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Topic: Electrons
Results
2012 / IEEE
By: Hon, S.J.; Tsun-Kai Ko; Shuguang Li; Zhi-Yong Jiao; Liu, C.H.; Shoou-Jinn Chang; Chuang, R.W.; Yu-Yao Lin;
By: Hon, S.J.; Tsun-Kai Ko; Shuguang Li; Zhi-Yong Jiao; Liu, C.H.; Shoou-Jinn Chang; Chuang, R.W.; Yu-Yao Lin;
2012 / IEEE
By: Tassisto, M.; Schon, H.; Putselyk, S.; Kosmider, A.; Gil, W.; Gehring, R.; Dormicchi, O.; Bonn, J.; Kleinfeller, J.;
By: Tassisto, M.; Schon, H.; Putselyk, S.; Kosmider, A.; Gil, W.; Gehring, R.; Dormicchi, O.; Bonn, J.; Kleinfeller, J.;
2011 / IEEE / 978-966-335-357-9
By: Kolosov, S.V.; Kizhlay, I.N.; Sinitsyn, A.K.; Rak, A.O.; Popkova, T.L.; Kurayev, A.A.;
By: Kolosov, S.V.; Kizhlay, I.N.; Sinitsyn, A.K.; Rak, A.O.; Popkova, T.L.; Kurayev, A.A.;
2011 / IEEE / 978-1-4577-1769-7
By: Song Ye; Leida Chen; Mingliang Huang; Shaoming Zhou; Xi Cao; Jifan Wang; Yuming Ye;
By: Song Ye; Leida Chen; Mingliang Huang; Shaoming Zhou; Xi Cao; Jifan Wang; Yuming Ye;
2011 / IEEE / 978-1-4577-0077-4
By: Duofang Li; Tianguang Cao; Jinpeng Geng; Yong Zhan; Hailong An; Yafei Chen; Chunlei Hu;
By: Duofang Li; Tianguang Cao; Jinpeng Geng; Yong Zhan; Hailong An; Yafei Chen; Chunlei Hu;
2011 / IEEE / 978-1-4244-8939-8
By: Gomes, R.; Marshall, A.; Pin Jern Ker; Chee Hing Tan; Jo Shien Ng; David, J.P.;
By: Gomes, R.; Marshall, A.; Pin Jern Ker; Chee Hing Tan; Jo Shien Ng; David, J.P.;
2011 / IEEE / 978-2-87487-023-1
By: Kyabaggu, P.; Mohammed-Ali, M.; Rezazadeh, A.A.; Sinulingga, E.;
By: Kyabaggu, P.; Mohammed-Ali, M.; Rezazadeh, A.A.; Sinulingga, E.;
2011 / IEEE / 978-1-4673-0120-6
By: Witkowska-Baran, M.; Kochanowska, D.; Mycielski, A.; Raulo, A.; Simon, H.; Sowinska, M.; James, R.B.;
By: Witkowska-Baran, M.; Kochanowska, D.; Mycielski, A.; Raulo, A.; Simon, H.; Sowinska, M.; James, R.B.;
2012 / IEEE / 978-1-4577-1438-2
By: Ludwig, F.; Hoffmann, M.; Czuba, K.; Zukocinski, M.; Piekarski, J.; Schiarb, H.;
By: Ludwig, F.; Hoffmann, M.; Czuba, K.; Zukocinski, M.; Piekarski, J.; Schiarb, H.;
2012 / IEEE / 978-1-4673-1164-9
By: Semenov, Y.G.; Stephanovich, V.; Xiaopeng Duan; Ki Wook Kim; Franchin, M.; Fangohr, H.;
By: Semenov, Y.G.; Stephanovich, V.; Xiaopeng Duan; Ki Wook Kim; Franchin, M.; Fangohr, H.;
2012 / IEEE / 978-1-4673-0707-9
By: Goodnick, S.M.; Ferry, D.K.; Guerra, D.; Soligo, R.; Saraniti, M.;
By: Goodnick, S.M.; Ferry, D.K.; Guerra, D.; Soligo, R.; Saraniti, M.;
2012 / IEEE / 978-1-4673-0442-9
By: Wacquez, R.; Sanquer, M.; Roche, B.; Jehl, X.; Vinet, M.; Devoille, L.; Djordjevic, S.; Charron, T.;
By: Wacquez, R.; Sanquer, M.; Roche, B.; Jehl, X.; Vinet, M.; Devoille, L.; Djordjevic, S.; Charron, T.;
2007 / American Institute of Physics
By: W. M. Nevins; S. E. Parker; Y. Chen; J. Candy; A. Dimits; W. Dorland; G. W. Hammett; F. Jenko;
By: W. M. Nevins; S. E. Parker; Y. Chen; J. Candy; A. Dimits; W. Dorland; G. W. Hammett; F. Jenko;
2009 / American Institute of Physics
By: A. Esfandyari-Kalejahi; M. Akbari-Moghanjoughi; B. Haddadpour-Khiaban;
By: A. Esfandyari-Kalejahi; M. Akbari-Moghanjoughi; B. Haddadpour-Khiaban;
2009 / American Institute of Physics
By: Felipe A. Asenjo; Víctor Muñoz; Juan Alejandro Valdivia; Tohru Hada;
By: Felipe A. Asenjo; Víctor Muñoz; Juan Alejandro Valdivia; Tohru Hada;
2015 / IEEE
By: Akimov, D. Y.; Alexandrov, I. S.; Tikhomirov, G. V.; Stekhanov, V. N.; Sosnovtsev, V. V.; Skorokhvatov, M. D.; Saldikov, I. S.; Rudik, D. G.; Nurakhov, N. N.; Nikolaev, R. I.; Melikyan, Y. A.; Lukyanchenko, G. A.; Kumpan, A. V.; Kuchenkov, A. V.; Krakhmalova, T. D.; Kovalenko, A. G.; Belov, V. A.; Bolozdynya, A. I.; Burenkov, A. A.; Chepurnov, A. S.; Danilov, M. V.; Efremenko, Y. V.; Etenko, A. V.; Gromov, M. B.; Gulin, M. A.; Ivakhin, S. V.; Kaplin, V. A.; Karelin, A. K.; Khromov, A. V.; Kirsanov, M. A.; Klimanov, S. G.; Kobyakin, A. S.; Konovalov, A. M.;
By: Akimov, D. Y.; Alexandrov, I. S.; Tikhomirov, G. V.; Stekhanov, V. N.; Sosnovtsev, V. V.; Skorokhvatov, M. D.; Saldikov, I. S.; Rudik, D. G.; Nurakhov, N. N.; Nikolaev, R. I.; Melikyan, Y. A.; Lukyanchenko, G. A.; Kumpan, A. V.; Kuchenkov, A. V.; Krakhmalova, T. D.; Kovalenko, A. G.; Belov, V. A.; Bolozdynya, A. I.; Burenkov, A. A.; Chepurnov, A. S.; Danilov, M. V.; Efremenko, Y. V.; Etenko, A. V.; Gromov, M. B.; Gulin, M. A.; Ivakhin, S. V.; Kaplin, V. A.; Karelin, A. K.; Khromov, A. V.; Kirsanov, M. A.; Klimanov, S. G.; Kobyakin, A. S.; Konovalov, A. M.;
2015 / IEEE
By: Hoff, G.; Han, M. C.; Basaglia, T.; Pia, M. G.; Kim, S. H.; Saracco, P.; Kim, C. H.;
By: Hoff, G.; Han, M. C.; Basaglia, T.; Pia, M. G.; Kim, S. H.; Saracco, P.; Kim, C. H.;
2013 / IEEE
By: Imaizumi, Mitsuru; Ohshima, Takeshi; Sato, Shin-Ichiro; Tajima, Michio; Nakamura, Tetsuya;
By: Imaizumi, Mitsuru; Ohshima, Takeshi; Sato, Shin-Ichiro; Tajima, Michio; Nakamura, Tetsuya;
2014 / IEEE
By: Daglis, I. A.; Sandberg, I.; Nieminen, P.; Evans, H.; Hands, A.; Truscott, P.; Heynderickx, D.;
By: Daglis, I. A.; Sandberg, I.; Nieminen, P.; Evans, H.; Hands, A.; Truscott, P.; Heynderickx, D.;
2006 / RSC Publishing
By: Deguang Huang; Alexander J. Blake; David R. Allan; Martin Schroumlder; Timothy J. Prior;
By: Deguang Huang; Alexander J. Blake; David R. Allan; Martin Schroumlder; Timothy J. Prior;
Excision of CN- and OCN- from acetamide and some amide derivatives triggered by low energy electrons
2008 / RSC PublishingBy: Eugen Illenberger; Jaroslav Koccaroniscaronek; Iwona Daogonbkowska; Janina Kopyra; Constanze KoenigLehmann;
2009 / RSC Publishing
By: M. Bertin; I. Martin; R. Azria; T. Chiavassa; A. Lafosse; E. Illenberger; F. Borget; J. B. Bossa; P. Theule; F. Duvernay;
By: M. Bertin; I. Martin; R. Azria; T. Chiavassa; A. Lafosse; E. Illenberger; F. Borget; J. B. Bossa; P. Theule; F. Duvernay;
2009 / RSC Publishing
By: Sylwia Ptasinska; Mario Orzol; Helga Doumlgg Flosadoacutettir; Iwona Daogonbkowska; Eugen Illenberger; Oddur Ingoacutelfsson; Ilko Bald;
By: Sylwia Ptasinska; Mario Orzol; Helga Doumlgg Flosadoacutettir; Iwona Daogonbkowska; Eugen Illenberger; Oddur Ingoacutelfsson; Ilko Bald;
2009 / RSC Publishing
By: Roy Copping; Catherine TalbotEeckelaers; Mark J. Sarsfield; Chris J. Jones; Oscar A. Valenzula; Ross D. McDonald; Brian L. Scott; Sean D. Reilly; David Collison; Madeleine Helliwell; Andrew J. Gaunt; Iain May;
By: Roy Copping; Catherine TalbotEeckelaers; Mark J. Sarsfield; Chris J. Jones; Oscar A. Valenzula; Ross D. McDonald; Brian L. Scott; Sean D. Reilly; David Collison; Madeleine Helliwell; Andrew J. Gaunt; Iain May;
2010 / RSC Publishing
By: Janus Urbanek; Joel TorresAlacan; Stephan Kratz; Peter Voumlhringer; Joumlrg Lindner;
By: Janus Urbanek; Joel TorresAlacan; Stephan Kratz; Peter Voumlhringer; Joumlrg Lindner;
2010 / RSC Publishing
By: Andrea Luumlbcke; Thomas Schultz; Ingolf V. Hertel; Nadja Heine; Franziska Buchner;
By: Andrea Luumlbcke; Thomas Schultz; Ingolf V. Hertel; Nadja Heine; Franziska Buchner;
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