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Topic: Electron Sources
Results
1992 / IEEE / 000-0-0000-0000-0
By: Gundersen, M.A.; Jiang, B.; Reinhardt, N.; Kirkman, G.; Temkin, R.J.; Liou, R.L.; Hsu, T.Y.;
By: Gundersen, M.A.; Jiang, B.; Reinhardt, N.; Kirkman, G.; Temkin, R.J.; Liou, R.L.; Hsu, T.Y.;
2004 / IEEE / 978-5-87911-088-3
By: Engelko, V.I.; Vyazmenova, G.A.; Mueller, G.; Kuryshev, V.O.; Kuznetsov, V.S.;
By: Engelko, V.I.; Vyazmenova, G.A.; Mueller, G.; Kuryshev, V.O.; Kuznetsov, V.S.;
2011 / IEEE / 978-3-00-035081-8
By: Prommesberger, C.; Mueller, G.; Bornmann, B.; Rutkowski, S.; Schreiner, R.; Langer, C.; Dams, F.;
By: Prommesberger, C.; Mueller, G.; Bornmann, B.; Rutkowski, S.; Schreiner, R.; Langer, C.; Dams, F.;
2011 / IEEE / 978-3-00-035081-8
By: Navitski, A.; Serbun, P.; Bornmann, B.; Prommesberger, C.; Dams, F.; Schreiner, R.; Muller, G.;
By: Navitski, A.; Serbun, P.; Bornmann, B.; Prommesberger, C.; Dams, F.; Schreiner, R.; Muller, G.;
2012 / IEEE / 978-1-4673-0442-9
By: Dolata, R.; Kaestner, B.; Hohls, F.; Fricke, L.; Mirovsky, P.; Schumacher, H.W.; Wulf, M.; Weimann, T.; Pierz, K.;
By: Dolata, R.; Kaestner, B.; Hohls, F.; Fricke, L.; Mirovsky, P.; Schumacher, H.W.; Wulf, M.; Weimann, T.; Pierz, K.;
2013 / IEEE
By: Bugaev, A. S.; Oks, E. M.; Litovko, I. V.; Dunets, S. P.; Dobrovolskiy, A. M.; Goncharov, A. A.; Gushenets, V. I.;
By: Bugaev, A. S.; Oks, E. M.; Litovko, I. V.; Dunets, S. P.; Dobrovolskiy, A. M.; Goncharov, A. A.; Gushenets, V. I.;
2006 / American Institute of Physics
By: I. V. Konoplev; A. W. Cross; P. MacInnes; W. He; C. G. Whyte; A. D. Phelps; C. W. Robertson; K. Ronald; A. R. Young;
By: I. V. Konoplev; A. W. Cross; P. MacInnes; W. He; C. G. Whyte; A. D. Phelps; C. W. Robertson; K. Ronald; A. R. Young;
2007 / American Institute of Physics
By: I. V. Konoplev; A. W. Cross; P. MacInnes; W. He; C. G. Whyte; A. D. Phelps; C. W. Robertson; K. Ronald; A. R. Young;
By: I. V. Konoplev; A. W. Cross; P. MacInnes; W. He; C. G. Whyte; A. D. Phelps; C. W. Robertson; K. Ronald; A. R. Young;
2008 / American Institute of Physics
By: X. H. Yuan; Y. T. Li; M. H. Xu; Z. Y. Zheng; M. Chen; W. X. Liang; Q. Z. Yu; Y. Zhang; F. Liu; J. Bernhardt; S. J. Wang; Z. H. Wang; Z. Y. Wei; W. Zhao; J. Zhang;
By: X. H. Yuan; Y. T. Li; M. H. Xu; Z. Y. Zheng; M. Chen; W. X. Liang; Q. Z. Yu; Y. Zhang; F. Liu; J. Bernhardt; S. J. Wang; Z. H. Wang; Z. Y. Wei; W. Zhao; J. Zhang;
2010 / American Institute of Physics
By: Alexandra Silze; Erik Ritter; Günter Zschornack; Andreas Schwan; Falk Ullmann;
By: Alexandra Silze; Erik Ritter; Günter Zschornack; Andreas Schwan; Falk Ullmann;
2012 / American Institute of Physics
By: G. Zschornack; A. Schwan; F. Ullmann; F. Grossmann; V. P. Ovsyannikov; E. Ritter;
By: G. Zschornack; A. Schwan; F. Ullmann; F. Grossmann; V. P. Ovsyannikov; E. Ritter;
Thermal field emission converter of an environmental thermal (T ∼300k) energy — To electrical energy
2014 / IEEEBy: Ptitsin, V. E.;
2014 / IEEE
By: Meijer, J.R.; Wieland, M.J.; van Veen, A.H.V.; Steenbrink, S.W.H.K.; Gurtler, L. Dinu;
By: Meijer, J.R.; Wieland, M.J.; van Veen, A.H.V.; Steenbrink, S.W.H.K.; Gurtler, L. Dinu;
2014 / IEEE
By: Liu, Yanwen; Qi, Shikai; Wang, Xiaoxia; Zhang, Qi; Li, Yun; Zhao, Qinglan; Luo, Jirun;
By: Liu, Yanwen; Qi, Shikai; Wang, Xiaoxia; Zhang, Qi; Li, Yun; Zhao, Qinglan; Luo, Jirun;
2014 / IEEE
By: Torgasin, K.; Mishima, K.; Ohgaki, H.; Masuda, K.; Nagasaki, K.; Kii, T.; Zen, H.; Omer, M.; Negm, H.; Yoshida, K.; Nogi, T.; Okumura, K.; Inukai, Motoharu;
By: Torgasin, K.; Mishima, K.; Ohgaki, H.; Masuda, K.; Nagasaki, K.; Kii, T.; Zen, H.; Omer, M.; Negm, H.; Yoshida, K.; Nogi, T.; Okumura, K.; Inukai, Motoharu;
2014 / IEEE
By: Song, Yoon-Ho; Ahn, Seungjoon; Jeong, Jin-Woo; Kang, Jun-Tae; Choi, Sungyoul; Kim, Jae-Woo;
By: Song, Yoon-Ho; Ahn, Seungjoon; Jeong, Jin-Woo; Kang, Jun-Tae; Choi, Sungyoul; Kim, Jae-Woo;
1989 / IEEE
By: Redel, T.; Hartmann, W.; Gundel, H.; Frank, K.; Christiansen, J.; Benker, W.; Stetter, M.;
By: Redel, T.; Hartmann, W.; Gundel, H.; Frank, K.; Christiansen, J.; Benker, W.; Stetter, M.;
1989 / IEEE
By: Builta, L.A.; Carlson, R.L.; Hughes, T.P.; Ridlon, R.N.; Moir, D.C.; Kauppila, T.J.;
By: Builta, L.A.; Carlson, R.L.; Hughes, T.P.; Ridlon, R.N.; Moir, D.C.; Kauppila, T.J.;
1989 / IEEE
By: Remelius, D.K.; Sheffield, R.; Busch, G.E.; Wenzel, R.G.; Watkins, D.E.; Nguyen, D.C.;
By: Remelius, D.K.; Sheffield, R.; Busch, G.E.; Wenzel, R.G.; Watkins, D.E.; Nguyen, D.C.;
1989 / IEEE
By: Poukey, J.W.; Mazarakis, M.G.; Wagner, J.S.; Leifeste, G.T.; Frost, C.A.; Haworth, M.D.; Smith, D.L.; Hasit, D.E.; Shope, S.L.;
By: Poukey, J.W.; Mazarakis, M.G.; Wagner, J.S.; Leifeste, G.T.; Frost, C.A.; Haworth, M.D.; Smith, D.L.; Hasit, D.E.; Shope, S.L.;
1991 / IEEE
By: Feldman, R.B.; Early, J.; Carlsten, B.E.; Bender, S.C.; Feldman, D.W.; Johnson, W.J.D.; Sheffield, R.L.; Young, L.M.; Stein, W.E.; O'Shea, P.G.; Lumpkin, A.H.;
By: Feldman, R.B.; Early, J.; Carlsten, B.E.; Bender, S.C.; Feldman, D.W.; Johnson, W.J.D.; Sheffield, R.L.; Young, L.M.; Stein, W.E.; O'Shea, P.G.; Lumpkin, A.H.;
1991 / IEEE
By: Schoen, P.E.; Kirkpatrick, D.A.; Ditchek, B.M.; Levinson, M.; Schnur, J.M.; Kahn, B.E.; Baral, S.; Price, R.; Stockton, W.B.;
By: Schoen, P.E.; Kirkpatrick, D.A.; Ditchek, B.M.; Levinson, M.; Schnur, J.M.; Kahn, B.E.; Baral, S.; Price, R.; Stockton, W.B.;
1991 / IEEE / 0-7803-0135-8
By: Konecny, R.; Ho, C.; Chojnacki, E.; Gai, W.; Mtingwa, S.; Rosing, M.; Simpson, J.; Schoessow, P.; Norem, J.;
By: Konecny, R.; Ho, C.; Chojnacki, E.; Gai, W.; Mtingwa, S.; Rosing, M.; Simpson, J.; Schoessow, P.; Norem, J.;
1991 / IEEE / 0-7803-0135-8
By: Yotam, R.; Smith, H.; Nelson, G.; Ipe, N.; Fitch, J.; Crook, K.; Benson, E.; Sebek, J.; Horton, M.; Hettel, R.; Garoutte, R.; Cerino, J.;
By: Yotam, R.; Smith, H.; Nelson, G.; Ipe, N.; Fitch, J.; Crook, K.; Benson, E.; Sebek, J.; Horton, M.; Hettel, R.; Garoutte, R.; Cerino, J.;
1991 / IEEE / 0-7803-0135-8
By: Yeremian, A.D.; Spencer, C.M.; Schultz, D.C.; Miller, R.H.; Eppley, K.A.; Early, R.A.; Lavine, T.L.; Herrmannsfeldt, W.B.;
By: Yeremian, A.D.; Spencer, C.M.; Schultz, D.C.; Miller, R.H.; Eppley, K.A.; Early, R.A.; Lavine, T.L.; Herrmannsfeldt, W.B.;
1991 / IEEE / 0-7803-0135-8
By: Young, A.T.; Watson, J.M.; Li, C.Y.; Leung, K.N.; Kunkel, W.B.; Chen, P.;
By: Young, A.T.; Watson, J.M.; Li, C.Y.; Leung, K.N.; Kunkel, W.B.; Chen, P.;
1991 / IEEE / 0-7803-0135-8
By: Yongshang Huang; Jie Gao; Jialin Xie; Youzhi Wang; Hongxiu Liu; Renshan Zhang;
By: Yongshang Huang; Jie Gao; Jialin Xie; Youzhi Wang; Hongxiu Liu; Renshan Zhang;
1991 / IEEE / 0-7803-0135-8
By: Saka, T.; Takeuchi, Y.; Mizuta, M.; Kato, T.; Kamiya, Y.; Itoga, K.; Nakamura, S.; Horinaka, H.; Furuya, T.; Baba, T.; Aoyagi, H.; Omori, T.; Kurihara, Y.; Nakanishi, T.; Yoshioka, M.; Tsubata, M.;
By: Saka, T.; Takeuchi, Y.; Mizuta, M.; Kato, T.; Kamiya, Y.; Itoga, K.; Nakamura, S.; Horinaka, H.; Furuya, T.; Baba, T.; Aoyagi, H.; Omori, T.; Kurihara, Y.; Nakanishi, T.; Yoshioka, M.; Tsubata, M.;