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Topic: Fixtures
Results
2012 / IEEE
By: Ji-Young Lee; Do-Kwan Hong; Dae-Suk Joo; Yo-Han Chio; Byoung-Uk Nam; Byung-Chul Woo;
By: Ji-Young Lee; Do-Kwan Hong; Dae-Suk Joo; Yo-Han Chio; Byoung-Uk Nam; Byung-Chul Woo;
2011 / IEEE / 978-1-58537-193-8
By: Burgess, K.; Ward, S.; Rost, T.; Schichl, J.; Duvvury, C.; Kunz, H.;
By: Burgess, K.; Ward, S.; Rost, T.; Schichl, J.; Duvvury, C.; Kunz, H.;
2011 / IEEE / 978-1-4577-1589-1
By: Turner, T.; Chinn, D.; Dabling, J.G.; Wheeler, J.W.; Rohrer, B.; Anderson, L.; Filatov, A.;
By: Turner, T.; Chinn, D.; Dabling, J.G.; Wheeler, J.W.; Rohrer, B.; Anderson, L.; Filatov, A.;
2011 / IEEE / 978-1-4577-0356-0
By: Seungmoon Choi; Kyungpyo Hong; Sunghoon Yim; In Lee; Gabjong Han; Hojin Lee;
By: Seungmoon Choi; Kyungpyo Hong; Sunghoon Yim; In Lee; Gabjong Han; Hojin Lee;
2011 / IEEE / 978-1-61284-972-0
By: Gadegaard, J.; Munk-Nielsen, S.; Beczkowski, S.; Torok, L.; Pedersen, K.; Kari, T.;
By: Gadegaard, J.; Munk-Nielsen, S.; Beczkowski, S.; Torok, L.; Pedersen, K.; Kari, T.;
2011 / IEEE / 978-1-4577-1982-0
By: Hamidullah, M.; Woo Tae Park; Huanhua Feng; Cairan He; Li Shiah Lim; Ming-Yuan Cheng;
By: Hamidullah, M.; Woo Tae Park; Huanhua Feng; Cairan He; Li Shiah Lim; Ming-Yuan Cheng;
2012 / IEEE / 978-1-4673-2185-3
By: Zongxi Tang; Ruimin Xu; Yuanfu Chen; Zegao Wang; Yuehang Xu; Yunqiu Wu; Biao Zhang;
By: Zongxi Tang; Ruimin Xu; Yuanfu Chen; Zegao Wang; Yuehang Xu; Yunqiu Wu; Biao Zhang;
2012 / IEEE / 978-1-4673-0199-2
By: Hong Dae-sun; Hwang Sang-wook; Kang Hyo-jeong; Kim Do-un; Lee Seung-young; Choi Hoon-ki;
By: Hong Dae-sun; Hwang Sang-wook; Kang Hyo-jeong; Kim Do-un; Lee Seung-young; Choi Hoon-ki;
2012 / IEEE / 978-1-4673-0487-0
By: Czamanski, T.N.; Morris, C.; Seidel, M.; Paprotny, I.; Wright, P.K.; White, R.M.;
By: Czamanski, T.N.; Morris, C.; Seidel, M.; Paprotny, I.; Wright, P.K.; White, R.M.;
2012 / IEEE
By: Kovach, P.; Ferracin, P.; Felice, H.; Caspi, S.; Cozzolino, J.; Lamm, M.; Anerella, M.; Ambrosio, G.; Schmalzle, J.; Wanderer, P.; Sabbi, G.;
By: Kovach, P.; Ferracin, P.; Felice, H.; Caspi, S.; Cozzolino, J.; Lamm, M.; Anerella, M.; Ambrosio, G.; Schmalzle, J.; Wanderer, P.; Sabbi, G.;
2014 / IEEE
By: Gouveia, Luiz H. B.; Campos, Marcos F. C.; Nogueira, Fernando J.; Braga, Mateus F.; Braga, Henrique A.C.;
By: Gouveia, Luiz H. B.; Campos, Marcos F. C.; Nogueira, Fernando J.; Braga, Mateus F.; Braga, Henrique A.C.;
Investigation of maintenance assumptions for an automotive production line using simulation modeling
2015 / IEEEBy: Pandian, Annamalai; Ali, Ahad;
2014 / IEEE
By: Getty, Stephanie A.; Southard, Adrian E.; Ferrance, J.; Mahaffy, Paul R.; Glavin, Daniel P.; Balvin, Manuel; Towner, Deborah W.; Kotecki, Carl; Melina, Ana Espiritu; Elsila, Jamie E.; Dworkin, J.P.;
By: Getty, Stephanie A.; Southard, Adrian E.; Ferrance, J.; Mahaffy, Paul R.; Glavin, Daniel P.; Balvin, Manuel; Towner, Deborah W.; Kotecki, Carl; Melina, Ana Espiritu; Elsila, Jamie E.; Dworkin, J.P.;
2014 / IEEE
By: Apple, Jeff; Ramsey, Brian; Wilson-Hodge, Colleen; Gaskin, Jessica; Dietz, Kurt; Christe, Steven; Swartz, Douglas; Tennant, Allyn; Shih, Albert;
By: Apple, Jeff; Ramsey, Brian; Wilson-Hodge, Colleen; Gaskin, Jessica; Dietz, Kurt; Christe, Steven; Swartz, Douglas; Tennant, Allyn; Shih, Albert;