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Topic: Experimental Data

Results

Impact of Circuit Placement on Single Event Transients in 65 nm Bulk CMOS Technology
2012 / IEEE
By: Chen Shuming; He Yibai; Huang Pengcheng; Du Yankang; Qin Junrui; Liu Biwei; Liang Bin; Chi Yaqing; Chen Jianjun;
Comparison of SOI Microdosimeter and Tissue Equivalent Proportional Counter Measurements at the CERF Facility
2012 / IEEE
By: Taylor, G.C.; Reinhard, M.I.; Prokopovich, D.A.; Rosenfeld, A.B.; Hands, A.;
Impact of Conifer Forest Litter on Microwave Emission at L-Band
2012 / IEEE
By: O'Neill, P.E.; Kurum, M.; Jackson, T.J.; Joseph, A.T.; Cosh, M.H.; Lang, R.H.;
Distribution of relaxation times: An inverse problem
2012 / IEEE
By: Tuncer, E.;
Calculation of cross-section average flow velocity in vegetated compound channels
2011 / IEEE / 978-1-4244-9439-2
By: Xingnian Liu; Kejun Yang; Yuqi Shan; Chao Liu;
Simulations of the 4DMPET SiPM-based PET module
2011 / IEEE / 978-1-4673-0120-6
By: Wheadon, R.; Peroni, C.; Moehrs, S.; Magazzu, G.; Llosa, G.; Lacasta, C.; Pennazio, F.; De Luca, G.; Cerello, P.; Bisogni, M.G.; Barrio, J.; Del Guerra, A.;
A sequential Monte Carlo base-calling method for next-generation dna sequencing
2011 / IEEE / 978-1-4673-0490-0
By: Xiaohu Shen; Vikalo, H.;
First radiation background studies for the TOTEM Roman Pot and T2 detectors
2011 / IEEE / 978-1-4673-0120-6
By: Ravotti, F.;
Structure analysis and design of magnetic powder clutch for vehicle based on the analysis of electromagnetic
2012 / IEEE / 978-1-4577-1415-3
By: Shanzhen Xu; Cheng Wang;
Changeloads for Resilience Benchmarking of Self-Adaptive Systems: A Risk-Based Approach
2012 / IEEE / 978-1-4673-0938-7
By: Vieira, M.; Almeida, R.;
Modeling Inductive Behavior of MOSFET Scattering Parameter $S _{22}$ in the Breakdown Regime
2012 / IEEE
By: Chie-In Lee; Wei-Cheng Lin; Yan-Tin Lin;
A Framework for Measuring the Impact and Effectiveness of the NEES Cyberinfrastructure for Earthquake Engineering
2014 / IEEE
By: Magana, Alejandra J.; Hacker, Thomas;
The breakdown process of a liquid trigatron
1988 / IEEE
By: Maksiejewski, J.L.;
An analytical approach to the capacitance-voltage characteristics of double-heterojunction HEMTs
1988 / IEEE
By: Pavlidis, D.; Ng, G.-I.; Cazaux, J.-L.; Chau, H.-F.;
An MOS transistor charge model for VLSI design
1988 / IEEE
By: Hsu, W.-J.; Sheu, B.J.; Ko, P.K.;
Simulation of focus effects in photolithography
1988 / IEEE
By: Bernard, D.A.;
Simulation of hot-electron trapping and aging of nMOSFETs
1988 / IEEE
By: Bibyk, S.; Samman, A.; Roblin, P.;
A framework to evaluate technology and device design enhancements for MOS integrated circuits
1989 / IEEE
By: Wong, S.S.; Sodini, C.G.; Ping-Keung Ko;
Diffused resistors characteristics at high current density levels-analysis and applications
1989 / IEEE
By: Krieger, G.; Niles, P.;
Distributive nature of gate current and negative transconductance in heterostructure field-effect transistors
1989 / IEEE
By: Ruden, P.P.; Jenkins, P.; Akinwande, A.I.; Shur, M.;
High-transconductance beta -SiC buried-gate JFETs
1989 / IEEE
By: Kong, H.-S.; Sleger, K.J.; Binari, S.; Shur, M.S.; Kelner, G.;
The resistance of laser-diffused diode links
1989 / IEEE
By: Canter, J.M.; Chapman, G.H.; Wyatt, P.W.; Cohen, SS.;
Single event upset in irradiated 16 K CMOS SRAMs
1988 / IEEE
By: Browning, J.S.; Winokur, P.S.; Schwank, J.R.; Axness, C.L.; Fleetwood, D.M.; Koga, R.;
An analytical model to describe the performance of digital radio links
1988 / IEEE
By: Namdar, N.;
Tribological properties of edge card connector spring/tab interface
1989 / IEEE
By: Bayer, R.G.; Hsue, E.Y.;
Simulation and modeling for soft recovery of p-i-n rectifiers
1988 / IEEE
By: Tien, B.; Mayaram, K.; Pederson, D.O.; Hu, C.;
A kinetic model for anomalous diffusion during post-implant annealing
1988 / IEEE
By: Mulvaney, B.J.; Richardson, W.B.; Crandle, T.L.;
Electric breakdown behaviour of SF/sub 6/ at lower pressure
1988 / IEEE
By: Zhongyi Ren; Guoli Gong;
Numerical modeling of an amorphous-silicon-based p-i-n solar cell
1990 / IEEE
By: Pawlikiewicz, A.H.; Guha, S.;
A new algorithm for the determination of crystal lattices (by electron microscopy)
1989 / IEEE
By: Carrascosa, J.L.; Hovmoller, S.; Secilla, J.P.;
A new thermal life model derived by the aging compensation effect
1990 / IEEE
By: Montanari, G.C.;
Charge to breakdown mechanism of thin ONO films
1990 / IEEE
By: Min Wha Park; Young-June Park; Jung Suk Goo; Dae-Gwan Khang;
Optimization method versus E-pulse method in the context of target discrimination
1991 / IEEE
By: Rothwell, E.J.; Schaubert, D.H.; Bayard, J.-P.R.; Sun, W.; Nyquist, D.P.; Chen, K.-M.;
An efficient algorithm for the three-dimensional analysis of passive microstrip components and discontinuities for microwave and millimeter-wave integrated circuits
1991 / IEEE
By: Hill, A.; Tripathi, V.K.;
A new wideband spread target maximum likelihood estimator for blood velocity estimation. II. Evaluation of estimator with experimental data
1991 / IEEE
By: Ferrara, K.W.; Algazi, V.R.;
Brillouin scattering by surface acoustic modes for elastic characterization of ZnO films
1991 / IEEE
By: Verdini, L.; Socino, G.; Palmieri, L.; Fioretto, D.; Carlotti, G.; Verona, E.;
Undersea lightguide cable reliability analyses
1990 / IEEE
By: Wu, P.S.;
Carrier impact on the thermal performance of tape-automated-bonding components
1990 / IEEE
By: Davis, T.L.;
Electronic package thermal design using boundary elements
1990 / IEEE
By: Liu, J.C.; Kozerek, R.L.; Hunter, D.E.;
A closed-form analysis of f/sub T/ for the bipolar transistor down to liquid nitrogen temperature
1989 / IEEE / 0-7803-0817-4
By: Shott, J.D.; Weybright, M.E.; Tamba, N.; Plummer, J.D.;
Simple and efficient modeling of EPROM writing
1991 / IEEE
By: Venturi, F.; Fiegna, C.; Ricco, B.; Sangiorgi, E.; Melanotte, M.;
Monte Carlo simulation of transport in technologically significant semiconductors of the diamond and zinc-blende structures. I. Homogeneous transport
1991 / IEEE
By: Fischetti, M.V.;
Quantum-well doped p-channel AlGaAs/GaAs/sub 0.85/Sb/sub 0.15//GaAs heterostructure field-effect transistors
1991 / IEEE
By: Martinez, E.; Cook, P.; Lee, K.; Shur, M.; Martinez, E.J.; Schuermeyer, F.L.; Byun, Y.H.; Stutz, C.E.; Evans, K.;
Avalanche-induced effects in polysilicon thin-film transistors
1991 / IEEE
By: Lewis, A.G.; Hack, M.;
Two-dimensional analysis and design considerations of high-voltage planar junctions equipped with field plate and guard ring
1991 / IEEE
By: Goud, C.B.; Bhat, K.N.;
On the classification of equine force traces
1991 / IEEE
By: Ranu, H.S.; Busch, N.A.; Silver, I.A.;
Relaxation simulation of transverse electromagnetic wave propagation in coupled transmission lines
1991 / IEEE
By: Chang, F.-Y.;
Modelling digital recording in thin film media
1988 / IEEE
By: Mackintosh, N.D.; Miles, J.J.; Middleton, B.K.; Noyau, R.H.;
Dynamic Preisach models of hysteresis
1988 / IEEE
By: Mayergoyz, I.D.;
Training in test samples of superconducting cables for accelerator magnets
1989 / IEEE
By: Garber, M.; Ghosh, A.K.; Sampson, W.B.; Robins, K.E.;
Properties of centrally shorted circular patch microstrip antennas
1988 / IEEE
By: Shafai, L.; Lin, Y.;
Equivalent circuits for an electrically thick square patch directly fed by a coaxial probe or by a microstrip line
1988 / IEEE
By: du Toit, L.J.; Cloete, J.H.;
Variational solutions to E-plane bilateral septum in waveguide
1990 / IEEE
By: Pham, V.; Shih, Y.C.; Ho, T.Q.;
Method-of-moments solution for the posts in a circular waveguide
1990 / IEEE
By: Shi Jin; Dai Zong; Zhu Xiao-Hui;
Interpretation of the depolarizing effects in vector diffraction tomography
1989 / IEEE
By: Soliman, N.A.; Boerner, W.-M.;
Simulation of the transient radiation response for GaAs thyristors
1990 / IEEE
By: Hawkins, C.F.; Hughes, R.C.; Weaver, H.T.; Carson, R.F.; Keshavarz, A.A.;
3-D finite element time-varying fields and eddy currents in nonlinear thin steel channels
1991 / IEEE
By: Mohammed, O.A.; Uler, F.G.;
Measurement and modeling of in situ lead stiffness of surface mounted packages
1991 / IEEE
By: Jahsman, W.E.; Byrd, K.; Pope, D.E.; Jain, P.;
A study of the electrical performances of isolation structures
1990 / IEEE
By: Baccus, B.; Coppee, J.-L.; Dubois, E.; Collard, D.;
Approximative threshold-calculation of a PLL-FM-demodulator with bandpass-limiter
1990 / IEEE
By: Mohr, W.;
Singularity structure analysis for nonlinear dynamic systems
1990 / IEEE
By: Tsao, Y.-Y.;
An analysis of coefficient inaccuracy for 2-D FIR direct form digital filters
1990 / IEEE
By: Siohan, P.;
Thermal stress analysis of plastic leaded chip carriers
1990 / IEEE
By: Lau, J.H.;
Silicon interconnect-a critical factor in device thermal management
1990 / IEEE
By: Smith, K.; Metelski, G.; Witzman, S.;
High-performance line contact cooling module for multichip packaging
1990 / IEEE
By: Yokoyama, H.; Naganuma, Y.; Morihara, A.;
High resolution radar imaging with small subarrays
1990 / IEEE
By: Jenho Tsao;
A new method to determine the work-function difference and its application to calibrate the boron-segregation coefficient
1991 / IEEE
By: Chia-Haur Chang; Pole-Shang Lin;
Experimental measurements of surface mount component lead stiffness
1990 / IEEE
By: Pope, D.E.; Byrd, K.;
Correlation between channel hot-electron degradation and radiation-induced interface trapping in N-channel LDD devices
1991 / IEEE
By: Wang, J.J.; King, E.E.; Huang, D.H.; Palkuti, L.J.; Ormond, R.;
Experimental investigation of slot type dual spiral antenna fed by a microstrip line
1989 / IEEE
By: Nakano, H.; Hirose, K.;
Circular array with frequency-invariant pattern
1989 / IEEE
By: Steyskal, H.;
Extraction of poles from experimental data-on pencil-of-function method
1989 / IEEE
By: Dan Ouyang; Weng Bing Wang; Jing Li;
Composite parabola dual beam antenna with a phase compensation subreflector
1989 / IEEE
By: Iwata, R.;
A new charge-control model for single- and double-heterojunction bipolar transistors
1992 / IEEE
By: Parikh, C.D.; Lindholm, F.A.;
Miniature dual mode microstrip filters
1991 / IEEE / 0-87942-591-1
By: Fiedziuszko, S.J.; Curtis, J.A.;
Thermal instability of InGaAs/InGaAsP quantum wells
1991 / IEEE / 0-87942-626-8
By: Briggs, A.T.R.; Greene, P.D.; Stagg, J.P.; Glew, R.W.; Marsh, J.H.; Bradshaw, S.;
Estimating directions of arrival with generalized MUSIC using a linear-interpolated array manifold
1991 / IEEE / 0-7803-0003-3
By: Wu, Y.W.;
Localization of underwater wide band acoustic sources
1991 / IEEE / 0-7803-0003-3
By: Faure, B.; Bourennane, S.;
A simple physical model including velocity overshoot for n-channel heterostructure FETs
1992 / IEEE
By: Fulkerson, D.E.;
Characteristics of InAlAs/InGaAsP quantum-well HEMTs
1991 / IEEE
By: Hong, W.-P.; Koza, M.; Nguyen, C.; Chang, G.K.; Hayes, J.R.; Bhat, R.;
A fracture mechanics approach to thermal fatigue life prediction of solder joints
1992 / IEEE
By: Pao, Y.-H.;
A new technique for low-angle radar tracking
1991 / IEEE / 0-87942-638-1
By: Litva, J.; Wong, T.; Lo, T.;
Theoretical analysis and optimization of CDS signal processing method for CCD image sensors
1992 / IEEE
By: Hynecek, J.;
Transverse modes in one-port SAW resonators
1992 / IEEE
By: Smith, P.M.; Edmonson, P.J.; Campbell, C.K.;
Monolithic coaxial transmission lines for mm-wave ICs
1991 / IEEE / 0-7803-0491-8
By: Hashemi, M.M.; Bishop, J.A.; Mishra, U.; Dagli, N.; Larson, L.; Kiziloglu, K.;
Design of shunt slots in the narrow wall of X band waveguide using simple formulas
1991 / IEEE / 0-7803-0144-7
By: Reddy, C.J.;
Two-dimensional analysis of thickness-shear and flexural vibrations in rectangular AT-cut quartz plates using a one-dimensional finite element method
1990 / IEEE
By: Sekimoto, H.; Nakazawa, M.; Watanabe, Y.;
A coupled thermal magnetic model for high frequency transformers. II. Finite element implementation and validation
1992 / IEEE
By: Jessee, J.P.; Nelson, D.J.;
Evaluation of NUMA memory management through modeling and measurements
1992 / IEEE
By: LaRowe, R.P., Jr.; Holliday, M.A.; Ellis, C.S.;
Least-squares time-of-arrival estimation for transient signals in a multipath environment
1991 / IEEE / 0-8186-2470-1
By: Ramalingam, C.S.; Manickam, T.; Vaccaro, R.J.; Tufts, D.W.; Kumaresan, R.;
Dislocation based mechanisms in electromigration
1992 / IEEE / 0-7803-0473-X
By: Hubbard, J.L.; Harris, H.M.; Garrison, A.K.; Donlin, N.E.; Livesay, B.R.;
A comparative study of bearing designs and operational environments for harmonic side-drive micromotors
1992 / IEEE / 0-7803-0497-7
By: Phillips, S.M.; Mehregany, M.; Dhuler, V.R.; Lang, J.H.;
Modeling of the transient response of substrate traps to the substrate voltage in GaAs FETs
1993 / IEEE
By: Sengouga, N.; Jones, B.K.;
A new I-V model for short gate-length MESFET's
1993 / IEEE
By: Chin, S.-P.; Wu, C.-Y.;
Space-efficient extraction algorithms
1992 / IEEE / 0-8186-2645-3
By: van Genderen, A.J.; van der Meijs, N.P.;
Equivalent circuits for multiconductor microstrip bend discontinuities
1993 / IEEE
By: Mittra, R.; Harms, P.H.;
Computing motion using analog VLSI vision chips: an experimental comparison among four approaches
1991 / IEEE / 0-8186-2153-2
By: Bishofberger, B.; Horiuchi, T.; Bair, W.; Moore, A.; Koch, C.; Lazzaro, J.;
Mismatch of current sources and accuracy of D/A converters in 0.5 mu m GaAs/GaAlAs HEMT technology
1992 / IEEE / 0-7803-0593-0
By: Feng, S.; Seitzer, D.; Sauerer, J.;
Field emission diodes with tungsten wedge cathode
1991 / IEEE / 0-7803-0243-5
By: Zeto, R.J.; Kim, J.M.; Carr, W.N.; Mulford, C.D.; Zakar, E.S.;
The physical mechanisms governing DC breakdown in GaAs MESFETs
1991 / IEEE / 0-7803-0243-5
By: Ashworth, J.M.;

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