Your Search Results
Use materials about this topic in your textbook!
AcademicPub holds over eight million pieces of educational content - such as case studies and journal articles - for you to mix-and-match your way.
Experience the freedom of customizing your course pack with AcademicPub!

Topic: Flash Memories
Results
2011 / IEEE
By: Wen-Chuan Chao; Sakamoto, Y.; Jian-Ming Jaw; Hung-Ming Hsueh; Chih-Ming Chao; Shirota, R.; Arakawa, H.; Sheng-Fu Yang;
By: Wen-Chuan Chao; Sakamoto, Y.; Jian-Ming Jaw; Hung-Ming Hsueh; Chih-Ming Chao; Shirota, R.; Arakawa, H.; Sheng-Fu Yang;
2011 / IEEE
By: Jang-Sik Lee; Jae Chul Park; Kim, D.M.; Dongsik Kong; Byeong-Hyeok Sohn; Jaeman Jang; Dae Hwan Kim; Il Hwan Cho;
By: Jang-Sik Lee; Jae Chul Park; Kim, D.M.; Dongsik Kong; Byeong-Hyeok Sohn; Jaeman Jang; Dae Hwan Kim; Il Hwan Cho;
2011 / IEEE
By: Jong Kyung Park; Byung Jin Cho; Kwon Hong; Moon Sig Joo; Jae Sub Oh; Sung Kyu Im; Seok-Hee Lee; Youngmin Park;
By: Jong Kyung Park; Byung Jin Cho; Kwon Hong; Moon Sig Joo; Jae Sub Oh; Sung Kyu Im; Seok-Hee Lee; Youngmin Park;
2011 / IEEE
By: Gerardin, S.; Bagatin, M.; Czeppel, L.T.; Bertuccio, M.; Beltrami, S.; Visconti, A.; Paccagnella, A.;
By: Gerardin, S.; Bagatin, M.; Czeppel, L.T.; Bertuccio, M.; Beltrami, S.; Visconti, A.; Paccagnella, A.;
2011 / IEEE
By: Bonanomi, M.; Visconti, A.; Paccagnella, A.; Bagatin, M.; Gerardin, S.; Beltrami, S.;
By: Bonanomi, M.; Visconti, A.; Paccagnella, A.; Bagatin, M.; Gerardin, S.; Beltrami, S.;
2011 / IEEE
By: Fonseca, E.C.P.; Kastensmidt, F.L.; Azambuja, J.R.; Tarrillo, J.; Goncalez, O.; Galhardo, R.;
By: Fonseca, E.C.P.; Kastensmidt, F.L.; Azambuja, J.R.; Tarrillo, J.; Goncalez, O.; Galhardo, R.;
2011 / IEEE
By: Ji-Hong Chiang; Lun-Chun Chen; Chao-Kan Yang; Yung-Chun Wu; Hung-Bin Chen; Chun-Yen Chang;
By: Ji-Hong Chiang; Lun-Chun Chen; Chao-Kan Yang; Yung-Chun Wu; Hung-Bin Chen; Chun-Yen Chang;
2011 / IEEE
By: Van Houdt, J.; Van den bosch, G.; Van Aerde, S.; Richard, O.; Douhard, B.; Vrancken, C.; Debusschere, I.; Paraschiv, V.; De Keersgieter, A.; Breuil, L.; Cacciato, A.; Arreghini, A.; Blomme, P.; Kar, G.S.;
By: Van Houdt, J.; Van den bosch, G.; Van Aerde, S.; Richard, O.; Douhard, B.; Vrancken, C.; Debusschere, I.; Paraschiv, V.; De Keersgieter, A.; Breuil, L.; Cacciato, A.; Arreghini, A.; Blomme, P.; Kar, G.S.;
2012 / IEEE
By: Paolucci, G. M.; Lacaita, A. L.; Spinelli, A. S.; Monzio Compagnoni, C.; Miccoli, C.;
By: Paolucci, G. M.; Lacaita, A. L.; Spinelli, A. S.; Monzio Compagnoni, C.; Miccoli, C.;
2012 / IEEE
By: Amoroso, S.M.; Asenov, A.; Monzio Compagnoni, C.; Mauri, A.; Brown, A.R.; Ghetti, A.;
By: Amoroso, S.M.; Asenov, A.; Monzio Compagnoni, C.; Mauri, A.; Brown, A.R.; Ghetti, A.;
2012 / IEEE
By: Wilcox, E.P.; Friendlich, M.R.; Oldham, T.R.; Castillo, J.; LaBel, K.A.; Eaton, P.H.; Mavis, D.G.; McMorrow, D.; Buchner, S.P.;
By: Wilcox, E.P.; Friendlich, M.R.; Oldham, T.R.; Castillo, J.; LaBel, K.A.; Eaton, P.H.; Mavis, D.G.; McMorrow, D.; Buchner, S.P.;
2012 / IEEE
By: Wang, K.L.W.; Fleetwood, D.M.; En Xia Zhang; Cher Xuan Zhang; Alles, M.L.; Galatsis, K.; Sung Min Kim; Song, E.B.; Schrimpf, R.D.;
By: Wang, K.L.W.; Fleetwood, D.M.; En Xia Zhang; Cher Xuan Zhang; Alles, M.L.; Galatsis, K.; Sung Min Kim; Song, E.B.; Schrimpf, R.D.;
2012 / IEEE
By: Schwank, J. R.; Paccagnella, A.; Bagatin, M.; Gerardin, S.; Blackmore, E. W.; Shaneyfelt, M. R.;
By: Schwank, J. R.; Paccagnella, A.; Bagatin, M.; Gerardin, S.; Blackmore, E. W.; Shaneyfelt, M. R.;
2012 / IEEE
By: LaBel, K.; Wilcox, E.P.; Carts, M.A.; Poongyeub Lee; Nguyen, V.; Rezgui, S.; McCollum, J.; Telecco, N.;
By: LaBel, K.; Wilcox, E.P.; Carts, M.A.; Poongyeub Lee; Nguyen, V.; Rezgui, S.; McCollum, J.; Telecco, N.;
2012 / IEEE
By: Roizin, Y.; Lisiansky, M.; Corso, D.; Libertino, S.; Palumbo, F.; Finocchiaro, P.; Lombardo, S.; Pace, C.; Principato, F.;
By: Roizin, Y.; Lisiansky, M.; Corso, D.; Libertino, S.; Palumbo, F.; Finocchiaro, P.; Lombardo, S.; Pace, C.; Principato, F.;
A 21 nm High Performance 64 Gb MLC NAND Flash Memory With 400 MB/s Asynchronous Toggle DDR Interface
2012 / IEEEBy: Jaeyong Jeong; Seonghwan Seo; Jaewoo Lim; Hyunggon Kim; Taesung Lee; Jinho Ryu; Chulbum Kim; Young-Hyun Jun; Young-Ho Lim; Kyehyun Kyung; Duheon Song; Jin-Man Han; Kwangil Park; Woopyo Jeong; Changhyun Cho; Yongsik Yim; Seongsoon Cho; Pansuk Kwak; Dooseop Lee; Inyoul Lee; Bokeun Kim; Hongsoo Jeon;
2012 / IEEE
By: Corso, D.; Lombardo, S.A.; Finocchiaro, P.; Pace, C.; Principato, F.; Palumbo, F.; Roizin, Y.; Lisiansky, M.; Libertino, S.;
By: Corso, D.; Lombardo, S.A.; Finocchiaro, P.; Pace, C.; Principato, F.; Palumbo, F.; Roizin, Y.; Lisiansky, M.; Libertino, S.;
2012 / IEEE
By: Shirota, R.; Arakawa, H.; Mitiukhina, N.; Fu-Hai Li; Sakamoto, Y.; Nagai, S.; Chen-Hao Huang;
By: Shirota, R.; Arakawa, H.; Mitiukhina, N.; Fu-Hai Li; Sakamoto, Y.; Nagai, S.; Chen-Hao Huang;
2012 / IEEE
By: Sung-Min Joe; Jong-Ho Lee; Sung-Kye Park; Kyoung-Rok Han; Bong-Su Jo; Min-Kyu Jeong;
By: Sung-Min Joe; Jong-Ho Lee; Sung-Kye Park; Kyoung-Rok Han; Bong-Su Jo; Min-Kyu Jeong;
2012 / IEEE
By: Yung-Chun Wu; Hung-Bin Chen; Chun-Yen Chang; Chao-Kan Yang; Ji-Hong Chiang; Lun-Chun Chen;
By: Yung-Chun Wu; Hung-Bin Chen; Chun-Yen Chang; Chao-Kan Yang; Ji-Hong Chiang; Lun-Chun Chen;
2012 / IEEE
By: Ya-Jui Lee; Zih-Song Wang; Chrong Jung Lin; Huei-Haurng Chen; Ying-Chia Li; Yang, R.;
By: Ya-Jui Lee; Zih-Song Wang; Chrong Jung Lin; Huei-Haurng Chen; Ying-Chia Li; Yang, R.;
2012 / IEEE
By: Kihwan Choi; Jongwook Jeon; Wookghee Hahn; Myounggon Kang; Il Han Park; Sunghee Yun; Chilhee Chung; Young-Kwan Park; Keun-Ho Lee; Gi-Young Yang;
By: Kihwan Choi; Jongwook Jeon; Wookghee Hahn; Myounggon Kang; Il Han Park; Sunghee Yun; Chilhee Chung; Young-Kwan Park; Keun-Ho Lee; Gi-Young Yang;
2012 / IEEE
By: Manhong Zhang; Dandan Jiang; Ming Liu; Junning Chen; Bo Zhang; Yong Wang; Zhong Sun; Zongliang Huo;
By: Manhong Zhang; Dandan Jiang; Ming Liu; Junning Chen; Bo Zhang; Yong Wang; Zhong Sun; Zongliang Huo;
2012 / IEEE
By: Visconti, A.; Paccagnella, A.; Ferrario, A.; Bagatin, M.; Beltrami, S.; Frost, C.D.; Gerardin, S.; Gorini, G.; Andreani, C.;
By: Visconti, A.; Paccagnella, A.; Ferrario, A.; Bagatin, M.; Beltrami, S.; Frost, C.D.; Gerardin, S.; Gorini, G.; Andreani, C.;
2012 / IEEE
By: Hyungcheol Shin; Byung-Gook Park; Seongjun Seo; Kyunghwan Lee; Ik Joon Chang; Il Han Park; Myounggon Kang;
By: Hyungcheol Shin; Byung-Gook Park; Seongjun Seo; Kyunghwan Lee; Ik Joon Chang; Il Han Park; Myounggon Kang;
2012 / IEEE
By: Min-Kyu Jeong; Sung-Min Joe; Jong-Ho Lee; Sung-Kye Park; Kyoung-Rok Han; Myounggon Kang;
By: Min-Kyu Jeong; Sung-Min Joe; Jong-Ho Lee; Sung-Kye Park; Kyoung-Rok Han; Myounggon Kang;
2012 / IEEE
By: Dehaene, W.; Pret, A.V.; Blomme, P.; Poliakov, P.; Corbalan, M.M.; Van Houdt, J.; Verkest, D.; Gronheid, R.;
By: Dehaene, W.; Pret, A.V.; Blomme, P.; Poliakov, P.; Corbalan, M.M.; Van Houdt, J.; Verkest, D.; Gronheid, R.;
2012 / IEEE
By: Masahara, M.; Ogura, A.; Sakamoto, K.; Hayashida, T.; Ishikawa, Y.; Yamauchi, H.; Kamei, T.; Tsukada, J.; O'uchi, S.; Endo, K.; Matsukawa, T.; Yongxun Liu;
By: Masahara, M.; Ogura, A.; Sakamoto, K.; Hayashida, T.; Ishikawa, Y.; Yamauchi, H.; Kamei, T.; Tsukada, J.; O'uchi, S.; Endo, K.; Matsukawa, T.; Yongxun Liu;
2012 / IEEE
By: Breuil, L.; Wellekens, D.; Cacciato, A.; Blomme, P.; Van Houdt, J.; Rosmeulen, M.; Richard, O.; Debusschere, I.; Vrancken, C.; Locorotondo, S.; Kar, G.S.;
By: Breuil, L.; Wellekens, D.; Cacciato, A.; Blomme, P.; Van Houdt, J.; Rosmeulen, M.; Richard, O.; Debusschere, I.; Vrancken, C.; Locorotondo, S.; Kar, G.S.;
2012 / IEEE
By: Doo-Hyun Kim; Dong Hua Li; Jung Hoon Lee; Seongjae Cho; Won Bo Shim; Gil Sung Lee; Jungdal Choi; Byung-Gook Park; Wandong Kim; Se Hwan Park; Yoon Kim;
By: Doo-Hyun Kim; Dong Hua Li; Jung Hoon Lee; Seongjae Cho; Won Bo Shim; Gil Sung Lee; Jungdal Choi; Byung-Gook Park; Wandong Kim; Se Hwan Park; Yoon Kim;
2009 / IEEE / 978-1-4577-0493-2
By: Harboe-Sorensen, R.; Cellere, G.; Gerardin, S.; Bagatin, M.; Paccagnella, A.; Bonanomi, M.; Beltrami, S.; Visconti, A.;
By: Harboe-Sorensen, R.; Cellere, G.; Gerardin, S.; Bagatin, M.; Paccagnella, A.; Bonanomi, M.; Beltrami, S.; Visconti, A.;
2011 / IEEE / 978-1-61284-175-5
By: Chulbum Kim; Young-Hyun Jun; Young-Ho Lim; Kyehyun Kyung; Dooheon Song; Jin-Man Han; Woopyo Jeong; Changhyun Cho; Yongsik Yim; Seongsoon Cho; PanSuk Kwak; DooSeop Lee; InYoul Lee; Bokeun Kim; Hongsoo Jeon; Seonghwan Seo; Jaeyong Jeong; Jeawoo Lim; Hyeonggon Kim; Taesung Lee; Jinho Ryu;
By: Chulbum Kim; Young-Hyun Jun; Young-Ho Lim; Kyehyun Kyung; Dooheon Song; Jin-Man Han; Woopyo Jeong; Changhyun Cho; Yongsik Yim; Seongsoon Cho; PanSuk Kwak; DooSeop Lee; InYoul Lee; Bokeun Kim; Hongsoo Jeon; Seonghwan Seo; Jaeyong Jeong; Jeawoo Lim; Hyeonggon Kim; Taesung Lee; Jinho Ryu;
2011 / IEEE / 978-1-4503-0636-2
By: Pei-Han Hsu; Du, D.H.-C.; Tei-Wei Kuo; Po-Chun Huang; Yuan-Hao Chang;
By: Pei-Han Hsu; Du, D.H.-C.; Tei-Wei Kuo; Po-Chun Huang; Yuan-Hao Chang;