Your Search Results
Use materials about this topic in your textbook!
AcademicPub holds over eight million pieces of educational content - such as case studies and journal articles - for you to mix-and-match your way.
Experience the freedom of customizing your course pack with AcademicPub!

Topic: Excimer Lasers
Results
2011 / IEEE
By: Kai Wang; Kandulski, W.; Calver, J.; Rygate, J.; Zakariyah, S.S.; Selviah, D.R.; Hutt, D.A.; Conway, P.P.;
By: Kai Wang; Kandulski, W.; Calver, J.; Rygate, J.; Zakariyah, S.S.; Selviah, D.R.; Hutt, D.A.; Conway, P.P.;
2012 / IEEE
By: Trucchi, D.M.; Conte, G.; Allegrini, P.; Girolami, M.; Salvatori, S.; Ralchenko, V.G.;
By: Trucchi, D.M.; Conte, G.; Allegrini, P.; Girolami, M.; Salvatori, S.; Ralchenko, V.G.;
2012 / IEEE
By: Chao-Lung Wang; Po-Yu Yang; Hsu-Hang Kuo; Chun-Chien Tsai; I-Che Lee; Huang-Chung Cheng;
By: Chao-Lung Wang; Po-Yu Yang; Hsu-Hang Kuo; Chun-Chien Tsai; I-Che Lee; Huang-Chung Cheng;
1992 / IEEE / 000-0-0000-0000-0
By: Masugata, K.; Masuda, W.; Yatsui, K.; Kang, X.D.; Jiang, W.; Sonegawa, T.; Imada, G.; Sekimoto, Y.;
By: Masugata, K.; Masuda, W.; Yatsui, K.; Kang, X.D.; Jiang, W.; Sonegawa, T.; Imada, G.; Sekimoto, Y.;
1992 / IEEE / 000-0-0000-0000-0
By: Kuznetsov, V.E.; Ovsyannikov, V.A.; Jeremkin, V.V.; Vodovosov, V.M.; Vasilevsky, M.A.; Burtsev, V.A.; Bolshakov, E.P.; Streltsov, A.P.; Baranov, V.Y.; Chetvertkov, V.L.; Cheraobrovin, V.I.; Finkelstein, K.I.; Pidelskaya, R.F.; Prokopenko, V.F.; Peohersky, O.P.;
By: Kuznetsov, V.E.; Ovsyannikov, V.A.; Jeremkin, V.V.; Vodovosov, V.M.; Vasilevsky, M.A.; Burtsev, V.A.; Bolshakov, E.P.; Streltsov, A.P.; Baranov, V.Y.; Chetvertkov, V.L.; Cheraobrovin, V.I.; Finkelstein, K.I.; Pidelskaya, R.F.; Prokopenko, V.F.; Peohersky, O.P.;
2011 / IEEE / 978-0-9775657-8-8
By: Simpson, M.C.; Rohde, C.A.; Meladze, M.; MacMillan, F.; Ware, H.;
By: Simpson, M.C.; Rohde, C.A.; Meladze, M.; MacMillan, F.; Ware, H.;
2012 / IEEE / 978-1-4673-0325-5
By: Onishi, J.; Matsushita, T.; Takahashi, T.; Wada, T.; Nishida, T.; Aoyagi, S.; Suzuki, M.; Yoshikawa, Y.;
By: Onishi, J.; Matsushita, T.; Takahashi, T.; Wada, T.; Nishida, T.; Aoyagi, S.; Suzuki, M.; Yoshikawa, Y.;
2012 / IEEE
By: Chan, F.Y.M.; Tse, M.-L.V.; Kit Man Chung; Zhengyong Liu; Lau, A.P.T.; Haw-Yaw Tam; Chuang Wu; Chao Lu;
By: Chan, F.Y.M.; Tse, M.-L.V.; Kit Man Chung; Zhengyong Liu; Lau, A.P.T.; Haw-Yaw Tam; Chuang Wu; Chao Lu;
2007 / American Institute of Physics
By: L. C. Casper; H. M. J. Bastiaens; P. J. M. Peters; K.-J. Boller; R. M. Hofstra;
By: L. C. Casper; H. M. J. Bastiaens; P. J. M. Peters; K.-J. Boller; R. M. Hofstra;
Performance characteristics of an injection-controlled electron-beam pumped XeF(C to A) laser system
1988 / IEEEBy: Hamada, N.; Nighan, W.L.; Tittel, F.K.; Wilson, W.L., Jr.; Sauerbrey, R.;
1989 / IEEE
By: Mordon, S.R.; Brunetaud, J.M.; Lacroix, B.; Huvenne, J.P.; Wrobel, R.; Bocquet, H.; Niay, P.; Bernage, P.; Descamps, C.;
By: Mordon, S.R.; Brunetaud, J.M.; Lacroix, B.; Huvenne, J.P.; Wrobel, R.; Bocquet, H.; Niay, P.; Bernage, P.; Descamps, C.;
1990 / IEEE
By: Harwood, B.; Fedosejevs, R.; Shan, X.X.; Offenberger, A.A.; Thompson, D.C.; Yamanaka, C.;
By: Harwood, B.; Fedosejevs, R.; Shan, X.X.; Offenberger, A.A.; Thompson, D.C.; Yamanaka, C.;
Characteristics of doubling circuits used in gas laser excitation: application to the N/sub 2/ laser
1990 / IEEEBy: Serafetinides, A.A.; Papadopoulos, A.D.;
1991 / IEEE
By: Sauerbrey, R.; Dane, C.B.; Hofmann, T.; Yamaguchi, S.; Tittel, F.K.; Wilson, W.L., Jr.;
By: Sauerbrey, R.; Dane, C.B.; Hofmann, T.; Yamaguchi, S.; Tittel, F.K.; Wilson, W.L., Jr.;
1991 / IEEE
By: Abarenov, A.V.; Suetin, N.V.; Shugai, J.S.; Rebrick, S.P.; Rakhimov, A.T.; Persiantsev, I.G.;
By: Abarenov, A.V.; Suetin, N.V.; Shugai, J.S.; Rebrick, S.P.; Rakhimov, A.T.; Persiantsev, I.G.;
1991 / IEEE
By: Wilson, W.L., Jr.; Sauerbrey, R.A.; Hofmann, T.; Cheville, A.; Yamaguchi, S.; Tittel, F.K.;
By: Wilson, W.L., Jr.; Sauerbrey, R.A.; Hofmann, T.; Cheville, A.; Yamaguchi, S.; Tittel, F.K.;
1990 / IEEE
By: Fowler, M.C.; Yamaguchi, S.; Hirst, G.J.; Dane, C.B.; Hofmann, T.; Nighan, W.L.; Tittel, F.K.; Sauerbrey, R.; Wilson, W.L., Jr.;
By: Fowler, M.C.; Yamaguchi, S.; Hirst, G.J.; Dane, C.B.; Hofmann, T.; Nighan, W.L.; Tittel, F.K.; Sauerbrey, R.; Wilson, W.L., Jr.;
1992 / IEEE
By: Szabo, G.; Tittel, F.K.; Wilson, W.L., Jr.; Wisoff, P.J.; Dane, C.B.; Sharp, T.E.; Hofmann, T.;
By: Szabo, G.; Tittel, F.K.; Wilson, W.L., Jr.; Wisoff, P.J.; Dane, C.B.; Sharp, T.E.; Hofmann, T.;
1990 / IEEE / 0-7803-0190-0
By: Pfeffer, R.L.; Neifeld, R.; Danforth, S.C.; Safari, A.; Ramkumar, K.; Lee, J.; Wrenn, C.;
By: Pfeffer, R.L.; Neifeld, R.; Danforth, S.C.; Safari, A.; Ramkumar, K.; Lee, J.; Wrenn, C.;