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Topic: Finite Difference Time-domain Analysis
Results
2011 / IEEE
By: Mittra, R.; Wenhua Yu; Yongjun Liu; Xiaoling Yang; Dau-Chyrh Chang; Lei Zhao; Wenxing Li; Akira, M.; Chao-Hsiang Liao;
By: Mittra, R.; Wenhua Yu; Yongjun Liu; Xiaoling Yang; Dau-Chyrh Chang; Lei Zhao; Wenxing Li; Akira, M.; Chao-Hsiang Liao;
2011 / IEEE
By: Hamacher, M.; Syvridis, D.; Mesaritakis, C.; Stamataki, I.; Kapsalis, A.; Heidrich, H.;
By: Hamacher, M.; Syvridis, D.; Mesaritakis, C.; Stamataki, I.; Kapsalis, A.; Heidrich, H.;
2011 / IEEE
By: Chengyong Hu; Taverne, M.P.C.; Ivanov, P.S.; Nicol, M.F.J.; Engin, E.; Cryan, M.J.; Ho, Y.D.; Rarity, J.G.; Railton, C.J.; Craddock, I.J.;
By: Chengyong Hu; Taverne, M.P.C.; Ivanov, P.S.; Nicol, M.F.J.; Engin, E.; Cryan, M.J.; Ho, Y.D.; Rarity, J.G.; Railton, C.J.; Craddock, I.J.;
2011 / IEEE
By: Geernaert, T.; Baghdasaryan, T.; Thienpont, H.; Berghmans, F.; Mergo, P.; Makara, M.; Bartelt, H.; Schuster, K.; Becker, M.;
By: Geernaert, T.; Baghdasaryan, T.; Thienpont, H.; Berghmans, F.; Mergo, P.; Makara, M.; Bartelt, H.; Schuster, K.; Becker, M.;
2011 / IEEE
By: Dingshan Gao; Cassan, E.; Xu Zhou; Huaming Wu; Jin Hou; Changjing Bao; Xinliang Zhang;
By: Dingshan Gao; Cassan, E.; Xu Zhou; Huaming Wu; Jin Hou; Changjing Bao; Xinliang Zhang;
2011 / IEEE
By: Wei-Cheng Lien; Jr-Hau He; Pisano, A.P.; Maboudian, R.; Senesky, D.G.; Shu-Hsien Chiu; Dung-Sheng Tsai;
By: Wei-Cheng Lien; Jr-Hau He; Pisano, A.P.; Maboudian, R.; Senesky, D.G.; Shu-Hsien Chiu; Dung-Sheng Tsai;
2012 / IEEE
By: Leveque, P.; Arnaud-Cormos, D.; Gaborit, G.; Duvillaret, L.; Jarrige, P.; O'Connor, R.P.; Kohler, S.; Ticaud, N.;
By: Leveque, P.; Arnaud-Cormos, D.; Gaborit, G.; Duvillaret, L.; Jarrige, P.; O'Connor, R.P.; Kohler, S.; Ticaud, N.;
2012 / IEEE
By: Vigneron, D.B.; Nelson, S.J.; Yong Pang; Lu, J.; Chunsheng Wang; Bing Wu; Xiaoliang Zhang;
By: Vigneron, D.B.; Nelson, S.J.; Yong Pang; Lu, J.; Chunsheng Wang; Bing Wu; Xiaoliang Zhang;
2012 / IEEE
By: Hamacher, M.; Syvridis, D.; Mesaritakis, C.; Stamataki, I.; Kapsalis, A.; Heidrich, H.;
By: Hamacher, M.; Syvridis, D.; Mesaritakis, C.; Stamataki, I.; Kapsalis, A.; Heidrich, H.;
2012 / IEEE
By: Chen, Y.M.; Fung, C.K.Y.; Ke Xu; Wong, C.Y.; Xia Chen; Zhenzhou Cheng; Hon Ki Tsang;
By: Chen, Y.M.; Fung, C.K.Y.; Ke Xu; Wong, C.Y.; Xia Chen; Zhenzhou Cheng; Hon Ki Tsang;
2012 / IEEE
By: Rakov, V.A.; Okabe, S.; Takami, J.; Ametani, A.; Nagaoka, N.; Baba, Y.; Tran Huu Thang;
By: Rakov, V.A.; Okabe, S.; Takami, J.; Ametani, A.; Nagaoka, N.; Baba, Y.; Tran Huu Thang;
2012 / IEEE
By: Tran Huu Thang; Rakov, V.A.; Okabe, S.; Takami, J.; Ametani, A.; Nagaoka, N.; Baba, Y.;
By: Tran Huu Thang; Rakov, V.A.; Okabe, S.; Takami, J.; Ametani, A.; Nagaoka, N.; Baba, Y.;
2012 / IEEE
By: Xinliang Zhang; Dingshan Gao; Lin Chen; Cassan, E.; Huaming Wu; Jin Hou; Changjing Bao;
By: Xinliang Zhang; Dingshan Gao; Lin Chen; Cassan, E.; Huaming Wu; Jin Hou; Changjing Bao;
2012 / IEEE
By: Stark, A.J.; Dabkowski, M.; Kirk, J.B.; Kim, J.; Kim, T.W.; Sultana, N.; Evans, G.A.; LaFave, T.P.; Liu, K.; Christensen, M.P.; MacFarlane, D.L.; Huntoon, N.; Ramakrishna, V.; Hunt, L.R.;
By: Stark, A.J.; Dabkowski, M.; Kirk, J.B.; Kim, J.; Kim, T.W.; Sultana, N.; Evans, G.A.; LaFave, T.P.; Liu, K.; Christensen, M.P.; MacFarlane, D.L.; Huntoon, N.; Ramakrishna, V.; Hunt, L.R.;