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Topic: Field Effect Mmic
Results
2012 / IEEE
By: Friedman, D.J.; Tierno, J.A.; Liu, Y.; Dickson, T.O.; Bulzacchelli, J.F.; Agrawal, A.;
By: Friedman, D.J.; Tierno, J.A.; Liu, Y.; Dickson, T.O.; Bulzacchelli, J.F.; Agrawal, A.;
2012 / IEEE
By: Yung-Chung Lo; Hyung-Joon Jeon; Helmy, A.A.; Entesari, K.; Larsson, A.J.; Silva-Martinez, J.; Jusung Kim; Kulkarni, R.;
By: Yung-Chung Lo; Hyung-Joon Jeon; Helmy, A.A.; Entesari, K.; Larsson, A.J.; Silva-Martinez, J.; Jusung Kim; Kulkarni, R.;
An LC Quadrature VCO Using Capacitive Source Degeneration Coupling to Eliminate Bi-Modal Oscillation
2012 / IEEEBy: Yung-Chung Lo; Shanfeng Cheng; Haitao Tong; Silva-Martinez, J.; Karsilayan, A.I.;
2011 / IEEE / 978-1-4577-1255-5
By: Far, M.A.; Kordalivand, A.M.; Sabaghi, M.; Nouri, A.; Rasouli, K.;
By: Far, M.A.; Kordalivand, A.M.; Sabaghi, M.; Nouri, A.; Rasouli, K.;
2011 / IEEE / 978-1-61284-943-0
By: Andriesei, C.; Delacressonniere, B.; Temcamani, F.; Goras, L.; Patache, N.;
By: Andriesei, C.; Delacressonniere, B.; Temcamani, F.; Goras, L.; Patache, N.;
2011 / IEEE / 978-1-4577-0803-9
By: Dave, M.; Kancharapu, N.K.; Sharma, D.K.; Baghini, M.S.; Masimukkula, V.;
By: Dave, M.; Kancharapu, N.K.; Sharma, D.K.; Baghini, M.S.; Masimukkula, V.;
2011 / IEEE / 978-1-61284-857-0
By: Naess, O.; Hjortland, H.A.; Sudalaiyandi, S.; Tuan Anh Vu; Hamran, S.E.; Lande, T.S.;
By: Naess, O.; Hjortland, H.A.; Sudalaiyandi, S.; Tuan Anh Vu; Hamran, S.E.; Lande, T.S.;
2011 / IEEE / 978-1-4577-0223-5
By: Ryman, E.; Emrich, A.; Andersson, S.; Riesbeck, J.; Svensson, L.; Larsson-Edefors, P.;
By: Ryman, E.; Emrich, A.; Andersson, S.; Riesbeck, J.; Svensson, L.; Larsson-Edefors, P.;
2011 / IEEE / 978-1-4244-6252-0
By: Mu-Chun Wang; Ming-Der Chang; Hsin-Chia Yang; Chuei-Tang Wang; Sungching Chi;
By: Mu-Chun Wang; Ming-Der Chang; Hsin-Chia Yang; Chuei-Tang Wang; Sungching Chi;
2011 / IEEE / 978-1-61284-965-2
By: Bruckner, P.; Massler, H.; Schwantuschke, D.; Wagner, S.; Haupt, C.; Kallfass, I.; Ambacher, O.; Quay, R.; Kiefer, R.;
By: Bruckner, P.; Massler, H.; Schwantuschke, D.; Wagner, S.; Haupt, C.; Kallfass, I.; Ambacher, O.; Quay, R.; Kiefer, R.;
2011 / IEEE / 978-1-61284-712-2
By: Wagner, S.; Lewark, U.; Massler, H.; Tessmann, A.; Leuther, A.; Kallfass, I.;
By: Wagner, S.; Lewark, U.; Massler, H.; Tessmann, A.; Leuther, A.; Kallfass, I.;
2011 / IEEE / 978-1-61284-712-2
By: Palacios, T.; Bettencourt, J.; Hoke, W.; Chelakara, R.; Kazior, T.E.; Lee, H.S.;
By: Palacios, T.; Bettencourt, J.; Hoke, W.; Chelakara, R.; Kazior, T.E.; Lee, H.S.;
2011 / IEEE / 978-1-4577-1610-2
By: Su Jie; Ruan Ying; Chen Lei; Hua Lin; Zhang Shulin; Lai Zongsheng; Yan Qiong; Liu Shengfu; Zhang Wei;
By: Su Jie; Ruan Ying; Chen Lei; Hua Lin; Zhang Shulin; Lai Zongsheng; Yan Qiong; Liu Shengfu; Zhang Wei;
2011 / IEEE / 978-1-61284-166-3
By: Bardy, S.; Meng, F.; Breunisse, R.; van der Heijden, E.; Moreau, F.; Praamsma, L.; Philippe, P.; Thomas, E.; Wane, S.;
By: Bardy, S.; Meng, F.; Breunisse, R.; van der Heijden, E.; Moreau, F.; Praamsma, L.; Philippe, P.; Thomas, E.; Wane, S.;
2011 / IEEE / 978-1-61284-166-3
By: Seth, S.; Cressler, J.D.; Arora, R.; Thrivikraman, T.; Poh, C.H.J.;
By: Seth, S.; Cressler, J.D.; Arora, R.; Thrivikraman, T.; Poh, C.H.J.;
2011 / IEEE / 978-1-61284-166-3
By: Imai, H.; Shinomura, K.; Morita, S.; Mochizuki, H.; Suligoj, T.; Koricic, M.;
By: Imai, H.; Shinomura, K.; Morita, S.; Mochizuki, H.; Suligoj, T.; Koricic, M.;
A novel low-power low-complexity chip solution for tunable UWB transmitter in CMOS 0.18�m technology
2011 / IEEE / 978-1-4577-1997-4By: Wu, Z.H.; Li, B.; Zhao, M.J.;
2011 / IEEE / 978-1-4577-1997-4
By: Shou Xian Mou; Kiat Seng Yeo; Kaixue Ma; Nagarajan, M.; Kumar, T.B.;
By: Shou Xian Mou; Kiat Seng Yeo; Kaixue Ma; Nagarajan, M.; Kumar, T.B.;
2011 / IEEE / 978-1-61284-865-5
By: Kiat Seng Yeo; Manh Anh Do; Jia Fu Lin; Chirn Chye Boon; Xiang Yi; Wei Meng Lim;
By: Kiat Seng Yeo; Manh Anh Do; Jia Fu Lin; Chirn Chye Boon; Xiang Yi; Wei Meng Lim;
2011 / IEEE / 978-0-85825-974-4
By: Jung, M.; Ussmueller, T.; Weigel, R.; Fischer, G.; Ferizi, A.; Fuhrmann, J.;
By: Jung, M.; Ussmueller, T.; Weigel, R.; Fischer, G.; Ferizi, A.; Fuhrmann, J.;
2011 / IEEE / 978-0-85825-974-4
By: Chan-Sei Yoo; Jun-Chul Park; Woo Sung Lee; Jong-Gwan Yook; Dongsu Kim; Wonshil Kang;
By: Chan-Sei Yoo; Jun-Chul Park; Woo Sung Lee; Jong-Gwan Yook; Dongsu Kim; Wonshil Kang;
2012 / IEEE / 978-1-4577-1318-7
By: Laemmle, B.; Weigel, R.; Kissinger, D.; Scheytt, C.; Schmalz, K.;
By: Laemmle, B.; Weigel, R.; Kissinger, D.; Scheytt, C.; Schmalz, K.;
2011 / IEEE / 978-1-61284-193-9
By: Dasheng Fang; Sweeney, S.; Wan Ni; Gillis, J.; Hanyi Ding; Wang, D.; Jingyang Zhang;
By: Dasheng Fang; Sweeney, S.; Wan Ni; Gillis, J.; Hanyi Ding; Wang, D.; Jingyang Zhang;
2011 / IEEE / 978-1-4577-1631-7
By: Scappaviva, F.; Musio, A.; Florian, C.; Feudale, M.; Paganelli, R.P.;
By: Scappaviva, F.; Musio, A.; Florian, C.; Feudale, M.; Paganelli, R.P.;
2012 / IEEE / 978-1-4673-0416-0
By: Yu-Chih Hsiao; Guo-Wei Huang; Shyh-Chyi Wong; Chia-Ling Wang; Jin-Siang Syu; Chinchun Meng;
By: Yu-Chih Hsiao; Guo-Wei Huang; Shyh-Chyi Wong; Chia-Ling Wang; Jin-Siang Syu; Chinchun Meng;