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Topic: Extraterrestrial Measurements
Results
2011 / IEEE
By: Berryman, A.; Kunpeng Zhu; Yingxiao Xu; Sridharan, M.; Calyam, P.; Venkataraman, A.; Patali, R.;
By: Berryman, A.; Kunpeng Zhu; Yingxiao Xu; Sridharan, M.; Calyam, P.; Venkataraman, A.; Patali, R.;
Surface-Charging Analysis of the Radiation Belt Storm Probe and Magnetospheric MultiScale Spacecraft
2012 / IEEEBy: Davis, V.A.; Herrmann, C.; Maurer, R.H.; Davis, G.T.; Brown-Hayes, M.; Baker, N.R.; Mandell, M.J.;
Sampled-Data Control for Relative Position Holding of Spacecraft Rendezvous With Thrust Nonlinearity
2012 / IEEEBy: Xibin Cao; Xuebo Yang; Huijun Gao;
2012 / IEEE
By: Dan-Dan Liu; Guang-Wei Cao; Xian-Guo Zhang; Chun-Qin Wang; Wei Tang; Bing-Sen Xue; Tao Yu; Jia-Wei Li; Cong Huang;
By: Dan-Dan Liu; Guang-Wei Cao; Xian-Guo Zhang; Chun-Qin Wang; Wei Tang; Bing-Sen Xue; Tao Yu; Jia-Wei Li; Cong Huang;
In-Orbit Measurement of the AOS (Acousto-Optical Spectrometer) Response Using Frequency Comb Signals
2012 / IEEEBy: Kikuchi, K.; Mizobuchi, S.; Ozeki, H.; Tamaki, K.; Sano, T.; Nishibori, T.; Ochiai, S.;
2012 / IEEE
By: Sedaka, J.; Scholz, C.; Cooper, M.; Miyasaka, H.; Meras, P.; Mao, P.; Liebe, C.C.; Madsen, K.K.; Kecman, B.; Cook, R.; Clark, G.R.; Bauman, B.W.;
By: Sedaka, J.; Scholz, C.; Cooper, M.; Miyasaka, H.; Meras, P.; Mao, P.; Liebe, C.C.; Madsen, K.K.; Kecman, B.; Cook, R.; Clark, G.R.; Bauman, B.W.;
2012 / IEEE
By: Martinez Rodriguez-Osorio, R.; Salas Natera, M.A.; Sierra Perez, M.; de Haro Ariet, L.;
By: Martinez Rodriguez-Osorio, R.; Salas Natera, M.A.; Sierra Perez, M.; de Haro Ariet, L.;
2012 / IEEE
By: Ambacher, O.; Schlechtweg, M.; Leuther, A.; Diez, C.; Schafer, F.; Aja, B.; Seelmann-Eggebert, M.; Gallego, J. D.; Amils, R. I.; Bruch, D.; Kallfass, I.;
By: Ambacher, O.; Schlechtweg, M.; Leuther, A.; Diez, C.; Schafer, F.; Aja, B.; Seelmann-Eggebert, M.; Gallego, J. D.; Amils, R. I.; Bruch, D.; Kallfass, I.;
2012 / IEEE
By: Yen-Sheng Chen; Shih-Yuan Chen; Ouedraogo, R.O.; Rothwell, E.J.; Hsueh-Jyh Li; Yao-Chia Chan;
By: Yen-Sheng Chen; Shih-Yuan Chen; Ouedraogo, R.O.; Rothwell, E.J.; Hsueh-Jyh Li; Yao-Chia Chan;
2002 / IEEE / 978-0-7354-0107-5
By: Maenchen, J.E.; Hahn, K.; Schamiloglu, E.; Woodring, R.; Cordova, S.; Williamson, M.; Thomas, K.J.; Sinclair, M.A.; Phillips, M.A.; Pearce, A.G.; Kincy, M.; Kitterman, D.; Lucero, R.; Menge, P.R.; Molina, I.; Olson, C.; Rovang, D.C.; Fulton, R.D.; Carlson, R.; Smith, J.; Martinson, D.; Droemer, D.; Gignac, R.; Helvin, T.; Ormand, E.; Wilkins, F.; Welch, D.R.; Oliver, B.V.; Rose, D.V.; Bailey, V.; Corcoran, P.; Johnson, D.L.; Smith, D.; Weidenheimer, D.; Cooperstein, G.; Commisso, R.; Mosher, D.; Stephanakis, S.; Schumer, J.; Swanekamp, S.; Young, F.; Goldsack, T.J.; Cooper, G.M.;
By: Maenchen, J.E.; Hahn, K.; Schamiloglu, E.; Woodring, R.; Cordova, S.; Williamson, M.; Thomas, K.J.; Sinclair, M.A.; Phillips, M.A.; Pearce, A.G.; Kincy, M.; Kitterman, D.; Lucero, R.; Menge, P.R.; Molina, I.; Olson, C.; Rovang, D.C.; Fulton, R.D.; Carlson, R.; Smith, J.; Martinson, D.; Droemer, D.; Gignac, R.; Helvin, T.; Ormand, E.; Wilkins, F.; Welch, D.R.; Oliver, B.V.; Rose, D.V.; Bailey, V.; Corcoran, P.; Johnson, D.L.; Smith, D.; Weidenheimer, D.; Cooperstein, G.; Commisso, R.; Mosher, D.; Stephanakis, S.; Schumer, J.; Swanekamp, S.; Young, F.; Goldsack, T.J.; Cooper, G.M.;
2004 / IEEE / 978-5-87911-088-3
By: Ning Ding; Cun Guo; Jianlun Yang; Zeping Xu; Jianjun Deng; Yuanchao Gu; Cheng Ning; Zhenghong Li; Xinsheng Hua; Xianjue Peng; Rongkun Xu; Yongjian Tang;
By: Ning Ding; Cun Guo; Jianlun Yang; Zeping Xu; Jianjun Deng; Yuanchao Gu; Cheng Ning; Zhenghong Li; Xinsheng Hua; Xianjue Peng; Rongkun Xu; Yongjian Tang;
2011 / IEEE / 978-1-4577-1226-5
By: Jaroszewicz, Z.; Ares, J.; Bara, S.; Prado, P.; Arines, J.; Martinez-Cuenca, R.; Lancis, J.; Tajahuerce, E.; Duran, V.; Climent, V.;
By: Jaroszewicz, Z.; Ares, J.; Bara, S.; Prado, P.; Arines, J.; Martinez-Cuenca, R.; Lancis, J.; Tajahuerce, E.; Duran, V.; Climent, V.;
2011 / IEEE / 978-1-4577-0351-5
By: Gramaglia, M.; Bernardos, C.J.; Calderon, M.; Hernandez, J.A.; Serrano, P.;
By: Gramaglia, M.; Bernardos, C.J.; Calderon, M.; Hernandez, J.A.; Serrano, P.;
2011 / IEEE / 978-1-4244-5731-1
By: Warburton, R.; Izdebski, F.; Barnett, S.M.; Franke-Arnold, S.; Ritsch-Marte, M.; Buller, G.; Romero, J.; Jack, B.; Leach, J.; Padgett, M.J.; Boyd, R.W.;
By: Warburton, R.; Izdebski, F.; Barnett, S.M.; Franke-Arnold, S.; Ritsch-Marte, M.; Buller, G.; Romero, J.; Jack, B.; Leach, J.; Padgett, M.J.; Boyd, R.W.;
2011 / IEEE / 978-1-61284-383-4
By: Arias, E.; Valero-Lara, P.; Uribe-Paredes, R.; Cazorla, D.; Sanchez, J.L.;
By: Arias, E.; Valero-Lara, P.; Uribe-Paredes, R.; Cazorla, D.; Sanchez, J.L.;
2011 / IEEE / 978-1-61284-660-6
By: Younghyun Kim; Woojoo Lee; Soohee Han; Pedram, M.; Naehyuck Chang; Yanzhi Wang;
By: Younghyun Kim; Woojoo Lee; Soohee Han; Pedram, M.; Naehyuck Chang; Yanzhi Wang;