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Topic: Emc
Results
2012 / IEEE
By: Ramdan, D.; Renn Chan Ooi; Chun Keang Ooi; Wei Keat Loh; Mujeebu, M.A.; Abdullah, Z.M.;
By: Ramdan, D.; Renn Chan Ooi; Chun Keang Ooi; Wei Keat Loh; Mujeebu, M.A.; Abdullah, Z.M.;
2011 / IEEE / 978-1-4577-1490-0
By: da Silva, E.R.; Boas, A.V.; Olmos, A.; Maltione, R.; Silva, J.C.;
By: da Silva, E.R.; Boas, A.V.; Olmos, A.; Maltione, R.; Silva, J.C.;
2011 / IEEE / 978-1-61284-978-2
By: Nitsch, J.; Tkachenko, S.; Vick, R.; Magdowski, M.; Sheibe, H.-J.; Sonnemann, F.;
By: Nitsch, J.; Tkachenko, S.; Vick, R.; Magdowski, M.; Sheibe, H.-J.; Sonnemann, F.;
2011 / IEEE / 978-0-9541146-3-3
By: Camarda, F.; Bencivinni, M.; Maffucci, A.; Chiariello, A.G.; Girardi, A.; Martines, I.; Capriglione, D.; Izzi, R.; Fusillo, G.;
By: Camarda, F.; Bencivinni, M.; Maffucci, A.; Chiariello, A.G.; Girardi, A.; Martines, I.; Capriglione, D.; Izzi, R.; Fusillo, G.;
Antenna efficiency determination in a reverberation chamber: From the relative to the E-field method
2011 / IEEE / 978-0-9541146-3-3By: Vandenbosch, G.A.E.; Piette, M.; Tsigros, C.; Van Troyen, D.;
2011 / IEEE / 978-0-9541146-3-3
By: Bertuol, S.; Genoulaz, J.; Dunand, M.; Lienard, M.; Degauque, P.; Degardin, V.; Junqua, I.;
By: Bertuol, S.; Genoulaz, J.; Dunand, M.; Lienard, M.; Degauque, P.; Degardin, V.; Junqua, I.;
2011 / IEEE / 978-1-4577-1769-7
By: Yi Xiao; Myungkee Chung; Senyun Kim; Jonghyun Chae; Yucai Huang; Jianfeng Zeng;
By: Yi Xiao; Myungkee Chung; Senyun Kim; Jonghyun Chae; Yucai Huang; Jianfeng Zeng;
2011 / IEEE / 978-2-87487-022-4
By: Ruey-Beei Wu; Huei Wang; Tzuang, C.C.; Tain-Wei Huang; Tzong-Lin Wu; Powen Hsu;
By: Ruey-Beei Wu; Huei Wang; Tzuang, C.C.; Tain-Wei Huang; Tzong-Lin Wu; Powen Hsu;
2012 / IEEE / 978-1-4577-1216-6
By: Grinberg, R.; Hensgens, N.; De La Parra, H.Z.; Canales, F.; Dujic, D.;
By: Grinberg, R.; Hensgens, N.; De La Parra, H.Z.; Canales, F.; Dujic, D.;
2011 / IEEE / 978-1-4577-1631-7
By: Fathi Abdul Rahim, A.; Kazemipour, A.; Zarar Mohamed Jenu, M.; Wibowo, I.A.;
By: Fathi Abdul Rahim, A.; Kazemipour, A.; Zarar Mohamed Jenu, M.; Wibowo, I.A.;
2012 / IEEE / 978-1-4577-1216-6
By: Garcia, O.; Alou, P.; Oliver, J.A.; Silva, M.; Hensgens, N.; Cobos, J.A.;
By: Garcia, O.; Alou, P.; Oliver, J.A.; Silva, M.; Hensgens, N.; Cobos, J.A.;
2012 / IEEE / 978-1-4673-1780-1
By: Jonghoon Kim; Chiuk Song; Hongseok Kim; Joungho Kim; Jiseong Kim;
By: Jonghoon Kim; Chiuk Song; Hongseok Kim; Joungho Kim; Jiseong Kim;
2012 / IEEE / 978-1-4577-1557-0
By: Shen Rong-jun; Li Jian-cheng; Wu Jian-fei; Ben Dhia, S.; Sicard, E.; Boyer, A.;
By: Shen Rong-jun; Li Jian-cheng; Wu Jian-fei; Ben Dhia, S.; Sicard, E.; Boyer, A.;
2012 / IEEE / 978-1-4577-1557-0
By: Vollaire, C.; Ferber, M.; Vasconcelos, J.A.; Coulomb, J.; Krahenbuhl, L.;
By: Vollaire, C.; Ferber, M.; Vasconcelos, J.A.; Coulomb, J.; Krahenbuhl, L.;
2012 / IEEE / 978-1-4577-1557-0
By: Kang Rong Li; Wei-Shan Soh; Kye Yak See; Lin Biao Wang; Svimonishvili, T.; Jun Wu Zhang;
By: Kang Rong Li; Wei-Shan Soh; Kye Yak See; Lin Biao Wang; Svimonishvili, T.; Jun Wu Zhang;