.S.; Zub, S.I.; Levenberg, A.I.; Kleiman, A.S.; Usenko, T.A.; Kravchenko, P.A.; Sidorenko, G.S.;
2011 / IEEE / 978-1-61284-112-0
By: Santarelli, G.; Davies, A.G.; Linfield, E.H.; Khanna, S.P.; Ravaro, M.; Sirtori, C.; Manquest, C.; Gellie, P.; Barbieri, S.;
By: Santarelli, G.; Davies, A.G.; Linfield, E.H.; Khanna, S.P.; Ravaro, M.; Sirtori, C.; Manquest, C.; Gellie, P.; Barbieri, S.;
2011 / IEEE / 978-1-61284-385-8
By: Aoyama, H.; Nakao, T.; Miyagawa, N.; Kubota, N.; Horihata, S.; Yano, K.;
By: Aoyama, H.; Nakao, T.; Miyagawa, N.; Kubota, N.; Horihata, S.; Yano, K.;
A low spurious level fractional-N frequency divider based on a DDS-like phase accumulation operation
2011 / IEEE / 978-83-932075-2-7By: Tournier, E.; Thuries, S.; Borr, T.; Burciu, I.; Juyon, J.;
2011 / IEEE / 978-1-4577-0762-9
By: Mu�Pacheco, J.M.; Sanchez-Lopez, C.; Tlelo-Cuautle, E.; Trejo-Guerra, R.; Carbajal-Gomez, V.H.;
By: Mu�Pacheco, J.M.; Sanchez-Lopez, C.; Tlelo-Cuautle, E.; Trejo-Guerra, R.; Carbajal-Gomez, V.H.;
2011 / IEEE / 978-1-4577-0618-9
By: Burg, A.; Sherazi, Y.; Andersson, O.; Meinerzhagen, P.; Rodrigues, J.;
By: Burg, A.; Sherazi, Y.; Andersson, O.; Meinerzhagen, P.; Rodrigues, J.;
2011 / IEEE / 978-1-4577-0223-5
By: Xing Zhang; Xiaobao Yu; Yang Xu; Baoyong Chi; Yang Xu; Nan Qi; Zhihua Wang;
By: Xing Zhang; Xiaobao Yu; Yang Xu; Baoyong Chi; Yang Xu; Nan Qi; Zhihua Wang;
Programmable phase/frequency generator for system debug and diagnosis using the IEEE 1149.1 test bus
2011 / IEEE / 978-1-4577-0223-5By: Roberts, G.W.; Tsung-Yen Tsai;
2011 / IEEE / 978-1-4577-0223-5
By: De Bernardinis, F.; Fanori, L.; Vercesi, L.; Castello, R.; Liscidini, A.;
By: De Bernardinis, F.; Fanori, L.; Vercesi, L.; Castello, R.; Liscidini, A.;
2011 / IEEE / 978-1-4577-0509-0
By: Hindle, F.; Cuisset, A.; Guinet, M.; Eliet, S.; Mouret, G.; Martin-Drumel, M.-A.; Pirali, O.;
By: Hindle, F.; Cuisset, A.; Guinet, M.; Eliet, S.; Mouret, G.; Martin-Drumel, M.-A.; Pirali, O.;
2011 / IEEE / 978-1-4244-8939-8
By: Karim, A.M.; Callahan, P.T.; Adles, E.J.; Clark, T.R.; Dennis, M.L.;
By: Karim, A.M.; Callahan, P.T.; Adles, E.J.; Clark, T.R.; Dennis, M.L.;