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Topic: Fets
Results
2011 / IEEE
By: Masse, C.; Huang, C.-W.P.; Zhan-Feng Zhou; McPartlin, M.J.; Madan, A.; Cressler, J.D.;
By: Masse, C.; Huang, C.-W.P.; Zhan-Feng Zhou; McPartlin, M.J.; Madan, A.; Cressler, J.D.;
2011 / IEEE
By: Hyung Bin Sohn; Chan Wook Baik; Jung Han Choi; SeungNam Cha; Jong Min Kim; Ohyun Kim; Joonhyock Choi;
By: Hyung Bin Sohn; Chan Wook Baik; Jung Han Choi; SeungNam Cha; Jong Min Kim; Ohyun Kim; Joonhyock Choi;
2011 / IEEE
By: Wan Sik Hwang; Qingmin Liu; Rui Li; Yeqing Lu; Guangle Zhou; Huili Xing; Seabaugh, A.; Fay, P.; Wistey, M.; Kosel, T.; Qin Zhang; Koswatta, S.; Jenn-Ming Kuo; Haijun Zhu; Chen Chen; Vasen, T.;
By: Wan Sik Hwang; Qingmin Liu; Rui Li; Yeqing Lu; Guangle Zhou; Huili Xing; Seabaugh, A.; Fay, P.; Wistey, M.; Kosel, T.; Qin Zhang; Koswatta, S.; Jenn-Ming Kuo; Haijun Zhu; Chen Chen; Vasen, T.;
2011 / IEEE
By: Gaskill, D.K.; Eddy, C.R.; Myers-Ward, R.L.; Tedesco, J.L.; Yanqing Wu; Dimitrakopoulos, C.; Farmer, D.B.; Yu-Ming Lin; Jenkins, K.A.; Avouris, P.;
By: Gaskill, D.K.; Eddy, C.R.; Myers-Ward, R.L.; Tedesco, J.L.; Yanqing Wu; Dimitrakopoulos, C.; Farmer, D.B.; Yu-Ming Lin; Jenkins, K.A.; Avouris, P.;
2011 / IEEE
By: Taniguchi, T.; Watanabe, K.; Hsu, A.; Taychatanapat, T.; Han Wang; Palacios, T.; Jarillo-Herrero, P.;
By: Taniguchi, T.; Watanabe, K.; Hsu, A.; Taychatanapat, T.; Han Wang; Palacios, T.; Jarillo-Herrero, P.;
2012 / IEEE
By: Wang, K.L.W.; Fleetwood, D.M.; En Xia Zhang; Cher Xuan Zhang; Alles, M.L.; Galatsis, K.; Sung Min Kim; Song, E.B.; Schrimpf, R.D.;
By: Wang, K.L.W.; Fleetwood, D.M.; En Xia Zhang; Cher Xuan Zhang; Alles, M.L.; Galatsis, K.; Sung Min Kim; Song, E.B.; Schrimpf, R.D.;
2012 / IEEE
By: Gui, P.; Deptuch, G. W.; Arora, R.; Cressler, J. D.; Lourenco, N. E.; Hoff, J. R.; Yarema, R. J.; Wu, G.;
By: Gui, P.; Deptuch, G. W.; Arora, R.; Cressler, J. D.; Lourenco, N. E.; Hoff, J. R.; Yarema, R. J.; Wu, G.;
2012 / IEEE
By: Magnus, W.; De Meyer, K.; Groeseneken, G.; Leonelli, D.; Kuo-Hsing Kao; Soree, B.; Vandenberghe, W.G.; Verhulst, A.S.;
By: Magnus, W.; De Meyer, K.; Groeseneken, G.; Leonelli, D.; Kuo-Hsing Kao; Soree, B.; Vandenberghe, W.G.; Verhulst, A.S.;
2012 / IEEE
By: Chang-Hoon Kim; Yang-Kyu Choi; Hyun Gyu Park; Cheulhee Jung; Kyung-Bok Lee; Jae-Hyuk Ahn;
By: Chang-Hoon Kim; Yang-Kyu Choi; Hyun Gyu Park; Cheulhee Jung; Kyung-Bok Lee; Jae-Hyuk Ahn;
2012 / IEEE
By: Hyuncher Chong; Johnson, C.S.; Kaushik, V.; Rodgers, M.; Akarvardar, K.; Injo Ok; Kirsch, P.; Jammy, R.; Hobbs, C.; Gausepohl, S.; Kah-Wee Ang;
By: Hyuncher Chong; Johnson, C.S.; Kaushik, V.; Rodgers, M.; Akarvardar, K.; Injo Ok; Kirsch, P.; Jammy, R.; Hobbs, C.; Gausepohl, S.; Kah-Wee Ang;
Increasing the Selectivity of Pt-Gate SiC Field Effect Gas Sensors by Dynamic Temperature Modulation
2012 / IEEEBy: Spetz, A.L.; Schutze, A.; Andersson, M.; Reimann, P.; Bur, C.;
2012 / IEEE
By: Byung-Gook Park; Mihee Uhm; Jung Han Lee; Won Hee Lee; Dong Myong Kim; Jin-Moo Lee; Jieun Lee; Dae Hwan Kim; Yong-Joo Jeong;
By: Byung-Gook Park; Mihee Uhm; Jung Han Lee; Won Hee Lee; Dong Myong Kim; Jin-Moo Lee; Jieun Lee; Dae Hwan Kim; Yong-Joo Jeong;
2012 / IEEE
By: Penarier, A.; Coquillat, D.; Nouvel, P.; Arakawa, K.; Hisatake, S.; Tohme, L.; Torres, J.; Blin, S.; Nagatsuma, T.; Teppe, F.; Knap, W.; Varani, L.;
By: Penarier, A.; Coquillat, D.; Nouvel, P.; Arakawa, K.; Hisatake, S.; Tohme, L.; Torres, J.; Blin, S.; Nagatsuma, T.; Teppe, F.; Knap, W.; Varani, L.;
2012 / IEEE
By: Lin, S.; Asbeck, P.; Antcliffe, M.; Seo, H.-C.; Moon, J.S.; McGuire, C.; Lee, K.-M.; Campbell, P.M.; Gaskill, D.K.; Nyakiti, L.O.; Le, D.;
By: Lin, S.; Asbeck, P.; Antcliffe, M.; Seo, H.-C.; Moon, J.S.; McGuire, C.; Lee, K.-M.; Campbell, P.M.; Gaskill, D.K.; Nyakiti, L.O.; Le, D.;
2012 / IEEE
By: Ha Sul Kim; Hui Fang; Takei, K.; Chuang, S.; Plis, E.; Javey, A.; Yu-Lun Chueh; Krishna, S.; Chin-Hung Liu;
By: Ha Sul Kim; Hui Fang; Takei, K.; Chuang, S.; Plis, E.; Javey, A.; Yu-Lun Chueh; Krishna, S.; Chin-Hung Liu;
2012 / IEEE
By: Verma, R.; Sangwoo Kim; Preu, S.; Gossard, A.C.; Sherwin, M.S.; Vinh, N.Q.; Burke, P.G.;
By: Verma, R.; Sangwoo Kim; Preu, S.; Gossard, A.C.; Sherwin, M.S.; Vinh, N.Q.; Burke, P.G.;
2012 / IEEE
By: Allen, M.W.; Partridge, J.; Gunn, R.; Fang, Q.; Masaud, T.B.; Ashburn, P.; Sun, K.; Sultan, S.M.; Clark, O.D.; Chong, H.M.H.;
By: Allen, M.W.; Partridge, J.; Gunn, R.; Fang, Q.; Masaud, T.B.; Ashburn, P.; Sun, K.; Sultan, S.M.; Clark, O.D.; Chong, H.M.H.;
2000 / IEEE
By: Horioka, K.; Watanabe, M.; Takayama, K.; Kishiro, J.; Ogawa, M.; Hasegawa, J.; Shiho, M.; Hotta, E.; Nakajima, M.;
By: Horioka, K.; Watanabe, M.; Takayama, K.; Kishiro, J.; Ogawa, M.; Hasegawa, J.; Shiho, M.; Hotta, E.; Nakajima, M.;
2011 / IEEE / 978-1-4244-9949-6
By: Hoffmann, T.Y.; Grasser, T.; Roussel, P.J.; Franco, J.; Kaczer, B.; Toledano-Luque, M.; Groeseneken, G.;
By: Hoffmann, T.Y.; Grasser, T.; Roussel, P.J.; Franco, J.; Kaczer, B.; Toledano-Luque, M.; Groeseneken, G.;
2011 / IEEE / 978-1-4244-9949-6
By: Baud, L.; Brunet, L.; Le Royer, C.; Sanchez, L.; Tabone, C.; Previtali, B.; Xu, C.; Vinet, M.; Batude, P.; Faynot, O.; Poiroux, T.; Thomas, O.; Aussenac, F.; Lafond, D.; Allain, F.; Toffoli, A.;
By: Baud, L.; Brunet, L.; Le Royer, C.; Sanchez, L.; Tabone, C.; Previtali, B.; Xu, C.; Vinet, M.; Batude, P.; Faynot, O.; Poiroux, T.; Thomas, O.; Aussenac, F.; Lafond, D.; Allain, F.; Toffoli, A.;
2011 / IEEE / 978-1-61284-244-8
By: McLelland, H.; Fox, O.J.L.; Moran, D.A.J.; May, P.W.; Russell, S.;
By: McLelland, H.; Fox, O.J.L.; Moran, D.A.J.; May, P.W.; Russell, S.;
2011 / IEEE / 978-1-4244-9563-4
By: Heimlich, M.; Esselle, K.P.; Matekovits, L.; Thalakotuna, D.N.P.;
By: Heimlich, M.; Esselle, K.P.; Matekovits, L.; Thalakotuna, D.N.P.;
2011 / IEEE / 978-1-61284-244-8
By: Reggiani, S.; Maiorano, P.; Gnani, E.; Baccarani, G.; Gnudi, A.;
By: Reggiani, S.; Maiorano, P.; Gnani, E.; Baccarani, G.; Gnudi, A.;
2011 / IEEE / 978-1-61284-244-8
By: Kern, K.; Zschieschang, U.; Hahn, K.; Fenk, B.; Kalblein, D.; Klauk, H.;
By: Kern, K.; Zschieschang, U.; Hahn, K.; Fenk, B.; Kalblein, D.; Klauk, H.;
2011 / IEEE / 978-1-4244-9949-6
By: Congqin Miao; Ming Zhang; Bo-Chao Huang; Yanjie Wang; Woo, J.C.S.; Ya-Hong Xie;
By: Congqin Miao; Ming Zhang; Bo-Chao Huang; Yanjie Wang; Woo, J.C.S.; Ya-Hong Xie;
2011 / IEEE / 978-1-4244-9949-6
By: Lackey, C.O.; Bair, L.A.; Tin Tin Wee; Loke, A.L.S.; Jia Feng; Krishnan, S.; Leary, B.M.; Fang, E.S.; Doyle, B.A.; Fischette, D.M.; Okada, L.A.; Icel, A.B.; Xin Li; Jung-Suk Goo; Zhi-Yuan Wu; Cooper, J.G.; Herden, M.M.; Morgan, J.H.; Mantei, T.; Schwan, C.T.;
By: Lackey, C.O.; Bair, L.A.; Tin Tin Wee; Loke, A.L.S.; Jia Feng; Krishnan, S.; Leary, B.M.; Fang, E.S.; Doyle, B.A.; Fischette, D.M.; Okada, L.A.; Icel, A.B.; Xin Li; Jung-Suk Goo; Zhi-Yuan Wu; Cooper, J.G.; Herden, M.M.; Morgan, J.H.; Mantei, T.; Schwan, C.T.;
2011 / IEEE / 978-1-61284-244-8
By: Klauk, H.; Schmidt, O.G.; Zschieschang, U.; Kalblein, D.; Ryu, H.;
By: Klauk, H.; Schmidt, O.G.; Zschieschang, U.; Kalblein, D.; Ryu, H.;
2011 / IEEE / 978-1-4577-0192-4
By: Sydoruk, V.A.; Vitusevich, S.A.; Offenhausser, A.; Bosman, G.; Ural, A.; Petrychuk, M.V.;
By: Sydoruk, V.A.; Vitusevich, S.A.; Offenhausser, A.; Bosman, G.; Ural, A.; Petrychuk, M.V.;
2011 / IEEE / 978-1-4503-0636-2
By: Criscione, J.M.; Routenberg, D.A.; Rajan, N.K.; Vacic, A.; Park, J.; Stern, E.; Reed, M.; Fahmy, T.M.;
By: Criscione, J.M.; Routenberg, D.A.; Rajan, N.K.; Vacic, A.; Park, J.; Stern, E.; Reed, M.; Fahmy, T.M.;
2011 / IEEE / 978-1-4244-9277-0
By: Singh, P.; Hamidullah, M.; Li-Shiah Lim; Cairan He; Han-Hua Feng; Woo-Tae Park;
By: Singh, P.; Hamidullah, M.; Li-Shiah Lim; Cairan He; Han-Hua Feng; Woo-Tae Park;
2011 / IEEE / 978-1-61284-777-1
By: Margis, M.R.; Chalamalasetty, S.N.S.; Wejinya, U.C.; Zhuxin Dong;
By: Margis, M.R.; Chalamalasetty, S.N.S.; Wejinya, U.C.; Zhuxin Dong;
2011 / IEEE / 978-1-4577-0708-7
By: Reggiani, S.; Gnani, E.; Gnudi, A.; Imperiale, I.; Baccarani, G.;
By: Reggiani, S.; Gnani, E.; Gnudi, A.; Imperiale, I.; Baccarani, G.;
2011 / IEEE / 978-1-4577-0708-7
By: Gnani, E.; Baccarani, G.; Gnudi, A.; Reggiani, S.; Maiorano, P.;
By: Gnani, E.; Baccarani, G.; Gnudi, A.; Reggiani, S.; Maiorano, P.;