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Topic: Fault Event
Results
1992 / IEEE
By: Kezunovic, M.; Sevcik, D.R.; Fromen, C.W.; Singh, H.; Skendzic, V.; Kojovic, L.; Abur, A.;
By: Kezunovic, M.; Sevcik, D.R.; Fromen, C.W.; Singh, H.; Skendzic, V.; Kojovic, L.; Abur, A.;
2004 / IEEE / 0-7803-8465-2
By: Lotfalian, M.; Mehdian, F.; Daneshdoost, M.; Hatziadoniu, C.; Farid, F.; Pourboghrat, F.;
By: Lotfalian, M.; Mehdian, F.; Daneshdoost, M.; Hatziadoniu, C.; Farid, F.; Pourboghrat, F.;
2004 / IEEE / 0-7803-8775-9
By: Camilo, L.M.; Cebrian, J.C.; Matsuo, N.M.; Castellano, U.F.; Vasconcelos, G.; Duarte, S.X.; Kagan, N.; Marsulo, J.A.; Bernartelli, W.H.; Arango, H.;
By: Camilo, L.M.; Cebrian, J.C.; Matsuo, N.M.; Castellano, U.F.; Vasconcelos, G.; Duarte, S.X.; Kagan, N.; Marsulo, J.A.; Bernartelli, W.H.; Arango, H.;
2006 / IEEE / 978-0-7803-9706-4
By: Benini, L.; Murali, S.; Atienza, D.; Angiolini, F.; De Micheli, G.;
By: Benini, L.; Murali, S.; Atienza, D.; Angiolini, F.; De Micheli, G.;
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